Abstract

The effect of a tunable, externally coupled Fabry–Perot cavity to resonantly enhance the optical Hall effect signatures at terahertz frequencies produced by a traditional Drude-like two-dimensional electron gas is shown and discussed in this Letter. As a result, the detection of optical Hall effect signatures at conveniently obtainable magnetic fields, for example, by neodymium permanent magnets, is demonstrated. An AlInN/GaN-based high-electron mobility transistor structure grown on a sapphire substrate is used for the experiment. The optical Hall effect signatures and their dispersions, which are governed by the frequency and the reflectance minima and maxima of the externally coupled Fabry–Perot cavity, are presented and discussed. Tuning the externally coupled Fabry–Perot cavity strongly modifies the optical Hall effect signatures, which provides a new degree of freedom for optical Hall effect experiments in addition to frequency, angle of incidence, and magnetic field direction and strength.

© 2015 Optical Society of America

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References

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  1. M. Schubert, T. Hofmann, and C. M. Herzinger, J. Opt. Soc. Am. A 20, 347 (2003).
    [Crossref]
  2. P. Kühne, C. Herzinger, M. Schubert, J. Woollam, and T. Hofmann, Rev. Sci. Instrum. 85, 071301 (2014).
    [Crossref]
  3. P. Kühne, V. Darakchieva, R. Yakimova, J. D. Tedesco, R. L. Myers-Ward, C. R. Eddy, D. K. Gaskill, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann, Phys. Rev. Lett. 111, 077402 (2013).
    [Crossref]
  4. T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. B. Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
    [Crossref]
  5. T. Hofmann, C. M. Herzinger, J. L. Tedesco, D. K. Gaskill, J. A. Woollam, and M. Schubert, Thin Solid Films 519, 2593 (2011).
    [Crossref]
  6. T. Hofmann, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, D. K. Gaskill, J. L. Tedesco, and M. Schubert, Appl. Phys. Lett. 98, 041906 (2011).
    [Crossref]
  7. S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann, Appl. Phys. Lett. 98, 092103 (2011).
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  8. T. Hofmann, C. Herzinger, and M. Schubert, Phys. Status Solidi A 205, 779 (2008).
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    [Crossref]
  10. M. Onoda, S. Murakami, and N. Nagaosa, Phys. Rev. Lett. 93, 083901 (2004).
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    [Crossref]
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2014 (3)

P. Kühne, C. Herzinger, M. Schubert, J. Woollam, and T. Hofmann, Rev. Sci. Instrum. 85, 071301 (2014).
[Crossref]

P. Wang, W. Li, Q. Liu, and X. Jiang, Phys. Rev. A 90, 015801 (2014).
[Crossref]

L. S. Abdallah, S. Zollner, C. Lavoie, A. Ozcan, and M. Raymond, Thin Solid Films 571, 484 (2014).
[Crossref]

2013 (1)

P. Kühne, V. Darakchieva, R. Yakimova, J. D. Tedesco, R. L. Myers-Ward, C. R. Eddy, D. K. Gaskill, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann, Phys. Rev. Lett. 111, 077402 (2013).
[Crossref]

2012 (1)

T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. B. Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
[Crossref]

2011 (3)

T. Hofmann, C. M. Herzinger, J. L. Tedesco, D. K. Gaskill, J. A. Woollam, and M. Schubert, Thin Solid Films 519, 2593 (2011).
[Crossref]

T. Hofmann, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, D. K. Gaskill, J. L. Tedesco, and M. Schubert, Appl. Phys. Lett. 98, 041906 (2011).
[Crossref]

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann, Appl. Phys. Lett. 98, 092103 (2011).
[Crossref]

2010 (1)

T. Hofmann, C. Herzinger, A. Boosalis, T. Tiwald, J. Woollam, and M. Schubert, Rev. Sci. Instrum. 81, 023101 (2010).
[Crossref]

2008 (2)

V. Darakchieva, M. Beckers, M.-Y. Xie, L. Hultman, B. Monemar, J.-F. Carlin, E. Feltin, M. Gonschorek, and N. Grandjean, J. Appl. Phys. 103, 103513 (2008).
[Crossref]

T. Hofmann, C. Herzinger, and M. Schubert, Phys. Status Solidi A 205, 779 (2008).
[Crossref]

2006 (1)

T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, and M. Schubert, Rev. Sci. Instrum. 77, 63902 (2006).
[Crossref]

2004 (2)

M. Onoda, S. Murakami, and N. Nagaosa, Phys. Rev. Lett. 93, 083901 (2004).
[Crossref]

Y. Ino, R. Shimano, Y. Svirko, and M. Kuwata-Gonokami, Phys. Rev. B 70, 155101 (2004).
[Crossref]

2003 (1)

2001 (1)

I. Vurgaftman, J. R. Meyer, and L. R. Ram-Mohan, J. Appl. Phys. 89, 5815 (2001).
[Crossref]

1959 (1)

S. Roberts, Phys. Rev. 114, 104 (1959).
[Crossref]

Abdallah, L. S.

L. S. Abdallah, S. Zollner, C. Lavoie, A. Ozcan, and M. Raymond, Thin Solid Films 571, 484 (2014).
[Crossref]

Beckers, M.

V. Darakchieva, M. Beckers, M.-Y. Xie, L. Hultman, B. Monemar, J.-F. Carlin, E. Feltin, M. Gonschorek, and N. Grandjean, J. Appl. Phys. 103, 103513 (2008).
[Crossref]

Boosalis, A.

T. Hofmann, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, D. K. Gaskill, J. L. Tedesco, and M. Schubert, Appl. Phys. Lett. 98, 041906 (2011).
[Crossref]

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann, Appl. Phys. Lett. 98, 092103 (2011).
[Crossref]

T. Hofmann, C. Herzinger, A. Boosalis, T. Tiwald, J. Woollam, and M. Schubert, Rev. Sci. Instrum. 81, 023101 (2010).
[Crossref]

Cardona, M.

P. Yu and M. Cardona, Fundamentals of Semiconductors (Springer, 1999).

Carlin, J.-F.

V. Darakchieva, M. Beckers, M.-Y. Xie, L. Hultman, B. Monemar, J.-F. Carlin, E. Feltin, M. Gonschorek, and N. Grandjean, J. Appl. Phys. 103, 103513 (2008).
[Crossref]

Chen, J.-T.

T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. B. Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
[Crossref]

Darakchieva, V.

P. Kühne, V. Darakchieva, R. Yakimova, J. D. Tedesco, R. L. Myers-Ward, C. R. Eddy, D. K. Gaskill, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann, Phys. Rev. Lett. 111, 077402 (2013).
[Crossref]

T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. B. Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
[Crossref]

V. Darakchieva, M. Beckers, M.-Y. Xie, L. Hultman, B. Monemar, J.-F. Carlin, E. Feltin, M. Gonschorek, and N. Grandjean, J. Appl. Phys. 103, 103513 (2008).
[Crossref]

Eastman, L. F.

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann, Appl. Phys. Lett. 98, 092103 (2011).
[Crossref]

Eddy, C. R.

P. Kühne, V. Darakchieva, R. Yakimova, J. D. Tedesco, R. L. Myers-Ward, C. R. Eddy, D. K. Gaskill, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann, Phys. Rev. Lett. 111, 077402 (2013).
[Crossref]

Esquinazi, P.

T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, and M. Schubert, Rev. Sci. Instrum. 77, 63902 (2006).
[Crossref]

Feltin, E.

V. Darakchieva, M. Beckers, M.-Y. Xie, L. Hultman, B. Monemar, J.-F. Carlin, E. Feltin, M. Gonschorek, and N. Grandjean, J. Appl. Phys. 103, 103513 (2008).
[Crossref]

Forsberg, U.

T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. B. Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
[Crossref]

Fujiwara, H.

H. Fujiwara, Spectroscopic Ellipsometry (Wiley, 2007).

Gaskill, D. K.

P. Kühne, V. Darakchieva, R. Yakimova, J. D. Tedesco, R. L. Myers-Ward, C. R. Eddy, D. K. Gaskill, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann, Phys. Rev. Lett. 111, 077402 (2013).
[Crossref]

T. Hofmann, C. M. Herzinger, J. L. Tedesco, D. K. Gaskill, J. A. Woollam, and M. Schubert, Thin Solid Films 519, 2593 (2011).
[Crossref]

T. Hofmann, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, D. K. Gaskill, J. L. Tedesco, and M. Schubert, Appl. Phys. Lett. 98, 041906 (2011).
[Crossref]

Gonschorek, M.

V. Darakchieva, M. Beckers, M.-Y. Xie, L. Hultman, B. Monemar, J.-F. Carlin, E. Feltin, M. Gonschorek, and N. Grandjean, J. Appl. Phys. 103, 103513 (2008).
[Crossref]

Grandjean, N.

V. Darakchieva, M. Beckers, M.-Y. Xie, L. Hultman, B. Monemar, J.-F. Carlin, E. Feltin, M. Gonschorek, and N. Grandjean, J. Appl. Phys. 103, 103513 (2008).
[Crossref]

Herzinger, C.

P. Kühne, C. Herzinger, M. Schubert, J. Woollam, and T. Hofmann, Rev. Sci. Instrum. 85, 071301 (2014).
[Crossref]

T. Hofmann, C. Herzinger, A. Boosalis, T. Tiwald, J. Woollam, and M. Schubert, Rev. Sci. Instrum. 81, 023101 (2010).
[Crossref]

T. Hofmann, C. Herzinger, and M. Schubert, Phys. Status Solidi A 205, 779 (2008).
[Crossref]

Herzinger, C. M.

P. Kühne, V. Darakchieva, R. Yakimova, J. D. Tedesco, R. L. Myers-Ward, C. R. Eddy, D. K. Gaskill, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann, Phys. Rev. Lett. 111, 077402 (2013).
[Crossref]

T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. B. Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
[Crossref]

T. Hofmann, C. M. Herzinger, J. L. Tedesco, D. K. Gaskill, J. A. Woollam, and M. Schubert, Thin Solid Films 519, 2593 (2011).
[Crossref]

T. Hofmann, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, D. K. Gaskill, J. L. Tedesco, and M. Schubert, Appl. Phys. Lett. 98, 041906 (2011).
[Crossref]

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann, Appl. Phys. Lett. 98, 092103 (2011).
[Crossref]

T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, and M. Schubert, Rev. Sci. Instrum. 77, 63902 (2006).
[Crossref]

M. Schubert, T. Hofmann, and C. M. Herzinger, J. Opt. Soc. Am. A 20, 347 (2003).
[Crossref]

Hofmann, T.

P. Kühne, C. Herzinger, M. Schubert, J. Woollam, and T. Hofmann, Rev. Sci. Instrum. 85, 071301 (2014).
[Crossref]

P. Kühne, V. Darakchieva, R. Yakimova, J. D. Tedesco, R. L. Myers-Ward, C. R. Eddy, D. K. Gaskill, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann, Phys. Rev. Lett. 111, 077402 (2013).
[Crossref]

T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. B. Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
[Crossref]

T. Hofmann, C. M. Herzinger, J. L. Tedesco, D. K. Gaskill, J. A. Woollam, and M. Schubert, Thin Solid Films 519, 2593 (2011).
[Crossref]

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann, Appl. Phys. Lett. 98, 092103 (2011).
[Crossref]

T. Hofmann, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, D. K. Gaskill, J. L. Tedesco, and M. Schubert, Appl. Phys. Lett. 98, 041906 (2011).
[Crossref]

T. Hofmann, C. Herzinger, A. Boosalis, T. Tiwald, J. Woollam, and M. Schubert, Rev. Sci. Instrum. 81, 023101 (2010).
[Crossref]

T. Hofmann, C. Herzinger, and M. Schubert, Phys. Status Solidi A 205, 779 (2008).
[Crossref]

T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, and M. Schubert, Rev. Sci. Instrum. 77, 63902 (2006).
[Crossref]

M. Schubert, T. Hofmann, and C. M. Herzinger, J. Opt. Soc. Am. A 20, 347 (2003).
[Crossref]

Hultman, L.

V. Darakchieva, M. Beckers, M.-Y. Xie, L. Hultman, B. Monemar, J.-F. Carlin, E. Feltin, M. Gonschorek, and N. Grandjean, J. Appl. Phys. 103, 103513 (2008).
[Crossref]

Ino, Y.

Y. Ino, R. Shimano, Y. Svirko, and M. Kuwata-Gonokami, Phys. Rev. B 70, 155101 (2004).
[Crossref]

Janzén, E.

T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. B. Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
[Crossref]

Jiang, X.

P. Wang, W. Li, Q. Liu, and X. Jiang, Phys. Rev. A 90, 015801 (2014).
[Crossref]

Kühne, P.

P. Kühne, C. Herzinger, M. Schubert, J. Woollam, and T. Hofmann, Rev. Sci. Instrum. 85, 071301 (2014).
[Crossref]

P. Kühne, V. Darakchieva, R. Yakimova, J. D. Tedesco, R. L. Myers-Ward, C. R. Eddy, D. K. Gaskill, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann, Phys. Rev. Lett. 111, 077402 (2013).
[Crossref]

T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. B. Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
[Crossref]

T. Hofmann, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, D. K. Gaskill, J. L. Tedesco, and M. Schubert, Appl. Phys. Lett. 98, 041906 (2011).
[Crossref]

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann, Appl. Phys. Lett. 98, 092103 (2011).
[Crossref]

Kuwata-Gonokami, M.

Y. Ino, R. Shimano, Y. Svirko, and M. Kuwata-Gonokami, Phys. Rev. B 70, 155101 (2004).
[Crossref]

Lavoie, C.

L. S. Abdallah, S. Zollner, C. Lavoie, A. Ozcan, and M. Raymond, Thin Solid Films 571, 484 (2014).
[Crossref]

Li, W.

P. Wang, W. Li, Q. Liu, and X. Jiang, Phys. Rev. A 90, 015801 (2014).
[Crossref]

Liu, Q.

P. Wang, W. Li, Q. Liu, and X. Jiang, Phys. Rev. A 90, 015801 (2014).
[Crossref]

Meyer, J. R.

I. Vurgaftman, J. R. Meyer, and L. R. Ram-Mohan, J. Appl. Phys. 89, 5815 (2001).
[Crossref]

Monemar, B.

V. Darakchieva, M. Beckers, M.-Y. Xie, L. Hultman, B. Monemar, J.-F. Carlin, E. Feltin, M. Gonschorek, and N. Grandjean, J. Appl. Phys. 103, 103513 (2008).
[Crossref]

Murakami, S.

M. Onoda, S. Murakami, and N. Nagaosa, Phys. Rev. Lett. 93, 083901 (2004).
[Crossref]

Myers-Ward, R. L.

P. Kühne, V. Darakchieva, R. Yakimova, J. D. Tedesco, R. L. Myers-Ward, C. R. Eddy, D. K. Gaskill, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann, Phys. Rev. Lett. 111, 077402 (2013).
[Crossref]

Nagaosa, N.

M. Onoda, S. Murakami, and N. Nagaosa, Phys. Rev. Lett. 93, 083901 (2004).
[Crossref]

Onoda, M.

M. Onoda, S. Murakami, and N. Nagaosa, Phys. Rev. Lett. 93, 083901 (2004).
[Crossref]

Ozcan, A.

L. S. Abdallah, S. Zollner, C. Lavoie, A. Ozcan, and M. Raymond, Thin Solid Films 571, 484 (2014).
[Crossref]

Pidgeon, C.

C. Pidgeon, Handbook on Semiconductors, M. Balkanski, ed. (North-Holland, 1980).

Ram-Mohan, L. R.

I. Vurgaftman, J. R. Meyer, and L. R. Ram-Mohan, J. Appl. Phys. 89, 5815 (2001).
[Crossref]

Raymond, M.

L. S. Abdallah, S. Zollner, C. Lavoie, A. Ozcan, and M. Raymond, Thin Solid Films 571, 484 (2014).
[Crossref]

Roberts, S.

S. Roberts, Phys. Rev. 114, 104 (1959).
[Crossref]

Schade, U.

T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, and M. Schubert, Rev. Sci. Instrum. 77, 63902 (2006).
[Crossref]

Schaff, W. J.

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann, Appl. Phys. Lett. 98, 092103 (2011).
[Crossref]

Schöche, S.

T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. B. Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
[Crossref]

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann, Appl. Phys. Lett. 98, 092103 (2011).
[Crossref]

Schubert, M.

P. Kühne, C. Herzinger, M. Schubert, J. Woollam, and T. Hofmann, Rev. Sci. Instrum. 85, 071301 (2014).
[Crossref]

P. Kühne, V. Darakchieva, R. Yakimova, J. D. Tedesco, R. L. Myers-Ward, C. R. Eddy, D. K. Gaskill, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann, Phys. Rev. Lett. 111, 077402 (2013).
[Crossref]

T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. B. Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
[Crossref]

T. Hofmann, C. M. Herzinger, J. L. Tedesco, D. K. Gaskill, J. A. Woollam, and M. Schubert, Thin Solid Films 519, 2593 (2011).
[Crossref]

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann, Appl. Phys. Lett. 98, 092103 (2011).
[Crossref]

T. Hofmann, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, D. K. Gaskill, J. L. Tedesco, and M. Schubert, Appl. Phys. Lett. 98, 041906 (2011).
[Crossref]

T. Hofmann, C. Herzinger, A. Boosalis, T. Tiwald, J. Woollam, and M. Schubert, Rev. Sci. Instrum. 81, 023101 (2010).
[Crossref]

T. Hofmann, C. Herzinger, and M. Schubert, Phys. Status Solidi A 205, 779 (2008).
[Crossref]

T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, and M. Schubert, Rev. Sci. Instrum. 77, 63902 (2006).
[Crossref]

M. Schubert, T. Hofmann, and C. M. Herzinger, J. Opt. Soc. Am. A 20, 347 (2003).
[Crossref]

M. Schubert, Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons and Polaritons, Vol. 209 of Springer Tracts in Modern Physics (Springer, 2004).

Sedrine, N. B.

T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. B. Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
[Crossref]

Shi, J.

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann, Appl. Phys. Lett. 98, 092103 (2011).
[Crossref]

Shimano, R.

Y. Ino, R. Shimano, Y. Svirko, and M. Kuwata-Gonokami, Phys. Rev. B 70, 155101 (2004).
[Crossref]

Svirko, Y.

Y. Ino, R. Shimano, Y. Svirko, and M. Kuwata-Gonokami, Phys. Rev. B 70, 155101 (2004).
[Crossref]

Tedesco, J. D.

P. Kühne, V. Darakchieva, R. Yakimova, J. D. Tedesco, R. L. Myers-Ward, C. R. Eddy, D. K. Gaskill, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann, Phys. Rev. Lett. 111, 077402 (2013).
[Crossref]

Tedesco, J. L.

T. Hofmann, C. M. Herzinger, J. L. Tedesco, D. K. Gaskill, J. A. Woollam, and M. Schubert, Thin Solid Films 519, 2593 (2011).
[Crossref]

T. Hofmann, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, D. K. Gaskill, J. L. Tedesco, and M. Schubert, Appl. Phys. Lett. 98, 041906 (2011).
[Crossref]

Tiwald, T.

T. Hofmann, C. Herzinger, A. Boosalis, T. Tiwald, J. Woollam, and M. Schubert, Rev. Sci. Instrum. 81, 023101 (2010).
[Crossref]

Vurgaftman, I.

I. Vurgaftman, J. R. Meyer, and L. R. Ram-Mohan, J. Appl. Phys. 89, 5815 (2001).
[Crossref]

Wang, P.

P. Wang, W. Li, Q. Liu, and X. Jiang, Phys. Rev. A 90, 015801 (2014).
[Crossref]

Woollam, J.

P. Kühne, C. Herzinger, M. Schubert, J. Woollam, and T. Hofmann, Rev. Sci. Instrum. 85, 071301 (2014).
[Crossref]

T. Hofmann, C. Herzinger, A. Boosalis, T. Tiwald, J. Woollam, and M. Schubert, Rev. Sci. Instrum. 81, 023101 (2010).
[Crossref]

Woollam, J. A.

P. Kühne, V. Darakchieva, R. Yakimova, J. D. Tedesco, R. L. Myers-Ward, C. R. Eddy, D. K. Gaskill, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann, Phys. Rev. Lett. 111, 077402 (2013).
[Crossref]

T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. B. Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
[Crossref]

T. Hofmann, C. M. Herzinger, J. L. Tedesco, D. K. Gaskill, J. A. Woollam, and M. Schubert, Thin Solid Films 519, 2593 (2011).
[Crossref]

T. Hofmann, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, D. K. Gaskill, J. L. Tedesco, and M. Schubert, Appl. Phys. Lett. 98, 041906 (2011).
[Crossref]

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann, Appl. Phys. Lett. 98, 092103 (2011).
[Crossref]

Xie, M.-Y.

V. Darakchieva, M. Beckers, M.-Y. Xie, L. Hultman, B. Monemar, J.-F. Carlin, E. Feltin, M. Gonschorek, and N. Grandjean, J. Appl. Phys. 103, 103513 (2008).
[Crossref]

Yakimova, R.

P. Kühne, V. Darakchieva, R. Yakimova, J. D. Tedesco, R. L. Myers-Ward, C. R. Eddy, D. K. Gaskill, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann, Phys. Rev. Lett. 111, 077402 (2013).
[Crossref]

Yu, P.

P. Yu and M. Cardona, Fundamentals of Semiconductors (Springer, 1999).

Zollner, S.

L. S. Abdallah, S. Zollner, C. Lavoie, A. Ozcan, and M. Raymond, Thin Solid Films 571, 484 (2014).
[Crossref]

Appl. Phys. Lett. (3)

T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. B. Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
[Crossref]

T. Hofmann, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, D. K. Gaskill, J. L. Tedesco, and M. Schubert, Appl. Phys. Lett. 98, 041906 (2011).
[Crossref]

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann, Appl. Phys. Lett. 98, 092103 (2011).
[Crossref]

J. Appl. Phys. (2)

V. Darakchieva, M. Beckers, M.-Y. Xie, L. Hultman, B. Monemar, J.-F. Carlin, E. Feltin, M. Gonschorek, and N. Grandjean, J. Appl. Phys. 103, 103513 (2008).
[Crossref]

I. Vurgaftman, J. R. Meyer, and L. R. Ram-Mohan, J. Appl. Phys. 89, 5815 (2001).
[Crossref]

J. Opt. Soc. Am. A (1)

Phys. Rev. (1)

S. Roberts, Phys. Rev. 114, 104 (1959).
[Crossref]

Phys. Rev. A (1)

P. Wang, W. Li, Q. Liu, and X. Jiang, Phys. Rev. A 90, 015801 (2014).
[Crossref]

Phys. Rev. B (1)

Y. Ino, R. Shimano, Y. Svirko, and M. Kuwata-Gonokami, Phys. Rev. B 70, 155101 (2004).
[Crossref]

Phys. Rev. Lett. (2)

M. Onoda, S. Murakami, and N. Nagaosa, Phys. Rev. Lett. 93, 083901 (2004).
[Crossref]

P. Kühne, V. Darakchieva, R. Yakimova, J. D. Tedesco, R. L. Myers-Ward, C. R. Eddy, D. K. Gaskill, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann, Phys. Rev. Lett. 111, 077402 (2013).
[Crossref]

Phys. Status Solidi A (1)

T. Hofmann, C. Herzinger, and M. Schubert, Phys. Status Solidi A 205, 779 (2008).
[Crossref]

Rev. Sci. Instrum. (3)

T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, and M. Schubert, Rev. Sci. Instrum. 77, 63902 (2006).
[Crossref]

P. Kühne, C. Herzinger, M. Schubert, J. Woollam, and T. Hofmann, Rev. Sci. Instrum. 85, 071301 (2014).
[Crossref]

T. Hofmann, C. Herzinger, A. Boosalis, T. Tiwald, J. Woollam, and M. Schubert, Rev. Sci. Instrum. 81, 023101 (2010).
[Crossref]

Thin Solid Films (2)

L. S. Abdallah, S. Zollner, C. Lavoie, A. Ozcan, and M. Raymond, Thin Solid Films 571, 484 (2014).
[Crossref]

T. Hofmann, C. M. Herzinger, J. L. Tedesco, D. K. Gaskill, J. A. Woollam, and M. Schubert, Thin Solid Films 519, 2593 (2011).
[Crossref]

Other (4)

M. Schubert, Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons and Polaritons, Vol. 209 of Springer Tracts in Modern Physics (Springer, 2004).

H. Fujiwara, Spectroscopic Ellipsometry (Wiley, 2007).

C. Pidgeon, Handbook on Semiconductors, M. Balkanski, ed. (North-Holland, 1980).

P. Yu and M. Cardona, Fundamentals of Semiconductors (Springer, 1999).

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Figures (3)

Fig. 1.
Fig. 1.

Schematic drawing of the beam path through the sample and the external optical cavity, shown for example for an AlInN/GaN/sapphire HEMT structure with 2DEG. The sapphire substrate and metallic cavity surface are parallel and separated by the distance d gap . Here, the magnetic field B is perpendicular to the sample surface with the positive magnetic field direction oriented into the sample.

Fig. 2.
Fig. 2.

Model-calculated contour plots of typical THz-OHE data, here for example Δ M 13 , 31 = M 13 , 31 ( + B ) M 13 , 31 ( B ) and Δ M 23 , 32 = M 23 , 32 ( + B ) M 23 , 32 ( B ) for the AlInN/GaN HEMT sample at Φ a = 45 ° and | B | = 0.55 T are shown as a function of frequency and d gap . The vertical solid and dashed black lines indicate the sample’s s -polarized reflection maxima and minima, respectively. The s -polarized reflectivity maxima and minima of the external cavity and that depend on d gap are shown as horizontal solid and dashed black lines, respectively. Note that the p -polarized modes occur indistinguishably close to the s -polarized modes and are omitted for clarity.

Fig. 3.
Fig. 3.

Panels (a) and (b) show the corresponding experimental (green lines) and best-model calculated (red solid lines) data Δ M 13 , 31 and Δ M 23 , 32 at three different d gap values. The Δ M 13 ( Δ M 23 ) and Δ M 31 ( Δ M 32 ) spectra are shown as open and closed data points, respectively. The panels (a) and (b) also include best-model calculated data for d gap as blue solid lines for comparison.

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