Abstract

We report on the first experimental demonstration of the thermal control of coupling strength between a rolled-up microtube and a waveguide on a silicon electronic-photonic integrated circuit. The microtubes are fabricated by selectively releasing a coherently strained GaAs/InGaAs heterostructure bilayer. The fabricated microtubes are then integrated with silicon waveguides using an abruptly tapered fiber probe. By tuning the gap between the microtube and the waveguide using localized heaters, the microtube–waveguide evanescent coupling is effectively controlled. With heating, the extinction ratio of a microtube whispering-gallery mode changes over an 18 dB range, while the resonant wavelength remains approximately unchanged. Utilizing this dynamic thermal tuning effect, we realize coupling modulation of the microtube integrated with the silicon waveguide at 2 kHz with a heater voltage swing of 0–6 V.

© 2014 Optical Society of America

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  1. V. Y. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chehovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E 6, 828 (2000).
    [CrossRef]
  2. O. G. Schmidt and K. Eberl, Nature 410, 168 (2001).
    [CrossRef]
  3. O. G. Schmidt, Ch. Deneke, S. Kiravittaya, R. Songmuang, H. Heidemeyer, Y. Nakamura, R. Zapf-Gottwick, C. Müller, and N. Y. Jin-Phillipp, IEEE J. Sel. Top. Quantum Electron. 8, 1025 (2002).
    [CrossRef]
  4. T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
    [CrossRef]
  5. X. Li, J. Phys. D 41, 193001 (2008).
  6. Ch. Strelow, M. Sauer, S. Fehringer, T. Korn, C. Schüller, A. Stemmann, Ch. Heyn, D. Heitmann, and T. Kipp, Appl. Phys. Lett. 95, 221115 (2009).
    [CrossRef]
  7. I. S. Chun, K. Bassett, A. Challa, and X. Li, Appl. Phys. Lett. 96, 251106 (2010).
    [CrossRef]
  8. J. Heo, S. Bhowmick, and P. Bhattacharya, IEEE J. Quantum Electron. 48, 927 (2012).
    [CrossRef]
  9. M. H. T. Dastjerdi, M. Djavid, S. Arafin, X. Liu, P. Bianucci, Z. Mi, and P. J. Poole, Semicond. Sci. Technol. 28, 094007 (2013).
    [CrossRef]
  10. S. Bhowmick, T. Frost, and P. Bhattacharya, Opt. Lett. 38, 1685 (2013).
    [CrossRef]
  11. S. Bhowmick, J. Heo, and P. Bhattacharya, Appl. Phys. Lett. 101, 171111 (2012).
    [CrossRef]
  12. S. Böttner, S. Li, M. Jorgensen, and O. G. Schmidt, Appl. Phys. Lett. 102, 251119 (2013).
    [CrossRef]
  13. K. J. Vahala, Nature 424, 839 (2003).
    [CrossRef]
  14. Z. Tian, V. Veerasubramanian, P. Bianucci, Z. Mi, A. G. Kirk, and D. V. Plant, Opt. Lett. 36, 3506 (2011).
    [CrossRef]
  15. Q. Zhong, Z. Tian, M. H. T. Dastjerdi, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 25, 1691 (2013).
    [CrossRef]
  16. A. Madani, S. Böttner, M. R. Jorgensen, and O. G. Schmidt, Opt. Lett. 39, 189 (2014).
    [CrossRef]
  17. Z. Tian, V. Veerasubramanian, P. Bianucci, S. Mukherjee, Z. Mi, A. G. Kirk, and D. V. Plant, Opt. Express 19, 12164 (2011).
    [CrossRef]
  18. F. Li, Z. Mi, and S. Vicknesh, Opt. Lett. 34, 2915 (2009).
    [CrossRef]
  19. Q. Zhong, Z. Tian, M. H. T. Dastjerdi, Z. Mi, and D. V. Plant, Opt. Express 21, 18909 (2013).
    [CrossRef]
  20. Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
    [CrossRef]
  21. F. V. Laere, T. Claes, J. Schrauwen, S. Scheerlinck, W. Bogaerts, D. Taillaert, L. O’Faolain, D. V. Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 19, 1919 (2007).
    [CrossRef]
  22. A. Yariv, IEEE Photon. Technol. Lett. 14, 483 (2002).
    [CrossRef]
  23. B. Li, Q. Wang, Y. Xiao, X. Jiang, Y. Li, L. Xiao, and Q. Gong, Appl. Phys. Lett. 96, 251109 (2010).
    [CrossRef]
  24. W. D. Sacher and J. K. S. Poon, J. Lightwave Technol. 27, 3800 (2009).
    [CrossRef]
  25. W. D. Sacher, W. M. J. Green, S. Assefa, T. Barwics, H. Pan, S. M. Shank, Y. A. Vlasov, and J. K. S. Poon, Opt. Express 21, 9722 (2013).
    [CrossRef]

2014 (1)

2013 (6)

W. D. Sacher, W. M. J. Green, S. Assefa, T. Barwics, H. Pan, S. M. Shank, Y. A. Vlasov, and J. K. S. Poon, Opt. Express 21, 9722 (2013).
[CrossRef]

S. Bhowmick, T. Frost, and P. Bhattacharya, Opt. Lett. 38, 1685 (2013).
[CrossRef]

Q. Zhong, Z. Tian, M. H. T. Dastjerdi, Z. Mi, and D. V. Plant, Opt. Express 21, 18909 (2013).
[CrossRef]

M. H. T. Dastjerdi, M. Djavid, S. Arafin, X. Liu, P. Bianucci, Z. Mi, and P. J. Poole, Semicond. Sci. Technol. 28, 094007 (2013).
[CrossRef]

S. Böttner, S. Li, M. Jorgensen, and O. G. Schmidt, Appl. Phys. Lett. 102, 251119 (2013).
[CrossRef]

Q. Zhong, Z. Tian, M. H. T. Dastjerdi, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 25, 1691 (2013).
[CrossRef]

2012 (2)

S. Bhowmick, J. Heo, and P. Bhattacharya, Appl. Phys. Lett. 101, 171111 (2012).
[CrossRef]

J. Heo, S. Bhowmick, and P. Bhattacharya, IEEE J. Quantum Electron. 48, 927 (2012).
[CrossRef]

2011 (2)

2010 (3)

B. Li, Q. Wang, Y. Xiao, X. Jiang, Y. Li, L. Xiao, and Q. Gong, Appl. Phys. Lett. 96, 251109 (2010).
[CrossRef]

I. S. Chun, K. Bassett, A. Challa, and X. Li, Appl. Phys. Lett. 96, 251106 (2010).
[CrossRef]

Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
[CrossRef]

2009 (3)

Ch. Strelow, M. Sauer, S. Fehringer, T. Korn, C. Schüller, A. Stemmann, Ch. Heyn, D. Heitmann, and T. Kipp, Appl. Phys. Lett. 95, 221115 (2009).
[CrossRef]

F. Li, Z. Mi, and S. Vicknesh, Opt. Lett. 34, 2915 (2009).
[CrossRef]

W. D. Sacher and J. K. S. Poon, J. Lightwave Technol. 27, 3800 (2009).
[CrossRef]

2008 (1)

X. Li, J. Phys. D 41, 193001 (2008).

2007 (1)

F. V. Laere, T. Claes, J. Schrauwen, S. Scheerlinck, W. Bogaerts, D. Taillaert, L. O’Faolain, D. V. Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 19, 1919 (2007).
[CrossRef]

2006 (1)

T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef]

2003 (1)

K. J. Vahala, Nature 424, 839 (2003).
[CrossRef]

2002 (2)

A. Yariv, IEEE Photon. Technol. Lett. 14, 483 (2002).
[CrossRef]

O. G. Schmidt, Ch. Deneke, S. Kiravittaya, R. Songmuang, H. Heidemeyer, Y. Nakamura, R. Zapf-Gottwick, C. Müller, and N. Y. Jin-Phillipp, IEEE J. Sel. Top. Quantum Electron. 8, 1025 (2002).
[CrossRef]

2001 (1)

O. G. Schmidt and K. Eberl, Nature 410, 168 (2001).
[CrossRef]

2000 (1)

V. Y. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chehovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E 6, 828 (2000).
[CrossRef]

Arafin, S.

M. H. T. Dastjerdi, M. Djavid, S. Arafin, X. Liu, P. Bianucci, Z. Mi, and P. J. Poole, Semicond. Sci. Technol. 28, 094007 (2013).
[CrossRef]

Assefa, S.

Baets, R.

F. V. Laere, T. Claes, J. Schrauwen, S. Scheerlinck, W. Bogaerts, D. Taillaert, L. O’Faolain, D. V. Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 19, 1919 (2007).
[CrossRef]

Barwics, T.

Bassett, K.

I. S. Chun, K. Bassett, A. Challa, and X. Li, Appl. Phys. Lett. 96, 251106 (2010).
[CrossRef]

Bhattacharya, P.

S. Bhowmick, T. Frost, and P. Bhattacharya, Opt. Lett. 38, 1685 (2013).
[CrossRef]

J. Heo, S. Bhowmick, and P. Bhattacharya, IEEE J. Quantum Electron. 48, 927 (2012).
[CrossRef]

S. Bhowmick, J. Heo, and P. Bhattacharya, Appl. Phys. Lett. 101, 171111 (2012).
[CrossRef]

Bhowmick, S.

S. Bhowmick, T. Frost, and P. Bhattacharya, Opt. Lett. 38, 1685 (2013).
[CrossRef]

J. Heo, S. Bhowmick, and P. Bhattacharya, IEEE J. Quantum Electron. 48, 927 (2012).
[CrossRef]

S. Bhowmick, J. Heo, and P. Bhattacharya, Appl. Phys. Lett. 101, 171111 (2012).
[CrossRef]

Bianucci, P.

Bogaerts, W.

F. V. Laere, T. Claes, J. Schrauwen, S. Scheerlinck, W. Bogaerts, D. Taillaert, L. O’Faolain, D. V. Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 19, 1919 (2007).
[CrossRef]

Böttner, S.

A. Madani, S. Böttner, M. R. Jorgensen, and O. G. Schmidt, Opt. Lett. 39, 189 (2014).
[CrossRef]

S. Böttner, S. Li, M. Jorgensen, and O. G. Schmidt, Appl. Phys. Lett. 102, 251119 (2013).
[CrossRef]

Challa, A.

I. S. Chun, K. Bassett, A. Challa, and X. Li, Appl. Phys. Lett. 96, 251106 (2010).
[CrossRef]

Chehovskiy, A. V.

V. Y. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chehovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E 6, 828 (2000).
[CrossRef]

Chun, I. S.

I. S. Chun, K. Bassett, A. Challa, and X. Li, Appl. Phys. Lett. 96, 251106 (2010).
[CrossRef]

Claes, T.

F. V. Laere, T. Claes, J. Schrauwen, S. Scheerlinck, W. Bogaerts, D. Taillaert, L. O’Faolain, D. V. Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 19, 1919 (2007).
[CrossRef]

Dastjerdi, M. H. T.

Q. Zhong, Z. Tian, M. H. T. Dastjerdi, Z. Mi, and D. V. Plant, Opt. Express 21, 18909 (2013).
[CrossRef]

M. H. T. Dastjerdi, M. Djavid, S. Arafin, X. Liu, P. Bianucci, Z. Mi, and P. J. Poole, Semicond. Sci. Technol. 28, 094007 (2013).
[CrossRef]

Q. Zhong, Z. Tian, M. H. T. Dastjerdi, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 25, 1691 (2013).
[CrossRef]

Deneke, Ch.

O. G. Schmidt, Ch. Deneke, S. Kiravittaya, R. Songmuang, H. Heidemeyer, Y. Nakamura, R. Zapf-Gottwick, C. Müller, and N. Y. Jin-Phillipp, IEEE J. Sel. Top. Quantum Electron. 8, 1025 (2002).
[CrossRef]

Djavid, M.

M. H. T. Dastjerdi, M. Djavid, S. Arafin, X. Liu, P. Bianucci, Z. Mi, and P. J. Poole, Semicond. Sci. Technol. 28, 094007 (2013).
[CrossRef]

Eberl, K.

O. G. Schmidt and K. Eberl, Nature 410, 168 (2001).
[CrossRef]

Fehringer, S.

Ch. Strelow, M. Sauer, S. Fehringer, T. Korn, C. Schüller, A. Stemmann, Ch. Heyn, D. Heitmann, and T. Kipp, Appl. Phys. Lett. 95, 221115 (2009).
[CrossRef]

Frost, T.

Gavrilova, T. A.

V. Y. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chehovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E 6, 828 (2000).
[CrossRef]

Gong, Q.

B. Li, Q. Wang, Y. Xiao, X. Jiang, Y. Li, L. Xiao, and Q. Gong, Appl. Phys. Lett. 96, 251109 (2010).
[CrossRef]

Green, W. M. J.

Gutakovsky, A. K.

V. Y. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chehovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E 6, 828 (2000).
[CrossRef]

Heidemeyer, H.

O. G. Schmidt, Ch. Deneke, S. Kiravittaya, R. Songmuang, H. Heidemeyer, Y. Nakamura, R. Zapf-Gottwick, C. Müller, and N. Y. Jin-Phillipp, IEEE J. Sel. Top. Quantum Electron. 8, 1025 (2002).
[CrossRef]

Heitmann, D.

Ch. Strelow, M. Sauer, S. Fehringer, T. Korn, C. Schüller, A. Stemmann, Ch. Heyn, D. Heitmann, and T. Kipp, Appl. Phys. Lett. 95, 221115 (2009).
[CrossRef]

T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef]

Heo, J.

S. Bhowmick, J. Heo, and P. Bhattacharya, Appl. Phys. Lett. 101, 171111 (2012).
[CrossRef]

J. Heo, S. Bhowmick, and P. Bhattacharya, IEEE J. Quantum Electron. 48, 927 (2012).
[CrossRef]

Heyn, Ch.

Ch. Strelow, M. Sauer, S. Fehringer, T. Korn, C. Schüller, A. Stemmann, Ch. Heyn, D. Heitmann, and T. Kipp, Appl. Phys. Lett. 95, 221115 (2009).
[CrossRef]

T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef]

Jiang, X.

B. Li, Q. Wang, Y. Xiao, X. Jiang, Y. Li, L. Xiao, and Q. Gong, Appl. Phys. Lett. 96, 251109 (2010).
[CrossRef]

Jin-Phillipp, N. Y.

O. G. Schmidt, Ch. Deneke, S. Kiravittaya, R. Songmuang, H. Heidemeyer, Y. Nakamura, R. Zapf-Gottwick, C. Müller, and N. Y. Jin-Phillipp, IEEE J. Sel. Top. Quantum Electron. 8, 1025 (2002).
[CrossRef]

Jorgensen, M.

S. Böttner, S. Li, M. Jorgensen, and O. G. Schmidt, Appl. Phys. Lett. 102, 251119 (2013).
[CrossRef]

Jorgensen, M. R.

Kipp, T.

Ch. Strelow, M. Sauer, S. Fehringer, T. Korn, C. Schüller, A. Stemmann, Ch. Heyn, D. Heitmann, and T. Kipp, Appl. Phys. Lett. 95, 221115 (2009).
[CrossRef]

T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef]

Kiravittaya, S.

O. G. Schmidt, Ch. Deneke, S. Kiravittaya, R. Songmuang, H. Heidemeyer, Y. Nakamura, R. Zapf-Gottwick, C. Müller, and N. Y. Jin-Phillipp, IEEE J. Sel. Top. Quantum Electron. 8, 1025 (2002).
[CrossRef]

Kirk, A. G.

Korn, T.

Ch. Strelow, M. Sauer, S. Fehringer, T. Korn, C. Schüller, A. Stemmann, Ch. Heyn, D. Heitmann, and T. Kipp, Appl. Phys. Lett. 95, 221115 (2009).
[CrossRef]

Laere, F. V.

F. V. Laere, T. Claes, J. Schrauwen, S. Scheerlinck, W. Bogaerts, D. Taillaert, L. O’Faolain, D. V. Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 19, 1919 (2007).
[CrossRef]

Li, B.

B. Li, Q. Wang, Y. Xiao, X. Jiang, Y. Li, L. Xiao, and Q. Gong, Appl. Phys. Lett. 96, 251109 (2010).
[CrossRef]

Li, F.

Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
[CrossRef]

F. Li, Z. Mi, and S. Vicknesh, Opt. Lett. 34, 2915 (2009).
[CrossRef]

Li, S.

S. Böttner, S. Li, M. Jorgensen, and O. G. Schmidt, Appl. Phys. Lett. 102, 251119 (2013).
[CrossRef]

Li, X.

I. S. Chun, K. Bassett, A. Challa, and X. Li, Appl. Phys. Lett. 96, 251106 (2010).
[CrossRef]

X. Li, J. Phys. D 41, 193001 (2008).

Li, Y.

B. Li, Q. Wang, Y. Xiao, X. Jiang, Y. Li, L. Xiao, and Q. Gong, Appl. Phys. Lett. 96, 251109 (2010).
[CrossRef]

Liu, X.

M. H. T. Dastjerdi, M. Djavid, S. Arafin, X. Liu, P. Bianucci, Z. Mi, and P. J. Poole, Semicond. Sci. Technol. 28, 094007 (2013).
[CrossRef]

Madani, A.

Mi, Z.

M. H. T. Dastjerdi, M. Djavid, S. Arafin, X. Liu, P. Bianucci, Z. Mi, and P. J. Poole, Semicond. Sci. Technol. 28, 094007 (2013).
[CrossRef]

Q. Zhong, Z. Tian, M. H. T. Dastjerdi, Z. Mi, and D. V. Plant, Opt. Express 21, 18909 (2013).
[CrossRef]

Q. Zhong, Z. Tian, M. H. T. Dastjerdi, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 25, 1691 (2013).
[CrossRef]

Z. Tian, V. Veerasubramanian, P. Bianucci, Z. Mi, A. G. Kirk, and D. V. Plant, Opt. Lett. 36, 3506 (2011).
[CrossRef]

Z. Tian, V. Veerasubramanian, P. Bianucci, S. Mukherjee, Z. Mi, A. G. Kirk, and D. V. Plant, Opt. Express 19, 12164 (2011).
[CrossRef]

Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
[CrossRef]

F. Li, Z. Mi, and S. Vicknesh, Opt. Lett. 34, 2915 (2009).
[CrossRef]

Mukherjee, S.

Müller, C.

O. G. Schmidt, Ch. Deneke, S. Kiravittaya, R. Songmuang, H. Heidemeyer, Y. Nakamura, R. Zapf-Gottwick, C. Müller, and N. Y. Jin-Phillipp, IEEE J. Sel. Top. Quantum Electron. 8, 1025 (2002).
[CrossRef]

Nakamura, Y.

O. G. Schmidt, Ch. Deneke, S. Kiravittaya, R. Songmuang, H. Heidemeyer, Y. Nakamura, R. Zapf-Gottwick, C. Müller, and N. Y. Jin-Phillipp, IEEE J. Sel. Top. Quantum Electron. 8, 1025 (2002).
[CrossRef]

O’Faolain, L.

F. V. Laere, T. Claes, J. Schrauwen, S. Scheerlinck, W. Bogaerts, D. Taillaert, L. O’Faolain, D. V. Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 19, 1919 (2007).
[CrossRef]

Pan, H.

Plant, D. V.

Poole, P. J.

M. H. T. Dastjerdi, M. Djavid, S. Arafin, X. Liu, P. Bianucci, Z. Mi, and P. J. Poole, Semicond. Sci. Technol. 28, 094007 (2013).
[CrossRef]

Poon, J. K. S.

Preobrazhenskii, V. V.

V. Y. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chehovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E 6, 828 (2000).
[CrossRef]

Prinz, V. Y.

V. Y. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chehovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E 6, 828 (2000).
[CrossRef]

Putyato, M. A.

V. Y. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chehovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E 6, 828 (2000).
[CrossRef]

Sacher, W. D.

Sauer, M.

Ch. Strelow, M. Sauer, S. Fehringer, T. Korn, C. Schüller, A. Stemmann, Ch. Heyn, D. Heitmann, and T. Kipp, Appl. Phys. Lett. 95, 221115 (2009).
[CrossRef]

Scheerlinck, S.

F. V. Laere, T. Claes, J. Schrauwen, S. Scheerlinck, W. Bogaerts, D. Taillaert, L. O’Faolain, D. V. Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 19, 1919 (2007).
[CrossRef]

Schmidt, O. G.

A. Madani, S. Böttner, M. R. Jorgensen, and O. G. Schmidt, Opt. Lett. 39, 189 (2014).
[CrossRef]

S. Böttner, S. Li, M. Jorgensen, and O. G. Schmidt, Appl. Phys. Lett. 102, 251119 (2013).
[CrossRef]

O. G. Schmidt, Ch. Deneke, S. Kiravittaya, R. Songmuang, H. Heidemeyer, Y. Nakamura, R. Zapf-Gottwick, C. Müller, and N. Y. Jin-Phillipp, IEEE J. Sel. Top. Quantum Electron. 8, 1025 (2002).
[CrossRef]

O. G. Schmidt and K. Eberl, Nature 410, 168 (2001).
[CrossRef]

Schrauwen, J.

F. V. Laere, T. Claes, J. Schrauwen, S. Scheerlinck, W. Bogaerts, D. Taillaert, L. O’Faolain, D. V. Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 19, 1919 (2007).
[CrossRef]

Schüller, C.

Ch. Strelow, M. Sauer, S. Fehringer, T. Korn, C. Schüller, A. Stemmann, Ch. Heyn, D. Heitmann, and T. Kipp, Appl. Phys. Lett. 95, 221115 (2009).
[CrossRef]

Seleznev, V. A.

V. Y. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chehovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E 6, 828 (2000).
[CrossRef]

Shank, S. M.

Songmuang, R.

O. G. Schmidt, Ch. Deneke, S. Kiravittaya, R. Songmuang, H. Heidemeyer, Y. Nakamura, R. Zapf-Gottwick, C. Müller, and N. Y. Jin-Phillipp, IEEE J. Sel. Top. Quantum Electron. 8, 1025 (2002).
[CrossRef]

Stemmann, A.

Ch. Strelow, M. Sauer, S. Fehringer, T. Korn, C. Schüller, A. Stemmann, Ch. Heyn, D. Heitmann, and T. Kipp, Appl. Phys. Lett. 95, 221115 (2009).
[CrossRef]

Strelow, Ch.

Ch. Strelow, M. Sauer, S. Fehringer, T. Korn, C. Schüller, A. Stemmann, Ch. Heyn, D. Heitmann, and T. Kipp, Appl. Phys. Lett. 95, 221115 (2009).
[CrossRef]

T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef]

Taillaert, D.

F. V. Laere, T. Claes, J. Schrauwen, S. Scheerlinck, W. Bogaerts, D. Taillaert, L. O’Faolain, D. V. Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 19, 1919 (2007).
[CrossRef]

Thourhout, D. V.

F. V. Laere, T. Claes, J. Schrauwen, S. Scheerlinck, W. Bogaerts, D. Taillaert, L. O’Faolain, D. V. Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 19, 1919 (2007).
[CrossRef]

Tian, Z.

Vahala, K. J.

K. J. Vahala, Nature 424, 839 (2003).
[CrossRef]

Veerasubramanian, V.

Vicknesh, S.

Vlasov, Y. A.

Wang, Q.

B. Li, Q. Wang, Y. Xiao, X. Jiang, Y. Li, L. Xiao, and Q. Gong, Appl. Phys. Lett. 96, 251109 (2010).
[CrossRef]

Welsch, H.

T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef]

Xiao, L.

B. Li, Q. Wang, Y. Xiao, X. Jiang, Y. Li, L. Xiao, and Q. Gong, Appl. Phys. Lett. 96, 251109 (2010).
[CrossRef]

Xiao, Y.

B. Li, Q. Wang, Y. Xiao, X. Jiang, Y. Li, L. Xiao, and Q. Gong, Appl. Phys. Lett. 96, 251109 (2010).
[CrossRef]

Yariv, A.

A. Yariv, IEEE Photon. Technol. Lett. 14, 483 (2002).
[CrossRef]

Zapf-Gottwick, R.

O. G. Schmidt, Ch. Deneke, S. Kiravittaya, R. Songmuang, H. Heidemeyer, Y. Nakamura, R. Zapf-Gottwick, C. Müller, and N. Y. Jin-Phillipp, IEEE J. Sel. Top. Quantum Electron. 8, 1025 (2002).
[CrossRef]

Zhong, Q.

Q. Zhong, Z. Tian, M. H. T. Dastjerdi, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 25, 1691 (2013).
[CrossRef]

Q. Zhong, Z. Tian, M. H. T. Dastjerdi, Z. Mi, and D. V. Plant, Opt. Express 21, 18909 (2013).
[CrossRef]

Appl. Phys. Lett. (5)

Ch. Strelow, M. Sauer, S. Fehringer, T. Korn, C. Schüller, A. Stemmann, Ch. Heyn, D. Heitmann, and T. Kipp, Appl. Phys. Lett. 95, 221115 (2009).
[CrossRef]

I. S. Chun, K. Bassett, A. Challa, and X. Li, Appl. Phys. Lett. 96, 251106 (2010).
[CrossRef]

S. Bhowmick, J. Heo, and P. Bhattacharya, Appl. Phys. Lett. 101, 171111 (2012).
[CrossRef]

S. Böttner, S. Li, M. Jorgensen, and O. G. Schmidt, Appl. Phys. Lett. 102, 251119 (2013).
[CrossRef]

B. Li, Q. Wang, Y. Xiao, X. Jiang, Y. Li, L. Xiao, and Q. Gong, Appl. Phys. Lett. 96, 251109 (2010).
[CrossRef]

IEEE J. Quantum Electron. (1)

J. Heo, S. Bhowmick, and P. Bhattacharya, IEEE J. Quantum Electron. 48, 927 (2012).
[CrossRef]

IEEE J. Sel. Top. Quantum Electron. (1)

O. G. Schmidt, Ch. Deneke, S. Kiravittaya, R. Songmuang, H. Heidemeyer, Y. Nakamura, R. Zapf-Gottwick, C. Müller, and N. Y. Jin-Phillipp, IEEE J. Sel. Top. Quantum Electron. 8, 1025 (2002).
[CrossRef]

IEEE Photon. Technol. Lett. (4)

Q. Zhong, Z. Tian, M. H. T. Dastjerdi, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 25, 1691 (2013).
[CrossRef]

Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
[CrossRef]

F. V. Laere, T. Claes, J. Schrauwen, S. Scheerlinck, W. Bogaerts, D. Taillaert, L. O’Faolain, D. V. Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 19, 1919 (2007).
[CrossRef]

A. Yariv, IEEE Photon. Technol. Lett. 14, 483 (2002).
[CrossRef]

J. Lightwave Technol. (1)

J. Phys. D (1)

X. Li, J. Phys. D 41, 193001 (2008).

Nature (2)

K. J. Vahala, Nature 424, 839 (2003).
[CrossRef]

O. G. Schmidt and K. Eberl, Nature 410, 168 (2001).
[CrossRef]

Opt. Express (3)

Opt. Lett. (4)

Phys. Rev. Lett. (1)

T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef]

Physica E (1)

V. Y. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chehovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E 6, 828 (2000).
[CrossRef]

Semicond. Sci. Technol. (1)

M. H. T. Dastjerdi, M. Djavid, S. Arafin, X. Liu, P. Bianucci, Z. Mi, and P. J. Poole, Semicond. Sci. Technol. 28, 094007 (2013).
[CrossRef]

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Figures (5)

Fig. 1.
Fig. 1.

(a) Schematic illustration of the microtube fabrication process. (b) SEM image of a rolled-up microtube.

Fig. 2.
Fig. 2.

(a) Optical microscopy image of a microtube integrated with waveguide on a Si-EPIC. Heaters are designed at both sides of the waveguide to control the evanescent coupling. (b) Schematic illustration of the cross section of the microtube integrated with waveguide. The drawing is not to the exact scale.

Fig. 3.
Fig. 3.

Transmission spectra of the microtube integrated with a silicon waveguide at heater voltages of 0, 3, and 6 V. The measured results are normalized to the FGC spectrum without integrating the microtube.

Fig. 4.
Fig. 4.

Trend of the ER variations of three microtube WGMs under various heater voltages.

Fig. 5.
Fig. 5.

Normalized modulation responses of the microtube integrated with a silicon waveguide. Upper curve: 1 kHz modulation signal with a heater swing of 0–3 V; lower curve: 2 kHz modulation signal with a heater swing of 0–6 V. The input signal frequency remains the same (1 kHz) for both results.

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