Abstract

Dynamic process of femtosecond laser-induced damage formation in dielectric thin films is reconstructed from a series of time-resolved images. Ta2O5 single-layer coatings of four different thicknesses have been investigated in transmission mode by means of time-resolved off-axis digital holography. Different processes overlapped in time were found to occur; namely, the Kerr effect, free-electron generation, ultrafast lattice heating, and shockwave generation. The trends in contribution of these effects are qualitatively reproduced by numerical models based on electron-rate equations and Drude theory, which take into account transient changes in the films and interference effects of the pump and probe pulses.

© 2014 Optical Society of America

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2013 (1)

2012 (2)

A. Urniežius, N. Šiaulys, V. Kudriašov, V. Sirutkaitis, and A. Melninkaitis, Appl. Phys. A 108, 343 (2012).
[CrossRef]

N. Šiaulys, V. Kudriašov, T. Stanislauskas, T. Malinauskas, A. Urniežius, and A. Melninkaitis, Opt. Lett. 37, 4916 (2012).
[CrossRef]

2011 (2)

2010 (3)

L. Zhu, C. Zhou, T. Wu, W. Jia, Z. Fan, Y. Ma, and G. Niu, Appl. Opt. 49, 2510 (2010).
[CrossRef]

D. S. Ivanov, Z. Lin, B. Rethfeld, G. M. O’Connor, T. J. Glynn, and L. V. Zhigilei, J. Appl. Phys. 107, 013519 (2010).
[CrossRef]

L. Gallais, B. Mangote, M. Commandré, A. Melninkaitis, J. Mirauskas, M. Jeskevic, and V. Sirutkaitis, Appl. Phys. Lett. 97, 051112 (2010).
[CrossRef]

2009 (1)

2008 (2)

T. Balciunas, A. Melninkaitis, G. Tamosauskas, and V. Sirutkaitis, Opt. Lett. 33, 58 (2008).
[CrossRef]

D. Puerto, W. Gawelda, J. Siegel, J. Bonse, G. Bachelier, and J. Solis, Appl. Phys. A 92, 803 (2008).
[CrossRef]

2007 (1)

2006 (1)

T. Q. Jia, H. Y. Sun, X. X. Li, D. H. Feng, C. B. Li, S. Z. Xu, R. X. Li, Z. Z. Xu, and H. Kuroda, J. Appl. Phys. 100, 023103 (2006).
[CrossRef]

2005 (1)

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2001 (1)

F. Quéré, S. Guizard, and Ph. Martin, Europhys. Lett. 56, 138 (2001).
[CrossRef]

1999 (1)

1996 (1)

B. N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, and A. Tünnermann, Appl. Phys. A 63, 109 (1996).
[CrossRef]

1985 (1)

Bachelier, G.

D. Puerto, W. Gawelda, J. Siegel, J. Bonse, G. Bachelier, and J. Solis, Appl. Phys. A 92, 803 (2008).
[CrossRef]

Balciunas, T.

Billard, F.

F. Billard, “Métrologie de l'indice non-linéaire dans les verres en régime nanoseconde, picoseconde et sub-picoseconde,” Ph.D. thesis (Université Paul-Cézanne Aix-Marseille III, 2005).

Bonse, J.

D. Puerto, W. Gawelda, J. Siegel, J. Bonse, G. Bachelier, and J. Solis, Appl. Phys. A 92, 803 (2008).
[CrossRef]

Chichkov, B. N.

B. N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, and A. Tünnermann, Appl. Phys. A 63, 109 (1996).
[CrossRef]

Commandré, M.

A. Melninkaitis, T. Tolenis, L. Mažulė, J. Mirauskas, V. Sirutkaitis, B. Mangote, X. Fu, M. Zerrad, L. Gallais, M. Commandré, S. Kičas, and R. Drazdys, Appl. Opt. 50, C188 (2011).
[CrossRef]

L. Gallais, B. Mangote, M. Commandré, A. Melninkaitis, J. Mirauskas, M. Jeskevic, and V. Sirutkaitis, Appl. Phys. Lett. 97, 051112 (2010).
[CrossRef]

Cuche, E.

Demos, S. G.

Depeursinge, C.

Downer, M. C.

Drazdys, R.

Fan, Z.

Feng, D. H.

T. Q. Jia, H. Y. Sun, X. X. Li, D. H. Feng, C. B. Li, S. Z. Xu, R. X. Li, Z. Z. Xu, and H. Kuroda, J. Appl. Phys. 100, 023103 (2006).
[CrossRef]

Fork, R. L.

Fu, X.

Gallais, L.

A. Melninkaitis, T. Tolenis, L. Mažulė, J. Mirauskas, V. Sirutkaitis, B. Mangote, X. Fu, M. Zerrad, L. Gallais, M. Commandré, S. Kičas, and R. Drazdys, Appl. Opt. 50, C188 (2011).
[CrossRef]

L. Gallais, B. Mangote, M. Commandré, A. Melninkaitis, J. Mirauskas, M. Jeskevic, and V. Sirutkaitis, Appl. Phys. Lett. 97, 051112 (2010).
[CrossRef]

Gawelda, W.

D. Puerto, W. Gawelda, J. Siegel, J. Bonse, G. Bachelier, and J. Solis, Appl. Phys. A 92, 803 (2008).
[CrossRef]

Glynn, T. J.

D. S. Ivanov, Z. Lin, B. Rethfeld, G. M. O’Connor, T. J. Glynn, and L. V. Zhigilei, J. Appl. Phys. 107, 013519 (2010).
[CrossRef]

Guizard, S.

F. Quéré, S. Guizard, and Ph. Martin, Europhys. Lett. 56, 138 (2001).
[CrossRef]

Hayasaki, Y.

Hirao, K.

Isaka, M.

Ivanov, D. S.

D. S. Ivanov, Z. Lin, B. Rethfeld, G. M. O’Connor, T. J. Glynn, and L. V. Zhigilei, J. Appl. Phys. 107, 013519 (2010).
[CrossRef]

Jeskevic, M.

L. Gallais, B. Mangote, M. Commandré, A. Melninkaitis, J. Mirauskas, M. Jeskevic, and V. Sirutkaitis, Appl. Phys. Lett. 97, 051112 (2010).
[CrossRef]

Jia, T. Q.

T. Q. Jia, H. Y. Sun, X. X. Li, D. H. Feng, C. B. Li, S. Z. Xu, R. X. Li, Z. Z. Xu, and H. Kuroda, J. Appl. Phys. 100, 023103 (2006).
[CrossRef]

Jia, W.

Juodkazis, S.

Kicas, S.

Kudriašov, V.

N. Šiaulys, V. Kudriašov, T. Stanislauskas, T. Malinauskas, A. Urniežius, and A. Melninkaitis, Opt. Lett. 37, 4916 (2012).
[CrossRef]

A. Urniežius, N. Šiaulys, V. Kudriašov, V. Sirutkaitis, and A. Melninkaitis, Appl. Phys. A 108, 343 (2012).
[CrossRef]

Kuroda, H.

T. Q. Jia, H. Y. Sun, X. X. Li, D. H. Feng, C. B. Li, S. Z. Xu, R. X. Li, Z. Z. Xu, and H. Kuroda, J. Appl. Phys. 100, 023103 (2006).
[CrossRef]

Li, C. B.

T. Q. Jia, H. Y. Sun, X. X. Li, D. H. Feng, C. B. Li, S. Z. Xu, R. X. Li, Z. Z. Xu, and H. Kuroda, J. Appl. Phys. 100, 023103 (2006).
[CrossRef]

Li, R. X.

T. Q. Jia, H. Y. Sun, X. X. Li, D. H. Feng, C. B. Li, S. Z. Xu, R. X. Li, Z. Z. Xu, and H. Kuroda, J. Appl. Phys. 100, 023103 (2006).
[CrossRef]

Li, X. X.

T. Q. Jia, H. Y. Sun, X. X. Li, D. H. Feng, C. B. Li, S. Z. Xu, R. X. Li, Z. Z. Xu, and H. Kuroda, J. Appl. Phys. 100, 023103 (2006).
[CrossRef]

Lin, Z.

D. S. Ivanov, Z. Lin, B. Rethfeld, G. M. O’Connor, T. J. Glynn, and L. V. Zhigilei, J. Appl. Phys. 107, 013519 (2010).
[CrossRef]

Ma, Y.

Malinauskas, T.

Mangote, B.

A. Melninkaitis, T. Tolenis, L. Mažulė, J. Mirauskas, V. Sirutkaitis, B. Mangote, X. Fu, M. Zerrad, L. Gallais, M. Commandré, S. Kičas, and R. Drazdys, Appl. Opt. 50, C188 (2011).
[CrossRef]

L. Gallais, B. Mangote, M. Commandré, A. Melninkaitis, J. Mirauskas, M. Jeskevic, and V. Sirutkaitis, Appl. Phys. Lett. 97, 051112 (2010).
[CrossRef]

Marquet, P.

Martin, Ph.

F. Quéré, S. Guizard, and Ph. Martin, Europhys. Lett. 56, 138 (2001).
[CrossRef]

Mažule, L.

Melninkaitis, A.

Mero, M.

M. Mero, A. J. Sabbah, J. Zeller, and W. Rudolph, Appl. Phys. A 81, 317 (2005).
[CrossRef]

Mirauskas, J.

A. Melninkaitis, T. Tolenis, L. Mažulė, J. Mirauskas, V. Sirutkaitis, B. Mangote, X. Fu, M. Zerrad, L. Gallais, M. Commandré, S. Kičas, and R. Drazdys, Appl. Opt. 50, C188 (2011).
[CrossRef]

L. Gallais, B. Mangote, M. Commandré, A. Melninkaitis, J. Mirauskas, M. Jeskevic, and V. Sirutkaitis, Appl. Phys. Lett. 97, 051112 (2010).
[CrossRef]

Miura, K.

Momma, C.

B. N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, and A. Tünnermann, Appl. Phys. A 63, 109 (1996).
[CrossRef]

Negres, R. A.

Niu, G.

Nolte, S.

B. N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, and A. Tünnermann, Appl. Phys. A 63, 109 (1996).
[CrossRef]

O’Connor, G. M.

D. S. Ivanov, Z. Lin, B. Rethfeld, G. M. O’Connor, T. J. Glynn, and L. V. Zhigilei, J. Appl. Phys. 107, 013519 (2010).
[CrossRef]

Puerto, D.

D. Puerto, W. Gawelda, J. Siegel, J. Bonse, G. Bachelier, and J. Solis, Appl. Phys. A 92, 803 (2008).
[CrossRef]

Quéré, F.

F. Quéré, S. Guizard, and Ph. Martin, Europhys. Lett. 56, 138 (2001).
[CrossRef]

Raman, R. N.

Rethfeld, B.

D. S. Ivanov, Z. Lin, B. Rethfeld, G. M. O’Connor, T. J. Glynn, and L. V. Zhigilei, J. Appl. Phys. 107, 013519 (2010).
[CrossRef]

Rudolph, W.

M. Mero, A. J. Sabbah, J. Zeller, and W. Rudolph, Appl. Phys. A 81, 317 (2005).
[CrossRef]

Sabbah, A. J.

M. Mero, A. J. Sabbah, J. Zeller, and W. Rudolph, Appl. Phys. A 81, 317 (2005).
[CrossRef]

Sakakura, M.

Shank, C. V.

Shimotsuma, Y.

Šiaulys, N.

N. Šiaulys, V. Kudriašov, T. Stanislauskas, T. Malinauskas, A. Urniežius, and A. Melninkaitis, Opt. Lett. 37, 4916 (2012).
[CrossRef]

A. Urniežius, N. Šiaulys, V. Kudriašov, V. Sirutkaitis, and A. Melninkaitis, Appl. Phys. A 108, 343 (2012).
[CrossRef]

Siegel, J.

D. Puerto, W. Gawelda, J. Siegel, J. Bonse, G. Bachelier, and J. Solis, Appl. Phys. A 92, 803 (2008).
[CrossRef]

Sirutkaitis, V.

Solis, J.

D. Puerto, W. Gawelda, J. Siegel, J. Bonse, G. Bachelier, and J. Solis, Appl. Phys. A 92, 803 (2008).
[CrossRef]

Stanislauskas, T.

Sun, H. Y.

T. Q. Jia, H. Y. Sun, X. X. Li, D. H. Feng, C. B. Li, S. Z. Xu, R. X. Li, Z. Z. Xu, and H. Kuroda, J. Appl. Phys. 100, 023103 (2006).
[CrossRef]

Takita, A.

Tamosauskas, G.

Terazima, M.

Tolenis, T.

Tünnermann, A.

B. N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, and A. Tünnermann, Appl. Phys. A 63, 109 (1996).
[CrossRef]

Urniežius, A.

A. Urniežius, N. Šiaulys, V. Kudriašov, V. Sirutkaitis, and A. Melninkaitis, Appl. Phys. A 108, 343 (2012).
[CrossRef]

N. Šiaulys, V. Kudriašov, T. Stanislauskas, T. Malinauskas, A. Urniežius, and A. Melninkaitis, Opt. Lett. 37, 4916 (2012).
[CrossRef]

Vanagas, A.

von Alvensleben, F.

B. N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, and A. Tünnermann, Appl. Phys. A 63, 109 (1996).
[CrossRef]

Wu, T.

Xu, S. Z.

T. Q. Jia, H. Y. Sun, X. X. Li, D. H. Feng, C. B. Li, S. Z. Xu, R. X. Li, Z. Z. Xu, and H. Kuroda, J. Appl. Phys. 100, 023103 (2006).
[CrossRef]

Xu, Z. Z.

T. Q. Jia, H. Y. Sun, X. X. Li, D. H. Feng, C. B. Li, S. Z. Xu, R. X. Li, Z. Z. Xu, and H. Kuroda, J. Appl. Phys. 100, 023103 (2006).
[CrossRef]

Zeller, J.

M. Mero, A. J. Sabbah, J. Zeller, and W. Rudolph, Appl. Phys. A 81, 317 (2005).
[CrossRef]

Zerrad, M.

Zhigilei, L. V.

D. S. Ivanov, Z. Lin, B. Rethfeld, G. M. O’Connor, T. J. Glynn, and L. V. Zhigilei, J. Appl. Phys. 107, 013519 (2010).
[CrossRef]

Zhou, C.

Zhu, L.

Appl. Opt. (3)

Appl. Phys. A (4)

A. Urniežius, N. Šiaulys, V. Kudriašov, V. Sirutkaitis, and A. Melninkaitis, Appl. Phys. A 108, 343 (2012).
[CrossRef]

M. Mero, A. J. Sabbah, J. Zeller, and W. Rudolph, Appl. Phys. A 81, 317 (2005).
[CrossRef]

B. N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, and A. Tünnermann, Appl. Phys. A 63, 109 (1996).
[CrossRef]

D. Puerto, W. Gawelda, J. Siegel, J. Bonse, G. Bachelier, and J. Solis, Appl. Phys. A 92, 803 (2008).
[CrossRef]

Appl. Phys. Lett. (1)

L. Gallais, B. Mangote, M. Commandré, A. Melninkaitis, J. Mirauskas, M. Jeskevic, and V. Sirutkaitis, Appl. Phys. Lett. 97, 051112 (2010).
[CrossRef]

Europhys. Lett. (1)

F. Quéré, S. Guizard, and Ph. Martin, Europhys. Lett. 56, 138 (2001).
[CrossRef]

J. Appl. Phys. (2)

T. Q. Jia, H. Y. Sun, X. X. Li, D. H. Feng, C. B. Li, S. Z. Xu, R. X. Li, Z. Z. Xu, and H. Kuroda, J. Appl. Phys. 100, 023103 (2006).
[CrossRef]

D. S. Ivanov, Z. Lin, B. Rethfeld, G. M. O’Connor, T. J. Glynn, and L. V. Zhigilei, J. Appl. Phys. 107, 013519 (2010).
[CrossRef]

J. Opt. Soc. Am. B (1)

Opt. Express (3)

Opt. Lett. (3)

Other (1)

F. Billard, “Métrologie de l'indice non-linéaire dans les verres en régime nanoseconde, picoseconde et sub-picoseconde,” Ph.D. thesis (Université Paul-Cézanne Aix-Marseille III, 2005).

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Figures (4)

Fig. 1.
Fig. 1.

Experimental setup for holographic registration of ultrafast processes in thin films: PBS, polarizing beam splitter; BS, beam splitter; P, polarizer; λ/2, half-wave plate; M, mirror; L, lenses; MO, microscope objective; S, Ta2O5 film sample; C1 and C2, digital CCD camera.

Fig. 2.
Fig. 2.

Time-resolved amplitude contrast images (top rows) and postmortal Nomarski interference contrast images (bottom row) of surface morphology for H sample.

Fig. 3.
Fig. 3.

Amplitude- (top row) and phase-contrast (bottom row) images of nonlinear excitation in tantala thin films corresponding to the four different samples.

Fig. 4.
Fig. 4.

(A), (C), (E), (G) Relative transmittance. (B), (D), (F), (H) Induced phase-shift evolution in time estimated at peak-intensity position of the coating. Rows correspond to deferent samples (H/2, H, 2H, and 4H). Red curve: overall phase shift. Dotted black curve: contribution of Kerr effect. Dashed gray curve: contribution from free electrons.

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