Abstract

The influence of nodular coating defects on the sub-picosecond laser damage resistance of multilayer coatings is investigated. The study is conducted on engineered nodules from monodisperse silica microspheres in HfO2/SiO2 high-reflective mirrors, at 400  fs/1030  nm. We demonstrate through an experimental study coupled with 3D finite-difference time-domain simulations that nodules in dielectric multilayer coatings are a main concern for the damage resistance of femtosecond optics. The nodules, and hence possibly other defects that produce E-field enhancement in coating materials, induce damage initiation at very low fluences (0.1  J/cm2 in the case under study) compared to the intrinsic damage threshold of the component (1.4  J/cm2 for the present mirror). After initiation, the damage sites grow catastrophically at a determined threshold, reducing significantly the damage resistance (0.6  J/cm2) but allowing a “safe” operating fluence to be defined.

© 2014 Optical Society of America

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  1. M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, Phys. Rev. B 71, 115109 (2005).
    [CrossRef]
  2. B. Mangote, L. Gallais, M. Commandré, M. Mende, L. Jensen, H. Ehlers, M. Jupé, D. Ristau, A. Melninkaitis, J. Mirauskas, V. Sirutkaitis, S. Kicas, T. Tolenis, and R. Drazdys, Opt. Lett. 37, 1478 (2012).
    [CrossRef]
  3. M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6403, 64031A (2007).
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  5. A. Hervy, L. Gallais, D. Mouricaud, and G. Chériaux, in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2013), p. FA.4.
  6. A. P. Joglekar, H. Liu, G. J. Spooner, E. Meyhofer, G. Mourou, and A. J. Hunt, Appl. Phys. B 77, 25 (2003).
    [CrossRef]
  7. N. Sanner, O. Utéza, B. Chimier, M. Sentis, P. Lassonde, F. Légaré, and J. C. Kieffer, Appl. Phys. Lett. 96, 071111 (2010).
    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
  16. M. Mero, B. Clapp, J. C. Jasapara, W. Rudolph, D. Ristau, K. Starke, J. Kruger, S. Martin, and W. Kautek, Opt. Eng. 44, 051107 (2005).
    [CrossRef]
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2013 (1)

X. Cheng, J. Zhang, T. Ding, Z. Wei, H. Li, and Z. Wang, Light Sci. Appl. 2, e80 (2013).
[CrossRef]

2012 (2)

2011 (1)

I. B. Angelova, A. Von Conta, S. A. Trushin, Z. Major, S. Karsch, F. Krausz, and V. Pervak, Proc. Soc. Photo-Opt. Instrum. Eng. 8190, 81900B (2011).

2010 (1)

N. Sanner, O. Utéza, B. Chimier, M. Sentis, P. Lassonde, F. Légaré, and J. C. Kieffer, Appl. Phys. Lett. 96, 071111 (2010).
[CrossRef]

2008 (1)

2007 (3)

M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6720, 6700U (2007).

J. Neauport, E. Lavastre, G. Razé, G. Dupuy, N. Bonod, M. Balas, G. de Villele, J. Flamand, S. Kaladgew, and F. Desserouer, Opt. Express 15, 12508 (2007).
[CrossRef]

M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6403, 64031A (2007).

2005 (2)

M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, Phys. Rev. B 71, 115109 (2005).
[CrossRef]

M. Mero, B. Clapp, J. C. Jasapara, W. Rudolph, D. Ristau, K. Starke, J. Kruger, S. Martin, and W. Kautek, Opt. Eng. 44, 051107 (2005).
[CrossRef]

2004 (1)

J. A. Britten, W. Molander, A. M. Komashkoa, and C. P. J. Barty, Proc. Soc. Photo-Opt. Instrum. Eng. 5273, 1 (2004).

2003 (1)

A. P. Joglekar, H. Liu, G. J. Spooner, E. Meyhofer, G. Mourou, and A. J. Hunt, Appl. Phys. B 77, 25 (2003).
[CrossRef]

2002 (1)

S. Papernov and A. W. Schmid, J. Appl. Phys. 92, 5720 (2002).
[CrossRef]

1981 (1)

Angelova, I. B.

I. B. Angelova, A. Von Conta, S. A. Trushin, Z. Major, S. Karsch, F. Krausz, and V. Pervak, Proc. Soc. Photo-Opt. Instrum. Eng. 8190, 81900B (2011).

Balas, M.

Barty, C. P. J.

J. A. Britten, W. Molander, A. M. Komashkoa, and C. P. J. Barty, Proc. Soc. Photo-Opt. Instrum. Eng. 5273, 1 (2004).

Bonod, N.

Britten, J. A.

J. A. Britten, W. Molander, A. M. Komashkoa, and C. P. J. Barty, Proc. Soc. Photo-Opt. Instrum. Eng. 5273, 1 (2004).

Cheng, X.

X. Cheng, J. Zhang, T. Ding, Z. Wei, H. Li, and Z. Wang, Light Sci. Appl. 2, e80 (2013).
[CrossRef]

Chériaux, G.

A. Hervy, L. Gallais, D. Mouricaud, and G. Chériaux, in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2013), p. FA.4.

Chimier, B.

N. Sanner, O. Utéza, B. Chimier, M. Sentis, P. Lassonde, F. Légaré, and J. C. Kieffer, Appl. Phys. Lett. 96, 071111 (2010).
[CrossRef]

Clapp, B.

M. Mero, B. Clapp, J. C. Jasapara, W. Rudolph, D. Ristau, K. Starke, J. Kruger, S. Martin, and W. Kautek, Opt. Eng. 44, 051107 (2005).
[CrossRef]

Commandré, M.

de Villele, G.

Desserouer, F.

Ding, T.

X. Cheng, J. Zhang, T. Ding, Z. Wei, H. Li, and Z. Wang, Light Sci. Appl. 2, e80 (2013).
[CrossRef]

Drazdys, R.

Dupuy, G.

Ehlers, H.

Flamand, J.

Gallais, L.

B. Mangote, L. Gallais, M. Commandré, M. Mende, L. Jensen, H. Ehlers, M. Jupé, D. Ristau, A. Melninkaitis, J. Mirauskas, V. Sirutkaitis, S. Kicas, T. Tolenis, and R. Drazdys, Opt. Lett. 37, 1478 (2012).
[CrossRef]

B. Mangote, L. Gallais, M. Zerrad, F. Lemarchand, L. H. Gao, M. Commandré, and M. Lequime, Rev. Sci. Instrum. 83, 013109 (2012).
[CrossRef]

A. Hervy, L. Gallais, D. Mouricaud, and G. Chériaux, in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2013), p. FA.4.

Gao, L. H.

B. Mangote, L. Gallais, M. Zerrad, F. Lemarchand, L. H. Gao, M. Commandré, and M. Lequime, Rev. Sci. Instrum. 83, 013109 (2012).
[CrossRef]

Guenther, H. H.

Hafeman, S.

Hervy, A.

A. Hervy, L. Gallais, D. Mouricaud, and G. Chériaux, in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2013), p. FA.4.

Hunt, A. J.

A. P. Joglekar, H. Liu, G. J. Spooner, E. Meyhofer, G. Mourou, and A. J. Hunt, Appl. Phys. B 77, 25 (2003).
[CrossRef]

Jasapara, J. C.

M. Mero, B. Clapp, J. C. Jasapara, W. Rudolph, D. Ristau, K. Starke, J. Kruger, S. Martin, and W. Kautek, Opt. Eng. 44, 051107 (2005).
[CrossRef]

Jensen, L.

B. Mangote, L. Gallais, M. Commandré, M. Mende, L. Jensen, H. Ehlers, M. Jupé, D. Ristau, A. Melninkaitis, J. Mirauskas, V. Sirutkaitis, S. Kicas, T. Tolenis, and R. Drazdys, Opt. Lett. 37, 1478 (2012).
[CrossRef]

M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6403, 64031A (2007).

M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6720, 6700U (2007).

Joglekar, A. P.

A. P. Joglekar, H. Liu, G. J. Spooner, E. Meyhofer, G. Mourou, and A. J. Hunt, Appl. Phys. B 77, 25 (2003).
[CrossRef]

Jupé, M.

B. Mangote, L. Gallais, M. Commandré, M. Mende, L. Jensen, H. Ehlers, M. Jupé, D. Ristau, A. Melninkaitis, J. Mirauskas, V. Sirutkaitis, S. Kicas, T. Tolenis, and R. Drazdys, Opt. Lett. 37, 1478 (2012).
[CrossRef]

M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6403, 64031A (2007).

M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6720, 6700U (2007).

Kaladgew, S.

Karsch, S.

I. B. Angelova, A. Von Conta, S. A. Trushin, Z. Major, S. Karsch, F. Krausz, and V. Pervak, Proc. Soc. Photo-Opt. Instrum. Eng. 8190, 81900B (2011).

Kautek, W.

M. Mero, B. Clapp, J. C. Jasapara, W. Rudolph, D. Ristau, K. Starke, J. Kruger, S. Martin, and W. Kautek, Opt. Eng. 44, 051107 (2005).
[CrossRef]

Kicas, S.

Kieffer, J. C.

N. Sanner, O. Utéza, B. Chimier, M. Sentis, P. Lassonde, F. Légaré, and J. C. Kieffer, Appl. Phys. Lett. 96, 071111 (2010).
[CrossRef]

Komashkoa, A. M.

J. A. Britten, W. Molander, A. M. Komashkoa, and C. P. J. Barty, Proc. Soc. Photo-Opt. Instrum. Eng. 5273, 1 (2004).

Kozlowski, M. R.

M. R. Kozlowski, in Thin Films for Optical Systems, F. R. Flory, ed. (Marcel Dekker, 1995), pp. 521–549.

Krausz, F.

I. B. Angelova, A. Von Conta, S. A. Trushin, Z. Major, S. Karsch, F. Krausz, and V. Pervak, Proc. Soc. Photo-Opt. Instrum. Eng. 8190, 81900B (2011).

Kruger, J.

M. Mero, B. Clapp, J. C. Jasapara, W. Rudolph, D. Ristau, K. Starke, J. Kruger, S. Martin, and W. Kautek, Opt. Eng. 44, 051107 (2005).
[CrossRef]

Lappschies, M.

M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6403, 64031A (2007).

M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6720, 6700U (2007).

Lassonde, P.

N. Sanner, O. Utéza, B. Chimier, M. Sentis, P. Lassonde, F. Légaré, and J. C. Kieffer, Appl. Phys. Lett. 96, 071111 (2010).
[CrossRef]

Lavastre, E.

Légaré, F.

N. Sanner, O. Utéza, B. Chimier, M. Sentis, P. Lassonde, F. Légaré, and J. C. Kieffer, Appl. Phys. Lett. 96, 071111 (2010).
[CrossRef]

Lemarchand, F.

B. Mangote, L. Gallais, M. Zerrad, F. Lemarchand, L. H. Gao, M. Commandré, and M. Lequime, Rev. Sci. Instrum. 83, 013109 (2012).
[CrossRef]

Lequime, M.

B. Mangote, L. Gallais, M. Zerrad, F. Lemarchand, L. H. Gao, M. Commandré, and M. Lequime, Rev. Sci. Instrum. 83, 013109 (2012).
[CrossRef]

Li, H.

X. Cheng, J. Zhang, T. Ding, Z. Wei, H. Li, and Z. Wang, Light Sci. Appl. 2, e80 (2013).
[CrossRef]

Liu, H.

A. P. Joglekar, H. Liu, G. J. Spooner, E. Meyhofer, G. Mourou, and A. J. Hunt, Appl. Phys. B 77, 25 (2003).
[CrossRef]

Liu, J.

M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, Phys. Rev. B 71, 115109 (2005).
[CrossRef]

Major, Z.

I. B. Angelova, A. Von Conta, S. A. Trushin, Z. Major, S. Karsch, F. Krausz, and V. Pervak, Proc. Soc. Photo-Opt. Instrum. Eng. 8190, 81900B (2011).

Mangote, B.

Martin, S.

M. Mero, B. Clapp, J. C. Jasapara, W. Rudolph, D. Ristau, K. Starke, J. Kruger, S. Martin, and W. Kautek, Opt. Eng. 44, 051107 (2005).
[CrossRef]

Melninkaitis, A.

Mende, M.

Mero, M.

M. Mero, B. Clapp, J. C. Jasapara, W. Rudolph, D. Ristau, K. Starke, J. Kruger, S. Martin, and W. Kautek, Opt. Eng. 44, 051107 (2005).
[CrossRef]

M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, Phys. Rev. B 71, 115109 (2005).
[CrossRef]

Meyhofer, E.

A. P. Joglekar, H. Liu, G. J. Spooner, E. Meyhofer, G. Mourou, and A. J. Hunt, Appl. Phys. B 77, 25 (2003).
[CrossRef]

Mirauskas, J.

Molander, W.

J. A. Britten, W. Molander, A. M. Komashkoa, and C. P. J. Barty, Proc. Soc. Photo-Opt. Instrum. Eng. 5273, 1 (2004).

Mouricaud, D.

A. Hervy, L. Gallais, D. Mouricaud, and G. Chériaux, in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2013), p. FA.4.

Mourou, G.

A. P. Joglekar, H. Liu, G. J. Spooner, E. Meyhofer, G. Mourou, and A. J. Hunt, Appl. Phys. B 77, 25 (2003).
[CrossRef]

Neauport, J.

Papernov, S.

S. Papernov and A. W. Schmid, J. Appl. Phys. 92, 5720 (2002).
[CrossRef]

Pervak, V.

I. B. Angelova, A. Von Conta, S. A. Trushin, Z. Major, S. Karsch, F. Krausz, and V. Pervak, Proc. Soc. Photo-Opt. Instrum. Eng. 8190, 81900B (2011).

Pistor, T. V.

Razé, G.

Ristau, D.

B. Mangote, L. Gallais, M. Commandré, M. Mende, L. Jensen, H. Ehlers, M. Jupé, D. Ristau, A. Melninkaitis, J. Mirauskas, V. Sirutkaitis, S. Kicas, T. Tolenis, and R. Drazdys, Opt. Lett. 37, 1478 (2012).
[CrossRef]

M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6403, 64031A (2007).

M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6720, 6700U (2007).

M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, Phys. Rev. B 71, 115109 (2005).
[CrossRef]

M. Mero, B. Clapp, J. C. Jasapara, W. Rudolph, D. Ristau, K. Starke, J. Kruger, S. Martin, and W. Kautek, Opt. Eng. 44, 051107 (2005).
[CrossRef]

Rudolph, W.

M. Mero, B. Clapp, J. C. Jasapara, W. Rudolph, D. Ristau, K. Starke, J. Kruger, S. Martin, and W. Kautek, Opt. Eng. 44, 051107 (2005).
[CrossRef]

M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, Phys. Rev. B 71, 115109 (2005).
[CrossRef]

Sanner, N.

N. Sanner, O. Utéza, B. Chimier, M. Sentis, P. Lassonde, F. Légaré, and J. C. Kieffer, Appl. Phys. Lett. 96, 071111 (2010).
[CrossRef]

Schmid, A. W.

S. Papernov and A. W. Schmid, J. Appl. Phys. 92, 5720 (2002).
[CrossRef]

Sentis, M.

N. Sanner, O. Utéza, B. Chimier, M. Sentis, P. Lassonde, F. Légaré, and J. C. Kieffer, Appl. Phys. Lett. 96, 071111 (2010).
[CrossRef]

Sirutkaitis, V.

Spooner, G. J.

A. P. Joglekar, H. Liu, G. J. Spooner, E. Meyhofer, G. Mourou, and A. J. Hunt, Appl. Phys. B 77, 25 (2003).
[CrossRef]

Starke, K.

M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6720, 6700U (2007).

M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6403, 64031A (2007).

M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, Phys. Rev. B 71, 115109 (2005).
[CrossRef]

M. Mero, B. Clapp, J. C. Jasapara, W. Rudolph, D. Ristau, K. Starke, J. Kruger, S. Martin, and W. Kautek, Opt. Eng. 44, 051107 (2005).
[CrossRef]

Stolz, C. J.

Tolenis, T.

Trushin, S. A.

I. B. Angelova, A. Von Conta, S. A. Trushin, Z. Major, S. Karsch, F. Krausz, and V. Pervak, Proc. Soc. Photo-Opt. Instrum. Eng. 8190, 81900B (2011).

Utéza, O.

N. Sanner, O. Utéza, B. Chimier, M. Sentis, P. Lassonde, F. Légaré, and J. C. Kieffer, Appl. Phys. Lett. 96, 071111 (2010).
[CrossRef]

Von Conta, A.

I. B. Angelova, A. Von Conta, S. A. Trushin, Z. Major, S. Karsch, F. Krausz, and V. Pervak, Proc. Soc. Photo-Opt. Instrum. Eng. 8190, 81900B (2011).

Wang, Z.

X. Cheng, J. Zhang, T. Ding, Z. Wei, H. Li, and Z. Wang, Light Sci. Appl. 2, e80 (2013).
[CrossRef]

Wei, Z.

X. Cheng, J. Zhang, T. Ding, Z. Wei, H. Li, and Z. Wang, Light Sci. Appl. 2, e80 (2013).
[CrossRef]

Zerrad, M.

B. Mangote, L. Gallais, M. Zerrad, F. Lemarchand, L. H. Gao, M. Commandré, and M. Lequime, Rev. Sci. Instrum. 83, 013109 (2012).
[CrossRef]

Zhang, J.

X. Cheng, J. Zhang, T. Ding, Z. Wei, H. Li, and Z. Wang, Light Sci. Appl. 2, e80 (2013).
[CrossRef]

Appl. Opt. (2)

Appl. Phys. B (1)

A. P. Joglekar, H. Liu, G. J. Spooner, E. Meyhofer, G. Mourou, and A. J. Hunt, Appl. Phys. B 77, 25 (2003).
[CrossRef]

Appl. Phys. Lett. (1)

N. Sanner, O. Utéza, B. Chimier, M. Sentis, P. Lassonde, F. Légaré, and J. C. Kieffer, Appl. Phys. Lett. 96, 071111 (2010).
[CrossRef]

J. Appl. Phys. (1)

S. Papernov and A. W. Schmid, J. Appl. Phys. 92, 5720 (2002).
[CrossRef]

Light Sci. Appl. (1)

X. Cheng, J. Zhang, T. Ding, Z. Wei, H. Li, and Z. Wang, Light Sci. Appl. 2, e80 (2013).
[CrossRef]

Opt. Eng. (1)

M. Mero, B. Clapp, J. C. Jasapara, W. Rudolph, D. Ristau, K. Starke, J. Kruger, S. Martin, and W. Kautek, Opt. Eng. 44, 051107 (2005).
[CrossRef]

Opt. Express (1)

Opt. Lett. (1)

Phys. Rev. B (1)

M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, Phys. Rev. B 71, 115109 (2005).
[CrossRef]

Proc. Soc. Photo-Opt. Instrum. Eng. (4)

J. A. Britten, W. Molander, A. M. Komashkoa, and C. P. J. Barty, Proc. Soc. Photo-Opt. Instrum. Eng. 5273, 1 (2004).

M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6720, 6700U (2007).

M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, Proc. Soc. Photo-Opt. Instrum. Eng. 6403, 64031A (2007).

I. B. Angelova, A. Von Conta, S. A. Trushin, Z. Major, S. Karsch, F. Krausz, and V. Pervak, Proc. Soc. Photo-Opt. Instrum. Eng. 8190, 81900B (2011).

Rev. Sci. Instrum. (1)

B. Mangote, L. Gallais, M. Zerrad, F. Lemarchand, L. H. Gao, M. Commandré, and M. Lequime, Rev. Sci. Instrum. 83, 013109 (2012).
[CrossRef]

Other (2)

A. Hervy, L. Gallais, D. Mouricaud, and G. Chériaux, in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2013), p. FA.4.

M. R. Kozlowski, in Thin Films for Optical Systems, F. R. Flory, ed. (Marcel Dekker, 1995), pp. 521–549.

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