Abstract

We demonstrate the measurement and tuning of second-to-fourth order dispersion of a silicon wire waveguide in a spectral region of low nonlinear losses. Using white light interferometry we extract the chromatic dispersion of our waveguide from 1950 to 2300 nm. Moreover we demonstrate tuning of the zero dispersion wavelength over more than 100 nm, pushing it to longer wavelength by partially underetching the waveguide.

© 2014 Optical Society of America

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