Abstract

Multiple-filter stopbands, with the potential to be nonuniformly spaced in frequency, are realized in a single integrated Bragg grating device on silicon. By utilizing a superposition of sidewall relief grating functions, N individual filter responses can be fabricated with a device length N× shorter than the equivalent serial set of gratings. Arbitrary combinations of eight-basis filter responses were demonstrated as selected by an eight-bit pseudorandom number generator, showing the flexibility of the complex Bragg grating device design.

© 2014 Optical Society of America

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  1. D. Melati, F. Morichetti, A. Canciamilla, D. Roncelli, F. M. Soares, A. Bakker, and A. Melloni, J. Lightwave Technol. 30, 3610 (2012).
    [CrossRef]
  2. P. Orlandi, C. Ferrari, M. John Strain, A. Canciamilla, F. Morichetti, M. Sorel, P. Bassi, and A. Melloni, Opt. Lett. 37, 3669 (2012).
    [CrossRef]
  3. W. Bogaerts, P. de Heyn, T. van Vaerenbergh, K. de Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. van Thourhout, and R. Baets, Laser Photon. Rev. 6, 472012.
  4. K. A. Rutkowska, D. Duchesne, M. J. Strain, R. Morandotti, M. Sorel, and J. Azaña, Opt. Express 19, 19514 (2011).
    [CrossRef]
  5. K. de Vos, I. Bartolozzi, E. Schacht, P. Bienstman, and R. Baets, Opt. Express 15, 7610 (2007).
    [CrossRef]
  6. A. Densmore, M. Vachon, D.-X. Xu, S. Janz, R. Ma, Y.-H. Li, G. Lopinski, A. Delâge, J. Lapointe, C. C. Luebbert, Q. Y. Liu, P. Cheben, and J. H. Schmid, Opt. Lett. 34, 3598 (2009).
    [CrossRef]
  7. L.-W. Luo, G. S. Wiederhecker, J. Cardenas, C. Poitras, and M. Lipson, Opt. Express 19, 6284 (2011).
    [CrossRef]
  8. F. Morichetti, A. Canciamilla, C. Ferrari, A. Samarelli, M. Sorel, and A. Melloni, Nat. Commun. 2, 296 (2011).
  9. M. Gnan, S. Thoms, D. S. Macintyre, R. M. D. L. Rue, and M. Sorel, Electron. Lett. 44, 115 (2008).
    [CrossRef]
  10. X. Wang, W. Shi, and S. Grist, IEEE Photon. Conf. 19, 25 (2011).
  11. A. R. Zain, N. P. Johnson, M. Sorel, and R. M. De La Rue, Opt. Express 16, 12084 (2008).
    [CrossRef]
  12. W. Shi, X. Wang, W. Zhang, H. Yun, C. Lin, L. Chrostowski, and N. A. F. Jaeger, Appl. Phys. Lett. 100, 121118 (2012).
    [CrossRef]
  13. J. Bland-Hawthorn, M. Englund, and G. Edvell, Opt. Express 12, 5902 (2004).
    [CrossRef]
  14. R. Measures, X. Lee, and A. Othonos, Electron. Lett. 30, 1972 (1994).
    [CrossRef]
  15. J. Miyazu, T. Segawa, S. Matsuo, T. Ishii, and H. Suzuki, IEICE Trans. Electron. E88-C, 1521 (2005).
    [CrossRef]
  16. X. Wang, W. Shi, R. Vafaei, N. A. F. Jaeger, and L. Chrostowski, IEEE Photon. Technol. Lett. 23, 290 (2011).
  17. M. J. Strain and M. Sorel, IEEE J. Quantum Electron 46, 774 (2010).
    [CrossRef]
  18. J. T. Hastings, M. H. Lim, J. G. Goodberlet, and I. H. Smith, J. Vac. Sci. Technol. B 20, 2753 (2002).
    [CrossRef]
  19. G. Roelkens, P. Dumon, W. Bogaerts, D. Van Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 17, 2613 (2005).
    [CrossRef]
  20. M. Yamada and K. Sakuda, Appl. Opt. 26, 3474 (1987).
    [CrossRef]

2012 (4)

D. Melati, F. Morichetti, A. Canciamilla, D. Roncelli, F. M. Soares, A. Bakker, and A. Melloni, J. Lightwave Technol. 30, 3610 (2012).
[CrossRef]

P. Orlandi, C. Ferrari, M. John Strain, A. Canciamilla, F. Morichetti, M. Sorel, P. Bassi, and A. Melloni, Opt. Lett. 37, 3669 (2012).
[CrossRef]

W. Bogaerts, P. de Heyn, T. van Vaerenbergh, K. de Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. van Thourhout, and R. Baets, Laser Photon. Rev. 6, 472012.

W. Shi, X. Wang, W. Zhang, H. Yun, C. Lin, L. Chrostowski, and N. A. F. Jaeger, Appl. Phys. Lett. 100, 121118 (2012).
[CrossRef]

2011 (5)

X. Wang, W. Shi, R. Vafaei, N. A. F. Jaeger, and L. Chrostowski, IEEE Photon. Technol. Lett. 23, 290 (2011).

K. A. Rutkowska, D. Duchesne, M. J. Strain, R. Morandotti, M. Sorel, and J. Azaña, Opt. Express 19, 19514 (2011).
[CrossRef]

L.-W. Luo, G. S. Wiederhecker, J. Cardenas, C. Poitras, and M. Lipson, Opt. Express 19, 6284 (2011).
[CrossRef]

F. Morichetti, A. Canciamilla, C. Ferrari, A. Samarelli, M. Sorel, and A. Melloni, Nat. Commun. 2, 296 (2011).

X. Wang, W. Shi, and S. Grist, IEEE Photon. Conf. 19, 25 (2011).

2010 (1)

M. J. Strain and M. Sorel, IEEE J. Quantum Electron 46, 774 (2010).
[CrossRef]

2009 (1)

2008 (2)

A. R. Zain, N. P. Johnson, M. Sorel, and R. M. De La Rue, Opt. Express 16, 12084 (2008).
[CrossRef]

M. Gnan, S. Thoms, D. S. Macintyre, R. M. D. L. Rue, and M. Sorel, Electron. Lett. 44, 115 (2008).
[CrossRef]

2007 (1)

2005 (2)

J. Miyazu, T. Segawa, S. Matsuo, T. Ishii, and H. Suzuki, IEICE Trans. Electron. E88-C, 1521 (2005).
[CrossRef]

G. Roelkens, P. Dumon, W. Bogaerts, D. Van Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 17, 2613 (2005).
[CrossRef]

2004 (1)

2002 (1)

J. T. Hastings, M. H. Lim, J. G. Goodberlet, and I. H. Smith, J. Vac. Sci. Technol. B 20, 2753 (2002).
[CrossRef]

1994 (1)

R. Measures, X. Lee, and A. Othonos, Electron. Lett. 30, 1972 (1994).
[CrossRef]

1987 (1)

Azaña, J.

Baets, R.

W. Bogaerts, P. de Heyn, T. van Vaerenbergh, K. de Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. van Thourhout, and R. Baets, Laser Photon. Rev. 6, 472012.

K. de Vos, I. Bartolozzi, E. Schacht, P. Bienstman, and R. Baets, Opt. Express 15, 7610 (2007).
[CrossRef]

G. Roelkens, P. Dumon, W. Bogaerts, D. Van Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 17, 2613 (2005).
[CrossRef]

Bakker, A.

Bartolozzi, I.

Bassi, P.

Bienstman, P.

W. Bogaerts, P. de Heyn, T. van Vaerenbergh, K. de Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. van Thourhout, and R. Baets, Laser Photon. Rev. 6, 472012.

K. de Vos, I. Bartolozzi, E. Schacht, P. Bienstman, and R. Baets, Opt. Express 15, 7610 (2007).
[CrossRef]

Bland-Hawthorn, J.

Bogaerts, W.

W. Bogaerts, P. de Heyn, T. van Vaerenbergh, K. de Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. van Thourhout, and R. Baets, Laser Photon. Rev. 6, 472012.

G. Roelkens, P. Dumon, W. Bogaerts, D. Van Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 17, 2613 (2005).
[CrossRef]

Canciamilla, A.

Cardenas, J.

Cheben, P.

Chrostowski, L.

W. Shi, X. Wang, W. Zhang, H. Yun, C. Lin, L. Chrostowski, and N. A. F. Jaeger, Appl. Phys. Lett. 100, 121118 (2012).
[CrossRef]

X. Wang, W. Shi, R. Vafaei, N. A. F. Jaeger, and L. Chrostowski, IEEE Photon. Technol. Lett. 23, 290 (2011).

Claes, T.

W. Bogaerts, P. de Heyn, T. van Vaerenbergh, K. de Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. van Thourhout, and R. Baets, Laser Photon. Rev. 6, 472012.

de Heyn, P.

W. Bogaerts, P. de Heyn, T. van Vaerenbergh, K. de Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. van Thourhout, and R. Baets, Laser Photon. Rev. 6, 472012.

De La Rue, R. M.

de Vos, K.

W. Bogaerts, P. de Heyn, T. van Vaerenbergh, K. de Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. van Thourhout, and R. Baets, Laser Photon. Rev. 6, 472012.

K. de Vos, I. Bartolozzi, E. Schacht, P. Bienstman, and R. Baets, Opt. Express 15, 7610 (2007).
[CrossRef]

Delâge, A.

Densmore, A.

Duchesne, D.

Dumon, P.

W. Bogaerts, P. de Heyn, T. van Vaerenbergh, K. de Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. van Thourhout, and R. Baets, Laser Photon. Rev. 6, 472012.

G. Roelkens, P. Dumon, W. Bogaerts, D. Van Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 17, 2613 (2005).
[CrossRef]

Edvell, G.

Englund, M.

Ferrari, C.

P. Orlandi, C. Ferrari, M. John Strain, A. Canciamilla, F. Morichetti, M. Sorel, P. Bassi, and A. Melloni, Opt. Lett. 37, 3669 (2012).
[CrossRef]

F. Morichetti, A. Canciamilla, C. Ferrari, A. Samarelli, M. Sorel, and A. Melloni, Nat. Commun. 2, 296 (2011).

Gnan, M.

M. Gnan, S. Thoms, D. S. Macintyre, R. M. D. L. Rue, and M. Sorel, Electron. Lett. 44, 115 (2008).
[CrossRef]

Goodberlet, J. G.

J. T. Hastings, M. H. Lim, J. G. Goodberlet, and I. H. Smith, J. Vac. Sci. Technol. B 20, 2753 (2002).
[CrossRef]

Grist, S.

X. Wang, W. Shi, and S. Grist, IEEE Photon. Conf. 19, 25 (2011).

Hastings, J. T.

J. T. Hastings, M. H. Lim, J. G. Goodberlet, and I. H. Smith, J. Vac. Sci. Technol. B 20, 2753 (2002).
[CrossRef]

Ishii, T.

J. Miyazu, T. Segawa, S. Matsuo, T. Ishii, and H. Suzuki, IEICE Trans. Electron. E88-C, 1521 (2005).
[CrossRef]

Jaeger, N. A. F.

W. Shi, X. Wang, W. Zhang, H. Yun, C. Lin, L. Chrostowski, and N. A. F. Jaeger, Appl. Phys. Lett. 100, 121118 (2012).
[CrossRef]

X. Wang, W. Shi, R. Vafaei, N. A. F. Jaeger, and L. Chrostowski, IEEE Photon. Technol. Lett. 23, 290 (2011).

Janz, S.

John Strain, M.

Johnson, N. P.

Kumar Selvaraja, S.

W. Bogaerts, P. de Heyn, T. van Vaerenbergh, K. de Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. van Thourhout, and R. Baets, Laser Photon. Rev. 6, 472012.

Lapointe, J.

Lee, X.

R. Measures, X. Lee, and A. Othonos, Electron. Lett. 30, 1972 (1994).
[CrossRef]

Li, Y.-H.

Lim, M. H.

J. T. Hastings, M. H. Lim, J. G. Goodberlet, and I. H. Smith, J. Vac. Sci. Technol. B 20, 2753 (2002).
[CrossRef]

Lin, C.

W. Shi, X. Wang, W. Zhang, H. Yun, C. Lin, L. Chrostowski, and N. A. F. Jaeger, Appl. Phys. Lett. 100, 121118 (2012).
[CrossRef]

Lipson, M.

Liu, Q. Y.

Lopinski, G.

Luebbert, C. C.

Luo, L.-W.

Ma, R.

Macintyre, D. S.

M. Gnan, S. Thoms, D. S. Macintyre, R. M. D. L. Rue, and M. Sorel, Electron. Lett. 44, 115 (2008).
[CrossRef]

Matsuo, S.

J. Miyazu, T. Segawa, S. Matsuo, T. Ishii, and H. Suzuki, IEICE Trans. Electron. E88-C, 1521 (2005).
[CrossRef]

Measures, R.

R. Measures, X. Lee, and A. Othonos, Electron. Lett. 30, 1972 (1994).
[CrossRef]

Melati, D.

Melloni, A.

Miyazu, J.

J. Miyazu, T. Segawa, S. Matsuo, T. Ishii, and H. Suzuki, IEICE Trans. Electron. E88-C, 1521 (2005).
[CrossRef]

Morandotti, R.

Morichetti, F.

Orlandi, P.

Othonos, A.

R. Measures, X. Lee, and A. Othonos, Electron. Lett. 30, 1972 (1994).
[CrossRef]

Poitras, C.

Roelkens, G.

G. Roelkens, P. Dumon, W. Bogaerts, D. Van Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 17, 2613 (2005).
[CrossRef]

Roncelli, D.

Rue, R. M. D. L.

M. Gnan, S. Thoms, D. S. Macintyre, R. M. D. L. Rue, and M. Sorel, Electron. Lett. 44, 115 (2008).
[CrossRef]

Rutkowska, K. A.

Sakuda, K.

Samarelli, A.

F. Morichetti, A. Canciamilla, C. Ferrari, A. Samarelli, M. Sorel, and A. Melloni, Nat. Commun. 2, 296 (2011).

Schacht, E.

Schmid, J. H.

Segawa, T.

J. Miyazu, T. Segawa, S. Matsuo, T. Ishii, and H. Suzuki, IEICE Trans. Electron. E88-C, 1521 (2005).
[CrossRef]

Shi, W.

W. Shi, X. Wang, W. Zhang, H. Yun, C. Lin, L. Chrostowski, and N. A. F. Jaeger, Appl. Phys. Lett. 100, 121118 (2012).
[CrossRef]

X. Wang, W. Shi, R. Vafaei, N. A. F. Jaeger, and L. Chrostowski, IEEE Photon. Technol. Lett. 23, 290 (2011).

X. Wang, W. Shi, and S. Grist, IEEE Photon. Conf. 19, 25 (2011).

Smith, I. H.

J. T. Hastings, M. H. Lim, J. G. Goodberlet, and I. H. Smith, J. Vac. Sci. Technol. B 20, 2753 (2002).
[CrossRef]

Soares, F. M.

Sorel, M.

P. Orlandi, C. Ferrari, M. John Strain, A. Canciamilla, F. Morichetti, M. Sorel, P. Bassi, and A. Melloni, Opt. Lett. 37, 3669 (2012).
[CrossRef]

K. A. Rutkowska, D. Duchesne, M. J. Strain, R. Morandotti, M. Sorel, and J. Azaña, Opt. Express 19, 19514 (2011).
[CrossRef]

F. Morichetti, A. Canciamilla, C. Ferrari, A. Samarelli, M. Sorel, and A. Melloni, Nat. Commun. 2, 296 (2011).

M. J. Strain and M. Sorel, IEEE J. Quantum Electron 46, 774 (2010).
[CrossRef]

A. R. Zain, N. P. Johnson, M. Sorel, and R. M. De La Rue, Opt. Express 16, 12084 (2008).
[CrossRef]

M. Gnan, S. Thoms, D. S. Macintyre, R. M. D. L. Rue, and M. Sorel, Electron. Lett. 44, 115 (2008).
[CrossRef]

Strain, M. J.

Suzuki, H.

J. Miyazu, T. Segawa, S. Matsuo, T. Ishii, and H. Suzuki, IEICE Trans. Electron. E88-C, 1521 (2005).
[CrossRef]

Thoms, S.

M. Gnan, S. Thoms, D. S. Macintyre, R. M. D. L. Rue, and M. Sorel, Electron. Lett. 44, 115 (2008).
[CrossRef]

Vachon, M.

Vafaei, R.

X. Wang, W. Shi, R. Vafaei, N. A. F. Jaeger, and L. Chrostowski, IEEE Photon. Technol. Lett. 23, 290 (2011).

van Thourhout, D.

W. Bogaerts, P. de Heyn, T. van Vaerenbergh, K. de Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. van Thourhout, and R. Baets, Laser Photon. Rev. 6, 472012.

G. Roelkens, P. Dumon, W. Bogaerts, D. Van Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 17, 2613 (2005).
[CrossRef]

van Vaerenbergh, T.

W. Bogaerts, P. de Heyn, T. van Vaerenbergh, K. de Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. van Thourhout, and R. Baets, Laser Photon. Rev. 6, 472012.

Wang, X.

W. Shi, X. Wang, W. Zhang, H. Yun, C. Lin, L. Chrostowski, and N. A. F. Jaeger, Appl. Phys. Lett. 100, 121118 (2012).
[CrossRef]

X. Wang, W. Shi, R. Vafaei, N. A. F. Jaeger, and L. Chrostowski, IEEE Photon. Technol. Lett. 23, 290 (2011).

X. Wang, W. Shi, and S. Grist, IEEE Photon. Conf. 19, 25 (2011).

Wiederhecker, G. S.

Xu, D.-X.

Yamada, M.

Yun, H.

W. Shi, X. Wang, W. Zhang, H. Yun, C. Lin, L. Chrostowski, and N. A. F. Jaeger, Appl. Phys. Lett. 100, 121118 (2012).
[CrossRef]

Zain, A. R.

Zhang, W.

W. Shi, X. Wang, W. Zhang, H. Yun, C. Lin, L. Chrostowski, and N. A. F. Jaeger, Appl. Phys. Lett. 100, 121118 (2012).
[CrossRef]

Appl. Opt. (1)

Appl. Phys. Lett. (1)

W. Shi, X. Wang, W. Zhang, H. Yun, C. Lin, L. Chrostowski, and N. A. F. Jaeger, Appl. Phys. Lett. 100, 121118 (2012).
[CrossRef]

Electron. Lett. (2)

R. Measures, X. Lee, and A. Othonos, Electron. Lett. 30, 1972 (1994).
[CrossRef]

M. Gnan, S. Thoms, D. S. Macintyre, R. M. D. L. Rue, and M. Sorel, Electron. Lett. 44, 115 (2008).
[CrossRef]

IEEE J. Quantum Electron (1)

M. J. Strain and M. Sorel, IEEE J. Quantum Electron 46, 774 (2010).
[CrossRef]

IEEE Photon. Conf. (1)

X. Wang, W. Shi, and S. Grist, IEEE Photon. Conf. 19, 25 (2011).

IEEE Photon. Technol. Lett. (2)

X. Wang, W. Shi, R. Vafaei, N. A. F. Jaeger, and L. Chrostowski, IEEE Photon. Technol. Lett. 23, 290 (2011).

G. Roelkens, P. Dumon, W. Bogaerts, D. Van Thourhout, and R. Baets, IEEE Photon. Technol. Lett. 17, 2613 (2005).
[CrossRef]

IEICE Trans. Electron. (1)

J. Miyazu, T. Segawa, S. Matsuo, T. Ishii, and H. Suzuki, IEICE Trans. Electron. E88-C, 1521 (2005).
[CrossRef]

J. Lightwave Technol. (1)

J. Vac. Sci. Technol. B (1)

J. T. Hastings, M. H. Lim, J. G. Goodberlet, and I. H. Smith, J. Vac. Sci. Technol. B 20, 2753 (2002).
[CrossRef]

Laser Photon. Rev. (1)

W. Bogaerts, P. de Heyn, T. van Vaerenbergh, K. de Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. van Thourhout, and R. Baets, Laser Photon. Rev. 6, 472012.

Nat. Commun. (1)

F. Morichetti, A. Canciamilla, C. Ferrari, A. Samarelli, M. Sorel, and A. Melloni, Nat. Commun. 2, 296 (2011).

Opt. Express (5)

Opt. Lett. (2)

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Figures (6)

Fig. 1.
Fig. 1.

Schematic of the sidewall perturbation grating.

Fig. 2.
Fig. 2.

Measured transmission spectra of eight individual gratings with varying period from 314 to 342 nm.

Fig. 3.
Fig. 3.

(a) Schematic of a dual period superposition grating. (b) Calculated grating sidewall function for dual grating periods of Λ1=314nm and Λ2=318nm (insets: SEM images of the grating with varying total perturbation amplitudes.).

Fig. 4.
Fig. 4.

Calculated grating sidewall perturbation for four superimposed grating period functions.

Fig. 5.
Fig. 5.

Measured and simulated grating transmission of one filter response in a superposition of 4.

Fig. 6.
Fig. 6.

Measured and simulated spectra for the superposition grating devices, binary numbers correspond to the designed combination of filters extracted from a pseudorandom number generator.

Equations (1)

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A(z)=a1sin(2πΛ1z)+a2sin(2πΛ2z)++aNsin(2πΛNz).

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