Abstract

The optical limiting effect was numerically simulated and experimentally observed for a 25-layer thin-film Fabry–Perot microresonator by 7 ns laser pulses at 532 nm. The sample, made by vacuum evaporation and consisting of alternating Nb2O5 and SiO2 layers, has an ultranarrow line of transparency at near 532 nm within a wide spectral band of reflection. By adjusting simulated results in accordance with experimental dependencies of transmittance, reflectance, and absorbance on incident light intensity, the coefficient of optical nonlinearity of Nb2O5 was estimated at (6+1i)·1012cm2/W.

© 2014 Optical Society of America

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2012 (2)

S. Husaini, H. Teng, and V. M. Menon, Appl. Phys. Lett. 101, 111103 (2012).
[CrossRef]

I. M. Belousova and A. A. Ryzhov, Opt. Spectrosc. 112, 902 (2012).
[CrossRef]

2009 (1)

2008 (1)

P. Hou, Y. Chen, J. Shi, M. Shen, X. Chen, and Q. Wang, Europhys. Lett. 81, 64003 (2008).
[CrossRef]

2002 (1)

1997 (2)

E. Lidorikis, K. Busch, Q. Li, C. Chan, and C. Soukoulis, Phys. Rev. B 56, 15090 (1997).
[CrossRef]

R. Wang, J. Dong, and D. Y. Xing, Phys. Rev. E 55, 6301 (1997).
[CrossRef]

1996 (3)

P. Tran, Opt. Lett. 21, 1138 (1996).
[CrossRef]

E. Lidorikis, Q. Li, and C. Soukoulis, Phys. Rev. B 54, 10249 (1996).
[CrossRef]

Q. Li, C. Chan, K. Ho, and C. Soukoulis, Phys. Rev. B 53, 15577 (1996).
[CrossRef]

1995 (1)

1992 (1)

J. He and M. Cada, Appl. Phys. Lett. 61, 2150 (1992).
[CrossRef]

1982 (1)

E. Abraham and S. D. Smith, Meas. Sci. Technol. 15, 33 (1982).

1979 (2)

H. M. Gibbs, S. L. McCall, T. N. C. Venkatesan, A. C. Gossard, A. Passner, and W. Wiegmann, Appl. Phys. Lett. 35, 451 (1979).
[CrossRef]

D. Miller, S. D. Smith, and A. Johnston, Appl. Phys. Lett. 35, 658 (1979).
[CrossRef]

1978 (1)

T. Bischofberger and Y. R. Shen, Appl. Phys. Lett. 32, 156 (1978).
[CrossRef]

1976 (1)

H. Gibbs, S. McCall, and T. Venkatesan, Phys. Rev. Lett. 36, 1135 (1976).
[CrossRef]

Abraham, E.

E. Abraham and S. D. Smith, Meas. Sci. Technol. 15, 33 (1982).

Belousova, I. M.

I. M. Belousova and A. A. Ryzhov, Opt. Spectrosc. 112, 902 (2012).
[CrossRef]

Bischofberger, T.

T. Bischofberger and Y. R. Shen, Appl. Phys. Lett. 32, 156 (1978).
[CrossRef]

Busch, K.

E. Lidorikis, K. Busch, Q. Li, C. Chan, and C. Soukoulis, Phys. Rev. B 56, 15090 (1997).
[CrossRef]

Cada, M.

J. He and M. Cada, Appl. Phys. Lett. 61, 2150 (1992).
[CrossRef]

Chan, C.

E. Lidorikis, K. Busch, Q. Li, C. Chan, and C. Soukoulis, Phys. Rev. B 56, 15090 (1997).
[CrossRef]

Q. Li, C. Chan, K. Ho, and C. Soukoulis, Phys. Rev. B 53, 15577 (1996).
[CrossRef]

Chen, X.

P. Hou, Y. Chen, J. Shi, M. Shen, X. Chen, and Q. Wang, Europhys. Lett. 81, 64003 (2008).
[CrossRef]

Chen, Y.

P. Hou, Y. Chen, J. Shi, M. Shen, X. Chen, and Q. Wang, Europhys. Lett. 81, 64003 (2008).
[CrossRef]

Dong, J.

R. Wang, J. Dong, and D. Y. Xing, Phys. Rev. E 55, 6301 (1997).
[CrossRef]

Gibbs, H.

H. Gibbs, S. McCall, and T. Venkatesan, Phys. Rev. Lett. 36, 1135 (1976).
[CrossRef]

Gibbs, H. M.

H. M. Gibbs, S. L. McCall, T. N. C. Venkatesan, A. C. Gossard, A. Passner, and W. Wiegmann, Appl. Phys. Lett. 35, 451 (1979).
[CrossRef]

Gossard, A. C.

H. M. Gibbs, S. L. McCall, T. N. C. Venkatesan, A. C. Gossard, A. Passner, and W. Wiegmann, Appl. Phys. Lett. 35, 451 (1979).
[CrossRef]

Hashimoto, T.

Haus, J. W.

He, J.

J. He and M. Cada, Appl. Phys. Lett. 61, 2150 (1992).
[CrossRef]

Ho, K.

Q. Li, C. Chan, K. Ho, and C. Soukoulis, Phys. Rev. B 53, 15577 (1996).
[CrossRef]

Hou, P.

P. Hou, Y. Chen, J. Shi, M. Shen, X. Chen, and Q. Wang, Europhys. Lett. 81, 64003 (2008).
[CrossRef]

Hsu, J.-C.

Husaini, S.

S. Husaini, H. Teng, and V. M. Menon, Appl. Phys. Lett. 101, 111103 (2012).
[CrossRef]

Johnston, A.

D. Miller, S. D. Smith, and A. Johnston, Appl. Phys. Lett. 35, 658 (1979).
[CrossRef]

Lee, C.-C.

Li, Q.

E. Lidorikis, K. Busch, Q. Li, C. Chan, and C. Soukoulis, Phys. Rev. B 56, 15090 (1997).
[CrossRef]

E. Lidorikis, Q. Li, and C. Soukoulis, Phys. Rev. B 54, 10249 (1996).
[CrossRef]

Q. Li, C. Chan, K. Ho, and C. Soukoulis, Phys. Rev. B 53, 15577 (1996).
[CrossRef]

Lidorikis, E.

E. Lidorikis, K. Busch, Q. Li, C. Chan, and C. Soukoulis, Phys. Rev. B 56, 15090 (1997).
[CrossRef]

E. Lidorikis, Q. Li, and C. Soukoulis, Phys. Rev. B 54, 10249 (1996).
[CrossRef]

Liu, X.

McCall, S.

H. Gibbs, S. McCall, and T. Venkatesan, Phys. Rev. Lett. 36, 1135 (1976).
[CrossRef]

McCall, S. L.

H. M. Gibbs, S. L. McCall, T. N. C. Venkatesan, A. C. Gossard, A. Passner, and W. Wiegmann, Appl. Phys. Lett. 35, 451 (1979).
[CrossRef]

Menon, V. M.

S. Husaini, H. Teng, and V. M. Menon, Appl. Phys. Lett. 101, 111103 (2012).
[CrossRef]

Miller, D.

D. Miller, S. D. Smith, and A. Johnston, Appl. Phys. Lett. 35, 658 (1979).
[CrossRef]

Passner, A.

H. M. Gibbs, S. L. McCall, T. N. C. Venkatesan, A. C. Gossard, A. Passner, and W. Wiegmann, Appl. Phys. Lett. 35, 451 (1979).
[CrossRef]

Ryzhov, A. A.

I. M. Belousova and A. A. Ryzhov, Opt. Spectrosc. 112, 902 (2012).
[CrossRef]

Shahriar, M. S.

Shen, M.

P. Hou, Y. Chen, J. Shi, M. Shen, X. Chen, and Q. Wang, Europhys. Lett. 81, 64003 (2008).
[CrossRef]

Shen, Y. R.

T. Bischofberger and Y. R. Shen, Appl. Phys. Lett. 32, 156 (1978).
[CrossRef]

Shi, J.

P. Hou, Y. Chen, J. Shi, M. Shen, X. Chen, and Q. Wang, Europhys. Lett. 81, 64003 (2008).
[CrossRef]

Smith, S. D.

E. Abraham and S. D. Smith, Meas. Sci. Technol. 15, 33 (1982).

D. Miller, S. D. Smith, and A. Johnston, Appl. Phys. Lett. 35, 658 (1979).
[CrossRef]

Soukoulis, C.

E. Lidorikis, K. Busch, Q. Li, C. Chan, and C. Soukoulis, Phys. Rev. B 56, 15090 (1997).
[CrossRef]

Q. Li, C. Chan, K. Ho, and C. Soukoulis, Phys. Rev. B 53, 15577 (1996).
[CrossRef]

E. Lidorikis, Q. Li, and C. Soukoulis, Phys. Rev. B 54, 10249 (1996).
[CrossRef]

Teng, H.

S. Husaini, H. Teng, and V. M. Menon, Appl. Phys. Lett. 101, 111103 (2012).
[CrossRef]

Tien, C.-L.

Tran, P.

Venkatesan, T.

H. Gibbs, S. McCall, and T. Venkatesan, Phys. Rev. Lett. 36, 1135 (1976).
[CrossRef]

Venkatesan, T. N. C.

H. M. Gibbs, S. L. McCall, T. N. C. Venkatesan, A. C. Gossard, A. Passner, and W. Wiegmann, Appl. Phys. Lett. 35, 451 (1979).
[CrossRef]

Wang, Q.

P. Hou, Y. Chen, J. Shi, M. Shen, X. Chen, and Q. Wang, Europhys. Lett. 81, 64003 (2008).
[CrossRef]

Wang, R.

R. Wang, J. Dong, and D. Y. Xing, Phys. Rev. E 55, 6301 (1997).
[CrossRef]

Wiegmann, W.

H. M. Gibbs, S. L. McCall, T. N. C. Venkatesan, A. C. Gossard, A. Passner, and W. Wiegmann, Appl. Phys. Lett. 35, 451 (1979).
[CrossRef]

Xing, D. Y.

R. Wang, J. Dong, and D. Y. Xing, Phys. Rev. E 55, 6301 (1997).
[CrossRef]

Yoko, T.

Appl. Opt. (2)

Appl. Phys. Lett. (5)

J. He and M. Cada, Appl. Phys. Lett. 61, 2150 (1992).
[CrossRef]

S. Husaini, H. Teng, and V. M. Menon, Appl. Phys. Lett. 101, 111103 (2012).
[CrossRef]

T. Bischofberger and Y. R. Shen, Appl. Phys. Lett. 32, 156 (1978).
[CrossRef]

H. M. Gibbs, S. L. McCall, T. N. C. Venkatesan, A. C. Gossard, A. Passner, and W. Wiegmann, Appl. Phys. Lett. 35, 451 (1979).
[CrossRef]

D. Miller, S. D. Smith, and A. Johnston, Appl. Phys. Lett. 35, 658 (1979).
[CrossRef]

Europhys. Lett. (1)

P. Hou, Y. Chen, J. Shi, M. Shen, X. Chen, and Q. Wang, Europhys. Lett. 81, 64003 (2008).
[CrossRef]

Meas. Sci. Technol. (1)

E. Abraham and S. D. Smith, Meas. Sci. Technol. 15, 33 (1982).

Opt. Express (1)

Opt. Lett. (1)

Opt. Spectrosc. (1)

I. M. Belousova and A. A. Ryzhov, Opt. Spectrosc. 112, 902 (2012).
[CrossRef]

Phys. Rev. B (3)

Q. Li, C. Chan, K. Ho, and C. Soukoulis, Phys. Rev. B 53, 15577 (1996).
[CrossRef]

E. Lidorikis, Q. Li, and C. Soukoulis, Phys. Rev. B 54, 10249 (1996).
[CrossRef]

E. Lidorikis, K. Busch, Q. Li, C. Chan, and C. Soukoulis, Phys. Rev. B 56, 15090 (1997).
[CrossRef]

Phys. Rev. E (1)

R. Wang, J. Dong, and D. Y. Xing, Phys. Rev. E 55, 6301 (1997).
[CrossRef]

Phys. Rev. Lett. (1)

H. Gibbs, S. McCall, and T. Venkatesan, Phys. Rev. Lett. 36, 1135 (1976).
[CrossRef]

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Figures (5)

Fig. 1.
Fig. 1.

Structure of the studied multilayer resonator.

Fig. 2.
Fig. 2.

Transmittance spectrum of the sample in the vicinity of the transparency line at low-level radiation.

Fig. 3.
Fig. 3.

Transmittance dependence on the angle of incidence at low-level radiation at 532 nm.

Fig. 4.
Fig. 4.

Experimental setup for synchronous measurements of T and R nonlinear dependencies. D1, D2, D3—pulse energy detectors; F1, F2—calibrated sets of filters.

Fig. 5.
Fig. 5.

Calculated and experimental nonlinear characteristics of transmittance (upper plot, black lines), absorbance (upper plot, gray lines), and reflectance (lower plot) at three different angles of incidence.

Equations (2)

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(HL)6H2(LH)6,
n=n0+n2I,

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