Abstract

Phosphor-in-glass (PiG) color converters for LED applications were fabricated with a mixture of phosphors, Y3Al5O12:Ce3+ (yellow) and CaAlSiN3:Eu2+ (red). The low sintering temperature (550°C) of SiO2–Na2O–RO (R=Ba, Zn) glass powder enabled the inclusion of CaAlSiN3:Eu2+ (red) phosphor which cannot be embedded with conventional glass powders for PiGs. By simply varying the mixing ratio of glass to phosphors as well as the ratio of yellow to red phosphors, the facile control of the CIE chromaticity coordinates and correlated color temperature of the LED following the Planckian locus has been achieved. Phosphors were well distributed within the glass matrix without noticeable reactions, preserving the enhanced thermal quenching property of the PiG compared to those with silicone resins, for LEDs.

© 2014 Optical Society of America

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2014

2013

2012

Y. K. Lee, J. S. Lee, J. Heo, W. B. Im, and W. J. Chung, Opt. Lett. 37, 3276 (2012).
[CrossRef]

C.-W. Yeh, W.-T. Chen, R.-S. Liu, S.-F. Hu, H.-S. Sheu, J.-M. Chen, and H. T. Hintzen, J. Am. Chem. Soc. 134, 14108 (2012).
[CrossRef]

H. S. Kim, T. Horikawa, H. Hanzawa, and K. Machida, J. Phys.: Conf. Ser. 379, 012016 (2012).
[CrossRef]

M.-H. Chang, D. Das, P. V. Varde, and M. Pecht, Microelectron. Reliab. 52, 762 (2012).

2011

S. Nishiura, S. Tanabe, K. Fujioka, and Y. Fujimoto, Opt. Mater. 33, 688 (2011).

2010

2009

T. Nakanishi and S. Tanabe, IEEE J. Sel. Top. Quantum Electron. 15, 1171 (2009).
[CrossRef]

V. Bachmann, C. Ronda, and A. Meijerink, Chem. Mater. 21, 2077 (2009).
[CrossRef]

2008

S. Fujita, A. Sakamoto, and S. Tanabe, IEEE J. Sel. Top. Quantum Electron. 14, 1387 (2008).
[CrossRef]

2005

N. Narendran and Y. Gu, J. Display Technol. 1, 167 (2005).
[CrossRef]

S. Fujita, S. Yoshihara, A. Sakamoto, S. Yamamoto, and S. Tanabe, Proc. SPIE 5941, 594111 (2005).
[CrossRef]

S. Tanabe, S. Fujita, S. Yoshihara, A. Sakamoto, and S. Yamamoto, Proc. SPIE 5941, 594112 (2005).
[CrossRef]

2004

N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, J. Cryst. Growth 268, 449 (2004).
[CrossRef]

1986

G. A. Luoma and R. D. Rowland, J. Appl. Polym. Sci. 32, 5777 (1986).
[CrossRef]

Arunkumar, P.

Bachmann, V.

V. Bachmann, C. Ronda, and A. Meijerink, Chem. Mater. 21, 2077 (2009).
[CrossRef]

Chang, M.-H.

M.-H. Chang, D. Das, P. V. Varde, and M. Pecht, Microelectron. Reliab. 52, 762 (2012).

Chen, J.-M.

C.-W. Yeh, W.-T. Chen, R.-S. Liu, S.-F. Hu, H.-S. Sheu, J.-M. Chen, and H. T. Hintzen, J. Am. Chem. Soc. 134, 14108 (2012).
[CrossRef]

Chen, W.-T.

C.-W. Yeh, W.-T. Chen, R.-S. Liu, S.-F. Hu, H.-S. Sheu, J.-M. Chen, and H. T. Hintzen, J. Am. Chem. Soc. 134, 14108 (2012).
[CrossRef]

Chung, W. J.

Das, D.

M.-H. Chang, D. Das, P. V. Varde, and M. Pecht, Microelectron. Reliab. 52, 762 (2012).

Deng, L.

N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, J. Cryst. Growth 268, 449 (2004).
[CrossRef]

Freyssinier, J. P.

N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, J. Cryst. Growth 268, 449 (2004).
[CrossRef]

Fujimoto, Y.

S. Nishiura, S. Tanabe, K. Fujioka, and Y. Fujimoto, Opt. Mater. 33, 688 (2011).

Fujioka, K.

S. Nishiura, S. Tanabe, K. Fujioka, and Y. Fujimoto, Opt. Mater. 33, 688 (2011).

Fujita, S.

S. Fujita, A. Sakamoto, and S. Tanabe, IEEE J. Sel. Top. Quantum Electron. 14, 1387 (2008).
[CrossRef]

S. Fujita, S. Yoshihara, A. Sakamoto, S. Yamamoto, and S. Tanabe, Proc. SPIE 5941, 594111 (2005).
[CrossRef]

S. Tanabe, S. Fujita, S. Yoshihara, A. Sakamoto, and S. Yamamoto, Proc. SPIE 5941, 594112 (2005).
[CrossRef]

Gu, Y.

N. Narendran and Y. Gu, J. Display Technol. 1, 167 (2005).
[CrossRef]

N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, J. Cryst. Growth 268, 449 (2004).
[CrossRef]

Hanzawa, H.

H. S. Kim, T. Horikawa, H. Hanzawa, and K. Machida, J. Phys.: Conf. Ser. 379, 012016 (2012).
[CrossRef]

Heo, J.

Hintzen, H. T.

C.-W. Yeh, W.-T. Chen, R.-S. Liu, S.-F. Hu, H.-S. Sheu, J.-M. Chen, and H. T. Hintzen, J. Am. Chem. Soc. 134, 14108 (2012).
[CrossRef]

Horikawa, T.

H. S. Kim, T. Horikawa, H. Hanzawa, and K. Machida, J. Phys.: Conf. Ser. 379, 012016 (2012).
[CrossRef]

Hu, S.-F.

C.-W. Yeh, W.-T. Chen, R.-S. Liu, S.-F. Hu, H.-S. Sheu, J.-M. Chen, and H. T. Hintzen, J. Am. Chem. Soc. 134, 14108 (2012).
[CrossRef]

Im, W. B.

Kim, H. S.

H. S. Kim, T. Horikawa, H. Hanzawa, and K. Machida, J. Phys.: Conf. Ser. 379, 012016 (2012).
[CrossRef]

Kim, S.

Lee, H.

Lee, I. J.

Lee, J. S.

Lee, S.

Lee, Y. K.

Liu, R.-S.

C.-W. Yeh, W.-T. Chen, R.-S. Liu, S.-F. Hu, H.-S. Sheu, J.-M. Chen, and H. T. Hintzen, J. Am. Chem. Soc. 134, 14108 (2012).
[CrossRef]

Luoma, G. A.

G. A. Luoma and R. D. Rowland, J. Appl. Polym. Sci. 32, 5777 (1986).
[CrossRef]

Machida, K.

H. S. Kim, T. Horikawa, H. Hanzawa, and K. Machida, J. Phys.: Conf. Ser. 379, 012016 (2012).
[CrossRef]

Meijerink, A.

V. Bachmann, C. Ronda, and A. Meijerink, Chem. Mater. 21, 2077 (2009).
[CrossRef]

Nakanishi, T.

T. Nakanishi and S. Tanabe, IEEE J. Sel. Top. Quantum Electron. 15, 1171 (2009).
[CrossRef]

Narendran, N.

N. Narendran and Y. Gu, J. Display Technol. 1, 167 (2005).
[CrossRef]

N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, J. Cryst. Growth 268, 449 (2004).
[CrossRef]

Nishiura, S.

S. Nishiura, S. Tanabe, K. Fujioka, and Y. Fujimoto, Opt. Mater. 33, 688 (2011).

Pecht, M.

M.-H. Chang, D. Das, P. V. Varde, and M. Pecht, Microelectron. Reliab. 52, 762 (2012).

Ronda, C.

V. Bachmann, C. Ronda, and A. Meijerink, Chem. Mater. 21, 2077 (2009).
[CrossRef]

Rowland, R. D.

G. A. Luoma and R. D. Rowland, J. Appl. Polym. Sci. 32, 5777 (1986).
[CrossRef]

Sakamoto, A.

S. Fujita, A. Sakamoto, and S. Tanabe, IEEE J. Sel. Top. Quantum Electron. 14, 1387 (2008).
[CrossRef]

S. Fujita, S. Yoshihara, A. Sakamoto, S. Yamamoto, and S. Tanabe, Proc. SPIE 5941, 594111 (2005).
[CrossRef]

S. Tanabe, S. Fujita, S. Yoshihara, A. Sakamoto, and S. Yamamoto, Proc. SPIE 5941, 594112 (2005).
[CrossRef]

Sheu, H.-S.

C.-W. Yeh, W.-T. Chen, R.-S. Liu, S.-F. Hu, H.-S. Sheu, J.-M. Chen, and H. T. Hintzen, J. Am. Chem. Soc. 134, 14108 (2012).
[CrossRef]

Sohn, K.-S.

Tanabe, S.

S. Nishiura, S. Tanabe, K. Fujioka, and Y. Fujimoto, Opt. Mater. 33, 688 (2011).

T. Nakanishi and S. Tanabe, IEEE J. Sel. Top. Quantum Electron. 15, 1171 (2009).
[CrossRef]

S. Fujita, A. Sakamoto, and S. Tanabe, IEEE J. Sel. Top. Quantum Electron. 14, 1387 (2008).
[CrossRef]

S. Fujita, S. Yoshihara, A. Sakamoto, S. Yamamoto, and S. Tanabe, Proc. SPIE 5941, 594111 (2005).
[CrossRef]

S. Tanabe, S. Fujita, S. Yoshihara, A. Sakamoto, and S. Yamamoto, Proc. SPIE 5941, 594112 (2005).
[CrossRef]

Unithrattil, S.

Varde, P. V.

M.-H. Chang, D. Das, P. V. Varde, and M. Pecht, Microelectron. Reliab. 52, 762 (2012).

Yamamoto, S.

S. Tanabe, S. Fujita, S. Yoshihara, A. Sakamoto, and S. Yamamoto, Proc. SPIE 5941, 594112 (2005).
[CrossRef]

S. Fujita, S. Yoshihara, A. Sakamoto, S. Yamamoto, and S. Tanabe, Proc. SPIE 5941, 594111 (2005).
[CrossRef]

Yeh, C.-W.

C.-W. Yeh, W.-T. Chen, R.-S. Liu, S.-F. Hu, H.-S. Sheu, J.-M. Chen, and H. T. Hintzen, J. Am. Chem. Soc. 134, 14108 (2012).
[CrossRef]

Yi, S.

S. Yi, W. J. Chung, and J. Heo, J. Am. Ceram. Soc. 97, 342 (2014).
[CrossRef]

Yoshihara, S.

S. Tanabe, S. Fujita, S. Yoshihara, A. Sakamoto, and S. Yamamoto, Proc. SPIE 5941, 594112 (2005).
[CrossRef]

S. Fujita, S. Yoshihara, A. Sakamoto, S. Yamamoto, and S. Tanabe, Proc. SPIE 5941, 594111 (2005).
[CrossRef]

Yu, H.

N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, J. Cryst. Growth 268, 449 (2004).
[CrossRef]

Chem. Mater.

V. Bachmann, C. Ronda, and A. Meijerink, Chem. Mater. 21, 2077 (2009).
[CrossRef]

IEEE J. Sel. Top. Quantum Electron.

S. Fujita, A. Sakamoto, and S. Tanabe, IEEE J. Sel. Top. Quantum Electron. 14, 1387 (2008).
[CrossRef]

T. Nakanishi and S. Tanabe, IEEE J. Sel. Top. Quantum Electron. 15, 1171 (2009).
[CrossRef]

J. Am. Ceram. Soc.

S. Yi, W. J. Chung, and J. Heo, J. Am. Ceram. Soc. 97, 342 (2014).
[CrossRef]

J. Am. Chem. Soc.

C.-W. Yeh, W.-T. Chen, R.-S. Liu, S.-F. Hu, H.-S. Sheu, J.-M. Chen, and H. T. Hintzen, J. Am. Chem. Soc. 134, 14108 (2012).
[CrossRef]

J. Appl. Polym. Sci.

G. A. Luoma and R. D. Rowland, J. Appl. Polym. Sci. 32, 5777 (1986).
[CrossRef]

J. Cryst. Growth

N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, J. Cryst. Growth 268, 449 (2004).
[CrossRef]

J. Display Technol.

J. Phys.: Conf. Ser.

H. S. Kim, T. Horikawa, H. Hanzawa, and K. Machida, J. Phys.: Conf. Ser. 379, 012016 (2012).
[CrossRef]

Microelectron. Reliab.

M.-H. Chang, D. Das, P. V. Varde, and M. Pecht, Microelectron. Reliab. 52, 762 (2012).

Opt. Lett.

Opt. Mater.

S. Nishiura, S. Tanabe, K. Fujioka, and Y. Fujimoto, Opt. Mater. 33, 688 (2011).

Proc. SPIE

S. Fujita, S. Yoshihara, A. Sakamoto, S. Yamamoto, and S. Tanabe, Proc. SPIE 5941, 594111 (2005).
[CrossRef]

S. Tanabe, S. Fujita, S. Yoshihara, A. Sakamoto, and S. Yamamoto, Proc. SPIE 5941, 594112 (2005).
[CrossRef]

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