Abstract

We propose a method for high resolution phase imaging of biological and non-biological samples using an incoherent deep ultraviolet (DUV) LED source. The diffraction pattern of the object wave is recorded at different axial planes and the phase is retrieved by propagation of the angular spectrum. To maintain enough light intensity, we avoided using a pinhole or spectral filter for increasing the coherence of the DUV LED source. This makes the setup very simple and cost effective. The short wavelength (285 nm) of the DUV light, tuned to the absorption peak of the biological samples, allows simultaneously high resolution and high contrast images. The experimental results are presented to verify this principle.

© 2014 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. M. Wurm, F. Pilarski, and B. Bodermann, Rev. Sci. Instrum. 81, 023701 (2010).
    [CrossRef]
  2. X. Niu, N. H. Jakatdar, J. Bao, C. J. Spanos, and S. K. Yedur, Proc. SPIE 3677, 159 (1999).
    [CrossRef]
  3. W. Osten, V. F. Paz, K. Frenner, T. Schuster, and H. Bloess, Proc. AIP 1173, 371 (2009).
  4. B. Bodermann, E. Buhr, G. Ehret, F. Scholze, and M. Wurm, Proc. SPIE 7155, 71550V (2008).
    [CrossRef]
  5. B. J. Zeskind, C. D. Jordan, W. Timp, L. Trapani, G. Waller, V. Horodincu, D. J. Ehrlich, and P. Matsudaira, Nat. Methods 4, 567 (2007).
    [CrossRef]
  6. A. Faridian, D. Hopp, G. Pedrini, U. Eigenthaler, M. Hirscher, and W. Osten, Opt. Express 18, 14159 (2010).
    [CrossRef]
  7. A. Faridian, D. Hopp, G. Pedrini, and W. Osten, Proc. SPIE 7718, 771803 (2010).
    [CrossRef]
  8. U. Gopinathan, G. Pedrini, B. Javidi, and W. Osten, J. Display Technol. 6, 479 (2010).
    [CrossRef]
  9. A. Anand, A. Faridian, V. Chhaniwal, G. Pedrini, W. Osten, and B. Javidi, Opt. Lett. 36, 4362 (2011).
    [CrossRef]
  10. R. Guo, B. Yao, P. Gao, J. Min, M. Zhou, J. Han, X. Yu, X. Yu, M. Lie, S. Yan, Y. Yang, D. Dan, and T. Ye, Appl. Opt. 52, 8233 (2013).
    [CrossRef]
  11. S. Stürwald, B. Kemper, C. Remmersmann, P. Langehanenberg, and G. von Bally, Proc. SPIE 6995, 699507 (2008).
    [CrossRef]
  12. F. Dubois and C. Yourassowsky, Opt. Lett. 37, 2190 (2012).
    [CrossRef]
  13. F. Dubois, L. Joannes, and J. C. Legros, Appl. Opt. 38, 7085 (1999).
    [CrossRef]
  14. B. Kemper, S. Stürwald, C. Remmersmann, P. Langehanenberg, and G. von Bally, Opt. Lasers Eng. 46, 499 (2008).
    [CrossRef]
  15. G. Pedrini, W. Osten, and Y. Zhang, Opt. Lett. 30, 833 (2005).
    [CrossRef]
  16. P. Almoro, G. Pedrini, and W. Osten, Appl. Opt. 45, 8596 (2006).
    [CrossRef]
  17. F. Zhang, G. Pedrini, and W. Osten, Phys. Rev. A 75, 043805 (2007).
    [CrossRef]
  18. A. Mazine and K. Heggarty, Appl. Opt. 50, 2679 (2011).
    [CrossRef]
  19. L. J. Allen and M. P. Oxley, Opt. Commun. 199, 65 (2001).
    [CrossRef]

2013 (1)

2012 (1)

2011 (2)

2010 (4)

A. Faridian, D. Hopp, G. Pedrini, U. Eigenthaler, M. Hirscher, and W. Osten, Opt. Express 18, 14159 (2010).
[CrossRef]

A. Faridian, D. Hopp, G. Pedrini, and W. Osten, Proc. SPIE 7718, 771803 (2010).
[CrossRef]

U. Gopinathan, G. Pedrini, B. Javidi, and W. Osten, J. Display Technol. 6, 479 (2010).
[CrossRef]

M. Wurm, F. Pilarski, and B. Bodermann, Rev. Sci. Instrum. 81, 023701 (2010).
[CrossRef]

2009 (1)

W. Osten, V. F. Paz, K. Frenner, T. Schuster, and H. Bloess, Proc. AIP 1173, 371 (2009).

2008 (3)

B. Bodermann, E. Buhr, G. Ehret, F. Scholze, and M. Wurm, Proc. SPIE 7155, 71550V (2008).
[CrossRef]

S. Stürwald, B. Kemper, C. Remmersmann, P. Langehanenberg, and G. von Bally, Proc. SPIE 6995, 699507 (2008).
[CrossRef]

B. Kemper, S. Stürwald, C. Remmersmann, P. Langehanenberg, and G. von Bally, Opt. Lasers Eng. 46, 499 (2008).
[CrossRef]

2007 (2)

B. J. Zeskind, C. D. Jordan, W. Timp, L. Trapani, G. Waller, V. Horodincu, D. J. Ehrlich, and P. Matsudaira, Nat. Methods 4, 567 (2007).
[CrossRef]

F. Zhang, G. Pedrini, and W. Osten, Phys. Rev. A 75, 043805 (2007).
[CrossRef]

2006 (1)

2005 (1)

2001 (1)

L. J. Allen and M. P. Oxley, Opt. Commun. 199, 65 (2001).
[CrossRef]

1999 (2)

F. Dubois, L. Joannes, and J. C. Legros, Appl. Opt. 38, 7085 (1999).
[CrossRef]

X. Niu, N. H. Jakatdar, J. Bao, C. J. Spanos, and S. K. Yedur, Proc. SPIE 3677, 159 (1999).
[CrossRef]

Allen, L. J.

L. J. Allen and M. P. Oxley, Opt. Commun. 199, 65 (2001).
[CrossRef]

Almoro, P.

Anand, A.

Bao, J.

X. Niu, N. H. Jakatdar, J. Bao, C. J. Spanos, and S. K. Yedur, Proc. SPIE 3677, 159 (1999).
[CrossRef]

Bloess, H.

W. Osten, V. F. Paz, K. Frenner, T. Schuster, and H. Bloess, Proc. AIP 1173, 371 (2009).

Bodermann, B.

M. Wurm, F. Pilarski, and B. Bodermann, Rev. Sci. Instrum. 81, 023701 (2010).
[CrossRef]

B. Bodermann, E. Buhr, G. Ehret, F. Scholze, and M. Wurm, Proc. SPIE 7155, 71550V (2008).
[CrossRef]

Buhr, E.

B. Bodermann, E. Buhr, G. Ehret, F. Scholze, and M. Wurm, Proc. SPIE 7155, 71550V (2008).
[CrossRef]

Chhaniwal, V.

Dan, D.

Dubois, F.

Ehret, G.

B. Bodermann, E. Buhr, G. Ehret, F. Scholze, and M. Wurm, Proc. SPIE 7155, 71550V (2008).
[CrossRef]

Ehrlich, D. J.

B. J. Zeskind, C. D. Jordan, W. Timp, L. Trapani, G. Waller, V. Horodincu, D. J. Ehrlich, and P. Matsudaira, Nat. Methods 4, 567 (2007).
[CrossRef]

Eigenthaler, U.

Faridian, A.

Frenner, K.

W. Osten, V. F. Paz, K. Frenner, T. Schuster, and H. Bloess, Proc. AIP 1173, 371 (2009).

Gao, P.

Gopinathan, U.

Guo, R.

Han, J.

Heggarty, K.

Hirscher, M.

Hopp, D.

Horodincu, V.

B. J. Zeskind, C. D. Jordan, W. Timp, L. Trapani, G. Waller, V. Horodincu, D. J. Ehrlich, and P. Matsudaira, Nat. Methods 4, 567 (2007).
[CrossRef]

Jakatdar, N. H.

X. Niu, N. H. Jakatdar, J. Bao, C. J. Spanos, and S. K. Yedur, Proc. SPIE 3677, 159 (1999).
[CrossRef]

Javidi, B.

Joannes, L.

Jordan, C. D.

B. J. Zeskind, C. D. Jordan, W. Timp, L. Trapani, G. Waller, V. Horodincu, D. J. Ehrlich, and P. Matsudaira, Nat. Methods 4, 567 (2007).
[CrossRef]

Kemper, B.

B. Kemper, S. Stürwald, C. Remmersmann, P. Langehanenberg, and G. von Bally, Opt. Lasers Eng. 46, 499 (2008).
[CrossRef]

S. Stürwald, B. Kemper, C. Remmersmann, P. Langehanenberg, and G. von Bally, Proc. SPIE 6995, 699507 (2008).
[CrossRef]

Langehanenberg, P.

B. Kemper, S. Stürwald, C. Remmersmann, P. Langehanenberg, and G. von Bally, Opt. Lasers Eng. 46, 499 (2008).
[CrossRef]

S. Stürwald, B. Kemper, C. Remmersmann, P. Langehanenberg, and G. von Bally, Proc. SPIE 6995, 699507 (2008).
[CrossRef]

Legros, J. C.

Lie, M.

Matsudaira, P.

B. J. Zeskind, C. D. Jordan, W. Timp, L. Trapani, G. Waller, V. Horodincu, D. J. Ehrlich, and P. Matsudaira, Nat. Methods 4, 567 (2007).
[CrossRef]

Mazine, A.

Min, J.

Niu, X.

X. Niu, N. H. Jakatdar, J. Bao, C. J. Spanos, and S. K. Yedur, Proc. SPIE 3677, 159 (1999).
[CrossRef]

Osten, W.

Oxley, M. P.

L. J. Allen and M. P. Oxley, Opt. Commun. 199, 65 (2001).
[CrossRef]

Paz, V. F.

W. Osten, V. F. Paz, K. Frenner, T. Schuster, and H. Bloess, Proc. AIP 1173, 371 (2009).

Pedrini, G.

Pilarski, F.

M. Wurm, F. Pilarski, and B. Bodermann, Rev. Sci. Instrum. 81, 023701 (2010).
[CrossRef]

Remmersmann, C.

B. Kemper, S. Stürwald, C. Remmersmann, P. Langehanenberg, and G. von Bally, Opt. Lasers Eng. 46, 499 (2008).
[CrossRef]

S. Stürwald, B. Kemper, C. Remmersmann, P. Langehanenberg, and G. von Bally, Proc. SPIE 6995, 699507 (2008).
[CrossRef]

Scholze, F.

B. Bodermann, E. Buhr, G. Ehret, F. Scholze, and M. Wurm, Proc. SPIE 7155, 71550V (2008).
[CrossRef]

Schuster, T.

W. Osten, V. F. Paz, K. Frenner, T. Schuster, and H. Bloess, Proc. AIP 1173, 371 (2009).

Spanos, C. J.

X. Niu, N. H. Jakatdar, J. Bao, C. J. Spanos, and S. K. Yedur, Proc. SPIE 3677, 159 (1999).
[CrossRef]

Stürwald, S.

B. Kemper, S. Stürwald, C. Remmersmann, P. Langehanenberg, and G. von Bally, Opt. Lasers Eng. 46, 499 (2008).
[CrossRef]

S. Stürwald, B. Kemper, C. Remmersmann, P. Langehanenberg, and G. von Bally, Proc. SPIE 6995, 699507 (2008).
[CrossRef]

Timp, W.

B. J. Zeskind, C. D. Jordan, W. Timp, L. Trapani, G. Waller, V. Horodincu, D. J. Ehrlich, and P. Matsudaira, Nat. Methods 4, 567 (2007).
[CrossRef]

Trapani, L.

B. J. Zeskind, C. D. Jordan, W. Timp, L. Trapani, G. Waller, V. Horodincu, D. J. Ehrlich, and P. Matsudaira, Nat. Methods 4, 567 (2007).
[CrossRef]

von Bally, G.

B. Kemper, S. Stürwald, C. Remmersmann, P. Langehanenberg, and G. von Bally, Opt. Lasers Eng. 46, 499 (2008).
[CrossRef]

S. Stürwald, B. Kemper, C. Remmersmann, P. Langehanenberg, and G. von Bally, Proc. SPIE 6995, 699507 (2008).
[CrossRef]

Waller, G.

B. J. Zeskind, C. D. Jordan, W. Timp, L. Trapani, G. Waller, V. Horodincu, D. J. Ehrlich, and P. Matsudaira, Nat. Methods 4, 567 (2007).
[CrossRef]

Wurm, M.

M. Wurm, F. Pilarski, and B. Bodermann, Rev. Sci. Instrum. 81, 023701 (2010).
[CrossRef]

B. Bodermann, E. Buhr, G. Ehret, F. Scholze, and M. Wurm, Proc. SPIE 7155, 71550V (2008).
[CrossRef]

Yan, S.

Yang, Y.

Yao, B.

Ye, T.

Yedur, S. K.

X. Niu, N. H. Jakatdar, J. Bao, C. J. Spanos, and S. K. Yedur, Proc. SPIE 3677, 159 (1999).
[CrossRef]

Yourassowsky, C.

Yu, X.

Zeskind, B. J.

B. J. Zeskind, C. D. Jordan, W. Timp, L. Trapani, G. Waller, V. Horodincu, D. J. Ehrlich, and P. Matsudaira, Nat. Methods 4, 567 (2007).
[CrossRef]

Zhang, F.

F. Zhang, G. Pedrini, and W. Osten, Phys. Rev. A 75, 043805 (2007).
[CrossRef]

Zhang, Y.

Zhou, M.

Appl. Opt. (4)

J. Display Technol. (1)

Nat. Methods (1)

B. J. Zeskind, C. D. Jordan, W. Timp, L. Trapani, G. Waller, V. Horodincu, D. J. Ehrlich, and P. Matsudaira, Nat. Methods 4, 567 (2007).
[CrossRef]

Opt. Commun. (1)

L. J. Allen and M. P. Oxley, Opt. Commun. 199, 65 (2001).
[CrossRef]

Opt. Express (1)

Opt. Lasers Eng. (1)

B. Kemper, S. Stürwald, C. Remmersmann, P. Langehanenberg, and G. von Bally, Opt. Lasers Eng. 46, 499 (2008).
[CrossRef]

Opt. Lett. (3)

Phys. Rev. A (1)

F. Zhang, G. Pedrini, and W. Osten, Phys. Rev. A 75, 043805 (2007).
[CrossRef]

Proc. AIP (1)

W. Osten, V. F. Paz, K. Frenner, T. Schuster, and H. Bloess, Proc. AIP 1173, 371 (2009).

Proc. SPIE (4)

B. Bodermann, E. Buhr, G. Ehret, F. Scholze, and M. Wurm, Proc. SPIE 7155, 71550V (2008).
[CrossRef]

X. Niu, N. H. Jakatdar, J. Bao, C. J. Spanos, and S. K. Yedur, Proc. SPIE 3677, 159 (1999).
[CrossRef]

A. Faridian, D. Hopp, G. Pedrini, and W. Osten, Proc. SPIE 7718, 771803 (2010).
[CrossRef]

S. Stürwald, B. Kemper, C. Remmersmann, P. Langehanenberg, and G. von Bally, Proc. SPIE 6995, 699507 (2008).
[CrossRef]

Rev. Sci. Instrum. (1)

M. Wurm, F. Pilarski, and B. Bodermann, Rev. Sci. Instrum. 81, 023701 (2010).
[CrossRef]

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1.
Fig. 1.

Schematic of the experimental setup. I1,I2,I3In are the intensity samplings at S1,S2,S3Sn planes, respectively; MO is microscope objective.

Fig. 2.
Fig. 2.

High resolution imaging of QUANTIFOIL mesh: (a) reconstructed amplitude image; (b) phase image at 285 nm by using the iterative method; (c) phase profile of the dashed line segment shown in (b); and (d) the 3D phase profile of the specimen. (e) and (f) are, respectively, the reconstructed amplitude and phase images from the digital hologram recorded using a 266 nm wavelength laser source. The contrast of the reconstructed amplitudes in (a) and (e) looks inverted because of the angle of illumination while recording the hologram.

Fig. 3.
Fig. 3.

(a) SEM image of the “ITO” logo; (b) reconstructed amplitude image using phase retrieval method at 285 nm in the image plane; (c) phase image; (d) white light image of the sample in the same configuration; (e) reconstructed amplitude image using an off-axis hologram at 193 nm; (f) height variation of the dashed line segment shown in (c); and (g) phase profile of the sample in 3D. The scale bar is 3 μm.

Fig. 4.
Fig. 4.

Biological sample: high contrast images of the 3 μm thick slice of mouse brain; (a) reconstructed amplitude image in the image plane and (b) reconstructed phase map. An enlarged view of the marked regions is shown in each figure. Different structures of the brain tissue are identified and shown in the magnified part of the amplitude image. The scale bar is 6 μm.

Equations (1)

Equations on this page are rendered with MathJax. Learn more.

U(x,y,z+Δz)=U˜(fx,fy,z)PFexp[i2π(fxx+fyy)]dfxdfy,

Metrics