Abstract

We present a quantitative phase microscopy scheme that simultaneously acquires two phase images at different wavelengths. The simultaneous dual-wavelength measurement was performed with a diffraction phase microscope (DPM) based on a transmission grating and a spatial filter that form a common-path imaging interferometer. With a combined laser source that generates two-color light continuously, a different diffraction order of the grating was utilized for each wavelength component so that the dual-wavelength interference pattern could be distinguished by the distinct fringe frequencies. Our dual-wavelength phase imaging allowed us to extract information on the physical thickness and the refractive index for a specimen immersed in a highly dispersive surrounding medium. We found that our dual-wavelength DPM (DW-DPM) provides an accurate measurement of the volume and the refractive index of a microscopy sample with good measurement stability that results from the common-path geometry.

© 2014 Optical Society of America

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2012 (1)

2009 (2)

2008 (2)

B. Rappaz, F. Charrière, C. Depeursinge, P. J. Magistretti, and P. Marquet, Opt. Lett. 33, 744 (2008).
[CrossRef]

J. Kuhn, F. Charriere, T. Colomb, E. Cuche, F. Montfort, Y. Emery, P. Marquet, and C. Depeursinge, Meas. Sci. Technol. 19, 074007 (2008).
[CrossRef]

2007 (1)

2006 (3)

2005 (5)

2003 (1)

Alfieri, D.

D. Alfieri, G. Coppola, S. De Nicola, P. Ferraro, A. Finizio, G. Pierattini, and B. Javidi, Opt. Commun. 260, 113 (2006).
[CrossRef]

S. De Nicola, A. Finizio, G. Pierattini, D. Alfieri, S. Grilli, L. Sansone, and P. Ferraro, Opt. Lett. 30, 2706 (2005).
[CrossRef]

Allman, B. E.

C. L. Curl, C. J. Bellair, T. Harris, B. E. Allman, P. J. Harris, A. G. Stewart, A. Roberts, K. A. Nugent, and L. M. D. Delbridge, Cytometry 65, 88 (2005).
[CrossRef]

Badizadegan, K.

Bass, M.

M. Bass, G. Li, C. MacDonald, V. Mahajan, and E. V. Stryland, Optical Properties of Materials, Nonlinear Optics, Quantum Optics (McGraw-Hill, 2009).

Bellair, C. J.

C. L. Curl, C. J. Bellair, T. Harris, B. E. Allman, P. J. Harris, A. G. Stewart, A. Roberts, K. A. Nugent, and L. M. D. Delbridge, Cytometry 65, 88 (2005).
[CrossRef]

Bhaduri, B.

Charriere, F.

J. Kuhn, F. Charriere, T. Colomb, E. Cuche, F. Montfort, Y. Emery, P. Marquet, and C. Depeursinge, Meas. Sci. Technol. 19, 074007 (2008).
[CrossRef]

Charrière, F.

Choi, W.

Colomb, T.

Coppola, G.

D. Alfieri, G. Coppola, S. De Nicola, P. Ferraro, A. Finizio, G. Pierattini, and B. Javidi, Opt. Commun. 260, 113 (2006).
[CrossRef]

G. Coppola, P. Ferraro, M. Lodice, and S. De Nicola, Appl. Opt. 42, 3882 (2003).
[CrossRef]

Cuche, E.

Curl, C. L.

C. L. Curl, C. J. Bellair, T. Harris, B. E. Allman, P. J. Harris, A. G. Stewart, A. Roberts, K. A. Nugent, and L. M. D. Delbridge, Cytometry 65, 88 (2005).
[CrossRef]

Dasari, R.

Dasari, R. R.

De Nicola, S.

Delbridge, L. M. D.

C. L. Curl, C. J. Bellair, T. Harris, B. E. Allman, P. J. Harris, A. G. Stewart, A. Roberts, K. A. Nugent, and L. M. D. Delbridge, Cytometry 65, 88 (2005).
[CrossRef]

Depeursinge, C.

Emery, Y.

Feld, M. S.

Ferraro, P.

Finizio, A.

D. Alfieri, G. Coppola, S. De Nicola, P. Ferraro, A. Finizio, G. Pierattini, and B. Javidi, Opt. Commun. 260, 113 (2006).
[CrossRef]

S. De Nicola, A. Finizio, G. Pierattini, D. Alfieri, S. Grilli, L. Sansone, and P. Ferraro, Opt. Lett. 30, 2706 (2005).
[CrossRef]

Grilli, S.

Harris, P. J.

C. L. Curl, C. J. Bellair, T. Harris, B. E. Allman, P. J. Harris, A. G. Stewart, A. Roberts, K. A. Nugent, and L. M. D. Delbridge, Cytometry 65, 88 (2005).
[CrossRef]

Harris, T.

C. L. Curl, C. J. Bellair, T. Harris, B. E. Allman, P. J. Harris, A. G. Stewart, A. Roberts, K. A. Nugent, and L. M. D. Delbridge, Cytometry 65, 88 (2005).
[CrossRef]

Ikeda, T.

Javidi, B.

D. Alfieri, G. Coppola, S. De Nicola, P. Ferraro, A. Finizio, G. Pierattini, and B. Javidi, Opt. Commun. 260, 113 (2006).
[CrossRef]

Kim, D. Y.

Kuhn, J.

J. Kuhn, F. Charriere, T. Colomb, E. Cuche, F. Montfort, Y. Emery, P. Marquet, and C. Depeursinge, Meas. Sci. Technol. 19, 074007 (2008).
[CrossRef]

Kühn, J.

Lee, J. Y.

Lee, S.

Li, G.

M. Bass, G. Li, C. MacDonald, V. Mahajan, and E. V. Stryland, Optical Properties of Materials, Nonlinear Optics, Quantum Optics (McGraw-Hill, 2009).

Lodice, M.

Lue, N.

MacDonald, C.

M. Bass, G. Li, C. MacDonald, V. Mahajan, and E. V. Stryland, Optical Properties of Materials, Nonlinear Optics, Quantum Optics (McGraw-Hill, 2009).

Magistretti, P.

Magistretti, P. J.

Mahajan, V.

M. Bass, G. Li, C. MacDonald, V. Mahajan, and E. V. Stryland, Optical Properties of Materials, Nonlinear Optics, Quantum Optics (McGraw-Hill, 2009).

Marquet, P.

Mir, M.

Montfort, F.

J. Kuhn, F. Charriere, T. Colomb, E. Cuche, F. Montfort, Y. Emery, P. Marquet, and C. Depeursinge, Meas. Sci. Technol. 19, 074007 (2008).
[CrossRef]

J. Kühn, T. Colomb, F. Montfort, F. Charrière, Y. Emery, E. Cuche, P. Marquet, and C. Depeursinge, Opt. Express 15, 7231 (2007).
[CrossRef]

Nugent, K. A.

C. L. Curl, C. J. Bellair, T. Harris, B. E. Allman, P. J. Harris, A. G. Stewart, A. Roberts, K. A. Nugent, and L. M. D. Delbridge, Cytometry 65, 88 (2005).
[CrossRef]

Park, Y.

Pham, H.

Pierattini, G.

D. Alfieri, G. Coppola, S. De Nicola, P. Ferraro, A. Finizio, G. Pierattini, and B. Javidi, Opt. Commun. 260, 113 (2006).
[CrossRef]

S. De Nicola, A. Finizio, G. Pierattini, D. Alfieri, S. Grilli, L. Sansone, and P. Ferraro, Opt. Lett. 30, 2706 (2005).
[CrossRef]

Popescu, G.

Rappaz, B.

Roberts, A.

C. L. Curl, C. J. Bellair, T. Harris, B. E. Allman, P. J. Harris, A. G. Stewart, A. Roberts, K. A. Nugent, and L. M. D. Delbridge, Cytometry 65, 88 (2005).
[CrossRef]

Sansone, L.

Stewart, A. G.

C. L. Curl, C. J. Bellair, T. Harris, B. E. Allman, P. J. Harris, A. G. Stewart, A. Roberts, K. A. Nugent, and L. M. D. Delbridge, Cytometry 65, 88 (2005).
[CrossRef]

Stryland, E. V.

M. Bass, G. Li, C. MacDonald, V. Mahajan, and E. V. Stryland, Optical Properties of Materials, Nonlinear Optics, Quantum Optics (McGraw-Hill, 2009).

Yamauchi, T.

Yang, W.

Appl. Opt. (1)

Cytometry (1)

C. L. Curl, C. J. Bellair, T. Harris, B. E. Allman, P. J. Harris, A. G. Stewart, A. Roberts, K. A. Nugent, and L. M. D. Delbridge, Cytometry 65, 88 (2005).
[CrossRef]

Meas. Sci. Technol. (1)

J. Kuhn, F. Charriere, T. Colomb, E. Cuche, F. Montfort, Y. Emery, P. Marquet, and C. Depeursinge, Meas. Sci. Technol. 19, 074007 (2008).
[CrossRef]

Opt. Commun. (1)

D. Alfieri, G. Coppola, S. De Nicola, P. Ferraro, A. Finizio, G. Pierattini, and B. Javidi, Opt. Commun. 260, 113 (2006).
[CrossRef]

Opt. Express (3)

Opt. Lett. (8)

Other (1)

M. Bass, G. Li, C. MacDonald, V. Mahajan, and E. V. Stryland, Optical Properties of Materials, Nonlinear Optics, Quantum Optics (McGraw-Hill, 2009).

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Figures (3)

Fig. 1.
Fig. 1.

Schematic of our DW-DPM setup with a tube lens (TL) and conversion lenses (L1 and L2). The dashed line, solid line, and dotted line represent combined, red, and green light, respectively.

Fig. 2.
Fig. 2.

(a) Partial raw fringe pattern, two filtered fringe components of (b) m1=2 and (c) m2=1 with the different fringe frequencies, and (d) the 2D Fourier transform of the raw fringe.

Fig. 3.
Fig. 3.

Simultaneously acquired phase images of the silica bead for (a) λ1=532nm, and (b) λ2=632nm, with (c) the extracted refractive thickness profile along a horizontal line that crossed the center of the bead, and (d) the thickness distribution.

Equations (5)

Equations on this page are rendered with MathJax. Learn more.

sinθ=mλd,
q=sinθλ,
q=f1·mf2·d
ns(x,y,λ1)=no(λ1)+ΔnoΔns(L(x,y,λ2)L(x,y,λ1)1),
δns=Δns(L(λ2)L(λ1)1)=no(λ1)ns(λ1)(ΔnoΔns1)

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