Abstract

The transport-of-intensity equation (TIE) is applied in the reconstruction of two interfering wavefronts by analyzing the interference patterns and their derivatives along their common propagation directions. The TIE is extended from one wave to two waves and is then applied to calculate the phase of the interference field. Finally, the phase shift concept is applied to reconstruct the phase distribution of two waves. The consistency of the method is verified by simulation.

© 2014 Optical Society of America

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R. Shomali, A. Darudi, and S. Nasiri, Optik 123, 1282 (2012).
[CrossRef]

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A. Darudi, R. Shomali, and M. T. Tavassoly, Opt. Laser Technol. 40, 850 (2008).
[CrossRef]

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V. V. Volkov, Y. Zhu, and M. De Graef, Micron 33, 411 (2002).
[CrossRef]

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S. Bajt, A. Barty, K. A. Nugent, M. McCartney, M. Wall, and D. Paganin, Ultramicroscopy 83, 67 (2000).
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M. T. Tavassoly and A. Darudi, Opt. Commun. 175, 43 (2000).
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Akhlaghi, E. A.

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S. Bajt, A. Barty, K. A. Nugent, M. McCartney, M. Wall, and D. Paganin, Ultramicroscopy 83, 67 (2000).
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Barnea, Z.

K. A. Nugent, T. E. Gureyev, D. F. Cookson, D. Paganin, and Z. Barnea, Phys. Rev. Lett. 77, 2961 (1996).
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S. Bajt, A. Barty, K. A. Nugent, M. McCartney, M. Wall, and D. Paganin, Ultramicroscopy 83, 67 (2000).
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A. Barty, K. A. Nugent, D. Paganin, and A. Roberts, Opt. Lett. 23, 817 (1998).
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K. A. Nugent, T. E. Gureyev, D. F. Cookson, D. Paganin, and Z. Barnea, Phys. Rev. Lett. 77, 2961 (1996).
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R. Shomali, A. Darudi, and S. Nasiri, Optik 123, 1282 (2012).
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E. A. Akhlaghi, A. Darudi, and M. T. Tavassoly, Opt. Express 19, 15976 (2011).
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A. Darudi, R. Shomali, and M. T. Tavassoly, Opt. Laser Technol. 40, 850 (2008).
[CrossRef]

M. T. Tavassoly and A. Darudi, Opt. Commun. 175, 43 (2000).
[CrossRef]

De Graef, M.

V. V. Volkov, Y. Zhu, and M. De Graef, Micron 33, 411 (2002).
[CrossRef]

Diaz-Douton, F.

Dorrer, C.

Fallah, H. R.

Gureyev, T. E.

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[CrossRef]

T. E. Gureyev and K. A. Nugent, J. Opt. Soc. Am. A 13, 1670 (1996).
[CrossRef]

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K. Ishizuka and B. Allman, J. Electron Microsc. 54, 191 (2005).
[CrossRef]

Lohmann, A. W.

Luna, E.

Luque, S. O.

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D. Malacara, Optical Shop Testing (Wiley, 2007), Vol. 3.

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S. Bajt, A. Barty, K. A. Nugent, M. McCartney, M. Wall, and D. Paganin, Ultramicroscopy 83, 67 (2000).
[CrossRef]

Nasiri, S.

R. Shomali, A. Darudi, and S. Nasiri, Optik 123, 1282 (2012).
[CrossRef]

Nugent, K. A.

S. Bajt, A. Barty, K. A. Nugent, M. McCartney, M. Wall, and D. Paganin, Ultramicroscopy 83, 67 (2000).
[CrossRef]

A. Barty, K. A. Nugent, D. Paganin, and A. Roberts, Opt. Lett. 23, 817 (1998).
[CrossRef]

K. A. Nugent, T. E. Gureyev, D. F. Cookson, D. Paganin, and Z. Barnea, Phys. Rev. Lett. 77, 2961 (1996).
[CrossRef]

T. E. Gureyev and K. A. Nugent, J. Opt. Soc. Am. A 13, 1670 (1996).
[CrossRef]

Orlav, V.

Orlova, E.

Paganin, D.

S. Bajt, A. Barty, K. A. Nugent, M. McCartney, M. Wall, and D. Paganin, Ultramicroscopy 83, 67 (2000).
[CrossRef]

A. Barty, K. A. Nugent, D. Paganin, and A. Roberts, Opt. Lett. 23, 817 (1998).
[CrossRef]

K. A. Nugent, T. E. Gureyev, D. F. Cookson, D. Paganin, and Z. Barnea, Phys. Rev. Lett. 77, 2961 (1996).
[CrossRef]

Pujol, J.

Roberts, A.

Roddier, C.

Roddier, F.

Shomali, R.

R. Shomali, A. Darudi, and S. Nasiri, Optik 123, 1282 (2012).
[CrossRef]

A. Darudi, R. Shomali, and M. T. Tavassoly, Opt. Laser Technol. 40, 850 (2008).
[CrossRef]

Streibl, N.

N. Streibl, Opt. Commun. 49, 6 (1984).
[CrossRef]

Takeda, M.

Tavassoly, M. T.

E. A. Akhlaghi, A. Darudi, and M. T. Tavassoly, Opt. Express 19, 15976 (2011).
[CrossRef]

A. Darudi, R. Shomali, and M. T. Tavassoly, Opt. Laser Technol. 40, 850 (2008).
[CrossRef]

M. T. Tavassoly and A. Darudi, Opt. Commun. 175, 43 (2000).
[CrossRef]

Teague, M. R.

Volkov, V. V.

V. V. Volkov, Y. Zhu, and M. De Graef, Micron 33, 411 (2002).
[CrossRef]

Wall, M.

S. Bajt, A. Barty, K. A. Nugent, M. McCartney, M. Wall, and D. Paganin, Ultramicroscopy 83, 67 (2000).
[CrossRef]

Yazdani, R.

Zhu, Y.

V. V. Volkov, Y. Zhu, and M. De Graef, Micron 33, 411 (2002).
[CrossRef]

Zuegel, J. D.

Appl. Opt. (3)

J. Electron Microsc. (1)

K. Ishizuka and B. Allman, J. Electron Microsc. 54, 191 (2005).
[CrossRef]

J. Opt. Soc. Am. (2)

J. Opt. Soc. Am. A (1)

Micron (1)

V. V. Volkov, Y. Zhu, and M. De Graef, Micron 33, 411 (2002).
[CrossRef]

Opt. Commun. (2)

M. T. Tavassoly and A. Darudi, Opt. Commun. 175, 43 (2000).
[CrossRef]

N. Streibl, Opt. Commun. 49, 6 (1984).
[CrossRef]

Opt. Express (2)

Opt. Laser Technol. (1)

A. Darudi, R. Shomali, and M. T. Tavassoly, Opt. Laser Technol. 40, 850 (2008).
[CrossRef]

Opt. Lett. (3)

Optik (1)

R. Shomali, A. Darudi, and S. Nasiri, Optik 123, 1282 (2012).
[CrossRef]

Phys. Rev. Lett. (1)

K. A. Nugent, T. E. Gureyev, D. F. Cookson, D. Paganin, and Z. Barnea, Phys. Rev. Lett. 77, 2961 (1996).
[CrossRef]

Ultramicroscopy (1)

S. Bajt, A. Barty, K. A. Nugent, M. McCartney, M. Wall, and D. Paganin, Ultramicroscopy 83, 67 (2000).
[CrossRef]

Other (1)

D. Malacara, Optical Shop Testing (Wiley, 2007), Vol. 3.

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