Abstract

A laser Doppler velocimeter (LDV) using nonmechanical scanning of multiple points spatially encoded by multichannel serrodyne frequency shifting is proposed for cross-sectional velocity distribution measurement. In the proposed LDV, nonmechanical scanning using wavelength change and simultaneous multipoint measurement using spatial encoding are combined. The use of a LiNbO3 phase-shifter array for multichannel serrodyne modulation makes it possible to simplify the generation of a spatially encoded beam array. An experiment was performed using a sensor probe setup with a six-channel beam array. The results indicate that two-dimensional velocity distribution measurement was successfully demonstrated.

© 2013 Optical Society of America

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2012 (1)

2011 (3)

2010 (1)

2009 (1)

H. Ishida, H. Shirakawa, T. Andoh, S. Akiguchi, D. Kobayashi, K. Ueyama, Y. Kuraishi, and T. Hachiga, J. Appl. Phys. 106, 054701 (2009).
[CrossRef]

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E. B. Li, J. Xi, J. F. Chicharo, J. Q. Yao, and D. Y. Yu, Opt. Commun. 245, 309 (2005).
[CrossRef]

2001 (1)

E. B. Li, A. K. Tieu, and W. Y. D. Yuen, Opt. Lasers Eng. 35, 41 (2001).
[CrossRef]

1990 (1)

1989 (1)

H. Toda, K. Kasazumi, M. Haruna, and H. Nishihara, J. Lightwave Technol. 7, 364 (1989).
[CrossRef]

1981 (1)

F. Durst, B. Lehmann, and C. Tropea, Rev. Sci. Instrum. 52, 1676 (1981).
[CrossRef]

1973 (1)

Akiguchi, S.

H. Ishida, H. Shirakawa, T. Andoh, S. Akiguchi, D. Kobayashi, K. Ueyama, Y. Kuraishi, and T. Hachiga, J. Appl. Phys. 106, 054701 (2009).
[CrossRef]

Andoh, T.

H. Ishida, H. Shirakawa, T. Andoh, S. Akiguchi, D. Kobayashi, K. Ueyama, Y. Kuraishi, and T. Hachiga, J. Appl. Phys. 106, 054701 (2009).
[CrossRef]

Baets, R.

Chicharo, J. F.

E. B. Li, J. Xi, J. F. Chicharo, J. Q. Yao, and D. Y. Yu, Opt. Commun. 245, 309 (2005).
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Craig, J.

Durst, F.

F. Durst, B. Lehmann, and C. Tropea, Rev. Sci. Instrum. 52, 1676 (1981).
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Fu, Y.

Fujiwara, T.

Grant, G. R.

Guo, M.

Hachiga, T.

H. Ishida, H. Shirakawa, T. Andoh, S. Akiguchi, D. Kobayashi, K. Ueyama, Y. Kuraishi, and T. Hachiga, J. Appl. Phys. 106, 054701 (2009).
[CrossRef]

Hanagud, S.

Haruna, M.

H. Toda, K. Kasazumi, M. Haruna, and H. Nishihara, J. Lightwave Technol. 7, 364 (1989).
[CrossRef]

Hata, T.

Ikeuchi, R.

Ishida, H.

H. Ishida, H. Shirakawa, T. Andoh, S. Akiguchi, D. Kobayashi, K. Ueyama, Y. Kuraishi, and T. Hachiga, J. Appl. Phys. 106, 054701 (2009).
[CrossRef]

Kasazumi, K.

H. Toda, K. Kasazumi, M. Haruna, and H. Nishihara, J. Lightwave Technol. 7, 364 (1989).
[CrossRef]

Keyvaninia, S.

Kobayashi, D.

H. Ishida, H. Shirakawa, T. Andoh, S. Akiguchi, D. Kobayashi, K. Ueyama, Y. Kuraishi, and T. Hachiga, J. Appl. Phys. 106, 054701 (2009).
[CrossRef]

Komerath, N. M.

Kuraishi, Y.

H. Ishida, H. Shirakawa, T. Andoh, S. Akiguchi, D. Kobayashi, K. Ueyama, Y. Kuraishi, and T. Hachiga, J. Appl. Phys. 106, 054701 (2009).
[CrossRef]

Lehmann, B.

F. Durst, B. Lehmann, and C. Tropea, Rev. Sci. Instrum. 52, 1676 (1981).
[CrossRef]

Li, E. B.

E. B. Li, J. Xi, J. F. Chicharo, J. Q. Yao, and D. Y. Yu, Opt. Commun. 245, 309 (2005).
[CrossRef]

E. B. Li, A. K. Tieu, and W. Y. D. Yuen, Opt. Lasers Eng. 35, 41 (2001).
[CrossRef]

Li, Y.

Maru, K.

Nishihara, H.

H. Toda, K. Kasazumi, M. Haruna, and H. Nishihara, J. Lightwave Technol. 7, 364 (1989).
[CrossRef]

Orloff, K. L.

Phua, P. B.

Roelkens, G.

Shirakawa, H.

H. Ishida, H. Shirakawa, T. Andoh, S. Akiguchi, D. Kobayashi, K. Ueyama, Y. Kuraishi, and T. Hachiga, J. Appl. Phys. 106, 054701 (2009).
[CrossRef]

Sriram, P.

Tieu, A. K.

E. B. Li, A. K. Tieu, and W. Y. D. Yuen, Opt. Lasers Eng. 35, 41 (2001).
[CrossRef]

Toda, H.

H. Toda, K. Kasazumi, M. Haruna, and H. Nishihara, J. Lightwave Technol. 7, 364 (1989).
[CrossRef]

Tropea, C.

F. Durst, B. Lehmann, and C. Tropea, Rev. Sci. Instrum. 52, 1676 (1981).
[CrossRef]

Ueyama, K.

H. Ishida, H. Shirakawa, T. Andoh, S. Akiguchi, D. Kobayashi, K. Ueyama, Y. Kuraishi, and T. Hachiga, J. Appl. Phys. 106, 054701 (2009).
[CrossRef]

Van Thourhout, D.

Verstuyft, S.

Xi, J.

E. B. Li, J. Xi, J. F. Chicharo, J. Q. Yao, and D. Y. Yu, Opt. Commun. 245, 309 (2005).
[CrossRef]

Yao, J. Q.

E. B. Li, J. Xi, J. F. Chicharo, J. Q. Yao, and D. Y. Yu, Opt. Commun. 245, 309 (2005).
[CrossRef]

Yu, D. Y.

E. B. Li, J. Xi, J. F. Chicharo, J. Q. Yao, and D. Y. Yu, Opt. Commun. 245, 309 (2005).
[CrossRef]

Yuen, W. Y. D.

E. B. Li, A. K. Tieu, and W. Y. D. Yuen, Opt. Lasers Eng. 35, 41 (2001).
[CrossRef]

Yurtsever, G.

Appl. Opt. (6)

J. Appl. Phys. (1)

H. Ishida, H. Shirakawa, T. Andoh, S. Akiguchi, D. Kobayashi, K. Ueyama, Y. Kuraishi, and T. Hachiga, J. Appl. Phys. 106, 054701 (2009).
[CrossRef]

J. Lightwave Technol. (1)

H. Toda, K. Kasazumi, M. Haruna, and H. Nishihara, J. Lightwave Technol. 7, 364 (1989).
[CrossRef]

Opt. Commun. (1)

E. B. Li, J. Xi, J. F. Chicharo, J. Q. Yao, and D. Y. Yu, Opt. Commun. 245, 309 (2005).
[CrossRef]

Opt. Express (1)

Opt. Lasers Eng. (1)

E. B. Li, A. K. Tieu, and W. Y. D. Yuen, Opt. Lasers Eng. 35, 41 (2001).
[CrossRef]

Opt. Lett. (1)

Rev. Sci. Instrum. (1)

F. Durst, B. Lehmann, and C. Tropea, Rev. Sci. Instrum. 52, 1676 (1981).
[CrossRef]

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Figures (5)

Fig. 1.
Fig. 1.

Concept of proposed cross-sectional LDV. (a) Entire system. (b) Transmitting optics in the probe.

Fig. 2.
Fig. 2.

Experimental setup. (a) Entire setup. (b) Arrangement of beam array on the surface of the target with channel numbers and preshift frequencies. (c) Photograph of the infrared detector card illuminated by the beam arrays around the beam crossing points for λ=1545nm.

Fig. 3.
Fig. 3.

Measured spectra of beat signals for rotational speeds of 3.0, 0, and 3.0s1. (a) λ=1530nm, axial position of 8.5mm. (b) λ=1545nm, axial position of 0.2 mm. (c) λ=1560nm, axial position of 9.7 mm.

Fig. 4.
Fig. 4.

Measured beat frequency as a function of wavelength for all six channels. The rotational speed was 4.0, 0, and 4.0s1. Theoretical values are also plotted.

Fig. 5.
Fig. 5.

Estimated measurement positions in two dimensions for wavelengths of 1530, 1535, 1540, 1545, 1550, 1555, and 1560 nm for six channels. Each point represents the average of six measurements in each direction. Error bars represent one standard deviation. The intersections of the dotted lines indicate theoretical values.

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