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Calibration of nonspherical particles in optical tweezers using only position measurement

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Abstract

Nonspherical probe particles are an attractive choice for optically-trapped scanning probe microscopy. We show that it is possible to calibrate a trap with a nonspherical particle using only position measurements, without requiring measurement of orientation, using a pseudopotential based on the position occupation probability. It is not necessary to assume the force is linear with displacement.

© 2013 Optical Society of America

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