Abstract

The stress and loading rate on disks of SrAl2O4:Eu mixed epoxy resin were measured by a lifetime-based method. The concentration of the mechanoluminescence (ML) phosphor and the excitation power did not affect the measured lifetime. The lifetime was proportional to the stress and was inversely proportional to the loading rate. The concentration, the excitation power, the stress, and the loading rate affected the peak intensity of ML, while previous work estimated the stress using the absolute intensity under well-controlled excitation and concentration conditions. The method used here can shorten the measurement time and enhance the practicality of a ML phosphor.

© 2013 Optical Society of America

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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
  12. S. Someya, Y. Li, K. Ishii, and K. Okamoto, Exp. Fluids 50, 65 (2011).
    [CrossRef]

2012 (1)

V. K. Chandra and B. P. Chandra, J. Lumin. 132, 858 (2012).
[CrossRef]

2011 (3)

B. P. Chandra, V. D. Sonwane, B. K. Haldar, and S. Pandey, Opt. Mater. 33, 444 (2011).
[CrossRef]

D. Olawale, T. Dickens, W. Sullivan, O. Okoli, J. Sobanjo, and B. Wang, J. Lumin. 131, 1407 (2011).
[CrossRef]

S. Someya, Y. Li, K. Ishii, and K. Okamoto, Exp. Fluids 50, 65 (2011).
[CrossRef]

2010 (1)

C. Chang, W. Li, X. Huang, Z. Wang, X. Chen, X. Qian, R. Guo, Y. Ding, and D. Mao, J. Lumin. 130, 347 (2010).
[CrossRef]

2009 (1)

2007 (1)

F. Clabau, X. Rocquefelte, S. Jobic, P. Deniard, M. Whangbo, A. Garcia, and T. Mercier, Solid State Sci. 9, 608 (2007).
[CrossRef]

2006 (1)

Y. Jia, M. Yei, and W. Jia, Opt. Mater. 28, 974 (2006).
[CrossRef]

2004 (1)

C. Xu, H. Yamada, X. Wang, and X. Zheng, Appl. Phys. Lett. 84, 3040 (2004).
[CrossRef]

2002 (1)

K. Sohn, S. Seo, Y. Kwon, and H. Park, J. Am. Ceram. Soc. 85, 712 (2002).
[CrossRef]

1999 (1)

C. Xu, T. Watanabe, M. Akiyama, and X. Zheng, Appl. Phys. Lett. 74, 2414 (1999).
[CrossRef]

1996 (1)

T. Matsuzawa, Y. Aoki, N. Takeuchi, and Y. Murayama, J. Electrochem. Soc. 143, 2670 (1996).
[CrossRef]

Akiyama, M.

C. Xu, T. Watanabe, M. Akiyama, and X. Zheng, Appl. Phys. Lett. 74, 2414 (1999).
[CrossRef]

Aoki, Y.

T. Matsuzawa, Y. Aoki, N. Takeuchi, and Y. Murayama, J. Electrochem. Soc. 143, 2670 (1996).
[CrossRef]

Chandra, B. P.

V. K. Chandra and B. P. Chandra, J. Lumin. 132, 858 (2012).
[CrossRef]

B. P. Chandra, V. D. Sonwane, B. K. Haldar, and S. Pandey, Opt. Mater. 33, 444 (2011).
[CrossRef]

Chandra, V. K.

V. K. Chandra and B. P. Chandra, J. Lumin. 132, 858 (2012).
[CrossRef]

Chang, C.

C. Chang, W. Li, X. Huang, Z. Wang, X. Chen, X. Qian, R. Guo, Y. Ding, and D. Mao, J. Lumin. 130, 347 (2010).
[CrossRef]

Chen, X.

C. Chang, W. Li, X. Huang, Z. Wang, X. Chen, X. Qian, R. Guo, Y. Ding, and D. Mao, J. Lumin. 130, 347 (2010).
[CrossRef]

Clabau, F.

F. Clabau, X. Rocquefelte, S. Jobic, P. Deniard, M. Whangbo, A. Garcia, and T. Mercier, Solid State Sci. 9, 608 (2007).
[CrossRef]

Deniard, P.

F. Clabau, X. Rocquefelte, S. Jobic, P. Deniard, M. Whangbo, A. Garcia, and T. Mercier, Solid State Sci. 9, 608 (2007).
[CrossRef]

Dickens, T.

D. Olawale, T. Dickens, W. Sullivan, O. Okoli, J. Sobanjo, and B. Wang, J. Lumin. 131, 1407 (2011).
[CrossRef]

Ding, Y.

C. Chang, W. Li, X. Huang, Z. Wang, X. Chen, X. Qian, R. Guo, Y. Ding, and D. Mao, J. Lumin. 130, 347 (2010).
[CrossRef]

Garcia, A.

F. Clabau, X. Rocquefelte, S. Jobic, P. Deniard, M. Whangbo, A. Garcia, and T. Mercier, Solid State Sci. 9, 608 (2007).
[CrossRef]

Guo, R.

C. Chang, W. Li, X. Huang, Z. Wang, X. Chen, X. Qian, R. Guo, Y. Ding, and D. Mao, J. Lumin. 130, 347 (2010).
[CrossRef]

Haldar, B. K.

B. P. Chandra, V. D. Sonwane, B. K. Haldar, and S. Pandey, Opt. Mater. 33, 444 (2011).
[CrossRef]

Huang, X.

C. Chang, W. Li, X. Huang, Z. Wang, X. Chen, X. Qian, R. Guo, Y. Ding, and D. Mao, J. Lumin. 130, 347 (2010).
[CrossRef]

Ishii, K.

S. Someya, Y. Li, K. Ishii, and K. Okamoto, Exp. Fluids 50, 65 (2011).
[CrossRef]

Jia, W.

Y. Jia, M. Yei, and W. Jia, Opt. Mater. 28, 974 (2006).
[CrossRef]

Jia, Y.

Y. Jia, M. Yei, and W. Jia, Opt. Mater. 28, 974 (2006).
[CrossRef]

Jobic, S.

F. Clabau, X. Rocquefelte, S. Jobic, P. Deniard, M. Whangbo, A. Garcia, and T. Mercier, Solid State Sci. 9, 608 (2007).
[CrossRef]

Kibble, K.

Kim, J.

Kwon, Y.

J. Kim, K. Kibble, Y. Kwon, and K. Sohn, Opt. Lett. 34, 1915 (2009).
[CrossRef]

K. Sohn, S. Seo, Y. Kwon, and H. Park, J. Am. Ceram. Soc. 85, 712 (2002).
[CrossRef]

Li, W.

C. Chang, W. Li, X. Huang, Z. Wang, X. Chen, X. Qian, R. Guo, Y. Ding, and D. Mao, J. Lumin. 130, 347 (2010).
[CrossRef]

Li, Y.

S. Someya, Y. Li, K. Ishii, and K. Okamoto, Exp. Fluids 50, 65 (2011).
[CrossRef]

Mao, D.

C. Chang, W. Li, X. Huang, Z. Wang, X. Chen, X. Qian, R. Guo, Y. Ding, and D. Mao, J. Lumin. 130, 347 (2010).
[CrossRef]

Matsuzawa, T.

T. Matsuzawa, Y. Aoki, N. Takeuchi, and Y. Murayama, J. Electrochem. Soc. 143, 2670 (1996).
[CrossRef]

Mercier, T.

F. Clabau, X. Rocquefelte, S. Jobic, P. Deniard, M. Whangbo, A. Garcia, and T. Mercier, Solid State Sci. 9, 608 (2007).
[CrossRef]

Murayama, Y.

T. Matsuzawa, Y. Aoki, N. Takeuchi, and Y. Murayama, J. Electrochem. Soc. 143, 2670 (1996).
[CrossRef]

Okamoto, K.

S. Someya, Y. Li, K. Ishii, and K. Okamoto, Exp. Fluids 50, 65 (2011).
[CrossRef]

Okoli, O.

D. Olawale, T. Dickens, W. Sullivan, O. Okoli, J. Sobanjo, and B. Wang, J. Lumin. 131, 1407 (2011).
[CrossRef]

Olawale, D.

D. Olawale, T. Dickens, W. Sullivan, O. Okoli, J. Sobanjo, and B. Wang, J. Lumin. 131, 1407 (2011).
[CrossRef]

Pandey, S.

B. P. Chandra, V. D. Sonwane, B. K. Haldar, and S. Pandey, Opt. Mater. 33, 444 (2011).
[CrossRef]

Park, H.

K. Sohn, S. Seo, Y. Kwon, and H. Park, J. Am. Ceram. Soc. 85, 712 (2002).
[CrossRef]

Qian, X.

C. Chang, W. Li, X. Huang, Z. Wang, X. Chen, X. Qian, R. Guo, Y. Ding, and D. Mao, J. Lumin. 130, 347 (2010).
[CrossRef]

Rocquefelte, X.

F. Clabau, X. Rocquefelte, S. Jobic, P. Deniard, M. Whangbo, A. Garcia, and T. Mercier, Solid State Sci. 9, 608 (2007).
[CrossRef]

Seo, S.

K. Sohn, S. Seo, Y. Kwon, and H. Park, J. Am. Ceram. Soc. 85, 712 (2002).
[CrossRef]

Sobanjo, J.

D. Olawale, T. Dickens, W. Sullivan, O. Okoli, J. Sobanjo, and B. Wang, J. Lumin. 131, 1407 (2011).
[CrossRef]

Sohn, K.

J. Kim, K. Kibble, Y. Kwon, and K. Sohn, Opt. Lett. 34, 1915 (2009).
[CrossRef]

K. Sohn, S. Seo, Y. Kwon, and H. Park, J. Am. Ceram. Soc. 85, 712 (2002).
[CrossRef]

Someya, S.

S. Someya, Y. Li, K. Ishii, and K. Okamoto, Exp. Fluids 50, 65 (2011).
[CrossRef]

Sonwane, V. D.

B. P. Chandra, V. D. Sonwane, B. K. Haldar, and S. Pandey, Opt. Mater. 33, 444 (2011).
[CrossRef]

Sullivan, W.

D. Olawale, T. Dickens, W. Sullivan, O. Okoli, J. Sobanjo, and B. Wang, J. Lumin. 131, 1407 (2011).
[CrossRef]

Takeuchi, N.

T. Matsuzawa, Y. Aoki, N. Takeuchi, and Y. Murayama, J. Electrochem. Soc. 143, 2670 (1996).
[CrossRef]

Wang, B.

D. Olawale, T. Dickens, W. Sullivan, O. Okoli, J. Sobanjo, and B. Wang, J. Lumin. 131, 1407 (2011).
[CrossRef]

Wang, X.

C. Xu, H. Yamada, X. Wang, and X. Zheng, Appl. Phys. Lett. 84, 3040 (2004).
[CrossRef]

Wang, Z.

C. Chang, W. Li, X. Huang, Z. Wang, X. Chen, X. Qian, R. Guo, Y. Ding, and D. Mao, J. Lumin. 130, 347 (2010).
[CrossRef]

Watanabe, T.

C. Xu, T. Watanabe, M. Akiyama, and X. Zheng, Appl. Phys. Lett. 74, 2414 (1999).
[CrossRef]

Whangbo, M.

F. Clabau, X. Rocquefelte, S. Jobic, P. Deniard, M. Whangbo, A. Garcia, and T. Mercier, Solid State Sci. 9, 608 (2007).
[CrossRef]

Xu, C.

C. Xu, H. Yamada, X. Wang, and X. Zheng, Appl. Phys. Lett. 84, 3040 (2004).
[CrossRef]

C. Xu, T. Watanabe, M. Akiyama, and X. Zheng, Appl. Phys. Lett. 74, 2414 (1999).
[CrossRef]

Yamada, H.

C. Xu, H. Yamada, X. Wang, and X. Zheng, Appl. Phys. Lett. 84, 3040 (2004).
[CrossRef]

Yei, M.

Y. Jia, M. Yei, and W. Jia, Opt. Mater. 28, 974 (2006).
[CrossRef]

Zheng, X.

C. Xu, H. Yamada, X. Wang, and X. Zheng, Appl. Phys. Lett. 84, 3040 (2004).
[CrossRef]

C. Xu, T. Watanabe, M. Akiyama, and X. Zheng, Appl. Phys. Lett. 74, 2414 (1999).
[CrossRef]

Appl. Phys. Lett. (2)

C. Xu, T. Watanabe, M. Akiyama, and X. Zheng, Appl. Phys. Lett. 74, 2414 (1999).
[CrossRef]

C. Xu, H. Yamada, X. Wang, and X. Zheng, Appl. Phys. Lett. 84, 3040 (2004).
[CrossRef]

Exp. Fluids (1)

S. Someya, Y. Li, K. Ishii, and K. Okamoto, Exp. Fluids 50, 65 (2011).
[CrossRef]

J. Am. Ceram. Soc. (1)

K. Sohn, S. Seo, Y. Kwon, and H. Park, J. Am. Ceram. Soc. 85, 712 (2002).
[CrossRef]

J. Electrochem. Soc. (1)

T. Matsuzawa, Y. Aoki, N. Takeuchi, and Y. Murayama, J. Electrochem. Soc. 143, 2670 (1996).
[CrossRef]

J. Lumin. (3)

V. K. Chandra and B. P. Chandra, J. Lumin. 132, 858 (2012).
[CrossRef]

C. Chang, W. Li, X. Huang, Z. Wang, X. Chen, X. Qian, R. Guo, Y. Ding, and D. Mao, J. Lumin. 130, 347 (2010).
[CrossRef]

D. Olawale, T. Dickens, W. Sullivan, O. Okoli, J. Sobanjo, and B. Wang, J. Lumin. 131, 1407 (2011).
[CrossRef]

Opt. Lett. (1)

Opt. Mater. (2)

B. P. Chandra, V. D. Sonwane, B. K. Haldar, and S. Pandey, Opt. Mater. 33, 444 (2011).
[CrossRef]

Y. Jia, M. Yei, and W. Jia, Opt. Mater. 28, 974 (2006).
[CrossRef]

Solid State Sci. (1)

F. Clabau, X. Rocquefelte, S. Jobic, P. Deniard, M. Whangbo, A. Garcia, and T. Mercier, Solid State Sci. 9, 608 (2007).
[CrossRef]

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Figures (5)

Fig. 1.
Fig. 1.

Transient intensity of ML and applied load.

Fig. 2.
Fig. 2.

Relation between Nmax and Imax, τup and τdown.

Fig. 3.
Fig. 3.

Effects of dN/dt on Nmax and Imax, τup and τdown.

Fig. 4.
Fig. 4.

Imax, τup and τdown at various SAOE concentrations.

Fig. 5.
Fig. 5.

Imax, τup, and τdown at different excitation power values.

Equations (2)

Equations on this page are rendered with MathJax. Learn more.

I(t)=Aet/τ+C(τup:τ,τdown:τ).
τup,τdownNmax,1/(dN/dt).

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