Abstract

The optical properties of zinc (hydr)oxide and its porous composites with 2% and 5% graphite oxide (GO), thus forming ZnGO-2 and ZnGO-5, are investigated using reflectance spectroscopy and two-photon fluorescence (TPF) imaging. The bandgap energies for the Zn(OH)2, ZnGO-2, and ZnGO-5 samples are determined to be in the range between 2.88 and 3.60 eV. The size of light-emitting regions (from 4.5 to 45 μm) and pore size (from 20 to 255 μm) are measured using the TPF imaging technique.

© 2013 Optical Society of America

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2012

M. Seredych, O. Mabayoje, M. M. Kolesnik, V. Krstic, and T. J. Bandosz, J. Mater. Chem. 22, 7970 (2012).
[CrossRef]

2009

H. K. Jeong, M. H. Jin, K. P. So, S. C. Lim, and Y. H. Lee, J. Phys. D 42, 065148 (2009).
[CrossRef]

2008

J. T. Robinson, F. K. Perkins, E. S. Snow, Z. Wei, and P. E. Sheenhan, Nano Lett. 8, 3137 (2008).
[CrossRef]

2005

S. Venkataprasad Bhat and F. L. Deepak, Solid State Commun. 135, 345 (2005).
[CrossRef]

1998

1995

S. R. Johnson and T. Tiedje, J. Appl. Phys. 78, 5609 (1995).
[CrossRef]

1962

H. Ehrenreich, H. R. Philipp, and J. C. Phillips, Phys. Rev. Lett. 8, 59 (1962).
[CrossRef]

1958

W. S. Hummers and R. E. Offeman, J. Am. Chem. Soc. 80, 1339 (1958).
[CrossRef]

Bandosz, T. J.

M. Seredych, O. Mabayoje, M. M. Kolesnik, V. Krstic, and T. J. Bandosz, J. Mater. Chem. 22, 7970 (2012).
[CrossRef]

Bewersdorf, J.

Cardona, M.

P. Y. Yu and M. Cardona, Fundamentals of Semiconductors: Physics and Materials Properties, 4th ed. (Springer, 2010); fig 16.41 a/b on p. 306, and Table 6.3 on p. 258.

Deepak, F. L.

S. Venkataprasad Bhat and F. L. Deepak, Solid State Commun. 135, 345 (2005).
[CrossRef]

Ehrenreich, H.

H. Ehrenreich, H. R. Philipp, and J. C. Phillips, Phys. Rev. Lett. 8, 59 (1962).
[CrossRef]

Hell, S. W.

Hummers, W. S.

W. S. Hummers and R. E. Offeman, J. Am. Chem. Soc. 80, 1339 (1958).
[CrossRef]

Jeong, H. K.

H. K. Jeong, M. H. Jin, K. P. So, S. C. Lim, and Y. H. Lee, J. Phys. D 42, 065148 (2009).
[CrossRef]

Jin, M. H.

H. K. Jeong, M. H. Jin, K. P. So, S. C. Lim, and Y. H. Lee, J. Phys. D 42, 065148 (2009).
[CrossRef]

Johnson, S. R.

S. R. Johnson and T. Tiedje, J. Appl. Phys. 78, 5609 (1995).
[CrossRef]

Kolesnik, M. M.

M. Seredych, O. Mabayoje, M. M. Kolesnik, V. Krstic, and T. J. Bandosz, J. Mater. Chem. 22, 7970 (2012).
[CrossRef]

Krstic, V.

M. Seredych, O. Mabayoje, M. M. Kolesnik, V. Krstic, and T. J. Bandosz, J. Mater. Chem. 22, 7970 (2012).
[CrossRef]

Lee, Y. H.

H. K. Jeong, M. H. Jin, K. P. So, S. C. Lim, and Y. H. Lee, J. Phys. D 42, 065148 (2009).
[CrossRef]

Lim, S. C.

H. K. Jeong, M. H. Jin, K. P. So, S. C. Lim, and Y. H. Lee, J. Phys. D 42, 065148 (2009).
[CrossRef]

Mabayoje, O.

M. Seredych, O. Mabayoje, M. M. Kolesnik, V. Krstic, and T. J. Bandosz, J. Mater. Chem. 22, 7970 (2012).
[CrossRef]

Offeman, R. E.

W. S. Hummers and R. E. Offeman, J. Am. Chem. Soc. 80, 1339 (1958).
[CrossRef]

Perkins, F. K.

J. T. Robinson, F. K. Perkins, E. S. Snow, Z. Wei, and P. E. Sheenhan, Nano Lett. 8, 3137 (2008).
[CrossRef]

Philipp, H. R.

H. Ehrenreich, H. R. Philipp, and J. C. Phillips, Phys. Rev. Lett. 8, 59 (1962).
[CrossRef]

Phillips, J. C.

H. Ehrenreich, H. R. Philipp, and J. C. Phillips, Phys. Rev. Lett. 8, 59 (1962).
[CrossRef]

Rainer, P.

Robinson, J. T.

J. T. Robinson, F. K. Perkins, E. S. Snow, Z. Wei, and P. E. Sheenhan, Nano Lett. 8, 3137 (2008).
[CrossRef]

Seredych, M.

M. Seredych, O. Mabayoje, M. M. Kolesnik, V. Krstic, and T. J. Bandosz, J. Mater. Chem. 22, 7970 (2012).
[CrossRef]

Sheenhan, P. E.

J. T. Robinson, F. K. Perkins, E. S. Snow, Z. Wei, and P. E. Sheenhan, Nano Lett. 8, 3137 (2008).
[CrossRef]

Snow, E. S.

J. T. Robinson, F. K. Perkins, E. S. Snow, Z. Wei, and P. E. Sheenhan, Nano Lett. 8, 3137 (2008).
[CrossRef]

So, K. P.

H. K. Jeong, M. H. Jin, K. P. So, S. C. Lim, and Y. H. Lee, J. Phys. D 42, 065148 (2009).
[CrossRef]

Tiedje, T.

S. R. Johnson and T. Tiedje, J. Appl. Phys. 78, 5609 (1995).
[CrossRef]

Venkataprasad Bhat, S.

S. Venkataprasad Bhat and F. L. Deepak, Solid State Commun. 135, 345 (2005).
[CrossRef]

Wei, Z.

J. T. Robinson, F. K. Perkins, E. S. Snow, Z. Wei, and P. E. Sheenhan, Nano Lett. 8, 3137 (2008).
[CrossRef]

Yu, P. Y.

P. Y. Yu and M. Cardona, Fundamentals of Semiconductors: Physics and Materials Properties, 4th ed. (Springer, 2010); fig 16.41 a/b on p. 306, and Table 6.3 on p. 258.

J. Am. Chem. Soc.

W. S. Hummers and R. E. Offeman, J. Am. Chem. Soc. 80, 1339 (1958).
[CrossRef]

J. Appl. Phys.

S. R. Johnson and T. Tiedje, J. Appl. Phys. 78, 5609 (1995).
[CrossRef]

J. Mater. Chem.

M. Seredych, O. Mabayoje, M. M. Kolesnik, V. Krstic, and T. J. Bandosz, J. Mater. Chem. 22, 7970 (2012).
[CrossRef]

J. Phys. D

H. K. Jeong, M. H. Jin, K. P. So, S. C. Lim, and Y. H. Lee, J. Phys. D 42, 065148 (2009).
[CrossRef]

Nano Lett.

J. T. Robinson, F. K. Perkins, E. S. Snow, Z. Wei, and P. E. Sheenhan, Nano Lett. 8, 3137 (2008).
[CrossRef]

Opt. Lett.

Phys. Rev. Lett.

H. Ehrenreich, H. R. Philipp, and J. C. Phillips, Phys. Rev. Lett. 8, 59 (1962).
[CrossRef]

Solid State Commun.

S. Venkataprasad Bhat and F. L. Deepak, Solid State Commun. 135, 345 (2005).
[CrossRef]

Other

P. Y. Yu and M. Cardona, Fundamentals of Semiconductors: Physics and Materials Properties, 4th ed. (Springer, 2010); fig 16.41 a/b on p. 306, and Table 6.3 on p. 258.

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Figures (2)

Fig. 1.
Fig. 1.

Reflectance spectra and their derivatives were used for determining the critical point energies for different materials: (a) GaAs, (b) porous Zn(OH)2, (c) ZnGO-2, and (d) ZnGO-5. For clarity, two vertical lines that intersect the derivative curves at locations, identified as E0=Eg and E1, are shown in Figs. 1(b)–1(d).

Fig. 2.
Fig. 2.

TPF images showing voids and light-emitting regions: (a) A 2D image for Zn(OH)2 with the pore size ranging from 20 to 63 μm, (b) A 2D image for ZnGO-2 with the pore size ranging from 25 to 255 μm, and (c) A 2D image for ZnGO-5 with pore size ranging from 20 to 232 μm. A 3D image for each sample is shown in the insets on the upper-left corner of each figure. Upper-right corner of images show intensity bars of emitted regions of samples, where white color denotes region of maximum emitted light whereas light blue color denotes region of no light. The arrows shown in (a)–(c) show that the holes are almost hexagonal in shape.

Tables (1)

Tables Icon

Table 1. Critical Point Energies (eV) of a Few Materials

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