Abstract

The influence of γ-ray irradiation on the optical properties of Bi2O3-B2O3-SiO2 glass has been investigated. Broadband infrared (IR) emission at 1310 nm with a FWHM over 200 nm is observed in the γ-ray irradiated glass. The IR luminescence depends on the γ-ray irradiation dose and the concentration of Bi2O3. The thermal stability of the γ-ray irradiated IR luminescence center is studied, and the origin of the IR luminescence center has been suggested.

© 2013 Optical Society of America

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M. Peng, G. Dong, L. Wondraczek, L. Zhang, N. Zhang, and J. Qiu, J. Non-Cryst. Solids 357, 2241 (2011).
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B. I. Denker, B. I. Galagan, A. M. Musalitin, I. L. Shulman, S. E. Sverchkov, and E. M. Dianov, Laser Phys. 21, 746 (2011).
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B. Xu, D. Tan, M. Guan, Y. Teng, J. Zhou, J. Qiu, and Z. Hong, J. Electrochem. Soc. 158, G203 (2011).
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2010

2009

2008

J. Ren, J. Qiu, D. Chen, X. Hu, X. Jiang, and C. Zhu, J. Alloy. Compd. 463, L5 (2008).
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I. Razdobreev, L. Bigot, V. Pureur, A. Favre, G. Bouwmans, and M. Douay, Appl. Phys. Lett. 90, 031103 (2007).
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M. Peng, J. Qiu, D. Chen, X. Meng, and C. Zhu, Opt. Lett. 30, 2433 (2005).
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2004

2001

Y. Fujimoto and M. Nakatsuka, Jpn. J. Appl. Phys. 40, L279 (2001).
[CrossRef]

Akada, T.

Bigot, L.

I. Razdobreev, L. Bigot, V. Pureur, A. Favre, G. Bouwmans, and M. Douay, Appl. Phys. Lett. 90, 031103 (2007).
[CrossRef]

Bouwmans, G.

I. Razdobreev, L. Bigot, V. Pureur, A. Favre, G. Bouwmans, and M. Douay, Appl. Phys. Lett. 90, 031103 (2007).
[CrossRef]

Bufetov, I. A.

Bulatov, L. I.

Cao, R.

Chen, D.

J. Ren, J. Qiu, D. Chen, X. Hu, X. Jiang, and C. Zhu, J. Alloy. Compd. 463, L5 (2008).
[CrossRef]

X. Meng, M. Peng, D. Chen, L. Yang, X. Jiang, C. Zhu, and J. Qiu, Chin. Phys. Lett. 22, 615 (2005).
[CrossRef]

M. Peng, J. Qiu, D. Chen, X. Meng, and C. Zhu, Opt. Lett. 30, 2433 (2005).
[CrossRef]

M. Peng, J. Qiu, D. Chen, X. Meng, I. Yang, X. Jiang, and C. Zhu, Opt. Lett. 29, 1998 (2004).
[CrossRef]

Denker, B. I.

B. I. Denker, B. I. Galagan, A. M. Musalitin, I. L. Shulman, S. E. Sverchkov, and E. M. Dianov, Laser Phys. 21, 746 (2011).
[CrossRef]

Dianov, E. M.

Dong, G.

J. Zheng, M. Peng, F. Kang, R. Cao, Z. Ma, G. Dong, J. Qiu, and S. Xu, Opt. Express 20, 22569 (2012).
[CrossRef]

M. Peng, G. Dong, L. Wondraczek, L. Zhang, N. Zhang, and J. Qiu, J. Non-Cryst. Solids 357, 2241 (2011).
[CrossRef]

Douay, M.

I. Razdobreev, L. Bigot, V. Pureur, A. Favre, G. Bouwmans, and M. Douay, Appl. Phys. Lett. 90, 031103 (2007).
[CrossRef]

Dvoyrin, V. V.

Favre, A.

I. Razdobreev, L. Bigot, V. Pureur, A. Favre, G. Bouwmans, and M. Douay, Appl. Phys. Lett. 90, 031103 (2007).
[CrossRef]

Fujimoto, Y.

Y. Fujimoto and M. Nakatsuka, Jpn. J. Appl. Phys. 40, L279 (2001).
[CrossRef]

Galagan, B. I.

B. I. Denker, B. I. Galagan, A. M. Musalitin, I. L. Shulman, S. E. Sverchkov, and E. M. Dianov, Laser Phys. 21, 746 (2011).
[CrossRef]

Guan, M.

B. Xu, D. Tan, M. Guan, Y. Teng, J. Zhou, J. Qiu, and Z. Hong, J. Electrochem. Soc. 158, G203 (2011).
[CrossRef]

Guryanov, A. N.

Hewak, D. W.

Hong, Z.

B. Xu, D. Tan, M. Guan, Y. Teng, J. Zhou, J. Qiu, and Z. Hong, J. Electrochem. Soc. 158, G203 (2011).
[CrossRef]

Hu, X.

J. Ren, J. Qiu, D. Chen, X. Hu, X. Jiang, and C. Zhu, J. Alloy. Compd. 463, L5 (2008).
[CrossRef]

Hughes, M. A.

Jiang, X.

J. Ren, J. Qiu, D. Chen, X. Hu, X. Jiang, and C. Zhu, J. Alloy. Compd. 463, L5 (2008).
[CrossRef]

X. Meng, M. Peng, D. Chen, L. Yang, X. Jiang, C. Zhu, and J. Qiu, Chin. Phys. Lett. 22, 615 (2005).
[CrossRef]

M. Peng, J. Qiu, D. Chen, X. Meng, I. Yang, X. Jiang, and C. Zhu, Opt. Lett. 29, 1998 (2004).
[CrossRef]

Kang, F.

Khopin, V. F.

Kustov, E. F.

Li, H.

Lisiecki, R.

Ma, Z.

Mashinsky, V. M.

Melkumov, M. A.

Meng, X.

Musalitin, A. M.

B. I. Denker, B. I. Galagan, A. M. Musalitin, I. L. Shulman, S. E. Sverchkov, and E. M. Dianov, Laser Phys. 21, 746 (2011).
[CrossRef]

Nakatsuka, M.

Y. Fujimoto and M. Nakatsuka, Jpn. J. Appl. Phys. 40, L279 (2001).
[CrossRef]

Ohishi, Y.

Peng, M.

J. Zheng, M. Peng, F. Kang, R. Cao, Z. Ma, G. Dong, J. Qiu, and S. Xu, Opt. Express 20, 22569 (2012).
[CrossRef]

R. Cao, M. Peng, L. Wondraczek, and J. Qiu, Opt. Express 20, 2562 (2012).
[CrossRef]

M. Peng, G. Dong, L. Wondraczek, L. Zhang, N. Zhang, and J. Qiu, J. Non-Cryst. Solids 357, 2241 (2011).
[CrossRef]

M. Peng, Q. Zhao, J. Qiu, and L. Wondraczek, J. Am. Ceram. Soc. 92, 542 (2009).
[CrossRef]

X. Meng, M. Peng, D. Chen, L. Yang, X. Jiang, C. Zhu, and J. Qiu, Chin. Phys. Lett. 22, 615 (2005).
[CrossRef]

M. Peng, J. Qiu, D. Chen, X. Meng, and C. Zhu, Opt. Lett. 30, 2433 (2005).
[CrossRef]

M. Peng, J. Qiu, D. Chen, X. Meng, I. Yang, X. Jiang, and C. Zhu, Opt. Lett. 29, 1998 (2004).
[CrossRef]

Pureur, V.

I. Razdobreev, L. Bigot, V. Pureur, A. Favre, G. Bouwmans, and M. Douay, Appl. Phys. Lett. 90, 031103 (2007).
[CrossRef]

Qiu, J.

R. Cao, M. Peng, L. Wondraczek, and J. Qiu, Opt. Express 20, 2562 (2012).
[CrossRef]

J. Zheng, M. Peng, F. Kang, R. Cao, Z. Ma, G. Dong, J. Qiu, and S. Xu, Opt. Express 20, 22569 (2012).
[CrossRef]

M. Peng, G. Dong, L. Wondraczek, L. Zhang, N. Zhang, and J. Qiu, J. Non-Cryst. Solids 357, 2241 (2011).
[CrossRef]

B. Xu, D. Tan, M. Guan, Y. Teng, J. Zhou, J. Qiu, and Z. Hong, J. Electrochem. Soc. 158, G203 (2011).
[CrossRef]

M. Peng, Q. Zhao, J. Qiu, and L. Wondraczek, J. Am. Ceram. Soc. 92, 542 (2009).
[CrossRef]

J. Ren, J. Qiu, D. Chen, X. Hu, X. Jiang, and C. Zhu, J. Alloy. Compd. 463, L5 (2008).
[CrossRef]

X. Meng, M. Peng, D. Chen, L. Yang, X. Jiang, C. Zhu, and J. Qiu, Chin. Phys. Lett. 22, 615 (2005).
[CrossRef]

M. Peng, J. Qiu, D. Chen, X. Meng, and C. Zhu, Opt. Lett. 30, 2433 (2005).
[CrossRef]

M. Peng, J. Qiu, D. Chen, X. Meng, I. Yang, X. Jiang, and C. Zhu, Opt. Lett. 29, 1998 (2004).
[CrossRef]

Razdobreev, I.

I. Razdobreev, L. Bigot, V. Pureur, A. Favre, G. Bouwmans, and M. Douay, Appl. Phys. Lett. 90, 031103 (2007).
[CrossRef]

Ren, G.

Ren, J.

J. Ren, J. Qiu, D. Chen, X. Hu, X. Jiang, and C. Zhu, J. Alloy. Compd. 463, L5 (2008).
[CrossRef]

Ryba-Romanowski, W.

Shubin, A. V.

Shulman, I. L.

B. I. Denker, B. I. Galagan, A. M. Musalitin, I. L. Shulman, S. E. Sverchkov, and E. M. Dianov, Laser Phys. 21, 746 (2011).
[CrossRef]

Solarz, P.

Su, L.

Suzuki, T.

Sverchkov, S. E.

B. I. Denker, B. I. Galagan, A. M. Musalitin, I. L. Shulman, S. E. Sverchkov, and E. M. Dianov, Laser Phys. 21, 746 (2011).
[CrossRef]

Tan, D.

B. Xu, D. Tan, M. Guan, Y. Teng, J. Zhou, J. Qiu, and Z. Hong, J. Electrochem. Soc. 158, G203 (2011).
[CrossRef]

Tang, H.

Teng, Y.

B. Xu, D. Tan, M. Guan, Y. Teng, J. Zhou, J. Qiu, and Z. Hong, J. Electrochem. Soc. 158, G203 (2011).
[CrossRef]

Umnikov, A. A.

Wondraczek, L.

R. Cao, M. Peng, L. Wondraczek, and J. Qiu, Opt. Express 20, 2562 (2012).
[CrossRef]

M. Peng, G. Dong, L. Wondraczek, L. Zhang, N. Zhang, and J. Qiu, J. Non-Cryst. Solids 357, 2241 (2011).
[CrossRef]

M. Peng, Q. Zhao, J. Qiu, and L. Wondraczek, J. Am. Ceram. Soc. 92, 542 (2009).
[CrossRef]

Wu, F.

Xia, H.

Xu, B.

B. Xu, D. Tan, M. Guan, Y. Teng, J. Zhou, J. Qiu, and Z. Hong, J. Electrochem. Soc. 158, G203 (2011).
[CrossRef]

Xu, J.

Xu, S.

Yang, I.

Yang, L.

X. Meng, M. Peng, D. Chen, L. Yang, X. Jiang, C. Zhu, and J. Qiu, Chin. Phys. Lett. 22, 615 (2005).
[CrossRef]

Yang, Y.

Yashkov, M. V.

Yu, J.

Zhang, L.

M. Peng, G. Dong, L. Wondraczek, L. Zhang, N. Zhang, and J. Qiu, J. Non-Cryst. Solids 357, 2241 (2011).
[CrossRef]

Zhang, N.

M. Peng, G. Dong, L. Wondraczek, L. Zhang, N. Zhang, and J. Qiu, J. Non-Cryst. Solids 357, 2241 (2011).
[CrossRef]

Zhao, H.

Zhao, Q.

M. Peng, Q. Zhao, J. Qiu, and L. Wondraczek, J. Am. Ceram. Soc. 92, 542 (2009).
[CrossRef]

Zheng, J.

Zheng, L.

Zhou, J.

B. Xu, D. Tan, M. Guan, Y. Teng, J. Zhou, J. Qiu, and Z. Hong, J. Electrochem. Soc. 158, G203 (2011).
[CrossRef]

Zhou, P.

Zhu, C.

J. Ren, J. Qiu, D. Chen, X. Hu, X. Jiang, and C. Zhu, J. Alloy. Compd. 463, L5 (2008).
[CrossRef]

X. Meng, M. Peng, D. Chen, L. Yang, X. Jiang, C. Zhu, and J. Qiu, Chin. Phys. Lett. 22, 615 (2005).
[CrossRef]

M. Peng, J. Qiu, D. Chen, X. Meng, and C. Zhu, Opt. Lett. 30, 2433 (2005).
[CrossRef]

M. Peng, J. Qiu, D. Chen, X. Meng, I. Yang, X. Jiang, and C. Zhu, Opt. Lett. 29, 1998 (2004).
[CrossRef]

Appl. Phys. Lett.

I. Razdobreev, L. Bigot, V. Pureur, A. Favre, G. Bouwmans, and M. Douay, Appl. Phys. Lett. 90, 031103 (2007).
[CrossRef]

Chin. Phys. Lett.

X. Meng, M. Peng, D. Chen, L. Yang, X. Jiang, C. Zhu, and J. Qiu, Chin. Phys. Lett. 22, 615 (2005).
[CrossRef]

J. Alloy. Compd.

J. Ren, J. Qiu, D. Chen, X. Hu, X. Jiang, and C. Zhu, J. Alloy. Compd. 463, L5 (2008).
[CrossRef]

J. Am. Ceram. Soc.

M. Peng, Q. Zhao, J. Qiu, and L. Wondraczek, J. Am. Ceram. Soc. 92, 542 (2009).
[CrossRef]

J. Electrochem. Soc.

B. Xu, D. Tan, M. Guan, Y. Teng, J. Zhou, J. Qiu, and Z. Hong, J. Electrochem. Soc. 158, G203 (2011).
[CrossRef]

J. Non-Cryst. Solids

M. Peng, G. Dong, L. Wondraczek, L. Zhang, N. Zhang, and J. Qiu, J. Non-Cryst. Solids 357, 2241 (2011).
[CrossRef]

Jpn. J. Appl. Phys.

Y. Fujimoto and M. Nakatsuka, Jpn. J. Appl. Phys. 40, L279 (2001).
[CrossRef]

Laser Phys.

B. I. Denker, B. I. Galagan, A. M. Musalitin, I. L. Shulman, S. E. Sverchkov, and E. M. Dianov, Laser Phys. 21, 746 (2011).
[CrossRef]

Opt. Express

Opt. Lett.

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Figures (4)

Fig. 1.
Fig. 1.

(a) Emission spectra of the 50Bi2O3 glass before (as-prepared) and after γ-ray irradiation at different doses (indicated by the number) and (b) variations of the emission spectra of the 5 kGy γ-ray irradiated glasses of varying concentration of Bi2O3.

Fig. 2.
Fig. 2.

(a) Transmission spectra of the 50Bi2O3 glass before and after γ-ray irradiation at different doses, inset shows changes in the color of the samples; (b) difference transmission spectra (ΔT=TbeforeTafter, where Tbefore and Tafter are the transmissions before and after irradiation) of the 50Bi2O3 glass; (c) difference transmission spectra of the 5 kGy γ-ray irradiated samples of varying concentration of Bi2O3; and (d) variation of the 544 nm absorption band as a function of the concentration of Bi2O3.

Fig. 3.
Fig. 3.

Transmission spectra of the 15 kGy γ-ray irradiated and thermally annealed 50Bi2O3 sample. Inset: photos of the samples before and after the irradiation.

Fig. 4.
Fig. 4.

Raman spectra of the 50Bi2O3 sample before and after γ-ray irradiation. The spectra of the irradiated samples are lifted for clarity.

Tables (1)

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Table 1. Nominal Compositions of Glass Samples

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