Abstract

A modified effective index method (MEIM), which correctly describes, in a 2D case, both the phase and the group indexes in a 3D photonic wire waveguide, is introduced in the Letter. The MEIM utilizes the combined index profile with two spatial parameters. The central part with wire index has the width of nearly a wire height, and it is responsible for the group index. The basic part has the width of 3D wire and the smaller refractive index Nb. Numerical experiments by finite-difference time-domain method of Fabry–Perot and asymmetric Mach–Zehnder interferometers constructed by silicon wires prove that the MEIM gives an excellent agreement (about 2%) with test 3D simulation in comparison with an about 40% error for the effective index method.

© 2013 Optical Society of America

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References

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W. Bogaerts, P. De Heyn, T. Van Vaerenbergh, K. De Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. Van Thourhout, and R. Baets, Laser Photon. Rev. 6, 47 (2011).
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W. Bogaerts, P. De Heyn, T. Van Vaerenbergh, K. De Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. Van Thourhout, and R. Baets, Laser Photon. Rev. 6, 47 (2011).
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[CrossRef]

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Zdyrko, B.

Appl. Opt. (1)

IEEE Photonics Technol. Lett. (1)

S. Matsuo, Y. Yoshikuni, T. Segawa, Y. Ohiso, and H. Okamoto, IEEE Photonics Technol. Lett. 15, 1114 (2003).
[CrossRef]

IEEE Trans. Antennas Propag. (1)

K. S. Yee, IEEE Trans. Antennas Propag. AP-14, 302(1966).

J. Lightwave Technol. (1)

B. E. Little, S. T. Chu, H. A. Haus, J. Foresi, and J. P. Laine, J. Lightwave Technol. 15, 998 (1997).
[CrossRef]

Laser Photon. Rev. (1)

W. Bogaerts, P. De Heyn, T. Van Vaerenbergh, K. De Vos, S. Kumar Selvaraja, T. Claes, P. Dumon, P. Bienstman, D. Van Thourhout, and R. Baets, Laser Photon. Rev. 6, 47 (2011).
[CrossRef]

Opt. Express (5)

Opt. Lett. (2)

Opt. Quantum Electron. (1)

M. Gnan, G. Bellanca, H. M. H. Chong, P. Bassi, and R. M. De La Rue, Opt. Quantum Electron. 38, 133 (2006).
[CrossRef]

Other (2)

http://www.rsoftdesign.com .

A. Tsarev, in Proceedings of the 11th International Conference on Actual Problems of Electronic Instrument Engineering APEIE-2012 (Novosibirsk State Technical University, 2012), Vol. 1, pp. 147–151.

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Figures (5)

Fig. 1.
Fig. 1.

Refractive index distributions used in (a) 3D and (b) 2D simulations.

Fig. 2.
Fig. 2.

Wavelength dependence of the phase index for 3D and 2D waveguides.

Fig. 3.
Fig. 3.

Wavelength dependence of the group index for 3D and 2D waveguides.

Fig. 4.
Fig. 4.

General view of the asymmetric MZ interferometer used for MEIM simulations. Numbers indicate the power monitors (small green boxes), which are important for device study.

Fig. 5.
Fig. 5.

Wavelength dependence of the FSR of MZ and FP interferometers in 3D and 2D cases.

Tables (1)

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Table 1. Fitting Data for the MEIM on SOI (λ0=1.55μm)

Equations (1)

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S2=[Np(λ0,2D)Np(λ0,3D)]2+[Ng(λ0,2D)Ng(λ0,3D)]2.

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