Abstract

We demonstrate a novel interferometric characterization scheme that allows the complete reconstruction of two interfering electric fields. The phase profiles of both beams, and their relative phase, can be retrieved simultaneously as a function of any degree of freedom in which it is possible to shear one of the beams. The method has applications in wavefront sensing or ultrashort-pulse measurement, especially also in the domain of extreme light sources where it is difficult to generate a reference field or to replicate the beam in order to perform a self-referencing measurement. We demonstrate the technique experimentally by measuring simultaneously two ultrashort pulses in a single laser shot.

© 2013 Optical Society of America

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2010 (1)

2009 (3)

2007 (1)

2005 (1)

1998 (1)

1997 (1)

1982 (1)

1974 (1)

1973 (1)

C. Froehly, A. Lacourt, and J. C. Vienot, J. Opt. 4, 183 (1973).

Austin, D. R.

Bunk, O.

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, Ultramicroscopy 109, 338 (2009).
[CrossRef]

Clement, T. S.

Cohen, M.

Dierolf, M.

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, Ultramicroscopy 109, 338 (2009).
[CrossRef]

Froehly, C.

C. Froehly, A. Lacourt, and J. C. Vienot, J. Opt. 4, 183 (1973).

Gorza, S.-P.

Guérineau, N.

Iaconis, C.

Ina, H.

Kane, D. J.

Kobayashi, S.

Lacourt, A.

C. Froehly, A. Lacourt, and J. C. Vienot, J. Opt. 4, 183 (1973).

Menzel, A.

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, Ultramicroscopy 109, 338 (2009).
[CrossRef]

Pfeiffer, F.

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, Ultramicroscopy 109, 338 (2009).
[CrossRef]

Primot, J.

Rimmer, M. P.

Rodriguez, G.

Takeda, M.

Taylor, A. J.

Thibault, P.

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, Ultramicroscopy 109, 338 (2009).
[CrossRef]

Velghe, S.

Vienot, J. C.

C. Froehly, A. Lacourt, and J. C. Vienot, J. Opt. 4, 183 (1973).

Walmsley, I. A.

Wasylczyk, P.

Wattellier, B.

Witting, T.

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