Abstract

A fiber-tip high-temperature sensor based on multimode interference is demonstrated both theoretically and experimentally. The temperature sensor presented can measure a broad temperature interval ranging from room temperature to 1089°C. An average sensitivity of 11.4pm/°C is achieved experimentally.

© 2013 Optical Society of America

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  1. F. Xu, P. Horak, and G. Brambilla, Opt. Express 15, 7888 (2007).
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  4. L. Zhang, F. X. Gu, J. Y. Lou, X. F. Yin, and L. M. Tong, Opt. Express 16, 13349 (2008).
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  5. F. X. Gu, L. Zhang, X. F. Yin, and L. M. Tong, Nano Lett. 8, 2757 (2008).
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  6. P. Wang, M. Ding, G. Brambilla, Y. Semenova, Q. Wu, and G. Farrell, Electron. Lett. 48, 283 (2012).
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  7. J.-L. Kou, J. Feng, L. Ye, F. Xu, and Y.-Q. Lu, Opt. Express 18, 14245 (2010).
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  8. J.-L. Kou, S.-J. Qiu, F. Xu, and Y.-Q. Lu, Opt. Express 19, 18452 (2011).
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  9. J. Feng, M. Ding, J.-L. Kou, F. Xu, and Y. Q. Lu, IEEE Photon. J. 3, 810 (2011).
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  10. M. Ding, P. Wang, and G. Brambilla, IEEE Photon. Technol. Lett. 24, 1209 (2012).
    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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  14. P. Wang, G. Brambilla, M. Ding, T. Lee, L. Bo, Y. Semenova, Q. Wu, and G. Farrell, IEEE Sensors J. 13, 180 (2013).
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  15. P. Wang, G. Brambilla, M. Ding, Y. Semenova, Q. Wu, and G. Farrell, J. Opt. Soc. Am. B 28, 1180 (2011).
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2013 (1)

P. Wang, G. Brambilla, M. Ding, T. Lee, L. Bo, Y. Semenova, Q. Wu, and G. Farrell, IEEE Sensors J. 13, 180 (2013).
[CrossRef]

2012 (3)

M. Ding, P. Wang, and G. Brambilla, IEEE Photon. Technol. Lett. 24, 1209 (2012).
[CrossRef]

M. Ding, P. Wang, and G. Bramilla, Opt. Express 20, 5402 (2012).
[CrossRef]

P. Wang, M. Ding, G. Brambilla, Y. Semenova, Q. Wu, and G. Farrell, Electron. Lett. 48, 283 (2012).
[CrossRef]

2011 (5)

2010 (2)

2009 (1)

A. M. Hatta, G. Rajan, Y. Semenova, and G. Farrell, Electron. Lett. 45, 1069 (2009).
[CrossRef]

2008 (2)

L. Zhang, F. X. Gu, J. Y. Lou, X. F. Yin, and L. M. Tong, Opt. Express 16, 13349 (2008).
[CrossRef]

F. X. Gu, L. Zhang, X. F. Yin, and L. M. Tong, Nano Lett. 8, 2757 (2008).
[CrossRef]

2007 (1)

Barrera, D.

D. Barrera, V. Finazzi, J. Villatoro, S. Sales, and V. Pruneri, Proc. SPIE 7753, 775381 (2011).
[CrossRef]

Belal, M.

Bo, L.

P. Wang, G. Brambilla, M. Ding, T. Lee, L. Bo, Y. Semenova, Q. Wu, and G. Farrell, IEEE Sensors J. 13, 180 (2013).
[CrossRef]

Brambilla, G.

P. Wang, G. Brambilla, M. Ding, T. Lee, L. Bo, Y. Semenova, Q. Wu, and G. Farrell, IEEE Sensors J. 13, 180 (2013).
[CrossRef]

M. Ding, P. Wang, and G. Brambilla, IEEE Photon. Technol. Lett. 24, 1209 (2012).
[CrossRef]

P. Wang, M. Ding, G. Brambilla, Y. Semenova, Q. Wu, and G. Farrell, Electron. Lett. 48, 283 (2012).
[CrossRef]

P. Wang, G. Brambilla, M. Ding, Y. Semenova, Q. Wu, and G. Farrell, Opt. Lett. 36, 2233 (2011).
[CrossRef]

P. Wang, G. Brambilla, M. Ding, Y. Semenova, Q. Wu, and G. Farrell, J. Opt. Soc. Am. B 28, 1180 (2011).
[CrossRef]

M. Belal, Z. Song, Y. Jung, G. Brambilla, and T. Newson, Opt. Express 18, 19951 (2010).
[CrossRef]

F. Xu, P. Horak, and G. Brambilla, Opt. Express 15, 7888 (2007).
[CrossRef]

Bramilla, G.

Ding, M.

P. Wang, G. Brambilla, M. Ding, T. Lee, L. Bo, Y. Semenova, Q. Wu, and G. Farrell, IEEE Sensors J. 13, 180 (2013).
[CrossRef]

M. Ding, P. Wang, and G. Brambilla, IEEE Photon. Technol. Lett. 24, 1209 (2012).
[CrossRef]

M. Ding, P. Wang, and G. Bramilla, Opt. Express 20, 5402 (2012).
[CrossRef]

P. Wang, M. Ding, G. Brambilla, Y. Semenova, Q. Wu, and G. Farrell, Electron. Lett. 48, 283 (2012).
[CrossRef]

J. Feng, M. Ding, J.-L. Kou, F. Xu, and Y. Q. Lu, IEEE Photon. J. 3, 810 (2011).
[CrossRef]

P. Wang, G. Brambilla, M. Ding, Y. Semenova, Q. Wu, and G. Farrell, Opt. Lett. 36, 2233 (2011).
[CrossRef]

P. Wang, G. Brambilla, M. Ding, Y. Semenova, Q. Wu, and G. Farrell, J. Opt. Soc. Am. B 28, 1180 (2011).
[CrossRef]

Farrell, G.

P. Wang, G. Brambilla, M. Ding, T. Lee, L. Bo, Y. Semenova, Q. Wu, and G. Farrell, IEEE Sensors J. 13, 180 (2013).
[CrossRef]

P. Wang, M. Ding, G. Brambilla, Y. Semenova, Q. Wu, and G. Farrell, Electron. Lett. 48, 283 (2012).
[CrossRef]

P. Wang, G. Brambilla, M. Ding, Y. Semenova, Q. Wu, and G. Farrell, J. Opt. Soc. Am. B 28, 1180 (2011).
[CrossRef]

P. Wang, G. Brambilla, M. Ding, Y. Semenova, Q. Wu, and G. Farrell, Opt. Lett. 36, 2233 (2011).
[CrossRef]

A. M. Hatta, G. Rajan, Y. Semenova, and G. Farrell, Electron. Lett. 45, 1069 (2009).
[CrossRef]

Feng, J.

J. Feng, M. Ding, J.-L. Kou, F. Xu, and Y. Q. Lu, IEEE Photon. J. 3, 810 (2011).
[CrossRef]

J.-L. Kou, J. Feng, L. Ye, F. Xu, and Y.-Q. Lu, Opt. Express 18, 14245 (2010).
[CrossRef]

Finazzi, V.

D. Barrera, V. Finazzi, J. Villatoro, S. Sales, and V. Pruneri, Proc. SPIE 7753, 775381 (2011).
[CrossRef]

Gu, F. X.

L. Zhang, F. X. Gu, J. Y. Lou, X. F. Yin, and L. M. Tong, Opt. Express 16, 13349 (2008).
[CrossRef]

F. X. Gu, L. Zhang, X. F. Yin, and L. M. Tong, Nano Lett. 8, 2757 (2008).
[CrossRef]

Hatta, A. M.

A. M. Hatta, G. Rajan, Y. Semenova, and G. Farrell, Electron. Lett. 45, 1069 (2009).
[CrossRef]

Horak, P.

Jung, Y.

Kou, J.-L.

Lee, T.

P. Wang, G. Brambilla, M. Ding, T. Lee, L. Bo, Y. Semenova, Q. Wu, and G. Farrell, IEEE Sensors J. 13, 180 (2013).
[CrossRef]

Lou, J. Y.

Lu, Y. Q.

J. Feng, M. Ding, J.-L. Kou, F. Xu, and Y. Q. Lu, IEEE Photon. J. 3, 810 (2011).
[CrossRef]

Lu, Y.-Q.

Newson, T.

Pruneri, V.

D. Barrera, V. Finazzi, J. Villatoro, S. Sales, and V. Pruneri, Proc. SPIE 7753, 775381 (2011).
[CrossRef]

Qiu, S.-J.

Rajan, G.

A. M. Hatta, G. Rajan, Y. Semenova, and G. Farrell, Electron. Lett. 45, 1069 (2009).
[CrossRef]

Sales, S.

D. Barrera, V. Finazzi, J. Villatoro, S. Sales, and V. Pruneri, Proc. SPIE 7753, 775381 (2011).
[CrossRef]

Semenova, Y.

P. Wang, G. Brambilla, M. Ding, T. Lee, L. Bo, Y. Semenova, Q. Wu, and G. Farrell, IEEE Sensors J. 13, 180 (2013).
[CrossRef]

P. Wang, M. Ding, G. Brambilla, Y. Semenova, Q. Wu, and G. Farrell, Electron. Lett. 48, 283 (2012).
[CrossRef]

P. Wang, G. Brambilla, M. Ding, Y. Semenova, Q. Wu, and G. Farrell, J. Opt. Soc. Am. B 28, 1180 (2011).
[CrossRef]

P. Wang, G. Brambilla, M. Ding, Y. Semenova, Q. Wu, and G. Farrell, Opt. Lett. 36, 2233 (2011).
[CrossRef]

A. M. Hatta, G. Rajan, Y. Semenova, and G. Farrell, Electron. Lett. 45, 1069 (2009).
[CrossRef]

Song, Z.

Tong, L. M.

L. Zhang, F. X. Gu, J. Y. Lou, X. F. Yin, and L. M. Tong, Opt. Express 16, 13349 (2008).
[CrossRef]

F. X. Gu, L. Zhang, X. F. Yin, and L. M. Tong, Nano Lett. 8, 2757 (2008).
[CrossRef]

Villatoro, J.

D. Barrera, V. Finazzi, J. Villatoro, S. Sales, and V. Pruneri, Proc. SPIE 7753, 775381 (2011).
[CrossRef]

Wang, P.

P. Wang, G. Brambilla, M. Ding, T. Lee, L. Bo, Y. Semenova, Q. Wu, and G. Farrell, IEEE Sensors J. 13, 180 (2013).
[CrossRef]

M. Ding, P. Wang, and G. Brambilla, IEEE Photon. Technol. Lett. 24, 1209 (2012).
[CrossRef]

P. Wang, M. Ding, G. Brambilla, Y. Semenova, Q. Wu, and G. Farrell, Electron. Lett. 48, 283 (2012).
[CrossRef]

M. Ding, P. Wang, and G. Bramilla, Opt. Express 20, 5402 (2012).
[CrossRef]

P. Wang, G. Brambilla, M. Ding, Y. Semenova, Q. Wu, and G. Farrell, Opt. Lett. 36, 2233 (2011).
[CrossRef]

P. Wang, G. Brambilla, M. Ding, Y. Semenova, Q. Wu, and G. Farrell, J. Opt. Soc. Am. B 28, 1180 (2011).
[CrossRef]

Wu, Q.

P. Wang, G. Brambilla, M. Ding, T. Lee, L. Bo, Y. Semenova, Q. Wu, and G. Farrell, IEEE Sensors J. 13, 180 (2013).
[CrossRef]

P. Wang, M. Ding, G. Brambilla, Y. Semenova, Q. Wu, and G. Farrell, Electron. Lett. 48, 283 (2012).
[CrossRef]

P. Wang, G. Brambilla, M. Ding, Y. Semenova, Q. Wu, and G. Farrell, J. Opt. Soc. Am. B 28, 1180 (2011).
[CrossRef]

P. Wang, G. Brambilla, M. Ding, Y. Semenova, Q. Wu, and G. Farrell, Opt. Lett. 36, 2233 (2011).
[CrossRef]

Xu, F.

Ye, L.

Yin, X. F.

F. X. Gu, L. Zhang, X. F. Yin, and L. M. Tong, Nano Lett. 8, 2757 (2008).
[CrossRef]

L. Zhang, F. X. Gu, J. Y. Lou, X. F. Yin, and L. M. Tong, Opt. Express 16, 13349 (2008).
[CrossRef]

Zhang, L.

F. X. Gu, L. Zhang, X. F. Yin, and L. M. Tong, Nano Lett. 8, 2757 (2008).
[CrossRef]

L. Zhang, F. X. Gu, J. Y. Lou, X. F. Yin, and L. M. Tong, Opt. Express 16, 13349 (2008).
[CrossRef]

Electron. Lett. (2)

P. Wang, M. Ding, G. Brambilla, Y. Semenova, Q. Wu, and G. Farrell, Electron. Lett. 48, 283 (2012).
[CrossRef]

A. M. Hatta, G. Rajan, Y. Semenova, and G. Farrell, Electron. Lett. 45, 1069 (2009).
[CrossRef]

IEEE Photon. J. (1)

J. Feng, M. Ding, J.-L. Kou, F. Xu, and Y. Q. Lu, IEEE Photon. J. 3, 810 (2011).
[CrossRef]

IEEE Photon. Technol. Lett. (1)

M. Ding, P. Wang, and G. Brambilla, IEEE Photon. Technol. Lett. 24, 1209 (2012).
[CrossRef]

IEEE Sensors J. (1)

P. Wang, G. Brambilla, M. Ding, T. Lee, L. Bo, Y. Semenova, Q. Wu, and G. Farrell, IEEE Sensors J. 13, 180 (2013).
[CrossRef]

J. Opt. Soc. Am. B (1)

Nano Lett. (1)

F. X. Gu, L. Zhang, X. F. Yin, and L. M. Tong, Nano Lett. 8, 2757 (2008).
[CrossRef]

Opt. Express (6)

Opt. Lett. (1)

Proc. SPIE (1)

D. Barrera, V. Finazzi, J. Villatoro, S. Sales, and V. Pruneri, Proc. SPIE 7753, 775381 (2011).
[CrossRef]

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Figures (7)

Fig. 1.
Fig. 1.

Schematic of the proposed MMF half-taper sensor.

Fig. 2.
Fig. 2.

Reflectivity as a function of wavelength at 20°C, 500°C, and 1000°C.

Fig. 3.
Fig. 3.

Schematic of experimental setup for fabricating MMF tip.

Fig. 4.
Fig. 4.

Microscope image of the MMF tip.

Fig. 5.
Fig. 5.

Reflectivity of the fabricated MMF tip sample (blue line) and the calculated results using a WABPM.

Fig. 6.
Fig. 6.

Experimental setup for temperature measurement.

Fig. 7.
Fig. 7.

(a) Reflection spectra of the fiber temperature sensor at different temperatures. (b) Peak wavelength shift as a function of temperature. The blue squares represent the measured data from low to high temperature, the red circles the measured data from high to low; blue and red lines represent the linear fits, respectively.

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