Damage threshold influenced by the high absorption defect at the film–substrate interface under ultraviolet laser irradiation

Zhenkun Yu; Hongbo He; Wei Sun; Hongji Qi; Minghong Yang; Qiling Xiao; Meiping Zhu

doi:10.1364/OL.38.004308

Damage threshold influenced by the high absorption defect at the film–substrate interface under ultraviolet laser irradiation

Zhenkun Yu, Hongbo He, Wei Sun, Hongji Qi, Minghong Yang, Qiling Xiao, and Meiping Zhu

Optics Letters
Vol. 38,
Issue 21,
pp. 4308-4311
(2013)
•https://doi.org/10.1364/OL.38.004308

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Zhenkun Yu, Hongbo He, Wei Sun, Hongji Qi, Minghong Yang, Qiling Xiao, and Meiping Zhu, "Damage threshold influenced by the high absorption defect at the film–substrate interface under ultraviolet laser irradiation," Opt. Lett. 38, 4308-4311 (2013)

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Related Topics
Table of Contents Category
- Lasers and Laser Optics
Optics & Photonics Topics
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The topics in this list come from the OSA Optics and Photonics Topics applied to this article.
Previously assigned OCIS codes
- Laser damage (140.3330)
- UV, EUV, and X-ray lasers (140.7240)
- Defect-center materials (160.2220)
- Thin films, other properties (310.6870)

About this Article
History
- Original Manuscript: July 16, 2013
- Revised Manuscript: September 2, 2013
- Manuscript Accepted: September 17, 2013
- Published: October 18, 2013

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Abstract

The laser-induced damage threshold (LIDT) of a single-layer coating at the nanosecond (ns) regime is obviously lower than an uncoated substrate or a high reflectivity coating coated by the same material. To elucidate this phenomenon, we demonstrate the LIDT of three types of samples at 355 nm with 8 ns. High absorption defects are found at the film–substrate interface by comparing their LIDTs and damage morphologies. These defects originate from the substrate and appear during the coating process. Simulation results show that these defects, coupled to the coating, are mainly responsible for decreasing the damage threshold.

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Parameters	Defect Density $d ({mm}^{- 2})$	Center Threshold $I_{0} (J / {cm}^{2})$	Differential Value $Δ I$ ( $J / {cm}^{2}$ )
Substrate	1288	15.1	6.5
HR coating	867	6.45	0.009
Special coating	1173	2.78	0.007

Parameters	Thermal Capacity ( $J / (g \cdot K)$ )	Density ( $g / {cm}^{3}$ )	Thermal Conductivity ( $W / (cm \cdot K)$ )	Refractive Index	Melting Point (K)
${Ce O}_{2}$	0.369	7.6	0.02	$2 - 0.2 i$	2673
${A l}_{2} O_{3}$	0.777	3.98	0.58	1.69	2319

Parameters	Defect Density $d ({mm}^{- 2})$	Center Threshold $I_{0} (J / {cm}^{2})$	Differential Value $Δ I$ ( $J / {cm}^{2}$ )
Substrate	1288	15.1	6.5
HR coating	867	6.45	0.009
Special coating	1173	2.78	0.007

Parameters	Thermal Capacity ( $J / (g \cdot K)$ )	Density ( $g / {cm}^{3}$ )	Thermal Conductivity ( $W / (cm \cdot K)$ )	Refractive Index	Melting Point (K)
${Ce O}_{2}$	0.369	7.6	0.02	$2 - 0.2 i$	2673
${A l}_{2} O_{3}$	0.777	3.98	0.58	1.69	2319

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