Abstract

A polarization imaging device based on a femtosecond laser nanostructured birefringent array is demonstrated. The device enables instant measurement of the distribution of the Stokes vectors in the visible spectrum. Polarimetric measurements with radially and circularly polarized light distributions are demonstrated.

© 2013 Optical Society of America

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2013

2011

A. Pierangelo, A. Benali, M.-R. Antonelli, T. Novikova, P. Validire, B. Gayet, and A. De Martino, Opt. Express 19, 1582 (2011).
[CrossRef]

M. Fridman, E. Grinvald, A. Godel, M. Nixon, A. A. Friesem, and N. Davidson, Appl. Phys. Lett. 98, 141107 (2011).
[CrossRef]

M. Beresna, M. Gecevičius, and P. G. Kazansky, Opt. Mater. 1, 10117 (2011).

2008

M. Anastasiadou, A. De Martino, D. Clement, F. Liège, B. Laude-Boulesteix, N. Quang, J. Dreyfuss, B. Huynh, A. Nazac, L. Schwartz, and H. Cohen, Phys. Status Solidi C 5, 1423 (2008).
[CrossRef]

2006

2005

2004

2003

M. Shribak and R. Oldenbourg, Appl. Opt. 42, 3009 (2003).
[CrossRef]

Y. Shimotsuma, P. Kazansky, J. Qiu, and K. Hirao, Phys. Rev. Lett. 91, 247405 (2003).
[CrossRef]

2002

2001

Z. Bomzon, V. Kleiner, and E. Hasman, Appl. Phys. Lett. 79, 1587 (2001).
[CrossRef]

2000

1999

M. G. Ducros, J. F. De Boer, H. Huang, L. C. Chao, Z. Chen, J. S. Nelson, T. E. Milner, H. G. Rylander, and A. Member, IEEE J. Sel. Top. Quantum Electron. 5, 1159 (1999).

G. Yao and L. V. Wang, Opt. Lett. 24, 537 (1999).
[CrossRef]

1998

1997

1993

Anastasiadou, M.

M. Anastasiadou, A. De Martino, D. Clement, F. Liège, B. Laude-Boulesteix, N. Quang, J. Dreyfuss, B. Huynh, A. Nazac, L. Schwartz, and H. Cohen, Phys. Status Solidi C 5, 1423 (2008).
[CrossRef]

Antonelli, M.-R.

Bellouard, Y.

Benali, A.

Beresna, M.

M. Gecevičius, M. Beresna, J. Zhang, W. Yang, H. Takebe, and P. G. Kazansky, Opt. Express 21, 3959 (2013).
[CrossRef]

M. Beresna, M. Gecevičius, and P. G. Kazansky, Opt. Mater. 1, 10117 (2011).

Bomzon, Z.

Z. Bomzon, V. Kleiner, and E. Hasman, Appl. Phys. Lett. 79, 1587 (2001).
[CrossRef]

Brady, D.

Bricchi, E.

Cense, B.

Chao, L. C.

M. G. Ducros, J. F. De Boer, H. Huang, L. C. Chao, Z. Chen, J. S. Nelson, T. E. Milner, H. G. Rylander, and A. Member, IEEE J. Sel. Top. Quantum Electron. 5, 1159 (1999).

Chen, T. C.

Chen, Z.

M. G. Ducros, J. F. De Boer, H. Huang, L. C. Chao, Z. Chen, J. S. Nelson, T. E. Milner, H. G. Rylander, and A. Member, IEEE J. Sel. Top. Quantum Electron. 5, 1159 (1999).

Chenault, D. B.

Chun, C.

F. Sadjadi and C. Chun, Int. J. Infrared Millimeter Waves 19, 1541 (1998).

Clement, D.

M. Anastasiadou, A. De Martino, D. Clement, F. Liège, B. Laude-Boulesteix, N. Quang, J. Dreyfuss, B. Huynh, A. Nazac, L. Schwartz, and H. Cohen, Phys. Status Solidi C 5, 1423 (2008).
[CrossRef]

Cohen, H.

M. Anastasiadou, A. De Martino, D. Clement, F. Liège, B. Laude-Boulesteix, N. Quang, J. Dreyfuss, B. Huynh, A. Nazac, L. Schwartz, and H. Cohen, Phys. Status Solidi C 5, 1423 (2008).
[CrossRef]

Colston, B. W.

Da Silva, L. B.

Dainty, C.

Davidson, N.

M. Fridman, E. Grinvald, A. Godel, M. Nixon, A. A. Friesem, and N. Davidson, Appl. Phys. Lett. 98, 141107 (2011).
[CrossRef]

De Boer, J. F.

B. Cense, T. C. Chen, B. H. Park, M. C. Pierce, and J. F. De Boer, Opt. Lett. 27, 1610 (2002).

M. G. Ducros, J. F. De Boer, H. Huang, L. C. Chao, Z. Chen, J. S. Nelson, T. E. Milner, H. G. Rylander, and A. Member, IEEE J. Sel. Top. Quantum Electron. 5, 1159 (1999).

J. F. de Boer, T. E. Milner, M. J. van Gemert, and J. S. Nelson, Opt. Lett. 22, 934 (1997).
[CrossRef]

De Martino, A.

A. Pierangelo, A. Benali, M.-R. Antonelli, T. Novikova, P. Validire, B. Gayet, and A. De Martino, Opt. Express 19, 1582 (2011).
[CrossRef]

M. Anastasiadou, A. De Martino, D. Clement, F. Liège, B. Laude-Boulesteix, N. Quang, J. Dreyfuss, B. Huynh, A. Nazac, L. Schwartz, and H. Cohen, Phys. Status Solidi C 5, 1423 (2008).
[CrossRef]

Dreyfuss, J.

M. Anastasiadou, A. De Martino, D. Clement, F. Liège, B. Laude-Boulesteix, N. Quang, J. Dreyfuss, B. Huynh, A. Nazac, L. Schwartz, and H. Cohen, Phys. Status Solidi C 5, 1423 (2008).
[CrossRef]

Ducros, M. G.

M. G. Ducros, J. F. De Boer, H. Huang, L. C. Chao, Z. Chen, J. S. Nelson, T. E. Milner, H. G. Rylander, and A. Member, IEEE J. Sel. Top. Quantum Electron. 5, 1159 (1999).

Everett, M. J.

Fainman, Y.

Ford, J.

Fridman, M.

M. Fridman, E. Grinvald, A. Godel, M. Nixon, A. A. Friesem, and N. Davidson, Appl. Phys. Lett. 98, 141107 (2011).
[CrossRef]

Friesem, A. A.

M. Fridman, E. Grinvald, A. Godel, M. Nixon, A. A. Friesem, and N. Davidson, Appl. Phys. Lett. 98, 141107 (2011).
[CrossRef]

Gayet, B.

Gecevicius, M.

M. Gecevičius, M. Beresna, J. Zhang, W. Yang, H. Takebe, and P. G. Kazansky, Opt. Express 21, 3959 (2013).
[CrossRef]

M. Beresna, M. Gecevičius, and P. G. Kazansky, Opt. Mater. 1, 10117 (2011).

Godel, A.

M. Fridman, E. Grinvald, A. Godel, M. Nixon, A. A. Friesem, and N. Davidson, Appl. Phys. Lett. 98, 141107 (2011).
[CrossRef]

Goldstein, D. L.

Grinvald, E.

M. Fridman, E. Grinvald, A. Godel, M. Nixon, A. A. Friesem, and N. Davidson, Appl. Phys. Lett. 98, 141107 (2011).
[CrossRef]

Guo, J.

Hasman, E.

Z. Bomzon, V. Kleiner, and E. Hasman, Appl. Phys. Lett. 79, 1587 (2001).
[CrossRef]

Hirao, K.

Y. Shimotsuma, P. Kazansky, J. Qiu, and K. Hirao, Phys. Rev. Lett. 91, 247405 (2003).
[CrossRef]

Huang, H.

M. G. Ducros, J. F. De Boer, H. Huang, L. C. Chao, Z. Chen, J. S. Nelson, T. E. Milner, H. G. Rylander, and A. Member, IEEE J. Sel. Top. Quantum Electron. 5, 1159 (1999).

Huynh, B.

M. Anastasiadou, A. De Martino, D. Clement, F. Liège, B. Laude-Boulesteix, N. Quang, J. Dreyfuss, B. Huynh, A. Nazac, L. Schwartz, and H. Cohen, Phys. Status Solidi C 5, 1423 (2008).
[CrossRef]

Kazansky, P.

Y. Shimotsuma, P. Kazansky, J. Qiu, and K. Hirao, Phys. Rev. Lett. 91, 247405 (2003).
[CrossRef]

Kazansky, P. G.

Klappauf, B. G.

Kleiner, V.

Z. Bomzon, V. Kleiner, and E. Hasman, Appl. Phys. Lett. 79, 1587 (2001).
[CrossRef]

Lara, D.

Laude-Boulesteix, B.

M. Anastasiadou, A. De Martino, D. Clement, F. Liège, B. Laude-Boulesteix, N. Quang, J. Dreyfuss, B. Huynh, A. Nazac, L. Schwartz, and H. Cohen, Phys. Status Solidi C 5, 1423 (2008).
[CrossRef]

Liège, F.

M. Anastasiadou, A. De Martino, D. Clement, F. Liège, B. Laude-Boulesteix, N. Quang, J. Dreyfuss, B. Huynh, A. Nazac, L. Schwartz, and H. Cohen, Phys. Status Solidi C 5, 1423 (2008).
[CrossRef]

Maitland, D. J.

Member, A.

M. G. Ducros, J. F. De Boer, H. Huang, L. C. Chao, Z. Chen, J. S. Nelson, T. E. Milner, H. G. Rylander, and A. Member, IEEE J. Sel. Top. Quantum Electron. 5, 1159 (1999).

Milner, T. E.

M. G. Ducros, J. F. De Boer, H. Huang, L. C. Chao, Z. Chen, J. S. Nelson, T. E. Milner, H. G. Rylander, and A. Member, IEEE J. Sel. Top. Quantum Electron. 5, 1159 (1999).

J. F. de Boer, T. E. Milner, M. J. van Gemert, and J. S. Nelson, Opt. Lett. 22, 934 (1997).
[CrossRef]

Nazac, A.

M. Anastasiadou, A. De Martino, D. Clement, F. Liège, B. Laude-Boulesteix, N. Quang, J. Dreyfuss, B. Huynh, A. Nazac, L. Schwartz, and H. Cohen, Phys. Status Solidi C 5, 1423 (2008).
[CrossRef]

Nelson, J. S.

M. G. Ducros, J. F. De Boer, H. Huang, L. C. Chao, Z. Chen, J. S. Nelson, T. E. Milner, H. G. Rylander, and A. Member, IEEE J. Sel. Top. Quantum Electron. 5, 1159 (1999).

J. F. de Boer, T. E. Milner, M. J. van Gemert, and J. S. Nelson, Opt. Lett. 22, 934 (1997).
[CrossRef]

Nixon, M.

M. Fridman, E. Grinvald, A. Godel, M. Nixon, A. A. Friesem, and N. Davidson, Appl. Phys. Lett. 98, 141107 (2011).
[CrossRef]

Novikova, T.

Oldenbourg, R.

Park, B. H.

Pierangelo, A.

Pierce, M. C.

Qiu, J.

Y. Shimotsuma, P. Kazansky, J. Qiu, and K. Hirao, Phys. Rev. Lett. 91, 247405 (2003).
[CrossRef]

Quang, N.

M. Anastasiadou, A. De Martino, D. Clement, F. Liège, B. Laude-Boulesteix, N. Quang, J. Dreyfuss, B. Huynh, A. Nazac, L. Schwartz, and H. Cohen, Phys. Status Solidi C 5, 1423 (2008).
[CrossRef]

Rylander, H. G.

M. G. Ducros, J. F. De Boer, H. Huang, L. C. Chao, Z. Chen, J. S. Nelson, T. E. Milner, H. G. Rylander, and A. Member, IEEE J. Sel. Top. Quantum Electron. 5, 1159 (1999).

Sadjadi, F.

F. Sadjadi and C. Chun, Int. J. Infrared Millimeter Waves 19, 1541 (1998).

Schaap, A.

Schoenenberger, K.

Schwartz, L.

M. Anastasiadou, A. De Martino, D. Clement, F. Liège, B. Laude-Boulesteix, N. Quang, J. Dreyfuss, B. Huynh, A. Nazac, L. Schwartz, and H. Cohen, Phys. Status Solidi C 5, 1423 (2008).
[CrossRef]

Shaw, J. A.

Shimotsuma, Y.

Y. Shimotsuma, P. Kazansky, J. Qiu, and K. Hirao, Phys. Rev. Lett. 91, 247405 (2003).
[CrossRef]

Shribak, M.

Takebe, H.

Tyo, J. S.

Urquhart, K.

Validire, P.

van Gemert, M. J.

Wang, L. V.

Xu, F.

Yang, W.

Yao, G.

Zhang, J.

Appl. Opt.

Appl. Phys. Lett.

M. Fridman, E. Grinvald, A. Godel, M. Nixon, A. A. Friesem, and N. Davidson, Appl. Phys. Lett. 98, 141107 (2011).
[CrossRef]

Z. Bomzon, V. Kleiner, and E. Hasman, Appl. Phys. Lett. 79, 1587 (2001).
[CrossRef]

IEEE J. Sel. Top. Quantum Electron.

M. G. Ducros, J. F. De Boer, H. Huang, L. C. Chao, Z. Chen, J. S. Nelson, T. E. Milner, H. G. Rylander, and A. Member, IEEE J. Sel. Top. Quantum Electron. 5, 1159 (1999).

Int. J. Infrared Millimeter Waves

F. Sadjadi and C. Chun, Int. J. Infrared Millimeter Waves 19, 1541 (1998).

Opt. Express

Opt. Lett.

Opt. Mater.

M. Beresna, M. Gecevičius, and P. G. Kazansky, Opt. Mater. 1, 10117 (2011).

Opt. Mater. Express

Phys. Rev. Lett.

Y. Shimotsuma, P. Kazansky, J. Qiu, and K. Hirao, Phys. Rev. Lett. 91, 247405 (2003).
[CrossRef]

Phys. Status Solidi C

M. Anastasiadou, A. De Martino, D. Clement, F. Liège, B. Laude-Boulesteix, N. Quang, J. Dreyfuss, B. Huynh, A. Nazac, L. Schwartz, and H. Cohen, Phys. Status Solidi C 5, 1423 (2008).
[CrossRef]

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Figures (5)

Fig. 1.
Fig. 1.

Basic schematic of the polarimetric camera. Before the light reaches a CCD matrix it propagates through a microwaveplate array and a linear polarizer.

Fig. 2.
Fig. 2.

(Left) Schematic of one segment in the birefringent mask. The lines indicate direction of the imprinted nanogratings. (Right) Birefringent mask imaged in cross-polarizers (1mm×1mm). The inset shows a zoomed segment of the mask.

Fig. 3.
Fig. 3.

Retardance dependence on the laser pulse energy when written at different polarization orientations with respect to the writing direction.

Fig. 4.
Fig. 4.

(a)–(f) Measurement of the polarization distribution in the radially polarized beam. (g)–(i) Transition of the circularly polarized light near the edge of the S-waveplate. (a) Image of the birefringent mask illuminated with the radially polarized light. (b)–(e) Distribution of the calculated Stokes parameters (S0, S1, S2, and S3). (f) Orientation of the linear polarization. (g) Image of the birefringent mask when it is illuminated with the circularly polarized light. (h) and (i) Distribution of the calculated Stokes parameters (S1 and S3).

Fig. 5.
Fig. 5.

Measurement of the radially polarized light and the high-order cylindrical vector (CV) beam with the high resolution waveplate mask. (a) and (b) Image of the mask while illuminated with the high order CV beam. (c) and (d) Measured polarization distribution of the radially polarized light and the high-order CV beam.

Equations (10)

Equations on this page are rendered with MathJax. Learn more.

S0=I0+I90,
S1=I0I90,
S2=I45I45,
S3=IlIr,
I=Ia+Ib.
S1=IaIbI.
S2=2·IcII,
S3=2·IdII.
P=S1+S2+S3,
θ=12arg(S1+iS2).

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