Abstract

The change in phase of the free space terahertz (THz) electric field as a sample of material introduced into the THz beampath of a CW THz system is measured and used to calculate the index of refraction of materials at 250 GHz.

© 2013 Optical Society of America

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2013

S. Hisatake, G. Kitahara, K. Ajito, Y. Fukada, N. Yoshimoto, and T. Nagatsuma, IEEE Sens. J. 13, 31 (2013).
[CrossRef]

2012

2008

2005

N. Trappe, J. A. Murphy, S. Withington, and W. Jellema, IEEE Trans. Antennas Propag. 53, 1755 (2005).
[CrossRef]

2001

S. Krishnamurthy, M. T. Reiten, S. A. Harmon, and R. A. Cheville, Appl. Phys. Lett. 79, 875 (2001).
[CrossRef]

1996

1995

M. Feldman and S. Braun, Proc. SPIE 2460, 637 (1995).

1992

B. Boashash, Proc. IEEE 80, 520 (1992).
[CrossRef]

Ajito, K.

S. Hisatake, G. Kitahara, K. Ajito, Y. Fukada, N. Yoshimoto, and T. Nagatsuma, IEEE Sens. J. 13, 31 (2013).
[CrossRef]

Barat, R. B.

Boashash, B.

B. Boashash, Proc. IEEE 80, 520 (1992).
[CrossRef]

Boreman, G.

W. R. Folks, S. K. Pandey, and G. Boreman, in Optical Terahertz Science and Technology, OSA Technical Digest Series (CD) (Optical Society of America, 2007), paper MD10.

Braun, S.

M. Feldman and S. Braun, Proc. SPIE 2460, 637 (1995).

Cheville, R. A.

S. Krishnamurthy, M. T. Reiten, S. A. Harmon, and R. A. Cheville, Appl. Phys. Lett. 79, 875 (2001).
[CrossRef]

Cordes, A. H.

D. H. Thomas, A. H. Cordes, and J. P. von der Weid, in Microwave Optoelectronics Conference (IMOC), SBMO/IEEE MTT-S International (IEEE, 2013).

Deninger, A.

Federici, J. F.

Feldman, M.

M. Feldman and S. Braun, Proc. SPIE 2460, 637 (1995).

Folks, W. R.

W. R. Folks, S. K. Pandey, and G. Boreman, in Optical Terahertz Science and Technology, OSA Technical Digest Series (CD) (Optical Society of America, 2007), paper MD10.

Fukada, Y.

S. Hisatake, G. Kitahara, K. Ajito, Y. Fukada, N. Yoshimoto, and T. Nagatsuma, IEEE Sens. J. 13, 31 (2013).
[CrossRef]

Gary, D. E.

Gente, R.

R. Gente, B. Scherger, and M. Koch, in 37th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) (IEEE, 2012), pp. 1–2.

Grüninger, M.

Güsten, R.

Han, S.-P.

Harmon, S. A.

S. Krishnamurthy, M. T. Reiten, S. A. Harmon, and R. A. Cheville, Appl. Phys. Lett. 79, 875 (2001).
[CrossRef]

Hattori, T.

T. Hattori, H. Kumon, and H. Tamazumi, in 35th International Conference on Infrared Millimeter and Terahertz Waves (IRMMW-THz) (IEEE, 2010), pp. 1–2.

Hemberger, J.

Hisatake, S.

S. Hisatake, G. Kitahara, K. Ajito, Y. Fukada, N. Yoshimoto, and T. Nagatsuma, IEEE Sens. J. 13, 31 (2013).
[CrossRef]

Hor, Y. L.

Jacobsen, R. H.

Jellema, W.

N. Trappe, J. A. Murphy, S. Withington, and W. Jellema, IEEE Trans. Antennas Propag. 53, 1755 (2005).
[CrossRef]

Jepsen, P. U.

Johansson, M.

M. Johansson, “The Hilbert Transform,” Master Thesis (Vaxjo University, 1999).

Keiding, S. R.

Kim, N.

Kitahara, G.

S. Hisatake, G. Kitahara, K. Ajito, Y. Fukada, N. Yoshimoto, and T. Nagatsuma, IEEE Sens. J. 13, 31 (2013).
[CrossRef]

Ko, H.

Koch, M.

R. Gente, B. Scherger, and M. Koch, in 37th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) (IEEE, 2012), pp. 1–2.

Krishnamurthy, S.

S. Krishnamurthy, M. T. Reiten, S. A. Harmon, and R. A. Cheville, Appl. Phys. Lett. 79, 875 (2001).
[CrossRef]

Kumon, H.

T. Hattori, H. Kumon, and H. Tamazumi, in 35th International Conference on Infrared Millimeter and Terahertz Waves (IRMMW-THz) (IEEE, 2010), pp. 1–2.

Liu, Z.

Marx, J.

Mayorga, I. C.

Michalopoulou, Z.-H.

Moon, K.

Murphy, J. A.

N. Trappe, J. A. Murphy, S. Withington, and W. Jellema, IEEE Trans. Antennas Propag. 53, 1755 (2005).
[CrossRef]

Nagatsuma, T.

S. Hisatake, G. Kitahara, K. Ajito, Y. Fukada, N. Yoshimoto, and T. Nagatsuma, IEEE Sens. J. 13, 31 (2013).
[CrossRef]

Pandey, S. K.

W. R. Folks, S. K. Pandey, and G. Boreman, in Optical Terahertz Science and Technology, OSA Technical Digest Series (CD) (Optical Society of America, 2007), paper MD10.

Park, J.-W.

Park, K. H.

Reiten, M. T.

S. Krishnamurthy, M. T. Reiten, S. A. Harmon, and R. A. Cheville, Appl. Phys. Lett. 79, 875 (2001).
[CrossRef]

Roggenbuck, A.

Ryu, H.-C.

Scherger, B.

R. Gente, B. Scherger, and M. Koch, in 37th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) (IEEE, 2012), pp. 1–2.

Schmitz, H.

Sinyukov, A. M.

Su, K.

Tamazumi, H.

T. Hattori, H. Kumon, and H. Tamazumi, in 35th International Conference on Infrared Millimeter and Terahertz Waves (IRMMW-THz) (IEEE, 2010), pp. 1–2.

Thirunavukkuarasu, K.

Thomas, D. H.

D. H. Thomas, A. H. Cordes, and J. P. von der Weid, in Microwave Optoelectronics Conference (IMOC), SBMO/IEEE MTT-S International (IEEE, 2013).

Trappe, N.

N. Trappe, J. A. Murphy, S. Withington, and W. Jellema, IEEE Trans. Antennas Propag. 53, 1755 (2005).
[CrossRef]

von der Weid, J. P.

D. H. Thomas, A. H. Cordes, and J. P. von der Weid, in Microwave Optoelectronics Conference (IMOC), SBMO/IEEE MTT-S International (IEEE, 2013).

Withington, S.

N. Trappe, J. A. Murphy, S. Withington, and W. Jellema, IEEE Trans. Antennas Propag. 53, 1755 (2005).
[CrossRef]

Yoshimoto, N.

S. Hisatake, G. Kitahara, K. Ajito, Y. Fukada, N. Yoshimoto, and T. Nagatsuma, IEEE Sens. J. 13, 31 (2013).
[CrossRef]

Zimdars, D.

Zorych, I.

Appl. Phys. Lett.

S. Krishnamurthy, M. T. Reiten, S. A. Harmon, and R. A. Cheville, Appl. Phys. Lett. 79, 875 (2001).
[CrossRef]

IEEE Sens. J.

S. Hisatake, G. Kitahara, K. Ajito, Y. Fukada, N. Yoshimoto, and T. Nagatsuma, IEEE Sens. J. 13, 31 (2013).
[CrossRef]

IEEE Trans. Antennas Propag.

N. Trappe, J. A. Murphy, S. Withington, and W. Jellema, IEEE Trans. Antennas Propag. 53, 1755 (2005).
[CrossRef]

J. Opt. Soc. Am. B

Opt. Express

Opt. Lett.

Proc. IEEE

B. Boashash, Proc. IEEE 80, 520 (1992).
[CrossRef]

Proc. SPIE

M. Feldman and S. Braun, Proc. SPIE 2460, 637 (1995).

Other

M. Johansson, “The Hilbert Transform,” Master Thesis (Vaxjo University, 1999).

R. Gente, B. Scherger, and M. Koch, in 37th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) (IEEE, 2012), pp. 1–2.

D. H. Thomas, A. H. Cordes, and J. P. von der Weid, in Microwave Optoelectronics Conference (IMOC), SBMO/IEEE MTT-S International (IEEE, 2013).

T. Hattori, H. Kumon, and H. Tamazumi, in 35th International Conference on Infrared Millimeter and Terahertz Waves (IRMMW-THz) (IEEE, 2010), pp. 1–2.

W. R. Folks, S. K. Pandey, and G. Boreman, in Optical Terahertz Science and Technology, OSA Technical Digest Series (CD) (Optical Society of America, 2007), paper MD10.

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Figures (4)

Fig. 1.
Fig. 1.

CW THz setup.

Fig. 2.
Fig. 2.

Full scan of the THz field, showing the effect of material insertion at the midpoint.

Fig. 3.
Fig. 3.

Phase as determined by the Hilbert transform. The black line is the phase across the full separation. Hollow symbols are the best fit to the free space only data. Bold symbols are the best fit after the material is inserted.

Fig. 4.
Fig. 4.

Phase delay at 0.25 THz versus material thickness for two types of material tested. Solid triangles are for 3M PP2200 140g/m2 transparency for photocopiers. Hollow circles are Filipaper FP02500 120g/m2 Lasermatte paper. Solid lines are best linear fits.

Tables (1)

Tables Icon

Table 1. Measured Densities and Refractive Indices

Equations (7)

Equations on this page are rendered with MathJax. Learn more.

s(x)=S1cos(kTHzLTHz+φ0),
s(x)=noddSncos(kTHznLTHz+φ0).
Δφ=kTHz(nmat1)Lmat.
Δφ2πνTHz=(nmat1)clmat.
S(x)=s(x)+js˜(x).
φ(x)=arctan(s˜(x)s(x)).
nmat=c*slope+1.

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