Abstract

The authors present an energy-efficient integral imaging system with suppression of pseudo images, which are caused by a leakage of rays from each elemental image to the adjacent elemental lenses. The leakage of rays can be decreased when the lens is paired with a segmented backlight with limited aperture, which consumes less electricity. To remove the leakage of rays completely without damaging the image to be presented, three modifications are implemented. First, a lens with a larger focal distance is used to decrease aberration. Second, a lens array composed of thick elemental lenses is used so that the leakage of rays can be blocked by the rough surface on the side of the thick lens. Third, the aperture of the segmented backlight is expanded to avoid loss of light in the right image.

© 2013 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. G. Lippmann, C. R. Acad. Sci. 146, 446 (1908).
  2. H. Kakeya, Proc. SPIE 6803, 680317 (2008).
    [CrossRef]
  3. B. Lee, S. Jung, S.-W. Min, and J.-H. Park, Opt. Lett. 26, 1481 (2001).
    [CrossRef]
  4. J.-H. Park, S. Jung, H. Choi, and B. Lee, Opt. Express 11, 1862 (2003).
    [CrossRef]
  5. S.-W. Min, B. Javidi, and B. Lee, Appl. Opt. 42, 4186 (2003).
    [CrossRef]
  6. Y. Kim, J.-H. Park, H. Choi, J. Kim, S.-W. Cho, and B. Lee, Appl. Opt. 45, 4334 (2006).
    [CrossRef]
  7. Y. Kim, H. Choi, J. Kim, S.-W. Cho, Y. Kim, G. Park, and B. Lee, Appl. Opt. 46, 3766 (2007).
    [CrossRef]
  8. H. Kakeya, Proc. SPIE 7237, 723726 (2009).
    [CrossRef]
  9. H. Kodaira, A. Nakao, Y. Mano, and H. Kakeya, Proc. 3DSA2010, 205 (2010).
  10. S. Sawada and H. Kakeya, J. Electron. Imaging 21, 011004 (2012).
    [CrossRef]
  11. H. Kakeya, S. Sawada, Y. Ueda, and T. Kurokawa, Opt. Express 20, 1963 (2012).
    [CrossRef]
  12. S. Sawada and H. Kakeya, Opt. Express 20, 25902 (2012).
    [CrossRef]
  13. H. Kakeya, T. Kurokawa, and Y. Mano, Proc. SPIE 7524, 752411 (2010).
    [CrossRef]
  14. H. Kakeya, Opt. Express 19, 20395 (2011).
    [CrossRef]
  15. Y. Ueda and H. Kakeya, SID Int. Symp. Digest Tech. Papers 42, 1116 (2011).
    [CrossRef]
  16. T. Kurokawa and H. Kakeya, Proc. SPIE 7863, 78631M (2011).
    [CrossRef]

2012 (3)

2011 (3)

H. Kakeya, Opt. Express 19, 20395 (2011).
[CrossRef]

Y. Ueda and H. Kakeya, SID Int. Symp. Digest Tech. Papers 42, 1116 (2011).
[CrossRef]

T. Kurokawa and H. Kakeya, Proc. SPIE 7863, 78631M (2011).
[CrossRef]

2010 (1)

H. Kakeya, T. Kurokawa, and Y. Mano, Proc. SPIE 7524, 752411 (2010).
[CrossRef]

2009 (1)

H. Kakeya, Proc. SPIE 7237, 723726 (2009).
[CrossRef]

2008 (1)

H. Kakeya, Proc. SPIE 6803, 680317 (2008).
[CrossRef]

2007 (1)

2006 (1)

2003 (2)

2001 (1)

1908 (1)

G. Lippmann, C. R. Acad. Sci. 146, 446 (1908).

Cho, S.-W.

Choi, H.

Javidi, B.

Jung, S.

Kakeya, H.

H. Kakeya, S. Sawada, Y. Ueda, and T. Kurokawa, Opt. Express 20, 1963 (2012).
[CrossRef]

S. Sawada and H. Kakeya, Opt. Express 20, 25902 (2012).
[CrossRef]

S. Sawada and H. Kakeya, J. Electron. Imaging 21, 011004 (2012).
[CrossRef]

Y. Ueda and H. Kakeya, SID Int. Symp. Digest Tech. Papers 42, 1116 (2011).
[CrossRef]

H. Kakeya, Opt. Express 19, 20395 (2011).
[CrossRef]

T. Kurokawa and H. Kakeya, Proc. SPIE 7863, 78631M (2011).
[CrossRef]

H. Kakeya, T. Kurokawa, and Y. Mano, Proc. SPIE 7524, 752411 (2010).
[CrossRef]

H. Kakeya, Proc. SPIE 7237, 723726 (2009).
[CrossRef]

H. Kakeya, Proc. SPIE 6803, 680317 (2008).
[CrossRef]

H. Kodaira, A. Nakao, Y. Mano, and H. Kakeya, Proc. 3DSA2010, 205 (2010).

Kim, J.

Kim, Y.

Kodaira, H.

H. Kodaira, A. Nakao, Y. Mano, and H. Kakeya, Proc. 3DSA2010, 205 (2010).

Kurokawa, T.

H. Kakeya, S. Sawada, Y. Ueda, and T. Kurokawa, Opt. Express 20, 1963 (2012).
[CrossRef]

T. Kurokawa and H. Kakeya, Proc. SPIE 7863, 78631M (2011).
[CrossRef]

H. Kakeya, T. Kurokawa, and Y. Mano, Proc. SPIE 7524, 752411 (2010).
[CrossRef]

Lee, B.

Lippmann, G.

G. Lippmann, C. R. Acad. Sci. 146, 446 (1908).

Mano, Y.

H. Kakeya, T. Kurokawa, and Y. Mano, Proc. SPIE 7524, 752411 (2010).
[CrossRef]

H. Kodaira, A. Nakao, Y. Mano, and H. Kakeya, Proc. 3DSA2010, 205 (2010).

Min, S.-W.

Nakao, A.

H. Kodaira, A. Nakao, Y. Mano, and H. Kakeya, Proc. 3DSA2010, 205 (2010).

Park, G.

Park, J.-H.

Sawada, S.

Ueda, Y.

H. Kakeya, S. Sawada, Y. Ueda, and T. Kurokawa, Opt. Express 20, 1963 (2012).
[CrossRef]

Y. Ueda and H. Kakeya, SID Int. Symp. Digest Tech. Papers 42, 1116 (2011).
[CrossRef]

Appl. Opt. (3)

C. R. Acad. Sci. (1)

G. Lippmann, C. R. Acad. Sci. 146, 446 (1908).

J. Electron. Imaging (1)

S. Sawada and H. Kakeya, J. Electron. Imaging 21, 011004 (2012).
[CrossRef]

Opt. Express (4)

Opt. Lett. (1)

Proc. SPIE (4)

T. Kurokawa and H. Kakeya, Proc. SPIE 7863, 78631M (2011).
[CrossRef]

H. Kakeya, T. Kurokawa, and Y. Mano, Proc. SPIE 7524, 752411 (2010).
[CrossRef]

H. Kakeya, Proc. SPIE 6803, 680317 (2008).
[CrossRef]

H. Kakeya, Proc. SPIE 7237, 723726 (2009).
[CrossRef]

SID Int. Symp. Digest Tech. Papers (1)

Y. Ueda and H. Kakeya, SID Int. Symp. Digest Tech. Papers 42, 1116 (2011).
[CrossRef]

Other (1)

H. Kodaira, A. Nakao, Y. Mano, and H. Kakeya, Proc. 3DSA2010, 205 (2010).

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (7)

Fig. 1.
Fig. 1.

Emergence of pseudo images in integral imaging.

Fig. 2.
Fig. 2.

Principle of pseudo image suppression proposed by Kurokawa and Kakeya [16].

Fig. 3.
Fig. 3.

Pictures of the prototype system hardware.

Fig. 4.
Fig. 4.

Image observed with the prototype system [16].

Fig. 5.
Fig. 5.

Emergence of pseudo images and black bands.

Fig. 6.
Fig. 6.

Blocking of pseudo image with thick lens array.

Fig. 7.
Fig. 7.

Images observed with the improved system.

Equations (2)

Equations on this page are rendered with MathJax. Learn more.

r=dfbfafb,
l=fafbfafb,

Metrics