Abstract

We demonstrate a experimental method to measure the spin Hall effect of light (SHEL), which is based on the interference between two orthogonal circularly polarized beams with the help of a polarizer. Our method can measure the SHEL across the entire exit pupil, not only at the centroid as is the case with earlier methods, and hence one can scan the transverse section of the beam. We measured the SHEL of an aluminium mirror and a glass plate using a He–Ne laser at wavelength 633 nm, for incidence angles varying from 22° to 70°. The experimental results are in good agreement with theory. We also measured the shift across the transverse section of a Gaussian beam using same method.

© 2013 Optical Society of America

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2013

2012

2011

H. Luo, X. Zhou, W. Shu, S. Wen, and D. Fan, Phys. Rev. A 84, 043806 (2011).
[CrossRef]

2010

M. Merano, N. Hermosa, J. P. Woerdman, and A. Aiello, Phys. Rev. A 82, 023817 (2010).
[CrossRef]

2009

2008

O. Hosten and P. Kwiat, Science 319, 787 (2008).
[CrossRef]

2007

K. Yu. Bliokh and Y. P. Bliokh, Phys. Rev. E 75, 066609 (2007).
[CrossRef]

C.-F. Li, Phys. Rev. A 76, 013811 (2007).
[CrossRef]

2006

K. Yu. Bliokh and Y. P. Bliokh, Phys. Rev. Lett. 96, 073903 (2006).
[CrossRef]

2004

F. Pillon, H. Gilles, and S. Girard, Appl. Opt. 43, 1863 (2004).
[CrossRef]

M. Onoda, S. Murakami, and N. Nagosa, Phys. Rev. Lett. 93, 083901 (2004).
[CrossRef]

2001

V. G. Fedoseyev, Opt. Commun. 193, 9 (2001).
[CrossRef]

1977

1972

C. Imbert, Phys. Rev. D 5, 787 (1972).
[CrossRef]

1955

F. I. Fedorov, Dokl. Akad. Nauk SSSR 105, 465 (1955).

Aiello, A.

K. Y. Bliokh and A. Aiello, J. Opt. 15, 014001 (2013).
[CrossRef]

N. Hermosa, A. M. Nugrowati, A. Aiello, and J. P. Woerdman, Opt. Lett. 37, 1044 (2012).
[CrossRef]

M. Merano, N. Hermosa, J. P. Woerdman, and A. Aiello, Phys. Rev. A 82, 023817 (2010).
[CrossRef]

Anicin, B.

Bliokh, K. Y.

K. Y. Bliokh and A. Aiello, J. Opt. 15, 014001 (2013).
[CrossRef]

Y. Gorodetski, K. Y. Bliokh, B. Stein, C. Genet, N. Shitrit, V. Kleiner, E. Hasman, and T. W. Ebbesen, Phys. Rev. Lett. 109, 013901 (2012).
[CrossRef]

K. Y. Bliokh, I. V. Shadrivov, and Y. S. Kivshar, Opt. Lett. 34, 389 (2009).
[CrossRef]

Bliokh, K. Yu.

K. Yu. Bliokh and Y. P. Bliokh, Phys. Rev. E 75, 066609 (2007).
[CrossRef]

K. Yu. Bliokh and Y. P. Bliokh, Phys. Rev. Lett. 96, 073903 (2006).
[CrossRef]

Bliokh, Y. P.

K. Yu. Bliokh and Y. P. Bliokh, Phys. Rev. E 75, 066609 (2007).
[CrossRef]

K. Yu. Bliokh and Y. P. Bliokh, Phys. Rev. Lett. 96, 073903 (2006).
[CrossRef]

Cao, M.

Chen, J.

L. J. Kong, X. L. Wang, S. M. Li, Y. Li, and J. Chen, Appl. Phys. Lett. 100, 071109 (2012).
[CrossRef]

Cowan, J. J.

Dennis, M. R.

J. B. Gotte and M. R. Dennis, arXiv:1303.5038v2.

Ebbesen, T. W.

Y. Gorodetski, K. Y. Bliokh, B. Stein, C. Genet, N. Shitrit, V. Kleiner, E. Hasman, and T. W. Ebbesen, Phys. Rev. Lett. 109, 013901 (2012).
[CrossRef]

Fan, D.

H. Luo, X. Zhou, W. Shu, S. Wen, and D. Fan, Phys. Rev. A 84, 043806 (2011).
[CrossRef]

Fedorov, F. I.

F. I. Fedorov, Dokl. Akad. Nauk SSSR 105, 465 (1955).

Fedoseyev, V. G.

V. G. Fedoseyev, Opt. Commun. 193, 9 (2001).
[CrossRef]

Gao, H.

Genet, C.

Y. Gorodetski, K. Y. Bliokh, B. Stein, C. Genet, N. Shitrit, V. Kleiner, E. Hasman, and T. W. Ebbesen, Phys. Rev. Lett. 109, 013901 (2012).
[CrossRef]

Gilles, H.

Girard, S.

Gong, Q.

Gorodetski, Y.

Y. Gorodetski, K. Y. Bliokh, B. Stein, C. Genet, N. Shitrit, V. Kleiner, E. Hasman, and T. W. Ebbesen, Phys. Rev. Lett. 109, 013901 (2012).
[CrossRef]

Gotte, J. B.

J. B. Gotte and M. R. Dennis, arXiv:1303.5038v2.

Hasman, E.

Y. Gorodetski, K. Y. Bliokh, B. Stein, C. Genet, N. Shitrit, V. Kleiner, E. Hasman, and T. W. Ebbesen, Phys. Rev. Lett. 109, 013901 (2012).
[CrossRef]

He, H.

Hermosa, N.

N. Hermosa, A. M. Nugrowati, A. Aiello, and J. P. Woerdman, Opt. Lett. 37, 1044 (2012).
[CrossRef]

M. Merano, N. Hermosa, J. P. Woerdman, and A. Aiello, Phys. Rev. A 82, 023817 (2010).
[CrossRef]

Hosten, O.

O. Hosten and P. Kwiat, Science 319, 787 (2008).
[CrossRef]

Imbert, C.

C. Imbert, Phys. Rev. D 5, 787 (1972).
[CrossRef]

Jin, Y.

Joseph, J.

Kivshar, Y. S.

Kleiner, V.

Y. Gorodetski, K. Y. Bliokh, B. Stein, C. Genet, N. Shitrit, V. Kleiner, E. Hasman, and T. W. Ebbesen, Phys. Rev. Lett. 109, 013901 (2012).
[CrossRef]

Kong, L. J.

L. J. Kong, X. L. Wang, S. M. Li, Y. Li, and J. Chen, Appl. Phys. Lett. 100, 071109 (2012).
[CrossRef]

Kwiat, P.

O. Hosten and P. Kwiat, Science 319, 787 (2008).
[CrossRef]

Li, C.-F.

C.-F. Li, Phys. Rev. A 76, 013811 (2007).
[CrossRef]

Li, F.

Li, H.

Li, S. M.

L. J. Kong, X. L. Wang, S. M. Li, Y. Li, and J. Chen, Appl. Phys. Lett. 100, 071109 (2012).
[CrossRef]

Li, Y.

L. J. Kong, X. L. Wang, S. M. Li, Y. Li, and J. Chen, Appl. Phys. Lett. 100, 071109 (2012).
[CrossRef]

Y. Qin, Y. Li, H. He, and Q. Gong, Opt. Lett. 34, 2551 (2009).
[CrossRef]

Luo, H.

X. Zhou, H. Luo, and S. Wen, Opt. Express 20, 16003 (2012).
[CrossRef]

H. Luo, X. Zhou, W. Shu, S. Wen, and D. Fan, Phys. Rev. A 84, 043806 (2011).
[CrossRef]

Lv, Y.

Merano, M.

M. Merano, N. Hermosa, J. P. Woerdman, and A. Aiello, Phys. Rev. A 82, 023817 (2010).
[CrossRef]

Murakami, S.

M. Onoda, S. Murakami, and N. Nagosa, Phys. Rev. Lett. 93, 083901 (2004).
[CrossRef]

Nagosa, N.

M. Onoda, S. Murakami, and N. Nagosa, Phys. Rev. Lett. 93, 083901 (2004).
[CrossRef]

Nugrowati, A. M.

Onoda, M.

M. Onoda, S. Murakami, and N. Nagosa, Phys. Rev. Lett. 93, 083901 (2004).
[CrossRef]

Pillon, F.

Prajapati, C.

Qin, Y.

Ranganathan, D.

Shadrivov, I. V.

Shitrit, N.

Y. Gorodetski, K. Y. Bliokh, B. Stein, C. Genet, N. Shitrit, V. Kleiner, E. Hasman, and T. W. Ebbesen, Phys. Rev. Lett. 109, 013901 (2012).
[CrossRef]

Shu, W.

H. Luo, X. Zhou, W. Shu, S. Wen, and D. Fan, Phys. Rev. A 84, 043806 (2011).
[CrossRef]

Stein, B.

Y. Gorodetski, K. Y. Bliokh, B. Stein, C. Genet, N. Shitrit, V. Kleiner, E. Hasman, and T. W. Ebbesen, Phys. Rev. Lett. 109, 013901 (2012).
[CrossRef]

Wang, X. L.

L. J. Kong, X. L. Wang, S. M. Li, Y. Li, and J. Chen, Appl. Phys. Lett. 100, 071109 (2012).
[CrossRef]

Wang, Z.

Wen, S.

X. Zhou, H. Luo, and S. Wen, Opt. Express 20, 16003 (2012).
[CrossRef]

H. Luo, X. Zhou, W. Shu, S. Wen, and D. Fan, Phys. Rev. A 84, 043806 (2011).
[CrossRef]

Woerdman, J. P.

N. Hermosa, A. M. Nugrowati, A. Aiello, and J. P. Woerdman, Opt. Lett. 37, 1044 (2012).
[CrossRef]

M. Merano, N. Hermosa, J. P. Woerdman, and A. Aiello, Phys. Rev. A 82, 023817 (2010).
[CrossRef]

Zhan, L.

Zhang, P.

Zhou, X.

X. Zhou, H. Luo, and S. Wen, Opt. Express 20, 16003 (2012).
[CrossRef]

H. Luo, X. Zhou, W. Shu, S. Wen, and D. Fan, Phys. Rev. A 84, 043806 (2011).
[CrossRef]

Appl. Opt.

Appl. Phys. Lett.

L. J. Kong, X. L. Wang, S. M. Li, Y. Li, and J. Chen, Appl. Phys. Lett. 100, 071109 (2012).
[CrossRef]

Dokl. Akad. Nauk SSSR

F. I. Fedorov, Dokl. Akad. Nauk SSSR 105, 465 (1955).

J. Opt.

K. Y. Bliokh and A. Aiello, J. Opt. 15, 014001 (2013).
[CrossRef]

J. Opt. Soc. Am.

J. Opt. Soc. Am. A

Opt. Commun.

V. G. Fedoseyev, Opt. Commun. 193, 9 (2001).
[CrossRef]

Opt. Express

Opt. Lett.

Phys. Rev. A

C.-F. Li, Phys. Rev. A 76, 013811 (2007).
[CrossRef]

H. Luo, X. Zhou, W. Shu, S. Wen, and D. Fan, Phys. Rev. A 84, 043806 (2011).
[CrossRef]

M. Merano, N. Hermosa, J. P. Woerdman, and A. Aiello, Phys. Rev. A 82, 023817 (2010).
[CrossRef]

Phys. Rev. D

C. Imbert, Phys. Rev. D 5, 787 (1972).
[CrossRef]

Phys. Rev. E

K. Yu. Bliokh and Y. P. Bliokh, Phys. Rev. E 75, 066609 (2007).
[CrossRef]

Phys. Rev. Lett.

M. Onoda, S. Murakami, and N. Nagosa, Phys. Rev. Lett. 93, 083901 (2004).
[CrossRef]

K. Yu. Bliokh and Y. P. Bliokh, Phys. Rev. Lett. 96, 073903 (2006).
[CrossRef]

Y. Gorodetski, K. Y. Bliokh, B. Stein, C. Genet, N. Shitrit, V. Kleiner, E. Hasman, and T. W. Ebbesen, Phys. Rev. Lett. 109, 013901 (2012).
[CrossRef]

Science

O. Hosten and P. Kwiat, Science 319, 787 (2008).
[CrossRef]

Other

J. B. Gotte and M. R. Dennis, arXiv:1303.5038v2.

The refractive index of aluminum is taken from the website http://refractiveindex.info at 633 nm wavelength.

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Figures (4)

Fig. 1.
Fig. 1.

Schematic diagram of the experimental setup to measure the SHEL for reflection from an Al surface and a glass plate. The inset is the sectional view of polarizer 2.

Fig. 2.
Fig. 2.

Images of the fringe pattern recorded at (a) 22°, (b) 34°, and (c) 46°.

Fig. 3.
Fig. 3.

Curve of experimental and theoretical results of the SHEL, with angles of incidence (a) for an Al mirror and (b) for a glass plate. The thick dotted curve is obtained from experiment and the blue line is obtained from theory.

Fig. 4.
Fig. 4.

Plot of the SHEL across the transverse section of the Gaussian beam at 46° of incidence angle.

Equations (2)

Equations on this page are rendered with MathJax. Learn more.

SHEL=(1+2|Rs||Rp||Rs|2+|Rp|2sinϕ+ϕsϕp)kxkyk(ky2+kz2)A2dkydkz.
SHEL=λ2πΔϕcosθ,

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