Abstract

This Letter presents a method for the fast and broad wavelength sweeping of a standard setup of a diode’s active region and its immediate vicinity, which contain the diode’s optical feedback system. The selective and rapid heating of the active region is possible due to the confinement of the voltage drop to the active diode’s region that has submicrometer thickness. Using the presented method and an off-the-shelf telecommunication distributed feedback laser diode, we demonstrate wavelength sweeps in excess of 10 nm that were completed in about 200 ns, while generating average optical power in excess of 50 mW. In spite of high-amplitude current-drive pulses, 6000 h continuous operation of the diode within such an operational regime did not show any significant degradation of the diode’s performance.

© 2013 Optical Society of America

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  1. S. H. Yun, D. J. Richardson, and B. Y. Kim, Opt. Lett. 23, 843 (1998).
    [CrossRef]
  2. B. Van Hoe, G. Lee, E. Bosman, J. Missinne, S. Kalathimekkad, O. Maskery, D. J. Webb, K. Sugden, P. Van Daele, and G. Van Steenberge, Sensors 12, 12052 (2012).
    [CrossRef]
  3. S. T. Sanders, D. W. Mattison, J. B. Jeffries, and R. K. Hanson, Opt. Lett. 26, 1568 (2001).
    [CrossRef]
  4. D. J. F. Cooper, T. Coroy, and P. W. E. Smith, Appl. Opt. 40, 2643 (2001).
    [CrossRef]
  5. A. J. Ward, D. J. Robbins, G. Busico, E. Barton, L. Ponnampalam, J. P. Duck, N. D. Whitbread, P. J. Williams, D. C. J. Reid, A. C. Carter, and M. J. Wale, IEEE J. Sel. Top. Quantum Electron. 11, 149 (2005).
    [CrossRef]
  6. M. Britzger, A. Khalaidovski, B. Hemb, E. B. Kley, F. Bruckner, R. H. Rinkleff, K. Danzmann, and R. Schnabel, Opt. Lett. 37, 3117 (2012).
    [CrossRef]
  7. H. Shalom, A. Zadok, M. Tur, P. J. Legg, W. D. Cornwell, and I. Andonovic, IEEE J. Quantum Electron. 34, 1816 (1998).
    [CrossRef]
  8. D. A. Cohen and L. A. Coldren, IEEE J. Sel. Top. Quantum Electron. 3, 649 (1997).
    [CrossRef]
  9. E. Cibula and D. Donlagic, Opt. Express 18, 12017 (2010).
    [CrossRef]

2012 (2)

B. Van Hoe, G. Lee, E. Bosman, J. Missinne, S. Kalathimekkad, O. Maskery, D. J. Webb, K. Sugden, P. Van Daele, and G. Van Steenberge, Sensors 12, 12052 (2012).
[CrossRef]

M. Britzger, A. Khalaidovski, B. Hemb, E. B. Kley, F. Bruckner, R. H. Rinkleff, K. Danzmann, and R. Schnabel, Opt. Lett. 37, 3117 (2012).
[CrossRef]

2010 (1)

2005 (1)

A. J. Ward, D. J. Robbins, G. Busico, E. Barton, L. Ponnampalam, J. P. Duck, N. D. Whitbread, P. J. Williams, D. C. J. Reid, A. C. Carter, and M. J. Wale, IEEE J. Sel. Top. Quantum Electron. 11, 149 (2005).
[CrossRef]

2001 (2)

1998 (2)

S. H. Yun, D. J. Richardson, and B. Y. Kim, Opt. Lett. 23, 843 (1998).
[CrossRef]

H. Shalom, A. Zadok, M. Tur, P. J. Legg, W. D. Cornwell, and I. Andonovic, IEEE J. Quantum Electron. 34, 1816 (1998).
[CrossRef]

1997 (1)

D. A. Cohen and L. A. Coldren, IEEE J. Sel. Top. Quantum Electron. 3, 649 (1997).
[CrossRef]

Andonovic, I.

H. Shalom, A. Zadok, M. Tur, P. J. Legg, W. D. Cornwell, and I. Andonovic, IEEE J. Quantum Electron. 34, 1816 (1998).
[CrossRef]

Barton, E.

A. J. Ward, D. J. Robbins, G. Busico, E. Barton, L. Ponnampalam, J. P. Duck, N. D. Whitbread, P. J. Williams, D. C. J. Reid, A. C. Carter, and M. J. Wale, IEEE J. Sel. Top. Quantum Electron. 11, 149 (2005).
[CrossRef]

Bosman, E.

B. Van Hoe, G. Lee, E. Bosman, J. Missinne, S. Kalathimekkad, O. Maskery, D. J. Webb, K. Sugden, P. Van Daele, and G. Van Steenberge, Sensors 12, 12052 (2012).
[CrossRef]

Britzger, M.

Bruckner, F.

Busico, G.

A. J. Ward, D. J. Robbins, G. Busico, E. Barton, L. Ponnampalam, J. P. Duck, N. D. Whitbread, P. J. Williams, D. C. J. Reid, A. C. Carter, and M. J. Wale, IEEE J. Sel. Top. Quantum Electron. 11, 149 (2005).
[CrossRef]

Carter, A. C.

A. J. Ward, D. J. Robbins, G. Busico, E. Barton, L. Ponnampalam, J. P. Duck, N. D. Whitbread, P. J. Williams, D. C. J. Reid, A. C. Carter, and M. J. Wale, IEEE J. Sel. Top. Quantum Electron. 11, 149 (2005).
[CrossRef]

Cibula, E.

Cohen, D. A.

D. A. Cohen and L. A. Coldren, IEEE J. Sel. Top. Quantum Electron. 3, 649 (1997).
[CrossRef]

Coldren, L. A.

D. A. Cohen and L. A. Coldren, IEEE J. Sel. Top. Quantum Electron. 3, 649 (1997).
[CrossRef]

Cooper, D. J. F.

Cornwell, W. D.

H. Shalom, A. Zadok, M. Tur, P. J. Legg, W. D. Cornwell, and I. Andonovic, IEEE J. Quantum Electron. 34, 1816 (1998).
[CrossRef]

Coroy, T.

Danzmann, K.

Donlagic, D.

Duck, J. P.

A. J. Ward, D. J. Robbins, G. Busico, E. Barton, L. Ponnampalam, J. P. Duck, N. D. Whitbread, P. J. Williams, D. C. J. Reid, A. C. Carter, and M. J. Wale, IEEE J. Sel. Top. Quantum Electron. 11, 149 (2005).
[CrossRef]

Hanson, R. K.

Hemb, B.

Jeffries, J. B.

Kalathimekkad, S.

B. Van Hoe, G. Lee, E. Bosman, J. Missinne, S. Kalathimekkad, O. Maskery, D. J. Webb, K. Sugden, P. Van Daele, and G. Van Steenberge, Sensors 12, 12052 (2012).
[CrossRef]

Khalaidovski, A.

Kim, B. Y.

Kley, E. B.

Lee, G.

B. Van Hoe, G. Lee, E. Bosman, J. Missinne, S. Kalathimekkad, O. Maskery, D. J. Webb, K. Sugden, P. Van Daele, and G. Van Steenberge, Sensors 12, 12052 (2012).
[CrossRef]

Legg, P. J.

H. Shalom, A. Zadok, M. Tur, P. J. Legg, W. D. Cornwell, and I. Andonovic, IEEE J. Quantum Electron. 34, 1816 (1998).
[CrossRef]

Maskery, O.

B. Van Hoe, G. Lee, E. Bosman, J. Missinne, S. Kalathimekkad, O. Maskery, D. J. Webb, K. Sugden, P. Van Daele, and G. Van Steenberge, Sensors 12, 12052 (2012).
[CrossRef]

Mattison, D. W.

Missinne, J.

B. Van Hoe, G. Lee, E. Bosman, J. Missinne, S. Kalathimekkad, O. Maskery, D. J. Webb, K. Sugden, P. Van Daele, and G. Van Steenberge, Sensors 12, 12052 (2012).
[CrossRef]

Ponnampalam, L.

A. J. Ward, D. J. Robbins, G. Busico, E. Barton, L. Ponnampalam, J. P. Duck, N. D. Whitbread, P. J. Williams, D. C. J. Reid, A. C. Carter, and M. J. Wale, IEEE J. Sel. Top. Quantum Electron. 11, 149 (2005).
[CrossRef]

Reid, D. C. J.

A. J. Ward, D. J. Robbins, G. Busico, E. Barton, L. Ponnampalam, J. P. Duck, N. D. Whitbread, P. J. Williams, D. C. J. Reid, A. C. Carter, and M. J. Wale, IEEE J. Sel. Top. Quantum Electron. 11, 149 (2005).
[CrossRef]

Richardson, D. J.

Rinkleff, R. H.

Robbins, D. J.

A. J. Ward, D. J. Robbins, G. Busico, E. Barton, L. Ponnampalam, J. P. Duck, N. D. Whitbread, P. J. Williams, D. C. J. Reid, A. C. Carter, and M. J. Wale, IEEE J. Sel. Top. Quantum Electron. 11, 149 (2005).
[CrossRef]

Sanders, S. T.

Schnabel, R.

Shalom, H.

H. Shalom, A. Zadok, M. Tur, P. J. Legg, W. D. Cornwell, and I. Andonovic, IEEE J. Quantum Electron. 34, 1816 (1998).
[CrossRef]

Smith, P. W. E.

Sugden, K.

B. Van Hoe, G. Lee, E. Bosman, J. Missinne, S. Kalathimekkad, O. Maskery, D. J. Webb, K. Sugden, P. Van Daele, and G. Van Steenberge, Sensors 12, 12052 (2012).
[CrossRef]

Tur, M.

H. Shalom, A. Zadok, M. Tur, P. J. Legg, W. D. Cornwell, and I. Andonovic, IEEE J. Quantum Electron. 34, 1816 (1998).
[CrossRef]

Van Daele, P.

B. Van Hoe, G. Lee, E. Bosman, J. Missinne, S. Kalathimekkad, O. Maskery, D. J. Webb, K. Sugden, P. Van Daele, and G. Van Steenberge, Sensors 12, 12052 (2012).
[CrossRef]

Van Hoe, B.

B. Van Hoe, G. Lee, E. Bosman, J. Missinne, S. Kalathimekkad, O. Maskery, D. J. Webb, K. Sugden, P. Van Daele, and G. Van Steenberge, Sensors 12, 12052 (2012).
[CrossRef]

Van Steenberge, G.

B. Van Hoe, G. Lee, E. Bosman, J. Missinne, S. Kalathimekkad, O. Maskery, D. J. Webb, K. Sugden, P. Van Daele, and G. Van Steenberge, Sensors 12, 12052 (2012).
[CrossRef]

Wale, M. J.

A. J. Ward, D. J. Robbins, G. Busico, E. Barton, L. Ponnampalam, J. P. Duck, N. D. Whitbread, P. J. Williams, D. C. J. Reid, A. C. Carter, and M. J. Wale, IEEE J. Sel. Top. Quantum Electron. 11, 149 (2005).
[CrossRef]

Ward, A. J.

A. J. Ward, D. J. Robbins, G. Busico, E. Barton, L. Ponnampalam, J. P. Duck, N. D. Whitbread, P. J. Williams, D. C. J. Reid, A. C. Carter, and M. J. Wale, IEEE J. Sel. Top. Quantum Electron. 11, 149 (2005).
[CrossRef]

Webb, D. J.

B. Van Hoe, G. Lee, E. Bosman, J. Missinne, S. Kalathimekkad, O. Maskery, D. J. Webb, K. Sugden, P. Van Daele, and G. Van Steenberge, Sensors 12, 12052 (2012).
[CrossRef]

Whitbread, N. D.

A. J. Ward, D. J. Robbins, G. Busico, E. Barton, L. Ponnampalam, J. P. Duck, N. D. Whitbread, P. J. Williams, D. C. J. Reid, A. C. Carter, and M. J. Wale, IEEE J. Sel. Top. Quantum Electron. 11, 149 (2005).
[CrossRef]

Williams, P. J.

A. J. Ward, D. J. Robbins, G. Busico, E. Barton, L. Ponnampalam, J. P. Duck, N. D. Whitbread, P. J. Williams, D. C. J. Reid, A. C. Carter, and M. J. Wale, IEEE J. Sel. Top. Quantum Electron. 11, 149 (2005).
[CrossRef]

Yun, S. H.

Zadok, A.

H. Shalom, A. Zadok, M. Tur, P. J. Legg, W. D. Cornwell, and I. Andonovic, IEEE J. Quantum Electron. 34, 1816 (1998).
[CrossRef]

Appl. Opt. (1)

IEEE J. Quantum Electron. (1)

H. Shalom, A. Zadok, M. Tur, P. J. Legg, W. D. Cornwell, and I. Andonovic, IEEE J. Quantum Electron. 34, 1816 (1998).
[CrossRef]

IEEE J. Sel. Top. Quantum Electron. (2)

D. A. Cohen and L. A. Coldren, IEEE J. Sel. Top. Quantum Electron. 3, 649 (1997).
[CrossRef]

A. J. Ward, D. J. Robbins, G. Busico, E. Barton, L. Ponnampalam, J. P. Duck, N. D. Whitbread, P. J. Williams, D. C. J. Reid, A. C. Carter, and M. J. Wale, IEEE J. Sel. Top. Quantum Electron. 11, 149 (2005).
[CrossRef]

Opt. Express (1)

Opt. Lett. (3)

Sensors (1)

B. Van Hoe, G. Lee, E. Bosman, J. Missinne, S. Kalathimekkad, O. Maskery, D. J. Webb, K. Sugden, P. Van Daele, and G. Van Steenberge, Sensors 12, 12052 (2012).
[CrossRef]

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Figures (6)

Fig. 1.
Fig. 1.

Temperature distribution in diode chip’s cross section during and after applications of 250 ns long, 2 A pulse: (a) 100, (b) 250, (c) 500, and (d) 2000 ns.

Fig. 2.
Fig. 2.

Simulated temperature response during and after application of 250 ns long 2 A current pulse.

Fig. 3.
Fig. 3.

Measurement setup.

Fig. 4.
Fig. 4.

LD output power, optical power reflected from AFFP, and reconstructed wavelength change.

Fig. 5.
Fig. 5.

Measured current shape.

Fig. 6.
Fig. 6.

Linearized wavelength sweep: optical power reflected from AFFP and reconstructed wavelength change.

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