Abstract

We present a new concept for a beam position monitor with the unique ability to map particle beam position to a measurable wavelength. Coupled with an optical spectrograph, this beam position monitor is capable of subnanometer resolution. We describe one possible design, and through finite-element frequency-domain simulations, we show a resolution of 0.7 nm. Because of its high precision and ultracompact form factor, this device is ideal for future x-ray sources and laser-driven particle accelerators “on a chip.”

© 2012 Optical Society of America

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