We present a new method that allows efficient spectral calibration for a polarization state analyzer. The procedure does not require any additional polarization optical element other than the polarization state analyzer itself. It uses a double-pass technique that can be achieved up to a very good precision. The method is illustrated using real measurements done at several wavelengths with a rotating wave plate polarization state analyzer. Alignment of axis as well as true retardation at a specific wavelength are easily obtained by a standard function fitting.
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