Abstract

The resolution of imaging is limited by the missing of high-frequencies information. The superlens employing negative refraction can compensate for these components. But for the directional coupling of Bloch waves and the low coupling efficiency of large-angle waves, the resolution of subwavelength imaging is not satisfactory. However, the subwavelength metallic grating can produce high-order diffracted waves carrying a lot of high-frequencies information. Therefore, this structure is used to inhibit the zero-order diffraction and enhance the high-order diffraction to achieve super-resolution.

© 2012 Optical Society of America

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2009

A. Fang, T. Koschny, and C. M. Soukoulis, Phys. Rev. B 79, 245127 (2009).

2008

X. Zhang and Z. Liu, Nature Materials 7, 435 (2008).
[CrossRef]

C. Croénne, N. Fabre, D. P. Gaillot, O. Vanbésien, and D. Lippens, Phys. Rev. B 77, 1253331 (2008).
[CrossRef]

2006

2005

Z. Ruan, M. Qiu, S. Xiao, S. He, and L. Thylén, Phys. Rev. B 71, 0451111 (2005).
[CrossRef]

R. Moussa, S. Foteinopoulou, L. Zhang, G. Tuttle, K. Guven, E. Ozbay, and C. M. Soukoulis, Phys. Rev. B 71, 0851061 (2005).
[CrossRef]

Z. Lu, J. A. Murakowski, C. A. Schuetz, S. Shi, G. J. Schneider, and D. W. Prather, Phys. Rev. Lett. 95, 153901 (2005).

P. Vodo, P. V. Parimi, W. T. Lu, and S. Sridhar, Appl. Phys. Lett. 86, 201108 (2005).
[CrossRef]

2004

K. Guven, K. Aydin, K. B. Alici, C. M. Soukoulis, and E. Ozbay, Phys. Rev. B 70, 2051251 (2004).
[CrossRef]

2003

S. Foteinopoulou, E. N. Economou, and C. M. Soukoulis, Phys. Rev. Lett. 90, 1074021 (2003).
[CrossRef]

Z. Li and L. Lin, Phys. Rev. B 68, 245110 (2003).

E. Cubukcu, K. Aydin, E. Ozbay, S. Foteinopoulou, and C. M. Soukoulis, Phys. Rev. Lett. 91, 2074011 (2003).
[CrossRef]

S. Foteinopoulou and C. M. Soukoulis, Phys. Rev. B 67, 2351071 (2003).
[CrossRef]

E. J. Reed, M. Soljacic, and J. D. Joannopoulos, Phys. Rev. Lett. 91, 1339011 (2003).
[CrossRef]

C. Luo, M. lbanescu, G. Johnson, and J. D. Joannopoulos, Science 299, 368 (2003).
[CrossRef]

2002

C. Luo, S. G. Johnson, J. D. Joannopoulos, and J. B. Pendry, Phys. Rev. B 65, 201104 (2002).

2001

R. A. Shelby, D. R. Smith, and S. Schultz, Science 292, 77 (2001).
[CrossRef]

2000

J. B. Pendry, Phys. Rev. Lett. 85, 3966 (2000).
[CrossRef]

1993

1968

V. G. Veselago, Sov. Phys. Usp. 10, 509 (1968).
[CrossRef]

Alici, K. B.

K. Guven, K. Aydin, K. B. Alici, C. M. Soukoulis, and E. Ozbay, Phys. Rev. B 70, 2051251 (2004).
[CrossRef]

Aydin, K.

K. Guven, K. Aydin, K. B. Alici, C. M. Soukoulis, and E. Ozbay, Phys. Rev. B 70, 2051251 (2004).
[CrossRef]

E. Cubukcu, K. Aydin, E. Ozbay, S. Foteinopoulou, and C. M. Soukoulis, Phys. Rev. Lett. 91, 2074011 (2003).
[CrossRef]

Croénne, C.

C. Croénne, N. Fabre, D. P. Gaillot, O. Vanbésien, and D. Lippens, Phys. Rev. B 77, 1253331 (2008).
[CrossRef]

Cubukcu, E.

E. Cubukcu, K. Aydin, E. Ozbay, S. Foteinopoulou, and C. M. Soukoulis, Phys. Rev. Lett. 91, 2074011 (2003).
[CrossRef]

Durant, S.

Economou, E. N.

S. Foteinopoulou, E. N. Economou, and C. M. Soukoulis, Phys. Rev. Lett. 90, 1074021 (2003).
[CrossRef]

Fabre, N.

C. Croénne, N. Fabre, D. P. Gaillot, O. Vanbésien, and D. Lippens, Phys. Rev. B 77, 1253331 (2008).
[CrossRef]

Fang, A.

A. Fang, T. Koschny, and C. M. Soukoulis, Phys. Rev. B 79, 245127 (2009).

Foteinopoulou, S.

R. Moussa, S. Foteinopoulou, L. Zhang, G. Tuttle, K. Guven, E. Ozbay, and C. M. Soukoulis, Phys. Rev. B 71, 0851061 (2005).
[CrossRef]

E. Cubukcu, K. Aydin, E. Ozbay, S. Foteinopoulou, and C. M. Soukoulis, Phys. Rev. Lett. 91, 2074011 (2003).
[CrossRef]

S. Foteinopoulou and C. M. Soukoulis, Phys. Rev. B 67, 2351071 (2003).
[CrossRef]

S. Foteinopoulou, E. N. Economou, and C. M. Soukoulis, Phys. Rev. Lett. 90, 1074021 (2003).
[CrossRef]

Gaillot, D. P.

C. Croénne, N. Fabre, D. P. Gaillot, O. Vanbésien, and D. Lippens, Phys. Rev. B 77, 1253331 (2008).
[CrossRef]

Guven, K.

R. Moussa, S. Foteinopoulou, L. Zhang, G. Tuttle, K. Guven, E. Ozbay, and C. M. Soukoulis, Phys. Rev. B 71, 0851061 (2005).
[CrossRef]

K. Guven, K. Aydin, K. B. Alici, C. M. Soukoulis, and E. Ozbay, Phys. Rev. B 70, 2051251 (2004).
[CrossRef]

He, S.

Z. Ruan, M. Qiu, S. Xiao, S. He, and L. Thylén, Phys. Rev. B 71, 0451111 (2005).
[CrossRef]

Huang, K.

Joannopoulos, J. D.

C. Luo, M. lbanescu, G. Johnson, and J. D. Joannopoulos, Science 299, 368 (2003).
[CrossRef]

E. J. Reed, M. Soljacic, and J. D. Joannopoulos, Phys. Rev. Lett. 91, 1339011 (2003).
[CrossRef]

C. Luo, S. G. Johnson, J. D. Joannopoulos, and J. B. Pendry, Phys. Rev. B 65, 201104 (2002).

Johnson, G.

C. Luo, M. lbanescu, G. Johnson, and J. D. Joannopoulos, Science 299, 368 (2003).
[CrossRef]

Johnson, S. G.

C. Luo, S. G. Johnson, J. D. Joannopoulos, and J. B. Pendry, Phys. Rev. B 65, 201104 (2002).

Koschny, T.

A. Fang, T. Koschny, and C. M. Soukoulis, Phys. Rev. B 79, 245127 (2009).

lbanescu, M.

C. Luo, M. lbanescu, G. Johnson, and J. D. Joannopoulos, Science 299, 368 (2003).
[CrossRef]

Li, L.

Li, Y.-P.

Li, Z.

Z. Li and L. Lin, Phys. Rev. B 68, 245110 (2003).

Lin, L.

Z. Li and L. Lin, Phys. Rev. B 68, 245110 (2003).

Lippens, D.

C. Croénne, N. Fabre, D. P. Gaillot, O. Vanbésien, and D. Lippens, Phys. Rev. B 77, 1253331 (2008).
[CrossRef]

Liu, Z.

Lu, W. T.

P. Vodo, P. V. Parimi, W. T. Lu, and S. Sridhar, Appl. Phys. Lett. 86, 201108 (2005).
[CrossRef]

Lu, Z.

Z. Lu, J. A. Murakowski, C. A. Schuetz, S. Shi, G. J. Schneider, and D. W. Prather, Phys. Rev. Lett. 95, 153901 (2005).

Luo, C.

C. Luo, M. lbanescu, G. Johnson, and J. D. Joannopoulos, Science 299, 368 (2003).
[CrossRef]

C. Luo, S. G. Johnson, J. D. Joannopoulos, and J. B. Pendry, Phys. Rev. B 65, 201104 (2002).

Moussa, R.

R. Moussa, S. Foteinopoulou, L. Zhang, G. Tuttle, K. Guven, E. Ozbay, and C. M. Soukoulis, Phys. Rev. B 71, 0851061 (2005).
[CrossRef]

Murakowski, J. A.

Z. Lu, J. A. Murakowski, C. A. Schuetz, S. Shi, G. J. Schneider, and D. W. Prather, Phys. Rev. Lett. 95, 153901 (2005).

Ozbay, E.

R. Moussa, S. Foteinopoulou, L. Zhang, G. Tuttle, K. Guven, E. Ozbay, and C. M. Soukoulis, Phys. Rev. B 71, 0851061 (2005).
[CrossRef]

K. Guven, K. Aydin, K. B. Alici, C. M. Soukoulis, and E. Ozbay, Phys. Rev. B 70, 2051251 (2004).
[CrossRef]

E. Cubukcu, K. Aydin, E. Ozbay, S. Foteinopoulou, and C. M. Soukoulis, Phys. Rev. Lett. 91, 2074011 (2003).
[CrossRef]

Parimi, P. V.

P. Vodo, P. V. Parimi, W. T. Lu, and S. Sridhar, Appl. Phys. Lett. 86, 201108 (2005).
[CrossRef]

Pendry, J. B.

C. Luo, S. G. Johnson, J. D. Joannopoulos, and J. B. Pendry, Phys. Rev. B 65, 201104 (2002).

J. B. Pendry, Phys. Rev. Lett. 85, 3966 (2000).
[CrossRef]

Prather, D. W.

Z. Lu, J. A. Murakowski, C. A. Schuetz, S. Shi, G. J. Schneider, and D. W. Prather, Phys. Rev. Lett. 95, 153901 (2005).

Qiu, M.

Z. Ruan, M. Qiu, S. Xiao, S. He, and L. Thylén, Phys. Rev. B 71, 0451111 (2005).
[CrossRef]

Reed, E. J.

E. J. Reed, M. Soljacic, and J. D. Joannopoulos, Phys. Rev. Lett. 91, 1339011 (2003).
[CrossRef]

Ruan, Z.

Z. Ruan, M. Qiu, S. Xiao, S. He, and L. Thylén, Phys. Rev. B 71, 0451111 (2005).
[CrossRef]

Schneider, G. J.

Z. Lu, J. A. Murakowski, C. A. Schuetz, S. Shi, G. J. Schneider, and D. W. Prather, Phys. Rev. Lett. 95, 153901 (2005).

Schuetz, C. A.

Z. Lu, J. A. Murakowski, C. A. Schuetz, S. Shi, G. J. Schneider, and D. W. Prather, Phys. Rev. Lett. 95, 153901 (2005).

Schultz, S.

R. A. Shelby, D. R. Smith, and S. Schultz, Science 292, 77 (2001).
[CrossRef]

Shelby, R. A.

R. A. Shelby, D. R. Smith, and S. Schultz, Science 292, 77 (2001).
[CrossRef]

Shi, P.

Shi, S.

Z. Lu, J. A. Murakowski, C. A. Schuetz, S. Shi, G. J. Schneider, and D. W. Prather, Phys. Rev. Lett. 95, 153901 (2005).

Smith, D. R.

R. A. Shelby, D. R. Smith, and S. Schultz, Science 292, 77 (2001).
[CrossRef]

Soljacic, M.

E. J. Reed, M. Soljacic, and J. D. Joannopoulos, Phys. Rev. Lett. 91, 1339011 (2003).
[CrossRef]

Soukoulis, C. M.

A. Fang, T. Koschny, and C. M. Soukoulis, Phys. Rev. B 79, 245127 (2009).

R. Moussa, S. Foteinopoulou, L. Zhang, G. Tuttle, K. Guven, E. Ozbay, and C. M. Soukoulis, Phys. Rev. B 71, 0851061 (2005).
[CrossRef]

K. Guven, K. Aydin, K. B. Alici, C. M. Soukoulis, and E. Ozbay, Phys. Rev. B 70, 2051251 (2004).
[CrossRef]

S. Foteinopoulou, E. N. Economou, and C. M. Soukoulis, Phys. Rev. Lett. 90, 1074021 (2003).
[CrossRef]

E. Cubukcu, K. Aydin, E. Ozbay, S. Foteinopoulou, and C. M. Soukoulis, Phys. Rev. Lett. 91, 2074011 (2003).
[CrossRef]

S. Foteinopoulou and C. M. Soukoulis, Phys. Rev. B 67, 2351071 (2003).
[CrossRef]

Sridhar, S.

P. Vodo, P. V. Parimi, W. T. Lu, and S. Sridhar, Appl. Phys. Lett. 86, 201108 (2005).
[CrossRef]

Steele, J. M.

Thylén, L.

Z. Ruan, M. Qiu, S. Xiao, S. He, and L. Thylén, Phys. Rev. B 71, 0451111 (2005).
[CrossRef]

Tuttle, G.

R. Moussa, S. Foteinopoulou, L. Zhang, G. Tuttle, K. Guven, E. Ozbay, and C. M. Soukoulis, Phys. Rev. B 71, 0851061 (2005).
[CrossRef]

Vanbésien, O.

C. Croénne, N. Fabre, D. P. Gaillot, O. Vanbésien, and D. Lippens, Phys. Rev. B 77, 1253331 (2008).
[CrossRef]

Veselago, V. G.

V. G. Veselago, Sov. Phys. Usp. 10, 509 (1968).
[CrossRef]

Vodo, P.

P. Vodo, P. V. Parimi, W. T. Lu, and S. Sridhar, Appl. Phys. Lett. 86, 201108 (2005).
[CrossRef]

Xiao, S.

Z. Ruan, M. Qiu, S. Xiao, S. He, and L. Thylén, Phys. Rev. B 71, 0451111 (2005).
[CrossRef]

Zhang, L.

R. Moussa, S. Foteinopoulou, L. Zhang, G. Tuttle, K. Guven, E. Ozbay, and C. M. Soukoulis, Phys. Rev. B 71, 0851061 (2005).
[CrossRef]

Zhang, X.

Appl. Phys. Lett.

P. Vodo, P. V. Parimi, W. T. Lu, and S. Sridhar, Appl. Phys. Lett. 86, 201108 (2005).
[CrossRef]

J. Opt. Soc. Am. A

J. Opt. Soc. Am. B

Nature Materials

X. Zhang and Z. Liu, Nature Materials 7, 435 (2008).
[CrossRef]

Phys. Rev. B

S. Foteinopoulou and C. M. Soukoulis, Phys. Rev. B 67, 2351071 (2003).
[CrossRef]

C. Luo, S. G. Johnson, J. D. Joannopoulos, and J. B. Pendry, Phys. Rev. B 65, 201104 (2002).

R. Moussa, S. Foteinopoulou, L. Zhang, G. Tuttle, K. Guven, E. Ozbay, and C. M. Soukoulis, Phys. Rev. B 71, 0851061 (2005).
[CrossRef]

Z. Li and L. Lin, Phys. Rev. B 68, 245110 (2003).

Z. Ruan, M. Qiu, S. Xiao, S. He, and L. Thylén, Phys. Rev. B 71, 0451111 (2005).
[CrossRef]

C. Croénne, N. Fabre, D. P. Gaillot, O. Vanbésien, and D. Lippens, Phys. Rev. B 77, 1253331 (2008).
[CrossRef]

K. Guven, K. Aydin, K. B. Alici, C. M. Soukoulis, and E. Ozbay, Phys. Rev. B 70, 2051251 (2004).
[CrossRef]

A. Fang, T. Koschny, and C. M. Soukoulis, Phys. Rev. B 79, 245127 (2009).

Phys. Rev. Lett.

Z. Lu, J. A. Murakowski, C. A. Schuetz, S. Shi, G. J. Schneider, and D. W. Prather, Phys. Rev. Lett. 95, 153901 (2005).

S. Foteinopoulou, E. N. Economou, and C. M. Soukoulis, Phys. Rev. Lett. 90, 1074021 (2003).
[CrossRef]

E. Cubukcu, K. Aydin, E. Ozbay, S. Foteinopoulou, and C. M. Soukoulis, Phys. Rev. Lett. 91, 2074011 (2003).
[CrossRef]

J. B. Pendry, Phys. Rev. Lett. 85, 3966 (2000).
[CrossRef]

E. J. Reed, M. Soljacic, and J. D. Joannopoulos, Phys. Rev. Lett. 91, 1339011 (2003).
[CrossRef]

Science

C. Luo, M. lbanescu, G. Johnson, and J. D. Joannopoulos, Science 299, 368 (2003).
[CrossRef]

R. A. Shelby, D. R. Smith, and S. Schultz, Science 292, 77 (2001).
[CrossRef]

Sov. Phys. Usp.

V. G. Veselago, Sov. Phys. Usp. 10, 509 (1968).
[CrossRef]

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Figures (6)

Fig. 1.
Fig. 1.

Schematic diagram for the imaging system. A metallic grating following with a dielectric film is in front of the 2D PC. The PC slab consists of a honeycomb lattice of silicon rods (black rods) with a radius of 0.44a in the air matrix.

Fig. 2.
Fig. 2.

The normalized average intensities over a period for the flat superlens. The object distance is do=3.06a, and the image distance is di=1.61a.

Fig. 3.
Fig. 3.

The normalized average intensities over a period for the flat superlens by employing the metallic grating. The object distance is do=3.06a.

Fig. 4.
Fig. 4.

Diffraction efficiencies of a silver binary grating in TM polarizations. The Λ, h, and η are set to 2.11a, 1.55a, and 1.055a, respectively.

Fig. 5.
Fig. 5.

Diffraction efficiencies of a silver binary grating in TM polarizations. The Λ, h, and η are set to 2.11a, 1.68a, and 1.05a, respectively. The thickness of film between the grating and PC is 0.19a.

Fig. 6.
Fig. 6.

The normalized average intensities over a period for superlens imaging by employing the metallic grating. The FWHM of the image is 0.34λ, which is 62% that of the image without the metallic grating.

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