Abstract

We present dynamic full-field optical coherence microscope imaging using a scientific complementary metal oxide semiconductor camera in conjunction with a demodulation scheme based on the Riesz transform and monogenic signals. The potential of our approach is verified by a comparison with conventional phase-stepping as well as with an analytic reconstruction method and finally exemplified for dynamic mechanical testing of a polymer/fiber composite structure.

© 2012 Optical Society of America

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Supplementary Material (2)

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