Abstract

In this work, we present a novel method based on spectral domain interferometry for the electro-optic (EO) sampling of terahertz (THz) electric fields. This technique allows the use of thick crystals without the drawback of the over-rotation that may occur with intense THz sources, allowing longer temporal scans and thus, better spectral resolution. Using this technique, a phase difference of approximately 8898π can be measured, which is 18,000 times larger than the phase difference that could be measured using EO sampling.

© 2012 Optical Society of America

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2011 (2)

X. Lu and X.-C. Zhang, Appl. Phys. Lett. 98, 151111 (2011).
[CrossRef]

K. Singh, C. Dion, M. R. Lesk, T. Ozaki, and S. Costantino, Rev. Sci. Instrum. 82, 023706 (2011).
[CrossRef]

2010 (1)

K. Singh, C. Dion, S. Costantino, M. Wajszilber, M. R. Lesk, and T. Ozaki, Exp. Eye Res. 91, 63 (2010).
[CrossRef]

2009 (1)

2008 (2)

2007 (1)

2003 (1)

2002 (1)

2000 (1)

S. Kono, M. Tani, P. Gu, and K. Sakai, Appl. Phys. Lett. 77, 4104 (2000).
[CrossRef]

1998 (1)

1995 (3)

B. B. Hu and M. C. Nuss, Opt. Lett. 20, 1716 (1995).
[CrossRef]

Q. Wu and X.-C. Zhang, Appl. Phys. Lett. 67, 3523 (1995).
[CrossRef]

A. F. Fercher, C. K. Hitzenberger, G. Kamp, and S. Y. El-Zaiat, Opt. Commun. 117, 43 (1995).
[CrossRef]

Aoshima, S.-I.

Bajraszewski, T.

Chen, Z.

Costantino, S.

K. Singh, C. Dion, M. R. Lesk, T. Ozaki, and S. Costantino, Rev. Sci. Instrum. 82, 023706 (2011).
[CrossRef]

K. Singh, C. Dion, S. Costantino, M. Wajszilber, M. R. Lesk, and T. Ozaki, Exp. Eye Res. 91, 63 (2010).
[CrossRef]

Dion, C.

K. Singh, C. Dion, M. R. Lesk, T. Ozaki, and S. Costantino, Rev. Sci. Instrum. 82, 023706 (2011).
[CrossRef]

K. Singh, C. Dion, S. Costantino, M. Wajszilber, M. R. Lesk, and T. Ozaki, Exp. Eye Res. 91, 63 (2010).
[CrossRef]

El-Zaiat, S. Y.

A. F. Fercher, C. K. Hitzenberger, G. Kamp, and S. Y. El-Zaiat, Opt. Commun. 117, 43 (1995).
[CrossRef]

Fercher, A. F.

A. F. Fercher, C. K. Hitzenberger, G. Kamp, and S. Y. El-Zaiat, Opt. Commun. 117, 43 (1995).
[CrossRef]

Fletcher, J.

Gillespie, W. A.

Glownia, J. H.

Gu, P.

S. Kono, M. Tani, P. Gu, and K. Sakai, Appl. Phys. Lett. 77, 4104 (2000).
[CrossRef]

Hitzenberger, C. K.

A. F. Fercher, C. K. Hitzenberger, G. Kamp, and S. Y. El-Zaiat, Opt. Commun. 117, 43 (1995).
[CrossRef]

Hu, B. B.

Huber, R.

Jamison, S. P.

Jaroszynski, D. A.

Jiang, Z.

Kamp, G.

A. F. Fercher, C. K. Hitzenberger, G. Kamp, and S. Y. El-Zaiat, Opt. Commun. 117, 43 (1995).
[CrossRef]

Kawada, Y.

Kim, K. Y.

Kono, S.

S. Kono, M. Tani, P. Gu, and K. Sakai, Appl. Phys. Lett. 77, 4104 (2000).
[CrossRef]

Kowalczyk, A.

Lesk, M. R.

K. Singh, C. Dion, M. R. Lesk, T. Ozaki, and S. Costantino, Rev. Sci. Instrum. 82, 023706 (2011).
[CrossRef]

K. Singh, C. Dion, S. Costantino, M. Wajszilber, M. R. Lesk, and T. Ozaki, Exp. Eye Res. 91, 63 (2010).
[CrossRef]

Lu, X.

X. Lu and X.-C. Zhang, Appl. Phys. Lett. 98, 151111 (2011).
[CrossRef]

MacLeod, A. M.

Nuss, M. C.

Ozaki, T.

K. Singh, C. Dion, M. R. Lesk, T. Ozaki, and S. Costantino, Rev. Sci. Instrum. 82, 023706 (2011).
[CrossRef]

K. Singh, C. Dion, S. Costantino, M. Wajszilber, M. R. Lesk, and T. Ozaki, Exp. Eye Res. 91, 63 (2010).
[CrossRef]

Rao, B.

Rodriguez, G.

Sakai, K.

S. Kono, M. Tani, P. Gu, and K. Sakai, Appl. Phys. Lett. 77, 4104 (2000).
[CrossRef]

Shen, J.

Singh, K.

K. Singh, C. Dion, M. R. Lesk, T. Ozaki, and S. Costantino, Rev. Sci. Instrum. 82, 023706 (2011).
[CrossRef]

K. Singh, C. Dion, S. Costantino, M. Wajszilber, M. R. Lesk, and T. Ozaki, Exp. Eye Res. 91, 63 (2010).
[CrossRef]

Szkulmowska, A.

Szkulmowski, M.

Takahashi, H.

Tani, M.

S. Kono, M. Tani, P. Gu, and K. Sakai, Appl. Phys. Lett. 77, 4104 (2000).
[CrossRef]

Taylor, A. J.

Wajszilber, M.

K. Singh, C. Dion, S. Costantino, M. Wajszilber, M. R. Lesk, and T. Ozaki, Exp. Eye Res. 91, 63 (2010).
[CrossRef]

Wojtkowski, M.

Wu, Q.

Q. Wu and X.-C. Zhang, Appl. Phys. Lett. 67, 3523 (1995).
[CrossRef]

Yasuda, T.

Yellampalle, B.

Yu, L.

Zhang, J.

Zhang, X.-C.

X. Lu and X.-C. Zhang, Appl. Phys. Lett. 98, 151111 (2011).
[CrossRef]

Z. Jiang and X.-C. Zhang, Opt. Lett. 23, 1114 (1998).
[CrossRef]

Q. Wu and X.-C. Zhang, Appl. Phys. Lett. 67, 3523 (1995).
[CrossRef]

Appl. Phys. Lett. (3)

S. Kono, M. Tani, P. Gu, and K. Sakai, Appl. Phys. Lett. 77, 4104 (2000).
[CrossRef]

X. Lu and X.-C. Zhang, Appl. Phys. Lett. 98, 151111 (2011).
[CrossRef]

Q. Wu and X.-C. Zhang, Appl. Phys. Lett. 67, 3523 (1995).
[CrossRef]

Exp. Eye Res. (1)

K. Singh, C. Dion, S. Costantino, M. Wajszilber, M. R. Lesk, and T. Ozaki, Exp. Eye Res. 91, 63 (2010).
[CrossRef]

Opt. Commun. (1)

A. F. Fercher, C. K. Hitzenberger, G. Kamp, and S. Y. El-Zaiat, Opt. Commun. 117, 43 (1995).
[CrossRef]

Opt. Express (2)

Opt. Lett. (6)

Rev. Sci. Instrum. (1)

K. Singh, C. Dion, M. R. Lesk, T. Ozaki, and S. Costantino, Rev. Sci. Instrum. 82, 023706 (2011).
[CrossRef]

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Figures (3)

Fig. 1.
Fig. 1.

Experimental setup.

Fig. 2.
Fig. 2.

THz electric field measure with SDI (red solid line) and EO sampling (black dashed line). The inset shows the corresponding spectrum of the THz field taken with the two techniques.

Fig. 3.
Fig. 3.

Spatial profile of the THz focal spot at the ZnTe detector position.

Equations (4)

Equations on this page are rendered with MathJax. Learn more.

I(k)=IR(k)+IS(k)+2IR(k)IS(k)cos[ϕ0+2kL].
ϕ=arctan(Im(I˜(L))/Re(I˜(L))).
dmax=2ln2πN2λ02Δλ.
E0=η0WπωI2g2(t)dt.

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