Abstract

We report the formation and annihilation of vectorial topological dipole mediated by plasmons in structure-free metal surfaces using a polarization singular optical beam. The measured far-field behavior is due to the strong angular and polarization dependence of the reflection coefficient and the phase shift experienced by the spatially inhomogeneous polarized beam around the plasmon resonance. The threshold polarization ellipticity (σth) anticipated for the dipole formation is experimentally verified.

© 2012 Optical Society of America

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  1. P. S. Tan, X.-C. Yuan, J. Lin, Q. Wang, T. Mei, R. E. Burge, and G. G. Mu, Appl. Phys. Lett. 92, 111108 (2008).
    [CrossRef]
  2. D. L. Andrews, M. Babiker, V. E. Lembessis, and S. Al-Awfi, Phys. Status Solidi RRL 4, 241 (2010).
    [CrossRef]
  3. P. S. Tan, G. H. Yuan, Q. Wang, N. Zhang, D. H. Zhang, and X.-C. Yuan, Opt. Lett. 36, 3287 (2011).
    [CrossRef]
  4. T. H. Lan, C. Y. Ho, and C. H. Tien, Appl. Phys. Lett. 98, 081107 (2011).
    [CrossRef]
  5. T. H. Lan and C. H. Tien, Opt. Express 18, 23314 (2010).
    [CrossRef]
  6. S.-W. Cho, J. Park, S.-Y. Lee, H. Kim, and B. Lee, Opt. Express 20, 10083 (2012).
    [CrossRef]
  7. H. Kim, J. Park, S. W. Cho, S. Y. Lee, M. Kang, and B. Lee, Nano Lett. 10, 529 (2010).
    [CrossRef]
  8. Y. V. Jayasurya, V. V. G. K. Inavalli, and N. K. Viswanathan, Appl. Opt. 50, E131 (2011).
    [CrossRef]
  9. J. F. Nye, Natural Focusing and Fine Structure of Light (Institute of Physics, 1999).
  10. M. Born and E. Wolf, Principles of Optics, 7th ed.(Cambridge Univ., 1999).
  11. R. M. A. Azzam and E. Bashara, Ellipsometry and Polarized Light (North-Holland, 1977).
  12. H. Reather, Surface Plasmons on Smooth and Rough Surfaces and on Gratings (Springer-Verlag, 1986).
  13. O. V. Angelsky, P. V. Polyanskii, I. I. Mokhun, C. Yu. Zenkova, H. V. Bogatyryiva, Ch. V. Felde, V. T. Bachinkskiy, T. M. Boichuk, and A. G. Ushenko, in Modern Metrology Concerns, Luigi Cocco, ed., (InTech, 2012), pp. 263–316.

2012 (1)

2011 (3)

2010 (3)

T. H. Lan and C. H. Tien, Opt. Express 18, 23314 (2010).
[CrossRef]

D. L. Andrews, M. Babiker, V. E. Lembessis, and S. Al-Awfi, Phys. Status Solidi RRL 4, 241 (2010).
[CrossRef]

H. Kim, J. Park, S. W. Cho, S. Y. Lee, M. Kang, and B. Lee, Nano Lett. 10, 529 (2010).
[CrossRef]

2008 (1)

P. S. Tan, X.-C. Yuan, J. Lin, Q. Wang, T. Mei, R. E. Burge, and G. G. Mu, Appl. Phys. Lett. 92, 111108 (2008).
[CrossRef]

Al-Awfi, S.

D. L. Andrews, M. Babiker, V. E. Lembessis, and S. Al-Awfi, Phys. Status Solidi RRL 4, 241 (2010).
[CrossRef]

Andrews, D. L.

D. L. Andrews, M. Babiker, V. E. Lembessis, and S. Al-Awfi, Phys. Status Solidi RRL 4, 241 (2010).
[CrossRef]

Angelsky, O. V.

O. V. Angelsky, P. V. Polyanskii, I. I. Mokhun, C. Yu. Zenkova, H. V. Bogatyryiva, Ch. V. Felde, V. T. Bachinkskiy, T. M. Boichuk, and A. G. Ushenko, in Modern Metrology Concerns, Luigi Cocco, ed., (InTech, 2012), pp. 263–316.

Azzam, R. M. A.

R. M. A. Azzam and E. Bashara, Ellipsometry and Polarized Light (North-Holland, 1977).

Babiker, M.

D. L. Andrews, M. Babiker, V. E. Lembessis, and S. Al-Awfi, Phys. Status Solidi RRL 4, 241 (2010).
[CrossRef]

Bachinkskiy, V. T.

O. V. Angelsky, P. V. Polyanskii, I. I. Mokhun, C. Yu. Zenkova, H. V. Bogatyryiva, Ch. V. Felde, V. T. Bachinkskiy, T. M. Boichuk, and A. G. Ushenko, in Modern Metrology Concerns, Luigi Cocco, ed., (InTech, 2012), pp. 263–316.

Bashara, E.

R. M. A. Azzam and E. Bashara, Ellipsometry and Polarized Light (North-Holland, 1977).

Bogatyryiva, H. V.

O. V. Angelsky, P. V. Polyanskii, I. I. Mokhun, C. Yu. Zenkova, H. V. Bogatyryiva, Ch. V. Felde, V. T. Bachinkskiy, T. M. Boichuk, and A. G. Ushenko, in Modern Metrology Concerns, Luigi Cocco, ed., (InTech, 2012), pp. 263–316.

Boichuk, T. M.

O. V. Angelsky, P. V. Polyanskii, I. I. Mokhun, C. Yu. Zenkova, H. V. Bogatyryiva, Ch. V. Felde, V. T. Bachinkskiy, T. M. Boichuk, and A. G. Ushenko, in Modern Metrology Concerns, Luigi Cocco, ed., (InTech, 2012), pp. 263–316.

Born, M.

M. Born and E. Wolf, Principles of Optics, 7th ed.(Cambridge Univ., 1999).

Burge, R. E.

P. S. Tan, X.-C. Yuan, J. Lin, Q. Wang, T. Mei, R. E. Burge, and G. G. Mu, Appl. Phys. Lett. 92, 111108 (2008).
[CrossRef]

Cho, S. W.

H. Kim, J. Park, S. W. Cho, S. Y. Lee, M. Kang, and B. Lee, Nano Lett. 10, 529 (2010).
[CrossRef]

Cho, S.-W.

Felde, Ch. V.

O. V. Angelsky, P. V. Polyanskii, I. I. Mokhun, C. Yu. Zenkova, H. V. Bogatyryiva, Ch. V. Felde, V. T. Bachinkskiy, T. M. Boichuk, and A. G. Ushenko, in Modern Metrology Concerns, Luigi Cocco, ed., (InTech, 2012), pp. 263–316.

Ho, C. Y.

T. H. Lan, C. Y. Ho, and C. H. Tien, Appl. Phys. Lett. 98, 081107 (2011).
[CrossRef]

Inavalli, V. V. G. K.

Jayasurya, Y. V.

Kang, M.

H. Kim, J. Park, S. W. Cho, S. Y. Lee, M. Kang, and B. Lee, Nano Lett. 10, 529 (2010).
[CrossRef]

Kim, H.

S.-W. Cho, J. Park, S.-Y. Lee, H. Kim, and B. Lee, Opt. Express 20, 10083 (2012).
[CrossRef]

H. Kim, J. Park, S. W. Cho, S. Y. Lee, M. Kang, and B. Lee, Nano Lett. 10, 529 (2010).
[CrossRef]

Lan, T. H.

T. H. Lan, C. Y. Ho, and C. H. Tien, Appl. Phys. Lett. 98, 081107 (2011).
[CrossRef]

T. H. Lan and C. H. Tien, Opt. Express 18, 23314 (2010).
[CrossRef]

Lee, B.

S.-W. Cho, J. Park, S.-Y. Lee, H. Kim, and B. Lee, Opt. Express 20, 10083 (2012).
[CrossRef]

H. Kim, J. Park, S. W. Cho, S. Y. Lee, M. Kang, and B. Lee, Nano Lett. 10, 529 (2010).
[CrossRef]

Lee, S. Y.

H. Kim, J. Park, S. W. Cho, S. Y. Lee, M. Kang, and B. Lee, Nano Lett. 10, 529 (2010).
[CrossRef]

Lee, S.-Y.

Lembessis, V. E.

D. L. Andrews, M. Babiker, V. E. Lembessis, and S. Al-Awfi, Phys. Status Solidi RRL 4, 241 (2010).
[CrossRef]

Lin, J.

P. S. Tan, X.-C. Yuan, J. Lin, Q. Wang, T. Mei, R. E. Burge, and G. G. Mu, Appl. Phys. Lett. 92, 111108 (2008).
[CrossRef]

Mei, T.

P. S. Tan, X.-C. Yuan, J. Lin, Q. Wang, T. Mei, R. E. Burge, and G. G. Mu, Appl. Phys. Lett. 92, 111108 (2008).
[CrossRef]

Mokhun, I. I.

O. V. Angelsky, P. V. Polyanskii, I. I. Mokhun, C. Yu. Zenkova, H. V. Bogatyryiva, Ch. V. Felde, V. T. Bachinkskiy, T. M. Boichuk, and A. G. Ushenko, in Modern Metrology Concerns, Luigi Cocco, ed., (InTech, 2012), pp. 263–316.

Mu, G. G.

P. S. Tan, X.-C. Yuan, J. Lin, Q. Wang, T. Mei, R. E. Burge, and G. G. Mu, Appl. Phys. Lett. 92, 111108 (2008).
[CrossRef]

Nye, J. F.

J. F. Nye, Natural Focusing and Fine Structure of Light (Institute of Physics, 1999).

Park, J.

S.-W. Cho, J. Park, S.-Y. Lee, H. Kim, and B. Lee, Opt. Express 20, 10083 (2012).
[CrossRef]

H. Kim, J. Park, S. W. Cho, S. Y. Lee, M. Kang, and B. Lee, Nano Lett. 10, 529 (2010).
[CrossRef]

Polyanskii, P. V.

O. V. Angelsky, P. V. Polyanskii, I. I. Mokhun, C. Yu. Zenkova, H. V. Bogatyryiva, Ch. V. Felde, V. T. Bachinkskiy, T. M. Boichuk, and A. G. Ushenko, in Modern Metrology Concerns, Luigi Cocco, ed., (InTech, 2012), pp. 263–316.

Reather, H.

H. Reather, Surface Plasmons on Smooth and Rough Surfaces and on Gratings (Springer-Verlag, 1986).

Tan, P. S.

P. S. Tan, G. H. Yuan, Q. Wang, N. Zhang, D. H. Zhang, and X.-C. Yuan, Opt. Lett. 36, 3287 (2011).
[CrossRef]

P. S. Tan, X.-C. Yuan, J. Lin, Q. Wang, T. Mei, R. E. Burge, and G. G. Mu, Appl. Phys. Lett. 92, 111108 (2008).
[CrossRef]

Tien, C. H.

T. H. Lan, C. Y. Ho, and C. H. Tien, Appl. Phys. Lett. 98, 081107 (2011).
[CrossRef]

T. H. Lan and C. H. Tien, Opt. Express 18, 23314 (2010).
[CrossRef]

Ushenko, A. G.

O. V. Angelsky, P. V. Polyanskii, I. I. Mokhun, C. Yu. Zenkova, H. V. Bogatyryiva, Ch. V. Felde, V. T. Bachinkskiy, T. M. Boichuk, and A. G. Ushenko, in Modern Metrology Concerns, Luigi Cocco, ed., (InTech, 2012), pp. 263–316.

Viswanathan, N. K.

Wang, Q.

P. S. Tan, G. H. Yuan, Q. Wang, N. Zhang, D. H. Zhang, and X.-C. Yuan, Opt. Lett. 36, 3287 (2011).
[CrossRef]

P. S. Tan, X.-C. Yuan, J. Lin, Q. Wang, T. Mei, R. E. Burge, and G. G. Mu, Appl. Phys. Lett. 92, 111108 (2008).
[CrossRef]

Wolf, E.

M. Born and E. Wolf, Principles of Optics, 7th ed.(Cambridge Univ., 1999).

Yuan, G. H.

Yuan, X.-C.

P. S. Tan, G. H. Yuan, Q. Wang, N. Zhang, D. H. Zhang, and X.-C. Yuan, Opt. Lett. 36, 3287 (2011).
[CrossRef]

P. S. Tan, X.-C. Yuan, J. Lin, Q. Wang, T. Mei, R. E. Burge, and G. G. Mu, Appl. Phys. Lett. 92, 111108 (2008).
[CrossRef]

Zenkova, C. Yu.

O. V. Angelsky, P. V. Polyanskii, I. I. Mokhun, C. Yu. Zenkova, H. V. Bogatyryiva, Ch. V. Felde, V. T. Bachinkskiy, T. M. Boichuk, and A. G. Ushenko, in Modern Metrology Concerns, Luigi Cocco, ed., (InTech, 2012), pp. 263–316.

Zhang, D. H.

Zhang, N.

Appl. Opt. (1)

Appl. Phys. Lett. (2)

P. S. Tan, X.-C. Yuan, J. Lin, Q. Wang, T. Mei, R. E. Burge, and G. G. Mu, Appl. Phys. Lett. 92, 111108 (2008).
[CrossRef]

T. H. Lan, C. Y. Ho, and C. H. Tien, Appl. Phys. Lett. 98, 081107 (2011).
[CrossRef]

Nano Lett. (1)

H. Kim, J. Park, S. W. Cho, S. Y. Lee, M. Kang, and B. Lee, Nano Lett. 10, 529 (2010).
[CrossRef]

Opt. Express (2)

Opt. Lett. (1)

Phys. Status Solidi RRL (1)

D. L. Andrews, M. Babiker, V. E. Lembessis, and S. Al-Awfi, Phys. Status Solidi RRL 4, 241 (2010).
[CrossRef]

Other (5)

J. F. Nye, Natural Focusing and Fine Structure of Light (Institute of Physics, 1999).

M. Born and E. Wolf, Principles of Optics, 7th ed.(Cambridge Univ., 1999).

R. M. A. Azzam and E. Bashara, Ellipsometry and Polarized Light (North-Holland, 1977).

H. Reather, Surface Plasmons on Smooth and Rough Surfaces and on Gratings (Springer-Verlag, 1986).

O. V. Angelsky, P. V. Polyanskii, I. I. Mokhun, C. Yu. Zenkova, H. V. Bogatyryiva, Ch. V. Felde, V. T. Bachinkskiy, T. M. Boichuk, and A. G. Ushenko, in Modern Metrology Concerns, Luigi Cocco, ed., (InTech, 2012), pp. 263–316.

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Figures (3)

Fig. 1.
Fig. 1.

(a) Schematic of the experimental setup, (b) polarization ellipse orientation map, and (c) star pattern in the incident polarization singular beam.

Fig. 2.
Fig. 2.

Experimentally measured angular dependence curves for RCP Gaussian (open symbol) and LCP vortex (filled symbol) beams: (a) SPR curve, (b) polarization ellipse orientation, ψ, (c) ellipticity, σ, and (d) phase, δ. Curves (b)–(d) are calculated using the measured Stokes polarization parameters.

Fig. 3.
Fig. 3.

Formation and annihilation of vectorial topological dipole: experimentally measured polarization ellipse orientation maps (top row) and the corresponding theoretical calculations (bottom row). Incident angles of the PS optical beam are (a) 42.38°, (b) 44.02°, (c) 44.41°, (d) 45.00°, and (e) 46.96°.

Equations (3)

Equations on this page are rendered with MathJax. Learn more.

r012p=[r01p+r12pexp(2ikz1d)1+r01pr12pexp(2ikz1d)],R=|r012p|2
rikp=[(kziεikzkεk)/(kziεi+kzkεk)],
E⃗={ε[rsx^+irpy^]+(xiy)[rsx^irpy^]}exp{i(kzωt)},

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