Abstract

Phase-shifting fringe projection is the primary structured illumination method for high-accuracy, three-dimensional (3D) shape measurements in the fields of profilometry and stereophotogrammetry. Many different schemes for the phase evaluation and the phase-shifted fringe pattern design exist. Here we focus on the role of the phase evaluation in the context of stereophotogrammetry, where the nominal phase value itself is merely used as an image feature that can be exploited to establish a correspondence between the two camera views. Starting from the classical phase evaluation function, we will discuss its essential properties for a highly accurate correspondence mapping. Based on the findings, we generalize the classical function to derive a generalized phase value for a sequence of stereo images. An experimental comparison between a correspondence assignment using the classical phase evaluation function and a specifically chosen general phase evaluation function is given.

© 2012 Optical Society of America

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References

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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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2011 (3)

2010 (2)

T. Luhmann, ISPRS J. Photogramm. Remote Sens. 65, 558 (2010), ISPRS Centenary Celebration Issue.
[CrossRef]

J. Salvi, S. Fernandez, T. Pribanic, and X. Llado, Pattern Recogn. 43, 2666 (2010).
[CrossRef]

2007 (1)

P. Kühmstedt, C. Munckelt, M. Heinze, C. Bräuer-Burchardt, and G. Notni, Proc. SPIE 6616, 66160B (2007).
[CrossRef]

2006 (1)

2000 (1)

J. P. Siebert and S. J. Marshall, Sens. Rev. 20, 218 (2000).
[CrossRef]

1998 (1)

P. Albrecht and B. Michaelis, IEEE Trans. Instrum. Meas. 47, 158 (1998).
[CrossRef]

Albrecht, P.

P. Albrecht and B. Michaelis, IEEE Trans. Instrum. Meas. 47, 158 (1998).
[CrossRef]

Bräuer-Burchardt, C.

P. Kühmstedt, C. Munckelt, M. Heinze, C. Bräuer-Burchardt, and G. Notni, Proc. SPIE 6616, 66160B (2007).
[CrossRef]

C. Bräuer-Burchardt, C. Munkelt, M. Heinze, P. Kühmstedt, and G. Notni, in Advanced Concepts for Intelligent Vision Systems, Vol. 5259 of Lecture Notes in Computer Science, J. Blanc-Talon, S. Bourennane, W. Philips, D. Popescu, and P. Scheunders, eds. (Springer, 2008), pp. 422–432.
[CrossRef]

C. Bräuer-Burchardt, M. Möller, C. Munkelt, M. Heinze, P. Kühmstedt, and G. Notni, in Applied Measurement SystemsP. Z. Haq, ed. (InTech, 2012).

Burke, J.

E. Hack and J. Burke, Rev. Sci. Instrum. 82, 061101 (2011).
[CrossRef]

Ekstrand, L.

Fernandez, S.

J. Salvi, S. Fernandez, T. Pribanic, and X. Llado, Pattern Recogn. 43, 2666 (2010).
[CrossRef]

Grosse, M.

Hack, E.

E. Hack and J. Burke, Rev. Sci. Instrum. 82, 061101 (2011).
[CrossRef]

Harendt, B.

Heinze, M.

P. Kühmstedt, C. Munckelt, M. Heinze, C. Bräuer-Burchardt, and G. Notni, Proc. SPIE 6616, 66160B (2007).
[CrossRef]

C. Bräuer-Burchardt, M. Möller, C. Munkelt, M. Heinze, P. Kühmstedt, and G. Notni, in Applied Measurement SystemsP. Z. Haq, ed. (InTech, 2012).

C. Bräuer-Burchardt, C. Munkelt, M. Heinze, P. Kühmstedt, and G. Notni, in Advanced Concepts for Intelligent Vision Systems, Vol. 5259 of Lecture Notes in Computer Science, J. Blanc-Talon, S. Bourennane, W. Philips, D. Popescu, and P. Scheunders, eds. (Springer, 2008), pp. 422–432.
[CrossRef]

Kowarschik, R.

Kühmstedt, P.

P. Kühmstedt, C. Munckelt, M. Heinze, C. Bräuer-Burchardt, and G. Notni, Proc. SPIE 6616, 66160B (2007).
[CrossRef]

C. Bräuer-Burchardt, C. Munkelt, M. Heinze, P. Kühmstedt, and G. Notni, in Advanced Concepts for Intelligent Vision Systems, Vol. 5259 of Lecture Notes in Computer Science, J. Blanc-Talon, S. Bourennane, W. Philips, D. Popescu, and P. Scheunders, eds. (Springer, 2008), pp. 422–432.
[CrossRef]

C. Bräuer-Burchardt, M. Möller, C. Munkelt, M. Heinze, P. Kühmstedt, and G. Notni, in Applied Measurement SystemsP. Z. Haq, ed. (InTech, 2012).

Llado, X.

J. Salvi, S. Fernandez, T. Pribanic, and X. Llado, Pattern Recogn. 43, 2666 (2010).
[CrossRef]

Luhmann, T.

T. Luhmann, ISPRS J. Photogramm. Remote Sens. 65, 558 (2010), ISPRS Centenary Celebration Issue.
[CrossRef]

Marshall, S. J.

J. P. Siebert and S. J. Marshall, Sens. Rev. 20, 218 (2000).
[CrossRef]

Michaelis, B.

P. Albrecht and B. Michaelis, IEEE Trans. Instrum. Meas. 47, 158 (1998).
[CrossRef]

Möller, M.

C. Bräuer-Burchardt, M. Möller, C. Munkelt, M. Heinze, P. Kühmstedt, and G. Notni, in Applied Measurement SystemsP. Z. Haq, ed. (InTech, 2012).

Munckelt, C.

P. Kühmstedt, C. Munckelt, M. Heinze, C. Bräuer-Burchardt, and G. Notni, Proc. SPIE 6616, 66160B (2007).
[CrossRef]

Munkelt, C.

C. Bräuer-Burchardt, M. Möller, C. Munkelt, M. Heinze, P. Kühmstedt, and G. Notni, in Applied Measurement SystemsP. Z. Haq, ed. (InTech, 2012).

C. Bräuer-Burchardt, C. Munkelt, M. Heinze, P. Kühmstedt, and G. Notni, in Advanced Concepts for Intelligent Vision Systems, Vol. 5259 of Lecture Notes in Computer Science, J. Blanc-Talon, S. Bourennane, W. Philips, D. Popescu, and P. Scheunders, eds. (Springer, 2008), pp. 422–432.
[CrossRef]

Notni, G.

P. Kühmstedt, C. Munckelt, M. Heinze, C. Bräuer-Burchardt, and G. Notni, Proc. SPIE 6616, 66160B (2007).
[CrossRef]

C. Bräuer-Burchardt, C. Munkelt, M. Heinze, P. Kühmstedt, and G. Notni, in Advanced Concepts for Intelligent Vision Systems, Vol. 5259 of Lecture Notes in Computer Science, J. Blanc-Talon, S. Bourennane, W. Philips, D. Popescu, and P. Scheunders, eds. (Springer, 2008), pp. 422–432.
[CrossRef]

C. Bräuer-Burchardt, M. Möller, C. Munkelt, M. Heinze, P. Kühmstedt, and G. Notni, in Applied Measurement SystemsP. Z. Haq, ed. (InTech, 2012).

Pribanic, T.

J. Salvi, S. Fernandez, T. Pribanic, and X. Llado, Pattern Recogn. 43, 2666 (2010).
[CrossRef]

Salvi, J.

J. Salvi, S. Fernandez, T. Pribanic, and X. Llado, Pattern Recogn. 43, 2666 (2010).
[CrossRef]

Schaffer, M.

Siebert, J. P.

J. P. Siebert and S. J. Marshall, Sens. Rev. 20, 218 (2000).
[CrossRef]

Wagner, H.

Wiegmann, A.

Zhang, S.

IEEE Trans. Instrum. Meas. (1)

P. Albrecht and B. Michaelis, IEEE Trans. Instrum. Meas. 47, 158 (1998).
[CrossRef]

ISPRS J. Photogramm. Remote Sens. (1)

T. Luhmann, ISPRS J. Photogramm. Remote Sens. 65, 558 (2010), ISPRS Centenary Celebration Issue.
[CrossRef]

Opt. Express (1)

Opt. Lett. (2)

Pattern Recogn. (1)

J. Salvi, S. Fernandez, T. Pribanic, and X. Llado, Pattern Recogn. 43, 2666 (2010).
[CrossRef]

Proc. SPIE (1)

P. Kühmstedt, C. Munckelt, M. Heinze, C. Bräuer-Burchardt, and G. Notni, Proc. SPIE 6616, 66160B (2007).
[CrossRef]

Rev. Sci. Instrum. (1)

E. Hack and J. Burke, Rev. Sci. Instrum. 82, 061101 (2011).
[CrossRef]

Sens. Rev. (1)

J. P. Siebert and S. J. Marshall, Sens. Rev. 20, 218 (2000).
[CrossRef]

Other (2)

C. Bräuer-Burchardt, C. Munkelt, M. Heinze, P. Kühmstedt, and G. Notni, in Advanced Concepts for Intelligent Vision Systems, Vol. 5259 of Lecture Notes in Computer Science, J. Blanc-Talon, S. Bourennane, W. Philips, D. Popescu, and P. Scheunders, eds. (Springer, 2008), pp. 422–432.
[CrossRef]

C. Bräuer-Burchardt, M. Möller, C. Munkelt, M. Heinze, P. Kühmstedt, and G. Notni, in Applied Measurement SystemsP. Z. Haq, ed. (InTech, 2012).

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Figures (1)

Fig. 1.
Fig. 1.

Qualitative comparison of a complex scene. Top, processed with generalized phase evaluation; bottom, processed with conventional phase evaluation.

Tables (1)

Tables Icon

Table 1. Overview of the Results on Experimental Data Using Conventional Phase Evaluation ϕV or the Generalized Phase Evaluation ϕV*a

Equations (8)

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ϕV(i,j)=arctann=1NCnVcnn=1NCnVsn,
|ϕ1(i,j)ϕ2(l,m)|<|ϕ1(i,j)ϕ2(x,y)|,(x,y)Ul,m
Cn1,Cn2RNm,bRCn1=mCn2+bϕ1(i,j)=ϕ2(l,m).
ϕ1(i,j)=arctann=1NCn1cnn=1NCn1sn=arctann=1N(mCn2+b)cnn=1N(mCn2+b)sn=arctanmn=1NCn2cn+bn=1Ncnmn=1NCn2sn+bn=1Nsn=arctanmn=1NCn2cnmn=1NCn2sn=ϕ2(l,m),
arctann=1NCn1cnn=1NCn1sn=arctann=1NCn2cnn=1NCn2snn=1NCn1cnn=1NCn1sn=n=1NCn2cnn=1NCn2snn=1NCn1cnn=1NCn2cn=n=1NCn1snn=1NCn2snn=1NCn1cn=mn=1NCn2cnwithm=n=1NCn1snn=1NCn2snn=1N(Cn1mCn2)cn=0analogue it holds thatn=1N(Cn1mCn2)sn=0.
ϕV*(i,j)=f(n=1NCnVcnn=1NCnVsn),
ϕV*(i,j)=arctann=1NCnVcnn=1NCnVsn,
cn={1cos2πnN>01cos2πnN0,sn{1sin2πnN>01sin2πnN0

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