Abstract

We report on the recent design and fabrication of kagome-type hollow-core photonic crystal fibers for the purpose of high-power ultrashort pulse transportation. The fabricated seven-cell three-ring hypocycloid-shaped large core fiber exhibits an up-to-date lowest attenuation (among all kagome fibers) of 40dB/km over a broadband transmission centered at 1500 nm. We show that the large core size, low attenuation, broadband transmission, single-mode guidance, and low dispersion make it an ideal host for high-power laser beam transportation. By filling the fiber with helium gas, a 74 μJ, 850 fs, and 40 kHz repetition rate ultrashort pulse at 1550 nm has been faithfully delivered at the fiber output with little propagation pulse distortion. Compression of a 105 μJ laser pulse from 850 fs down to 300 fs has been achieved by operating the fiber in ambient air.

© 2012 Optical Society of America

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    [CrossRef]
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    [CrossRef]
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2012

Y. Y. Wang, X. Peng, M. Alharbi, C. Fourcade Dutin, T. D. Bradley, F. Gérôme, M. Mielke, T. Booth, and F. Benabid, Proc. SPIE 8269, 826907 (2012).
[CrossRef]

2011

2010

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

2009

A. V. Smith, B. T. Do, G. R. Hadley, and R. L. Farrow, IEEE J. Sel. Top. Quantum Electron. 15, 153 (2009).
[CrossRef]

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

2007

F. Couny, F. Benabid, P. J. Roberts, P. S. Light, and M. G. Raymer, Science 318, 1118 (2007).
[CrossRef]

2006

F. Benabid, Phil. Trans. R. Soc. A 364, 3439 (2006).
[CrossRef]

2005

2004

1998

H. Loesel, J. P. Fischer, M. H. Götz, C. Horvath, T. Juhasz, F. Noack, N. Suhm, and J. F. Bille, Appl. Phys. B 66, 121 (1998).
[CrossRef]

1996

B. N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, and A. Tünnermann, Appl. Phys. A 63, 109 (1996).
[CrossRef]

1992

Alharbi, M.

Y. Y. Wang, X. Peng, M. Alharbi, C. Fourcade Dutin, T. D. Bradley, F. Gérôme, M. Mielke, T. Booth, and F. Benabid, Proc. SPIE 8269, 826907 (2012).
[CrossRef]

Allen, N.

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

Anderson, D.

Baer, C. R. E.

O. H. Heckl, C. J. Saraceno, C. R. E. Baer, T. Südmeyer, Y. Y. Wang, Y. Cheng, F. Benabid, and U. Keller, Opt. Express 19, 19142 (2011).
[CrossRef]

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

Benabid, F.

Y. Y. Wang, X. Peng, M. Alharbi, C. Fourcade Dutin, T. D. Bradley, F. Gérôme, M. Mielke, T. Booth, and F. Benabid, Proc. SPIE 8269, 826907 (2012).
[CrossRef]

Y. Y. Wang, N. V. Wheeler, F. Couny, P. J. Roberts, and F. Benabid, Opt. Lett. 36, 669 (2011).
[CrossRef]

O. H. Heckl, C. J. Saraceno, C. R. E. Baer, T. Südmeyer, Y. Y. Wang, Y. Cheng, F. Benabid, and U. Keller, Opt. Express 19, 19142 (2011).
[CrossRef]

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

F. Couny, F. Benabid, P. J. Roberts, P. S. Light, and M. G. Raymer, Science 318, 1118 (2007).
[CrossRef]

F. Benabid, Phil. Trans. R. Soc. A 364, 3439 (2006).
[CrossRef]

Bille, J. F.

H. Loesel, J. P. Fischer, M. H. Götz, C. Horvath, T. Juhasz, F. Noack, N. Suhm, and J. F. Bille, Appl. Phys. B 66, 121 (1998).
[CrossRef]

Birks, T. A.

Booth, T.

Y. Y. Wang, X. Peng, M. Alharbi, C. Fourcade Dutin, T. D. Bradley, F. Gérôme, M. Mielke, T. Booth, and F. Benabid, Proc. SPIE 8269, 826907 (2012).
[CrossRef]

X. Peng, M. Mielke, and T. Booth, Opt. Express 19, 923 (2011).
[CrossRef]

Bradley, T. D.

Y. Y. Wang, X. Peng, M. Alharbi, C. Fourcade Dutin, T. D. Bradley, F. Gérôme, M. Mielke, T. Booth, and F. Benabid, Proc. SPIE 8269, 826907 (2012).
[CrossRef]

Campbell, S.

Cheng, Y.

Chichkov, B. N.

B. N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, and A. Tünnermann, Appl. Phys. A 63, 109 (1996).
[CrossRef]

Cline, R.

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

Couny, F.

Y. Y. Wang, N. V. Wheeler, F. Couny, P. J. Roberts, and F. Benabid, Opt. Lett. 36, 669 (2011).
[CrossRef]

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

F. Couny, F. Benabid, P. J. Roberts, P. S. Light, and M. G. Raymer, Science 318, 1118 (2007).
[CrossRef]

P. J. Roberts, F. Couny, H. Sabert, B. J. Mangan, D. P. Williams, L. Farr, M. W. Mason, A. Tomlinson, T. A. Birks, J. C. Knight, and P. St. J. Russell, Opt. Express 13, 236 (2005).
[CrossRef]

Desaix, M.

Do, B. T.

A. V. Smith, B. T. Do, G. R. Hadley, and R. L. Farrow, IEEE J. Sel. Top. Quantum Electron. 15, 153 (2009).
[CrossRef]

Dutin, C. Fourcade

Y. Y. Wang, X. Peng, M. Alharbi, C. Fourcade Dutin, T. D. Bradley, F. Gérôme, M. Mielke, T. Booth, and F. Benabid, Proc. SPIE 8269, 826907 (2012).
[CrossRef]

Farr, L.

Farrow, R. L.

A. V. Smith, B. T. Do, G. R. Hadley, and R. L. Farrow, IEEE J. Sel. Top. Quantum Electron. 15, 153 (2009).
[CrossRef]

Ferrel, M.

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

Fischer, J. P.

H. Loesel, J. P. Fischer, M. H. Götz, C. Horvath, T. Juhasz, F. Noack, N. Suhm, and J. F. Bille, Appl. Phys. B 66, 121 (1998).
[CrossRef]

Gaudiosi, D.

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

Gérôme, F.

Y. Y. Wang, X. Peng, M. Alharbi, C. Fourcade Dutin, T. D. Bradley, F. Gérôme, M. Mielke, T. Booth, and F. Benabid, Proc. SPIE 8269, 826907 (2012).
[CrossRef]

Götz, M. H.

H. Loesel, J. P. Fischer, M. H. Götz, C. Horvath, T. Juhasz, F. Noack, N. Suhm, and J. F. Bille, Appl. Phys. B 66, 121 (1998).
[CrossRef]

Greenberg, M.

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

Gu, X.

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

Hadley, G. R.

A. V. Smith, B. T. Do, G. R. Hadley, and R. L. Farrow, IEEE J. Sel. Top. Quantum Electron. 15, 153 (2009).
[CrossRef]

Heckl, O. H.

O. H. Heckl, C. J. Saraceno, C. R. E. Baer, T. Südmeyer, Y. Y. Wang, Y. Cheng, F. Benabid, and U. Keller, Opt. Express 19, 19142 (2011).
[CrossRef]

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

Holler, M.

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

Horvath, C.

H. Loesel, J. P. Fischer, M. H. Götz, C. Horvath, T. Juhasz, F. Noack, N. Suhm, and J. F. Bille, Appl. Phys. B 66, 121 (1998).
[CrossRef]

Juhasz, T.

H. Loesel, J. P. Fischer, M. H. Götz, C. Horvath, T. Juhasz, F. Noack, N. Suhm, and J. F. Bille, Appl. Phys. B 66, 121 (1998).
[CrossRef]

Keller, U.

O. H. Heckl, C. J. Saraceno, C. R. E. Baer, T. Südmeyer, Y. Y. Wang, Y. Cheng, F. Benabid, and U. Keller, Opt. Express 19, 19142 (2011).
[CrossRef]

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

Kim, K.

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

Knight, J.

Knight, J. C.

Kränkel, C.

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

Light, P.

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

Light, P. S.

F. Couny, F. Benabid, P. J. Roberts, P. S. Light, and M. G. Raymer, Science 318, 1118 (2007).
[CrossRef]

Lisak, M.

Loesel, H.

H. Loesel, J. P. Fischer, M. H. Götz, C. Horvath, T. Juhasz, F. Noack, N. Suhm, and J. F. Bille, Appl. Phys. B 66, 121 (1998).
[CrossRef]

Luan, F.

Mangan, B.

Mangan, B. J.

Manning, M.

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

Marchese, S. V.

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

Mason, M. W.

Mielke, M.

Y. Y. Wang, X. Peng, M. Alharbi, C. Fourcade Dutin, T. D. Bradley, F. Gérôme, M. Mielke, T. Booth, and F. Benabid, Proc. SPIE 8269, 826907 (2012).
[CrossRef]

X. Peng, M. Mielke, and T. Booth, Opt. Express 19, 923 (2011).
[CrossRef]

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

Momma, C.

B. N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, and A. Tünnermann, Appl. Phys. A 63, 109 (1996).
[CrossRef]

Noack, F.

H. Loesel, J. P. Fischer, M. H. Götz, C. Horvath, T. Juhasz, F. Noack, N. Suhm, and J. F. Bille, Appl. Phys. B 66, 121 (1998).
[CrossRef]

Nolte, S.

B. N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, and A. Tünnermann, Appl. Phys. A 63, 109 (1996).
[CrossRef]

Peng, X.

Y. Y. Wang, X. Peng, M. Alharbi, C. Fourcade Dutin, T. D. Bradley, F. Gérôme, M. Mielke, T. Booth, and F. Benabid, Proc. SPIE 8269, 826907 (2012).
[CrossRef]

X. Peng, M. Mielke, and T. Booth, Opt. Express 19, 923 (2011).
[CrossRef]

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

Prachayaamorn, N.

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

Quiroga-Teixeiro, M. L.

Raymer, M. G.

F. Couny, F. Benabid, P. J. Roberts, P. S. Light, and M. G. Raymer, Science 318, 1118 (2007).
[CrossRef]

Reid, D.

Roberts, P.

Roberts, P. J.

Robinson, J. S.

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

Russell, P.

Russell, P. St. J.

Sabert, H.

Sapers, S.

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

Saraceno, C. J.

Schapper, F.

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

Slovick, M.

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

Smith, A. V.

A. V. Smith, B. T. Do, G. R. Hadley, and R. L. Farrow, IEEE J. Sel. Top. Quantum Electron. 15, 153 (2009).
[CrossRef]

Südmeyer, T.

O. H. Heckl, C. J. Saraceno, C. R. E. Baer, T. Südmeyer, Y. Y. Wang, Y. Cheng, F. Benabid, and U. Keller, Opt. Express 19, 19142 (2011).
[CrossRef]

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

Suhm, N.

H. Loesel, J. P. Fischer, M. H. Götz, C. Horvath, T. Juhasz, F. Noack, N. Suhm, and J. F. Bille, Appl. Phys. B 66, 121 (1998).
[CrossRef]

Tisch, J. W. G.

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

Tomlinson, A.

Tünnermann, A.

B. N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, and A. Tünnermann, Appl. Phys. A 63, 109 (1996).
[CrossRef]

von Alvensleben, F.

B. N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, and A. Tünnermann, Appl. Phys. A 63, 109 (1996).
[CrossRef]

Wang, Y. Y.

Wheeler, N. V.

Williams, D.

Williams, D. P.

Xiao, D.

Appl. Phys. A

B. N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, and A. Tünnermann, Appl. Phys. A 63, 109 (1996).
[CrossRef]

Appl. Phys. B

H. Loesel, J. P. Fischer, M. H. Götz, C. Horvath, T. Juhasz, F. Noack, N. Suhm, and J. F. Bille, Appl. Phys. B 66, 121 (1998).
[CrossRef]

O. H. Heckl, C. R. E. Baer, C. Kränkel, S. V. Marchese, F. Schapper, M. Holler, T. Südmeyer, J. S. Robinson, J. W. G. Tisch, F. Couny, P. Light, F. Benabid, and U. Keller, Appl. Phys. B 97, 369 (2009).
[CrossRef]

IEEE J. Sel. Top. Quantum Electron.

A. V. Smith, B. T. Do, G. R. Hadley, and R. L. Farrow, IEEE J. Sel. Top. Quantum Electron. 15, 153 (2009).
[CrossRef]

J. Laser. Micro/Nanoeng.

M. Mielke, D. Gaudiosi, K. Kim, M. Greenberg, X. Gu, R. Cline, X. Peng, M. Slovick, N. Allen, M. Manning, M. Ferrel, N. Prachayaamorn, and S. Sapers, J. Laser. Micro/Nanoeng. 5, 53 (2010).
[CrossRef]

J. Opt. Soc. Am. B

Opt. Express

Opt. Lett.

Phil. Trans. R. Soc. A

F. Benabid, Phil. Trans. R. Soc. A 364, 3439 (2006).
[CrossRef]

Proc. SPIE

Y. Y. Wang, X. Peng, M. Alharbi, C. Fourcade Dutin, T. D. Bradley, F. Gérôme, M. Mielke, T. Booth, and F. Benabid, Proc. SPIE 8269, 826907 (2012).
[CrossRef]

Science

F. Couny, F. Benabid, P. J. Roberts, P. S. Light, and M. G. Raymer, Science 318, 1118 (2007).
[CrossRef]

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Figures (4)

Fig. 1.
Fig. 1.

Scanning electronic micrograph (SEM) of the fabricated seven-cell three-ring hypocycloid-core kagome fiber showing (a) the whole structure and (b) the 66–79 μm core.

Fig. 2.
Fig. 2.

(a) Fiber optical transmission spectra. (b) The fiber optical attenuation spectrum (solid black curve) and calculated GVD (dashed red curve). The dotted horizontal curve shows the baseline of the attenuation figure. (c) Calculated near-field (NF) pattern with an MFD of 47 μm. (d) Calculated intensity profile showing along the axis shown in the top left insert. (e) Measured NF pattern showing. (f) Measured far-field (FF) pattern.

Fig. 3.
Fig. 3.

Setup of the pulse-spread free experiment. HWP, half-wave plate; PBS, polarizing beam splitter; OSA, optical spectrum analyzer; AC, second-harmonic intensity autocorrelator.

Fig. 4.
Fig. 4.

Left: pulse-spread free experiment when the fiber is filled with helium. (a) Fiber output optical spectra of the fiber for different output pulse energies and the laser spectrum at 100 μJ (gray dashed curve), (b) intensity autocorrelation (AC) traces, and (c) FWHM pulse durations versus output pulse energy (solid squares) and a linear fit (red line) for an HC-PCF filled with 3.4 bar of helium. Right: same with an HC-PCF filled with ambient air. In (f), the error bar is ±0.05ps due to AC resolution, and the fit curve is for visual guidance.

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