Abstract

We report on the observation of a dynamical thermal effect in InGaAsP microtubes at telecom wavelengths. The microtubes are fabricated by releasing a strained semiconductor bilayer and are picked up by abruptly tapered optical fibers for subsequent coupling with adiabatically tapered optical fibers. As a result of absorption by InAs quantum dots embedded in the tube structure, these microtubes show dynamical thermal effects at wavelengths around 1525 nm and 1578 nm, while they are passive at longer wavelengths near 1634 nm. The photon absorption induced thermal effect is visualized by generating a pair of microbottles. The dynamical thermal effect can be avoided or exploited for passive or active applications by utilizing appropriate resonance wavelengths.

© 2012 Optical Society of America

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  1. V. Ya. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chekhovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E (Amsterdam) 6, 828 (2000).
    [CrossRef]
  2. T. Kipp, H. Welsch, C. Strelow, C. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
    [CrossRef]
  3. S. Vicknesh, F. Li, and Z. Mi, Appl. Phys. Lett. 94, 081101 (2009).
    [CrossRef]
  4. F. Li, Z. Mi, and S. Vicknesh, Opt. Lett. 34, 2915 (2009).
    [CrossRef]
  5. A. Bernardi, A. R. Goñi, M. I. Alonso, F. Alsina, H. Scheel, P. O. Vaccaro, and N. Saito, “Probing residual strain in InGaAs/GaAs micro-origami tubes by micro-Raman spectroscopy,” J. Appl. Phys. 99, 063512 (2006).
    [CrossRef]
  6. F. Li and Z. Mi, Opt. Express 17, 19933 (2009).
    [CrossRef]
  7. C. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
    [CrossRef]
  8. Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
    [CrossRef]
  9. Z. Tian, V. Veerasubramanian, P. Bianucci, S. Mukherjee, Z. Mi, A. G. Kirk, and D. V. Plant, Opt. Express 19, 12164 (2011).
    [CrossRef]
  10. Z. Tian, V. Veerasubramanian, P. Bianucci, Z. Mi, A. G. Kirk, and D. V. Plant, Opt. Lett. 36, 3506 (2011).
    [CrossRef]
  11. T. Carmon, L. Yang, and K. J. Vahala, Opt. Express 12, 4742 (2004).
    [CrossRef]
  12. C. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, C. Heyn, D. heitmann, and T. Kipp, Phys. Rev. Lett., 101, 127403 (2008).
    [CrossRef]
  13. Y. Tseng, F. Tseng, Y. Chen, and C. Chieng, Sens. Actuators A 114, 292 (2004).
    [CrossRef]
  14. M. Pöllinger, D. O’Shea, F. Warken, and A. Rauschenbeutel, Phys. Rev. Lett. 103, 053901 (2009).
    [CrossRef]

2011 (2)

2010 (2)

C. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
[CrossRef]

2009 (4)

M. Pöllinger, D. O’Shea, F. Warken, and A. Rauschenbeutel, Phys. Rev. Lett. 103, 053901 (2009).
[CrossRef]

F. Li, Z. Mi, and S. Vicknesh, Opt. Lett. 34, 2915 (2009).
[CrossRef]

F. Li and Z. Mi, Opt. Express 17, 19933 (2009).
[CrossRef]

S. Vicknesh, F. Li, and Z. Mi, Appl. Phys. Lett. 94, 081101 (2009).
[CrossRef]

2008 (1)

C. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, C. Heyn, D. heitmann, and T. Kipp, Phys. Rev. Lett., 101, 127403 (2008).
[CrossRef]

2006 (2)

A. Bernardi, A. R. Goñi, M. I. Alonso, F. Alsina, H. Scheel, P. O. Vaccaro, and N. Saito, “Probing residual strain in InGaAs/GaAs micro-origami tubes by micro-Raman spectroscopy,” J. Appl. Phys. 99, 063512 (2006).
[CrossRef]

T. Kipp, H. Welsch, C. Strelow, C. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef]

2004 (2)

Y. Tseng, F. Tseng, Y. Chen, and C. Chieng, Sens. Actuators A 114, 292 (2004).
[CrossRef]

T. Carmon, L. Yang, and K. J. Vahala, Opt. Express 12, 4742 (2004).
[CrossRef]

2000 (1)

V. Ya. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chekhovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E (Amsterdam) 6, 828 (2000).
[CrossRef]

Alonso, M. I.

A. Bernardi, A. R. Goñi, M. I. Alonso, F. Alsina, H. Scheel, P. O. Vaccaro, and N. Saito, “Probing residual strain in InGaAs/GaAs micro-origami tubes by micro-Raman spectroscopy,” J. Appl. Phys. 99, 063512 (2006).
[CrossRef]

Alsina, F.

A. Bernardi, A. R. Goñi, M. I. Alonso, F. Alsina, H. Scheel, P. O. Vaccaro, and N. Saito, “Probing residual strain in InGaAs/GaAs micro-origami tubes by micro-Raman spectroscopy,” J. Appl. Phys. 99, 063512 (2006).
[CrossRef]

Benyoucef, M.

C. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

Bernardi, A.

A. Bernardi, A. R. Goñi, M. I. Alonso, F. Alsina, H. Scheel, P. O. Vaccaro, and N. Saito, “Probing residual strain in InGaAs/GaAs micro-origami tubes by micro-Raman spectroscopy,” J. Appl. Phys. 99, 063512 (2006).
[CrossRef]

Bianucci, P.

Carmon, T.

Chekhovskiy, A. V.

V. Ya. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chekhovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E (Amsterdam) 6, 828 (2000).
[CrossRef]

Chen, Y.

Y. Tseng, F. Tseng, Y. Chen, and C. Chieng, Sens. Actuators A 114, 292 (2004).
[CrossRef]

Chieng, C.

Y. Tseng, F. Tseng, Y. Chen, and C. Chieng, Sens. Actuators A 114, 292 (2004).
[CrossRef]

Deneke, C.

C. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

Gavrilova, T. A.

V. Ya. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chekhovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E (Amsterdam) 6, 828 (2000).
[CrossRef]

Goñi, A. R.

A. Bernardi, A. R. Goñi, M. I. Alonso, F. Alsina, H. Scheel, P. O. Vaccaro, and N. Saito, “Probing residual strain in InGaAs/GaAs micro-origami tubes by micro-Raman spectroscopy,” J. Appl. Phys. 99, 063512 (2006).
[CrossRef]

Gutakovsky, A. K.

V. Ya. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chekhovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E (Amsterdam) 6, 828 (2000).
[CrossRef]

heitmann, D.

C. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, C. Heyn, D. heitmann, and T. Kipp, Phys. Rev. Lett., 101, 127403 (2008).
[CrossRef]

T. Kipp, H. Welsch, C. Strelow, C. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef]

Heyn, C.

C. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, C. Heyn, D. heitmann, and T. Kipp, Phys. Rev. Lett., 101, 127403 (2008).
[CrossRef]

T. Kipp, H. Welsch, C. Strelow, C. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef]

Kipp, T.

C. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, C. Heyn, D. heitmann, and T. Kipp, Phys. Rev. Lett., 101, 127403 (2008).
[CrossRef]

T. Kipp, H. Welsch, C. Strelow, C. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef]

Kiravittaya, S.

C. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

Kirk, A. G.

Li, F.

Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
[CrossRef]

F. Li, Z. Mi, and S. Vicknesh, Opt. Lett. 34, 2915 (2009).
[CrossRef]

S. Vicknesh, F. Li, and Z. Mi, Appl. Phys. Lett. 94, 081101 (2009).
[CrossRef]

F. Li and Z. Mi, Opt. Express 17, 19933 (2009).
[CrossRef]

Malachias, A.

C. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

Metzger, T. H.

C. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

Mi, Z.

Mukherjee, S.

O’Shea, D.

M. Pöllinger, D. O’Shea, F. Warken, and A. Rauschenbeutel, Phys. Rev. Lett. 103, 053901 (2009).
[CrossRef]

Plant, D. V.

Pöllinger, M.

M. Pöllinger, D. O’Shea, F. Warken, and A. Rauschenbeutel, Phys. Rev. Lett. 103, 053901 (2009).
[CrossRef]

Preobrazhenskii, V. V.

V. Ya. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chekhovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E (Amsterdam) 6, 828 (2000).
[CrossRef]

Prinz, V. Ya.

V. Ya. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chekhovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E (Amsterdam) 6, 828 (2000).
[CrossRef]

Putyato, M. A.

V. Ya. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chekhovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E (Amsterdam) 6, 828 (2000).
[CrossRef]

Rauschenbeutel, A.

M. Pöllinger, D. O’Shea, F. Warken, and A. Rauschenbeutel, Phys. Rev. Lett. 103, 053901 (2009).
[CrossRef]

Rehberg, H.

C. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, C. Heyn, D. heitmann, and T. Kipp, Phys. Rev. Lett., 101, 127403 (2008).
[CrossRef]

Saito, N.

A. Bernardi, A. R. Goñi, M. I. Alonso, F. Alsina, H. Scheel, P. O. Vaccaro, and N. Saito, “Probing residual strain in InGaAs/GaAs micro-origami tubes by micro-Raman spectroscopy,” J. Appl. Phys. 99, 063512 (2006).
[CrossRef]

Scheel, H.

A. Bernardi, A. R. Goñi, M. I. Alonso, F. Alsina, H. Scheel, P. O. Vaccaro, and N. Saito, “Probing residual strain in InGaAs/GaAs micro-origami tubes by micro-Raman spectroscopy,” J. Appl. Phys. 99, 063512 (2006).
[CrossRef]

Schmidt, O. G.

C. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

Schultz, C. M.

C. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, C. Heyn, D. heitmann, and T. Kipp, Phys. Rev. Lett., 101, 127403 (2008).
[CrossRef]

Seleznev, V. A.

V. Ya. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chekhovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E (Amsterdam) 6, 828 (2000).
[CrossRef]

Strelow, C.

C. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, C. Heyn, D. heitmann, and T. Kipp, Phys. Rev. Lett., 101, 127403 (2008).
[CrossRef]

T. Kipp, H. Welsch, C. Strelow, C. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef]

Tian, Z.

Tseng, F.

Y. Tseng, F. Tseng, Y. Chen, and C. Chieng, Sens. Actuators A 114, 292 (2004).
[CrossRef]

Tseng, Y.

Y. Tseng, F. Tseng, Y. Chen, and C. Chieng, Sens. Actuators A 114, 292 (2004).
[CrossRef]

Vaccaro, P. O.

A. Bernardi, A. R. Goñi, M. I. Alonso, F. Alsina, H. Scheel, P. O. Vaccaro, and N. Saito, “Probing residual strain in InGaAs/GaAs micro-origami tubes by micro-Raman spectroscopy,” J. Appl. Phys. 99, 063512 (2006).
[CrossRef]

Vahala, K. J.

Veerasubramanian, V.

Vicknesh, S.

S. Vicknesh, F. Li, and Z. Mi, Appl. Phys. Lett. 94, 081101 (2009).
[CrossRef]

F. Li, Z. Mi, and S. Vicknesh, Opt. Lett. 34, 2915 (2009).
[CrossRef]

Warken, F.

M. Pöllinger, D. O’Shea, F. Warken, and A. Rauschenbeutel, Phys. Rev. Lett. 103, 053901 (2009).
[CrossRef]

Welsch, H.

C. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, C. Heyn, D. heitmann, and T. Kipp, Phys. Rev. Lett., 101, 127403 (2008).
[CrossRef]

T. Kipp, H. Welsch, C. Strelow, C. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef]

Yang, L.

Appl. Phys. Lett. (2)

S. Vicknesh, F. Li, and Z. Mi, Appl. Phys. Lett. 94, 081101 (2009).
[CrossRef]

C. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

IEEE Photon. Technol. Lett. (1)

Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
[CrossRef]

J. Appl. Phys. (1)

A. Bernardi, A. R. Goñi, M. I. Alonso, F. Alsina, H. Scheel, P. O. Vaccaro, and N. Saito, “Probing residual strain in InGaAs/GaAs micro-origami tubes by micro-Raman spectroscopy,” J. Appl. Phys. 99, 063512 (2006).
[CrossRef]

Opt. Express (3)

Opt. Lett. (2)

Phys. Rev. Lett. (3)

T. Kipp, H. Welsch, C. Strelow, C. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef]

C. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, C. Heyn, D. heitmann, and T. Kipp, Phys. Rev. Lett., 101, 127403 (2008).
[CrossRef]

M. Pöllinger, D. O’Shea, F. Warken, and A. Rauschenbeutel, Phys. Rev. Lett. 103, 053901 (2009).
[CrossRef]

Physica E (Amsterdam) (1)

V. Ya. Prinz, V. A. Seleznev, A. K. Gutakovsky, A. V. Chekhovskiy, V. V. Preobrazhenskii, M. A. Putyato, and T. A. Gavrilova, Physica E (Amsterdam) 6, 828 (2000).
[CrossRef]

Sens. Actuators A (1)

Y. Tseng, F. Tseng, Y. Chen, and C. Chieng, Sens. Actuators A 114, 292 (2004).
[CrossRef]

Supplementary Material (1)

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