Abstract

A novel phase-sensitive surface plasmon resonance (pSPR) biosensor based on differential phase measurement between two cylindrical vector beams, namely radially polarized and azmuthally polarized beams, is proposed and studied in an inverted microscope. Different from a fixed angle or a relatively small angular range for SPR excitation in the attenuated total reflection (ATR) configuration, the signal beam focused by a total internal reflection fluorescence microscopic objective contains the entire angular range from 0 to the maximum angle given by the numerical aperture, leading to a dynamic range of 0.41 RIU which is over seven times wider than the best result of the ATR pSPR sensor. Moreover, with the technique of differential phase measurement between radial and azimuthal polarizations employed in our configuration, high sensitivity of ±9.05×108 refractive index unit/1deg can simultaneously be achieved in principle. The proposed technique maintains the unique advantages in terms of securing high imaging resolution and sensitivity with an ultra-wide dynamic range simultaneously.

© 2012 Optical Society of America

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References

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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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2012 (1)

Y. H. Huang, H. P. Ho, S. Y. Wu, and S. K. Kong, Adv. Opt. Technol. 2012, 471957 (2012).
[CrossRef]

2011 (1)

2009 (1)

2008 (1)

2007 (2)

2006 (2)

H. P. Ho, W. C. Law, S. Y. Wu, X. H. Liu, S. P. Wong, C. Lin, and S. K. Kong, Sens. Actuators B 114, 80 (2006).
[CrossRef]

K. J. Moh, X. C. Yuan, J. Bu, D. K. Y. Low, and R. E. Burge, Appl. Phys. Lett. 89, 251114 (2006).
[CrossRef]

2005 (1)

R. L. Rich and D. G. Myszka, J. Mol. Recognit. 18, 431 (2005).
[CrossRef]

2004 (1)

2000 (1)

H. Kano and W. Knoll, Opt. Commun. 182, 11 (2000).
[CrossRef]

1998 (2)

Bu, J.

Burge, R. E.

K. J. Moh, X. C. Yuan, J. Bu, R. E. Burge, and B. Z. Gao, Appl. Opt. 46, 7544 (2007).
[CrossRef]

K. J. Moh, X. C. Yuan, J. Bu, D. K. Y. Low, and R. E. Burge, Appl. Phys. Lett. 89, 251114 (2006).
[CrossRef]

Gao, B. Z.

Ho, H. P.

Y. H. Huang, H. P. Ho, S. Y. Wu, and S. K. Kong, Adv. Opt. Technol. 2012, 471957 (2012).
[CrossRef]

Y. H. Huang, H. P. Ho, S. Y. Wu, S. K. Kong, W. W. Wong, and P. Shum, Opt. Lett. 36, 4092 (2011).
[CrossRef]

W. Yuan, H. P. Ho, Y. K. Suen, S. K. Kong, and C. Lin, Appl. Opt. 46, 8068 (2007).
[CrossRef]

H. P. Ho, W. C. Law, S. Y. Wu, X. H. Liu, S. P. Wong, C. Lin, and S. K. Kong, Sens. Actuators B 114, 80 (2006).
[CrossRef]

S. Y. Wu, H. P. Ho, W. C. Law, and C. L. Lin, Opt. Lett. 29, 2378 (2004).
[CrossRef]

Huang, Y. H.

Y. H. Huang, H. P. Ho, S. Y. Wu, and S. K. Kong, Adv. Opt. Technol. 2012, 471957 (2012).
[CrossRef]

Y. H. Huang, H. P. Ho, S. Y. Wu, S. K. Kong, W. W. Wong, and P. Shum, Opt. Lett. 36, 4092 (2011).
[CrossRef]

Kano, H.

H. Kano and W. Knoll, Opt. Commun. 182, 11 (2000).
[CrossRef]

H. Kano and W. Knoll, Opt. Commun. 153, 235 (1998).
[CrossRef]

H. Kano, S. Mizuguchi, and S. Kawata, J. Opt. Soc. Am. B 15, 1381 (1998).
[CrossRef]

Kawata, S.

Knoll, W.

H. Kano and W. Knoll, Opt. Commun. 182, 11 (2000).
[CrossRef]

H. Kano and W. Knoll, Opt. Commun. 153, 235 (1998).
[CrossRef]

Kong, S. K.

Y. H. Huang, H. P. Ho, S. Y. Wu, and S. K. Kong, Adv. Opt. Technol. 2012, 471957 (2012).
[CrossRef]

Y. H. Huang, H. P. Ho, S. Y. Wu, S. K. Kong, W. W. Wong, and P. Shum, Opt. Lett. 36, 4092 (2011).
[CrossRef]

W. Yuan, H. P. Ho, Y. K. Suen, S. K. Kong, and C. Lin, Appl. Opt. 46, 8068 (2007).
[CrossRef]

H. P. Ho, W. C. Law, S. Y. Wu, X. H. Liu, S. P. Wong, C. Lin, and S. K. Kong, Sens. Actuators B 114, 80 (2006).
[CrossRef]

Law, W. C.

H. P. Ho, W. C. Law, S. Y. Wu, X. H. Liu, S. P. Wong, C. Lin, and S. K. Kong, Sens. Actuators B 114, 80 (2006).
[CrossRef]

S. Y. Wu, H. P. Ho, W. C. Law, and C. L. Lin, Opt. Lett. 29, 2378 (2004).
[CrossRef]

Lin, C.

W. Yuan, H. P. Ho, Y. K. Suen, S. K. Kong, and C. Lin, Appl. Opt. 46, 8068 (2007).
[CrossRef]

H. P. Ho, W. C. Law, S. Y. Wu, X. H. Liu, S. P. Wong, C. Lin, and S. K. Kong, Sens. Actuators B 114, 80 (2006).
[CrossRef]

Lin, C. L.

Liu, X. H.

H. P. Ho, W. C. Law, S. Y. Wu, X. H. Liu, S. P. Wong, C. Lin, and S. K. Kong, Sens. Actuators B 114, 80 (2006).
[CrossRef]

Low, D. K. Y.

K. J. Moh, X. C. Yuan, J. Bu, D. K. Y. Low, and R. E. Burge, Appl. Phys. Lett. 89, 251114 (2006).
[CrossRef]

Mizuguchi, S.

Moh, K. J.

Myszka, D. G.

R. L. Rich and D. G. Myszka, J. Mol. Recognit. 18, 431 (2005).
[CrossRef]

Rich, R. L.

R. L. Rich and D. G. Myszka, J. Mol. Recognit. 18, 431 (2005).
[CrossRef]

Shum, P.

Suen, Y. K.

Wong, S. P.

H. P. Ho, W. C. Law, S. Y. Wu, X. H. Liu, S. P. Wong, C. Lin, and S. K. Kong, Sens. Actuators B 114, 80 (2006).
[CrossRef]

Wong, W. W.

Wu, S. Y.

Y. H. Huang, H. P. Ho, S. Y. Wu, and S. K. Kong, Adv. Opt. Technol. 2012, 471957 (2012).
[CrossRef]

Y. H. Huang, H. P. Ho, S. Y. Wu, S. K. Kong, W. W. Wong, and P. Shum, Opt. Lett. 36, 4092 (2011).
[CrossRef]

H. P. Ho, W. C. Law, S. Y. Wu, X. H. Liu, S. P. Wong, C. Lin, and S. K. Kong, Sens. Actuators B 114, 80 (2006).
[CrossRef]

S. Y. Wu, H. P. Ho, W. C. Law, and C. L. Lin, Opt. Lett. 29, 2378 (2004).
[CrossRef]

Yuan, W.

Yuan, X. C.

K. J. Moh, X. C. Yuan, J. Bu, R. E. Burge, and B. Z. Gao, Appl. Opt. 46, 7544 (2007).
[CrossRef]

K. J. Moh, X. C. Yuan, J. Bu, D. K. Y. Low, and R. E. Burge, Appl. Phys. Lett. 89, 251114 (2006).
[CrossRef]

Yuan, X.-C.

Zhu, S. W.

Adv. Opt. Technol. (1)

Y. H. Huang, H. P. Ho, S. Y. Wu, and S. K. Kong, Adv. Opt. Technol. 2012, 471957 (2012).
[CrossRef]

Appl. Opt. (2)

Appl. Phys. Lett. (1)

K. J. Moh, X. C. Yuan, J. Bu, D. K. Y. Low, and R. E. Burge, Appl. Phys. Lett. 89, 251114 (2006).
[CrossRef]

J. Mol. Recognit. (1)

R. L. Rich and D. G. Myszka, J. Mol. Recognit. 18, 431 (2005).
[CrossRef]

J. Opt. Soc. Am. B (1)

Opt. Commun. (2)

H. Kano and W. Knoll, Opt. Commun. 153, 235 (1998).
[CrossRef]

H. Kano and W. Knoll, Opt. Commun. 182, 11 (2000).
[CrossRef]

Opt. Express (1)

Opt. Lett. (3)

Sens. Actuators B (1)

H. P. Ho, W. C. Law, S. Y. Wu, X. H. Liu, S. P. Wong, C. Lin, and S. K. Kong, Sens. Actuators B 114, 80 (2006).
[CrossRef]

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Figures (4)

Fig. 1.
Fig. 1.

Experimental setup for measuring the differential phase between RP and AP beams in an inverted microscope configuration.

Fig. 2.
Fig. 2.

Image captured on the CCD for different included angles between the two half-wave plates: (a) π4, (b) 3π8, (c) 7π16, and (d) π2. The inner dark ring corresponds to the SPR excitation angle.

Fig. 3.
Fig. 3.

Phase changes versus refractive index at a series of pixels for 55 nm thick gold film.

Fig. 4.
Fig. 4.

System response versus refractive index (a) from 1.320 to 1.340 RIU for a 55 nm thick gold film; (b) from 1.333 to 1.333001 RIU for a 55.3 nm thick gold film.

Equations (3)

Equations on this page are rendered with MathJax. Learn more.

RΔθ·M0·RΔθ·M0=[cos(Δθ)sin(Δθ)sin(Δθ)cos(Δθ)][i00i][cos(Δθ)sin(Δθ)sin(Δθ)cos(Δθ)][i00i]=[cos(2Δθ)sin(2Δθ)sin(2Δθ)cos(2Δθ)]=R2Δθ.
Eout=R2Δθ·Ein=[cos(2Δθ)sin(2Δθ)sin(2Δθ)cos(2Δθ)][sin(θ)cos(θ)]=[sin(2Δθ+θ)cos(2Δθ+θ)].
Eout=22[sin(θ)cos(θ)]+22[cos(θ)sin(θ)],

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