Abstract

We generate self-collimating surface plasmon beams in a doubly periodic plasmonic grating. The self-collimation effect is understood from the local anisotropy of the isofrequency surface of the grating in the vicinity of the bandgap. The properties of the beams are analyzed by leakage radiation microscopy and show to an unprecedented level significantly reduced diffraction as compared with plasmon beams propagating on a flat metal film.

© 2012 Optical Society of America

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2011 (3)

P. Zhang, S. Wang, Y. Liu, X. Yin, C. Lu, Z. Chen, and X. Zhang, Opt. Lett. 36, 3191 (2011).
[CrossRef]

A. Minovich, A. E. Klein, N. Janunts, T. Pertsch, D. N. Neshev, and Y. S. Kivshar, Phys. Rev. Lett. 107, 116802 (2011).
[CrossRef]

L. Li, T. Li, S. M. Wang, C. Zhang, and S. N. Zhu, Phys. Rev. Lett. 107, 126804 (2011).
[CrossRef]

2010 (4)

2009 (1)

2006 (1)

S. Bozhevolnyi, V. Volkov, E. Devaux, J.-Y. Laluet, and T. Ebbesen, Nature 440, 508 (2006).
[CrossRef]

2005 (1)

2003 (1)

J.-C. Weeber, Y. Lacroute, and A. Dereux, Phys. Rev. B 68, 115401 (2003).
[CrossRef]

2002 (1)

C. Luo, S. G. Johnson, J. D. Joannopoulos, and J. B. Pendry, Phys. Rev. B 65, 201104 (2002).
[CrossRef]

1999 (1)

H. Kosaka, T. Kawashima, A. Tomita, M. Notomi, T. Tamamura, T. Sato, and S. Kawakami, Appl. Phys. Lett. 74, 1212 (1999).
[CrossRef]

1987 (1)

R. Zengerle, J. Mod. Opt. 34, 1589 (1987).
[CrossRef]

Archambault, A.

Aussenegg, F.

Bozhevolnyi, S.

S. Bozhevolnyi, V. Volkov, E. Devaux, J.-Y. Laluet, and T. Ebbesen, Nature 440, 508 (2006).
[CrossRef]

Chen, Z.

Christodoulides, D. N.

Dereux, A.

Devaux, E.

E. Devaux, J.-Y. Laluet, B. Stein, C. Genet, T. Ebbesen, J.-C. Weeber, and A. Dereux, Opt. Express 18, 20610 (2010).
[CrossRef]

B. Stein, J.-Y. Laluet, E. Devaux, C. Genet, and T. W. Ebbesen, Phys. Rev. Lett. 105, 266804 (2010).
[CrossRef]

S. Bozhevolnyi, V. Volkov, E. Devaux, J.-Y. Laluet, and T. Ebbesen, Nature 440, 508 (2006).
[CrossRef]

Ditlbacher, H.

Drezet, A.

Ebbesen, T.

E. Devaux, J.-Y. Laluet, B. Stein, C. Genet, T. Ebbesen, J.-C. Weeber, and A. Dereux, Opt. Express 18, 20610 (2010).
[CrossRef]

S. Bozhevolnyi, V. Volkov, E. Devaux, J.-Y. Laluet, and T. Ebbesen, Nature 440, 508 (2006).
[CrossRef]

Ebbesen, T. W.

B. Stein, J.-Y. Laluet, E. Devaux, C. Genet, and T. W. Ebbesen, Phys. Rev. Lett. 105, 266804 (2010).
[CrossRef]

Enoch, S.

Friberg, A. T.

J. Turunen and A. T. Friberg, in Progress in Optics, Vol. 54, E. Wolf, ed. (Elsevier, 2010), pp. 1–88.

Genet, C.

E. Devaux, J.-Y. Laluet, B. Stein, C. Genet, T. Ebbesen, J.-C. Weeber, and A. Dereux, Opt. Express 18, 20610 (2010).
[CrossRef]

B. Stein, J.-Y. Laluet, E. Devaux, C. Genet, and T. W. Ebbesen, Phys. Rev. Lett. 105, 266804 (2010).
[CrossRef]

González, M.

Greffet, J. J.

Hohenau, A.

Janunts, N.

A. Minovich, A. E. Klein, N. Janunts, T. Pertsch, D. N. Neshev, and Y. S. Kivshar, Phys. Rev. Lett. 107, 116802 (2011).
[CrossRef]

Joannopoulos, J. D.

C. Luo, S. G. Johnson, J. D. Joannopoulos, and J. B. Pendry, Phys. Rev. B 65, 201104 (2002).
[CrossRef]

Johnson, S. G.

C. Luo, S. G. Johnson, J. D. Joannopoulos, and J. B. Pendry, Phys. Rev. B 65, 201104 (2002).
[CrossRef]

Kawakami, S.

H. Kosaka, T. Kawashima, A. Tomita, M. Notomi, T. Tamamura, T. Sato, and S. Kawakami, Appl. Phys. Lett. 74, 1212 (1999).
[CrossRef]

Kawashima, T.

H. Kosaka, T. Kawashima, A. Tomita, M. Notomi, T. Tamamura, T. Sato, and S. Kawakami, Appl. Phys. Lett. 74, 1212 (1999).
[CrossRef]

Kivshar, Y. S.

A. Minovich, A. E. Klein, N. Janunts, T. Pertsch, D. N. Neshev, and Y. S. Kivshar, Phys. Rev. Lett. 107, 116802 (2011).
[CrossRef]

Klein, A. E.

A. Minovich, A. E. Klein, N. Janunts, T. Pertsch, D. N. Neshev, and Y. S. Kivshar, Phys. Rev. Lett. 107, 116802 (2011).
[CrossRef]

Kosaka, H.

H. Kosaka, T. Kawashima, A. Tomita, M. Notomi, T. Tamamura, T. Sato, and S. Kawakami, Appl. Phys. Lett. 74, 1212 (1999).
[CrossRef]

Krenn, J.

Lacroute, Y.

J.-C. Weeber, Y. Lacroute, and A. Dereux, Phys. Rev. B 68, 115401 (2003).
[CrossRef]

Laluet, J.-Y.

E. Devaux, J.-Y. Laluet, B. Stein, C. Genet, T. Ebbesen, J.-C. Weeber, and A. Dereux, Opt. Express 18, 20610 (2010).
[CrossRef]

B. Stein, J.-Y. Laluet, E. Devaux, C. Genet, and T. W. Ebbesen, Phys. Rev. Lett. 105, 266804 (2010).
[CrossRef]

S. Bozhevolnyi, V. Volkov, E. Devaux, J.-Y. Laluet, and T. Ebbesen, Nature 440, 508 (2006).
[CrossRef]

Leitner, A.

Li, L.

L. Li, T. Li, S. M. Wang, C. Zhang, and S. N. Zhu, Phys. Rev. Lett. 107, 126804 (2011).
[CrossRef]

Li, T.

L. Li, T. Li, S. M. Wang, C. Zhang, and S. N. Zhu, Phys. Rev. Lett. 107, 126804 (2011).
[CrossRef]

Liu, Y.

Lu, C.

Luo, C.

C. Luo, S. G. Johnson, J. D. Joannopoulos, and J. B. Pendry, Phys. Rev. B 65, 201104 (2002).
[CrossRef]

Marquier, F.

Minovich, A.

A. Minovich, A. E. Klein, N. Janunts, T. Pertsch, D. N. Neshev, and Y. S. Kivshar, Phys. Rev. Lett. 107, 116802 (2011).
[CrossRef]

Neshev, D. N.

A. Minovich, A. E. Klein, N. Janunts, T. Pertsch, D. N. Neshev, and Y. S. Kivshar, Phys. Rev. Lett. 107, 116802 (2011).
[CrossRef]

Notomi, M.

H. Kosaka, T. Kawashima, A. Tomita, M. Notomi, T. Tamamura, T. Sato, and S. Kawakami, Appl. Phys. Lett. 74, 1212 (1999).
[CrossRef]

Pendry, J. B.

C. Luo, S. G. Johnson, J. D. Joannopoulos, and J. B. Pendry, Phys. Rev. B 65, 201104 (2002).
[CrossRef]

Pertsch, T.

A. Minovich, A. E. Klein, N. Janunts, T. Pertsch, D. N. Neshev, and Y. S. Kivshar, Phys. Rev. Lett. 107, 116802 (2011).
[CrossRef]

Quidant, R.

Randhawa, S.

Renger, J.

Salandrino, A.

Sato, T.

H. Kosaka, T. Kawashima, A. Tomita, M. Notomi, T. Tamamura, T. Sato, and S. Kawakami, Appl. Phys. Lett. 74, 1212 (1999).
[CrossRef]

Stein, B.

B. Stein, J.-Y. Laluet, E. Devaux, C. Genet, and T. W. Ebbesen, Phys. Rev. Lett. 105, 266804 (2010).
[CrossRef]

E. Devaux, J.-Y. Laluet, B. Stein, C. Genet, T. Ebbesen, J.-C. Weeber, and A. Dereux, Opt. Express 18, 20610 (2010).
[CrossRef]

Steinberger, B.

Stepanov, A.

Tamamura, T.

H. Kosaka, T. Kawashima, A. Tomita, M. Notomi, T. Tamamura, T. Sato, and S. Kawakami, Appl. Phys. Lett. 74, 1212 (1999).
[CrossRef]

Teperik, T. V.

Tomita, A.

H. Kosaka, T. Kawashima, A. Tomita, M. Notomi, T. Tamamura, T. Sato, and S. Kawakami, Appl. Phys. Lett. 74, 1212 (1999).
[CrossRef]

Turunen, J.

J. Turunen and A. T. Friberg, in Progress in Optics, Vol. 54, E. Wolf, ed. (Elsevier, 2010), pp. 1–88.

Volkov, V.

S. Bozhevolnyi, V. Volkov, E. Devaux, J.-Y. Laluet, and T. Ebbesen, Nature 440, 508 (2006).
[CrossRef]

Wang, S.

Wang, S. M.

L. Li, T. Li, S. M. Wang, C. Zhang, and S. N. Zhu, Phys. Rev. Lett. 107, 126804 (2011).
[CrossRef]

Weeber, J.-C.

Yin, X.

Zengerle, R.

R. Zengerle, J. Mod. Opt. 34, 1589 (1987).
[CrossRef]

Zhang, C.

L. Li, T. Li, S. M. Wang, C. Zhang, and S. N. Zhu, Phys. Rev. Lett. 107, 126804 (2011).
[CrossRef]

Zhang, P.

Zhang, X.

Zhu, S. N.

L. Li, T. Li, S. M. Wang, C. Zhang, and S. N. Zhu, Phys. Rev. Lett. 107, 126804 (2011).
[CrossRef]

Appl. Phys. Lett. (1)

H. Kosaka, T. Kawashima, A. Tomita, M. Notomi, T. Tamamura, T. Sato, and S. Kawakami, Appl. Phys. Lett. 74, 1212 (1999).
[CrossRef]

J. Mod. Opt. (1)

R. Zengerle, J. Mod. Opt. 34, 1589 (1987).
[CrossRef]

Nature (1)

S. Bozhevolnyi, V. Volkov, E. Devaux, J.-Y. Laluet, and T. Ebbesen, Nature 440, 508 (2006).
[CrossRef]

Opt. Express (3)

Opt. Lett. (3)

Phys. Rev. B (2)

J.-C. Weeber, Y. Lacroute, and A. Dereux, Phys. Rev. B 68, 115401 (2003).
[CrossRef]

C. Luo, S. G. Johnson, J. D. Joannopoulos, and J. B. Pendry, Phys. Rev. B 65, 201104 (2002).
[CrossRef]

Phys. Rev. Lett. (3)

B. Stein, J.-Y. Laluet, E. Devaux, C. Genet, and T. W. Ebbesen, Phys. Rev. Lett. 105, 266804 (2010).
[CrossRef]

A. Minovich, A. E. Klein, N. Janunts, T. Pertsch, D. N. Neshev, and Y. S. Kivshar, Phys. Rev. Lett. 107, 116802 (2011).
[CrossRef]

L. Li, T. Li, S. M. Wang, C. Zhang, and S. N. Zhu, Phys. Rev. Lett. 107, 126804 (2011).
[CrossRef]

Other (1)

J. Turunen and A. T. Friberg, in Progress in Optics, Vol. 54, E. Wolf, ed. (Elsevier, 2010), pp. 1–88.

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Figures (4)

Fig. 1.
Fig. 1.

(a) IFS of a 2PG with a period of P=680/2nm, calculated on the metal-air interface (blue lines) at λ0=782nm taking the SP wavelength λSP=764nm for an 80 nm thin Au film and a modulation depth of the 2PG fitted to the experimental data; see [13] for details. SP modes on the metal-ITO interface are also shown (gray dashed) and the air light-cone is shaded in gray. Inset: AFM image of a 5×5μm2 section of the 2PG. (b) Experimental IFS acquired by LRM in the Fourier plane of a Nikon 60×, NA=1.49 immersion objective. The IFS is excited by illuminating at λ0 a single defect in the center of a 75×75μm grating with a laser beam circularly polarized and focused by a Nikon 40×, NA=0.60 illumination objective. Note that the SP modes on the air-metal interface disappear inside the air-light cone.

Fig. 2.
Fig. 2.

(a) Scanning electron microscope image of the source groove in front of the 2PG; scale bar corresponds to 10 μm. (b) Circular IFS of an SP propagating on the planar side from the groove, showing the spread in vg (green arrows) leading to diffraction for a given excitation range δky. (c) Modified IFS around the M-point in the 2PG of Fig. 1 (white dashed box). The flat edge leads to collimated vg that extend over Δky; scale bar corresponds to 1μm1.

Fig. 3.
Fig. 3.

(a) LRM image of the SP beam on the planar Au film; scale bar corresponds to 50 μm. (b) LRM image of the self-collimating beam over the 2PG. (c) Evolution along x^ of the SP beam intensity (I) integrated along y^. Decay lengths were extracted from linear fits of log(I).

Fig. 4.
Fig. 4.

(a)–(d) LRM images of SP, taken on a planar Au film (a),(c) and a 2PG (b),(d) with a focused excitation spot (a),(b) and a slightly defocused excitation spot (c),(d). HF simulations are shown in the insets of (a) and (c). The position of the 2PG is marked in (b) and (d) by the white box, and the scale bar corresponds to 50 μm. (e)–(h): Cross-sections along y^ of normalized LRM intensity in (a)–(d), respectively. (i) Evolution of the SP beam widths from Gaussian fitting along y^ with focused (dotted) and defocused (solid line) excitations on planar film (red) and the 2PG (black). HF simulations of the width evolutions on the planar film are shown as gray lines.

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