Abstract

A calibration scheme is presented for improved polarization state measurement of terahertz pulses. In this scheme the polarization response of a two-contact terahertz photoconductive detector is accurately measured, and is used to correct for the impact of the nonidealities of the detector. Experimental results show excellent subdegree angular accuracy and at least 60% error reduction with this scheme.

© 2012 Optical Society of America

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References

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  1. E. Castro-Camus, J. Infrared Milli. Terahz Waves 33, 418 (2012).
  2. R. V. Aguilar, A. V. Stier, W. Liu, L. S. Bilbro, D. K. George, N. Bansal, L. Wu, J. Cerne, A. G. Markelz, S. Oh, and N. P. Armitage, Phys. Rev. Lett. 108, 087403 (2012).
    [CrossRef]
  3. E. Castro-Camus, J. Lloyd-Hughes, and M. B. Johnston, Appl. Phys. Lett. 86, 254102 (2005).
    [CrossRef]
  4. A. Hussain and S. R. Andrews, Opt. Express 16, 7251 (2008).
    [CrossRef]
  5. H. Makabe, Y. Hirota, M. Tani, and M. Hangyo, Opt. Express 15, 11650 (2007).
    [CrossRef]
  6. H. Dong, Y. Gong, and M. Olivo, Microw. Opt. Technol. Lett. 52, 2319 (2010).
    [CrossRef]
  7. M. Byrne, M. Shaukat, J. Cunningham, E. Linfield, and A. Davies, Appl. Phys. Lett. 98, 151104 (2011).
    [CrossRef]
  8. Y. Gong, H. Dong, and Z. Chen, Terahertz Sci. Technol. 4, 137 (2011).
  9. E. Castro-Camus, J. Lloyd-Hughes, L. Fu, H. Tan, C. Jagadish, and M. B. Johnston, Opt. Express 15, 7047 (2007).
    [CrossRef]
  10. R. C. Jones, J. Opt. Soc. Am. 31, 488 (1941).
    [CrossRef]

2012 (2)

E. Castro-Camus, J. Infrared Milli. Terahz Waves 33, 418 (2012).

R. V. Aguilar, A. V. Stier, W. Liu, L. S. Bilbro, D. K. George, N. Bansal, L. Wu, J. Cerne, A. G. Markelz, S. Oh, and N. P. Armitage, Phys. Rev. Lett. 108, 087403 (2012).
[CrossRef]

2011 (2)

M. Byrne, M. Shaukat, J. Cunningham, E. Linfield, and A. Davies, Appl. Phys. Lett. 98, 151104 (2011).
[CrossRef]

Y. Gong, H. Dong, and Z. Chen, Terahertz Sci. Technol. 4, 137 (2011).

2010 (1)

H. Dong, Y. Gong, and M. Olivo, Microw. Opt. Technol. Lett. 52, 2319 (2010).
[CrossRef]

2008 (1)

2007 (2)

2005 (1)

E. Castro-Camus, J. Lloyd-Hughes, and M. B. Johnston, Appl. Phys. Lett. 86, 254102 (2005).
[CrossRef]

1941 (1)

Aguilar, R. V.

R. V. Aguilar, A. V. Stier, W. Liu, L. S. Bilbro, D. K. George, N. Bansal, L. Wu, J. Cerne, A. G. Markelz, S. Oh, and N. P. Armitage, Phys. Rev. Lett. 108, 087403 (2012).
[CrossRef]

Andrews, S. R.

Armitage, N. P.

R. V. Aguilar, A. V. Stier, W. Liu, L. S. Bilbro, D. K. George, N. Bansal, L. Wu, J. Cerne, A. G. Markelz, S. Oh, and N. P. Armitage, Phys. Rev. Lett. 108, 087403 (2012).
[CrossRef]

Bansal, N.

R. V. Aguilar, A. V. Stier, W. Liu, L. S. Bilbro, D. K. George, N. Bansal, L. Wu, J. Cerne, A. G. Markelz, S. Oh, and N. P. Armitage, Phys. Rev. Lett. 108, 087403 (2012).
[CrossRef]

Bilbro, L. S.

R. V. Aguilar, A. V. Stier, W. Liu, L. S. Bilbro, D. K. George, N. Bansal, L. Wu, J. Cerne, A. G. Markelz, S. Oh, and N. P. Armitage, Phys. Rev. Lett. 108, 087403 (2012).
[CrossRef]

Byrne, M.

M. Byrne, M. Shaukat, J. Cunningham, E. Linfield, and A. Davies, Appl. Phys. Lett. 98, 151104 (2011).
[CrossRef]

Castro-Camus, E.

E. Castro-Camus, J. Infrared Milli. Terahz Waves 33, 418 (2012).

E. Castro-Camus, J. Lloyd-Hughes, L. Fu, H. Tan, C. Jagadish, and M. B. Johnston, Opt. Express 15, 7047 (2007).
[CrossRef]

E. Castro-Camus, J. Lloyd-Hughes, and M. B. Johnston, Appl. Phys. Lett. 86, 254102 (2005).
[CrossRef]

Cerne, J.

R. V. Aguilar, A. V. Stier, W. Liu, L. S. Bilbro, D. K. George, N. Bansal, L. Wu, J. Cerne, A. G. Markelz, S. Oh, and N. P. Armitage, Phys. Rev. Lett. 108, 087403 (2012).
[CrossRef]

Chen, Z.

Y. Gong, H. Dong, and Z. Chen, Terahertz Sci. Technol. 4, 137 (2011).

Cunningham, J.

M. Byrne, M. Shaukat, J. Cunningham, E. Linfield, and A. Davies, Appl. Phys. Lett. 98, 151104 (2011).
[CrossRef]

Davies, A.

M. Byrne, M. Shaukat, J. Cunningham, E. Linfield, and A. Davies, Appl. Phys. Lett. 98, 151104 (2011).
[CrossRef]

Dong, H.

Y. Gong, H. Dong, and Z. Chen, Terahertz Sci. Technol. 4, 137 (2011).

H. Dong, Y. Gong, and M. Olivo, Microw. Opt. Technol. Lett. 52, 2319 (2010).
[CrossRef]

Fu, L.

George, D. K.

R. V. Aguilar, A. V. Stier, W. Liu, L. S. Bilbro, D. K. George, N. Bansal, L. Wu, J. Cerne, A. G. Markelz, S. Oh, and N. P. Armitage, Phys. Rev. Lett. 108, 087403 (2012).
[CrossRef]

Gong, Y.

Y. Gong, H. Dong, and Z. Chen, Terahertz Sci. Technol. 4, 137 (2011).

H. Dong, Y. Gong, and M. Olivo, Microw. Opt. Technol. Lett. 52, 2319 (2010).
[CrossRef]

Hangyo, M.

Hirota, Y.

Hussain, A.

Jagadish, C.

Johnston, M. B.

E. Castro-Camus, J. Lloyd-Hughes, L. Fu, H. Tan, C. Jagadish, and M. B. Johnston, Opt. Express 15, 7047 (2007).
[CrossRef]

E. Castro-Camus, J. Lloyd-Hughes, and M. B. Johnston, Appl. Phys. Lett. 86, 254102 (2005).
[CrossRef]

Jones, R. C.

Linfield, E.

M. Byrne, M. Shaukat, J. Cunningham, E. Linfield, and A. Davies, Appl. Phys. Lett. 98, 151104 (2011).
[CrossRef]

Liu, W.

R. V. Aguilar, A. V. Stier, W. Liu, L. S. Bilbro, D. K. George, N. Bansal, L. Wu, J. Cerne, A. G. Markelz, S. Oh, and N. P. Armitage, Phys. Rev. Lett. 108, 087403 (2012).
[CrossRef]

Lloyd-Hughes, J.

E. Castro-Camus, J. Lloyd-Hughes, L. Fu, H. Tan, C. Jagadish, and M. B. Johnston, Opt. Express 15, 7047 (2007).
[CrossRef]

E. Castro-Camus, J. Lloyd-Hughes, and M. B. Johnston, Appl. Phys. Lett. 86, 254102 (2005).
[CrossRef]

Makabe, H.

Markelz, A. G.

R. V. Aguilar, A. V. Stier, W. Liu, L. S. Bilbro, D. K. George, N. Bansal, L. Wu, J. Cerne, A. G. Markelz, S. Oh, and N. P. Armitage, Phys. Rev. Lett. 108, 087403 (2012).
[CrossRef]

Oh, S.

R. V. Aguilar, A. V. Stier, W. Liu, L. S. Bilbro, D. K. George, N. Bansal, L. Wu, J. Cerne, A. G. Markelz, S. Oh, and N. P. Armitage, Phys. Rev. Lett. 108, 087403 (2012).
[CrossRef]

Olivo, M.

H. Dong, Y. Gong, and M. Olivo, Microw. Opt. Technol. Lett. 52, 2319 (2010).
[CrossRef]

Shaukat, M.

M. Byrne, M. Shaukat, J. Cunningham, E. Linfield, and A. Davies, Appl. Phys. Lett. 98, 151104 (2011).
[CrossRef]

Stier, A. V.

R. V. Aguilar, A. V. Stier, W. Liu, L. S. Bilbro, D. K. George, N. Bansal, L. Wu, J. Cerne, A. G. Markelz, S. Oh, and N. P. Armitage, Phys. Rev. Lett. 108, 087403 (2012).
[CrossRef]

Tan, H.

Tani, M.

Wu, L.

R. V. Aguilar, A. V. Stier, W. Liu, L. S. Bilbro, D. K. George, N. Bansal, L. Wu, J. Cerne, A. G. Markelz, S. Oh, and N. P. Armitage, Phys. Rev. Lett. 108, 087403 (2012).
[CrossRef]

Appl. Phys. Lett. (2)

E. Castro-Camus, J. Lloyd-Hughes, and M. B. Johnston, Appl. Phys. Lett. 86, 254102 (2005).
[CrossRef]

M. Byrne, M. Shaukat, J. Cunningham, E. Linfield, and A. Davies, Appl. Phys. Lett. 98, 151104 (2011).
[CrossRef]

J. Infrared Milli. Terahz Waves (1)

E. Castro-Camus, J. Infrared Milli. Terahz Waves 33, 418 (2012).

J. Opt. Soc. Am. (1)

Microw. Opt. Technol. Lett. (1)

H. Dong, Y. Gong, and M. Olivo, Microw. Opt. Technol. Lett. 52, 2319 (2010).
[CrossRef]

Opt. Express (3)

Phys. Rev. Lett. (1)

R. V. Aguilar, A. V. Stier, W. Liu, L. S. Bilbro, D. K. George, N. Bansal, L. Wu, J. Cerne, A. G. Markelz, S. Oh, and N. P. Armitage, Phys. Rev. Lett. 108, 087403 (2012).
[CrossRef]

Terahertz Sci. Technol. (1)

Y. Gong, H. Dong, and Z. Chen, Terahertz Sci. Technol. 4, 137 (2011).

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Figures (4)

Fig. 1.
Fig. 1.

Experimental THz-TDS setup for polarization state measurement (M, mirror; RR, retro-reflector; BS, optical beam splitter; FL, optical focusing lens; TL, terahertz lens).

Fig. 2.
Fig. 2.

Measured polarization parameters (s,δ) of a 20 μm dipole with 5 μm gap size.

Fig. 3.
Fig. 3.

(a) Extracted rotation angle of the sample polarizer, (b)–(d) comparison of the error of the extracted rotation angle between calibrated and uncalibrated measurements for displayed frequencies.

Fig. 4.
Fig. 4.

Measured birefringence of a sapphire wafer obtained from polarimetry with and without calibration, and from conventional method.

Equations (6)

Equations on this page are rendered with MathJax. Learn more.

I(ω,ϕ)=Pd(ω)·Ed(ω,ϕ),
Pd=[1+s21s2exp(jδ)],
[Ex(ω,ϕ)Ey(ω,ϕ)]d=[cos2ϕcosϕsinϕcosϕsinϕsin2ϕ]×[Ex(ω)Ey(ω)]t.
s=1|r|21+|r|2,δ=arg(r),r=I(ω,+45°)I(ω,45°)I(ω,+45°)+I(ω,45°).
[Ex(ω)Ey(ω)]t=1px2py2[pxpypx+pypxpy(px+py)]×[I(ω,+45)I(ω,45)].
θ=12tan1[1R(R)],Δ=2tan1[1sin(2θ)I(R)],R=Ext(ω)Eyt(ω),

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