Abstract

The application of a two dimensional (2D) grating interferometer–Fresnel zone plate combination for quantitative submicron phase contrast imaging is reported. The combination of the two optical elements allows quick recovery of the phase shift introduced by a sample in a hard X-ray beam, avoiding artifacts observed when using the one dimensional (1D) interferometer for a sample with features oriented in the unsensitive direction of the interferometer. The setup provides submicron resolution due to the optics magnification ratio and a fine sensitivity in both transverse orientations due to the 2D analysis gratings. The method opens up possibilities for sub-micro phase contrast tomography of microscopic objects made of light and/or homogeneous materials with randomly oriented features.

© 2012 Optical Society of America

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