Abstract

A multilayered structure incorporating a metal–dielectric subwavelength grating, with the characteristic of polarization separation for visible light and the capability of creating reflection resonance and distinctive polarization-dependent color effects, is proposed. Its reflection resonance and color for TE and TM polarizations are discussed, as well as the influence of its structural parameters on them. Moreover, a reflection filter with characteristics of red for TE-polarized light, green for TM-polarized light, and yellow for daylight is designed and fabricated by replacing its grating region with a sinusoidal grating, and its related characteristics also are verified. The structure and its properties can achieve practical applications in various fields, such as color security, image reproduction, color filtering, and polarization-based information hiding.

© 2012 Optical Society of America

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2011

S. M. Lee, J. Upping, A. Bielawny, and M. Knez, ACS Appl. Mater. Int. 3, 30 (2011).
[CrossRef]

P. Ma, P. Kaspar, P. Strasser, Y. Fedoryshyn, and H. Jäckel, IEEE Photon. Technol. Lett. 23, 224 (2011).
[CrossRef]

Y. Chen and W. Liu, Opt. Eng. 50, 048001 (2011).
[CrossRef]

Y. Ye, Y. Zhou, H. Zhang, and L. S. Chen, Appl. Opt. 50, 1356 (2011).
[CrossRef] [PubMed]

2010

2009

2008

2006

2005

2004

1996

P. Lalanne and D. Lemercier-Lalanne, J. Mod. Opt. 43, 2063 (1996).
[CrossRef]

1994

A. Bodere, D. Carpentier, A. Accard, and B. Fernier, Mater. Sci. Eng. B 28, 293 (1994).
[CrossRef]

Accard, A.

A. Bodere, D. Carpentier, A. Accard, and B. Fernier, Mater. Sci. Eng. B 28, 293 (1994).
[CrossRef]

Bader, M. A.

Baloukas, B.

Bielawny, A.

S. M. Lee, J. Upping, A. Bielawny, and M. Knez, ACS Appl. Mater. Int. 3, 30 (2011).
[CrossRef]

Bodere, A.

A. Bodere, D. Carpentier, A. Accard, and B. Fernier, Mater. Sci. Eng. B 28, 293 (1994).
[CrossRef]

Byun, K. M.

Carpentier, D.

A. Bodere, D. Carpentier, A. Accard, and B. Fernier, Mater. Sci. Eng. B 28, 293 (1994).
[CrossRef]

Chen, L. S.

Chen, Y.

Y. Chen and W. Liu, Opt. Eng. 50, 048001 (2011).
[CrossRef]

Cho, E. H.

Deparis, O.

Fedoryshyn, Y.

P. Ma, P. Kaspar, P. Strasser, Y. Fedoryshyn, and H. Jäckel, IEEE Photon. Technol. Lett. 23, 224 (2011).
[CrossRef]

Fernier, B.

A. Bodere, D. Carpentier, A. Accard, and B. Fernier, Mater. Sci. Eng. B 28, 293 (1994).
[CrossRef]

Gadsdon, M. R.

Hibbins, A. P.

Hooper, I. R.

Jäckel, H.

P. Ma, P. Kaspar, P. Strasser, Y. Fedoryshyn, and H. Jäckel, IEEE Photon. Technol. Lett. 23, 224 (2011).
[CrossRef]

Kappel, C.

Kaspar, P.

P. Ma, P. Kaspar, P. Strasser, Y. Fedoryshyn, and H. Jäckel, IEEE Photon. Technol. Lett. 23, 224 (2011).
[CrossRef]

Kim, D.

Kim, H. S.

Kim, S. H.

Kim, S. J.

Knez, M.

S. M. Lee, J. Upping, A. Bielawny, and M. Knez, ACS Appl. Mater. Int. 3, 30 (2011).
[CrossRef]

Lalanne, P.

P. Lalanne and D. Lemercier-Lalanne, J. Mod. Opt. 43, 2063 (1996).
[CrossRef]

Lee, H. S.

Lee, K. D.

Lee, S. M.

S. M. Lee, J. Upping, A. Bielawny, and M. Knez, ACS Appl. Mater. Int. 3, 30 (2011).
[CrossRef]

Lee, S. S.

Lemercier-Lalanne, D.

P. Lalanne and D. Lemercier-Lalanne, J. Mod. Opt. 43, 2063 (1996).
[CrossRef]

Liu, W.

Y. Chen and W. Liu, Opt. Eng. 50, 048001 (2011).
[CrossRef]

Ma, P.

P. Ma, P. Kaspar, P. Strasser, Y. Fedoryshyn, and H. Jäckel, IEEE Photon. Technol. Lett. 23, 224 (2011).
[CrossRef]

Maeda, H.

G. Tanaka, H. Taniguchi, H. Maeda, and S. I. Nomura, Geology 38, 127 (2010).
[CrossRef]

Marowsky, G.

Martinu, L.

Moon, C. Y.

Nomura, S. I.

G. Tanaka, H. Taniguchi, H. Maeda, and S. I. Nomura, Geology 38, 127 (2010).
[CrossRef]

Palik, E. D.

E. D. Palik, Handbook of Optical Constants of Solids III (Academic, 1998).

Park, J. D.

Park, N. C.

Park, Y. P.

Rassart, M.

Sambles, J. R.

Selle, A.

Sohn, J. S.

Strasser, P.

P. Ma, P. Kaspar, P. Strasser, Y. Fedoryshyn, and H. Jäckel, IEEE Photon. Technol. Lett. 23, 224 (2011).
[CrossRef]

Tanaka, G.

G. Tanaka, H. Taniguchi, H. Maeda, and S. I. Nomura, Geology 38, 127 (2010).
[CrossRef]

Taniguchi, H.

G. Tanaka, H. Taniguchi, H. Maeda, and S. I. Nomura, Geology 38, 127 (2010).
[CrossRef]

Upping, J.

S. M. Lee, J. Upping, A. Bielawny, and M. Knez, ACS Appl. Mater. Int. 3, 30 (2011).
[CrossRef]

Vandenbem, C.

Vigneron, J. P.

Welch, V. L.

Ye, Y.

Yoon, Y. T.

Zhang, H.

Zhou, Y.

ACS Appl. Mater. Int.

S. M. Lee, J. Upping, A. Bielawny, and M. Knez, ACS Appl. Mater. Int. 3, 30 (2011).
[CrossRef]

Appl. Opt.

Geology

G. Tanaka, H. Taniguchi, H. Maeda, and S. I. Nomura, Geology 38, 127 (2010).
[CrossRef]

IEEE Photon. Technol. Lett.

P. Ma, P. Kaspar, P. Strasser, Y. Fedoryshyn, and H. Jäckel, IEEE Photon. Technol. Lett. 23, 224 (2011).
[CrossRef]

J. Mod. Opt.

P. Lalanne and D. Lemercier-Lalanne, J. Mod. Opt. 43, 2063 (1996).
[CrossRef]

J. Opt. Soc. Am. B

Mater. Sci. Eng. B

A. Bodere, D. Carpentier, A. Accard, and B. Fernier, Mater. Sci. Eng. B 28, 293 (1994).
[CrossRef]

Opt. Eng.

Y. Chen and W. Liu, Opt. Eng. 50, 048001 (2011).
[CrossRef]

Opt. Express

Other

E. D. Palik, Handbook of Optical Constants of Solids III (Academic, 1998).

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Figures (7)

Fig. 1
Fig. 1

Multilayered structures with MDGs.

Fig. 2
Fig. 2

Reflection characteristics of the structures without and with MDGs for TE- and TM-polarized lights.

Fig. 3
Fig. 3

Contour plots of reflection efficiencies as functions of grating period Λ and wavelength for (a) TE- and (b) TM-polarized incident lights. The gray scale is linear with efficiencies.

Fig. 4
Fig. 4

Effects of grating thickness d 3 on reflection of the structure for (a) TE- and (b) TM-polarized lights.

Fig. 5
Fig. 5

Effects of Cr film thickness d 1 on reflection of the structure for (a) TE- and (b) TM-polarized lights.

Fig. 6
Fig. 6

Reflection spectra as a function of dielectric thickness d 2 for (a) TE- and (b) TM-polarized lights.

Fig. 7
Fig. 7

(a) Atomic force microcopy surface, (b) plot of the grating region of fabricated filters and chromatic coordinates of the filter under daylight (C) and TE- (A) and TM-polarized lights (B). Position of the D65 illuminant is marked with an asterisk, and θ is the angle of reflection.

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