Abstract

A highly birefringent photonic bandgap Bragg fiber loop mirror configuration for simultaneous measurement of strain and temperature is proposed. The group birefringence and the sharp loss peaks are observable in the spectral response. Because the sensing head presents different sensitivities for strain and temperature measurands, these physical parameters can be discriminated by using the matrix method. It should be noted that this Bragg fiber presents high sensitivity to temperature, of 5.75nm/°C, due to the group birefringence variation. The rms deviations obtained are ±19.32με and ±0.5°C, for strain and temperature measurements, respectively.

© 2011 Optical Society of America

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2010 (2)

O. Frazão, J. M. Baptista, P. Roy, R. Jamier, and S. Février, Proc. SPIE 7714, 771402 (2010).
[CrossRef]

O. Frazão, L. M. N. Amaral, J. M. Baptista, P. Roy, R. Jamier, and S. Février, IEEE Photonics Technol. Lett. 22, 1616 (2010).
[CrossRef]

2009 (1)

2008 (1)

2006 (2)

2005 (1)

1999 (1)

M. Campbell, G. Zheng, A. S. Holmes-Smith, and P. A. A. Wallace, Meas. Sci. Technol. 10, 218 (1999).
[CrossRef]

1997 (2)

A. N. Starodumov, L. A. Zenteno, D. Monzon, and E. De La Rosa, Appl. Phys. Lett. 70, 19 (1997).
[CrossRef]

W. Jin, W. Craig Michie, G. Thursby, M. Konstantaki, and B. Culshaw, Opt. Eng. 36, 598 (1997).
[CrossRef]

1992 (1)

A. D. Kersey, T. A. Berkoff, and W. W. Morey, Electron. Lett. 28, 236 (1992).
[CrossRef]

1978 (1)

Amaral, L. M. N.

O. Frazão, L. M. N. Amaral, J. M. Baptista, P. Roy, R. Jamier, and S. Février, IEEE Photonics Technol. Lett. 22, 1616 (2010).
[CrossRef]

Baptista, J. M.

O. Frazão, L. M. N. Amaral, J. M. Baptista, P. Roy, R. Jamier, and S. Février, IEEE Photonics Technol. Lett. 22, 1616 (2010).
[CrossRef]

O. Frazão, J. M. Baptista, P. Roy, R. Jamier, and S. Février, Proc. SPIE 7714, 771402 (2010).
[CrossRef]

Berkoff, T. A.

A. D. Kersey, T. A. Berkoff, and W. W. Morey, Electron. Lett. 28, 236 (1992).
[CrossRef]

Bo, D.

Bubnov, M. M.

Campbell, M.

M. Campbell, G. Zheng, A. S. Holmes-Smith, and P. A. A. Wallace, Meas. Sci. Technol. 10, 218 (1999).
[CrossRef]

Culshaw, B.

B. Culshaw, Meas. Sci. Technol. 4, 1071 (2006).

W. Jin, W. Craig Michie, G. Thursby, M. Konstantaki, and B. Culshaw, Opt. Eng. 36, 598 (1997).
[CrossRef]

De La Rosa, E.

A. N. Starodumov, L. A. Zenteno, D. Monzon, and E. De La Rosa, Appl. Phys. Lett. 70, 19 (1997).
[CrossRef]

Dianov, E. M.

Dong, X.

Ducros, N.

R. Jamier, S. Février, N. Ducros, M. E. Likhachev, and M. Y. Salganskii, in Proceedings CLEO/IQEC (Optical Society of America, 2009), paper JWA53.

Feng, L.

Feng, X.

Février, S.

O. Frazão, J. M. Baptista, P. Roy, R. Jamier, and S. Février, Proc. SPIE 7714, 771402 (2010).
[CrossRef]

O. Frazão, L. M. N. Amaral, J. M. Baptista, P. Roy, R. Jamier, and S. Février, IEEE Photonics Technol. Lett. 22, 1616 (2010).
[CrossRef]

M. E. Likhachev, A. D. Pryamikov, D. A. Gaponov, M. M. Bubnov, M. Y. Salganskii, V. G. Khopin, A. N. Guryanov, and S. Février, Opt. Lett. 34, 1366 (2009).
[CrossRef] [PubMed]

S. Février, D. D. Gaponov, R. P. Roy, M. E. Likhachev, S. L. Semjonov, M. M. Bubnov, E. M. Dianov, M. Y. Yashkov, V. F. Khopin, M. Y. Salganskii, and A. N. Guryanov, Opt. Lett. 33, 989 (2008).
[CrossRef] [PubMed]

R. Jamier, S. Février, N. Ducros, M. E. Likhachev, and M. Y. Salganskii, in Proceedings CLEO/IQEC (Optical Society of America, 2009), paper JWA53.

Frazão, O.

O. Frazão, J. M. Baptista, P. Roy, R. Jamier, and S. Février, Proc. SPIE 7714, 771402 (2010).
[CrossRef]

O. Frazão, L. M. N. Amaral, J. M. Baptista, P. Roy, R. Jamier, and S. Février, IEEE Photonics Technol. Lett. 22, 1616 (2010).
[CrossRef]

Gaponov, D. A.

Gaponov, D. D.

Guryanov, A. N.

Holmes-Smith, A. S.

M. Campbell, G. Zheng, A. S. Holmes-Smith, and P. A. A. Wallace, Meas. Sci. Technol. 10, 218 (1999).
[CrossRef]

Hong, G.

Jamier, R.

O. Frazão, J. M. Baptista, P. Roy, R. Jamier, and S. Février, Proc. SPIE 7714, 771402 (2010).
[CrossRef]

O. Frazão, L. M. N. Amaral, J. M. Baptista, P. Roy, R. Jamier, and S. Février, IEEE Photonics Technol. Lett. 22, 1616 (2010).
[CrossRef]

R. Jamier, S. Février, N. Ducros, M. E. Likhachev, and M. Y. Salganskii, in Proceedings CLEO/IQEC (Optical Society of America, 2009), paper JWA53.

Jin, W.

W. Jin, W. Craig Michie, G. Thursby, M. Konstantaki, and B. Culshaw, Opt. Eng. 36, 598 (1997).
[CrossRef]

Kai, G.

Kersey, A. D.

A. D. Kersey, T. A. Berkoff, and W. W. Morey, Electron. Lett. 28, 236 (1992).
[CrossRef]

Khopin, V. F.

Khopin, V. G.

Konstantaki, M.

W. Jin, W. Craig Michie, G. Thursby, M. Konstantaki, and B. Culshaw, Opt. Eng. 36, 598 (1997).
[CrossRef]

Lifang, X.

Likhachev, M. E.

Liu, B.

Liu, Y.

Marom, E.

Michie, W. Craig

W. Jin, W. Craig Michie, G. Thursby, M. Konstantaki, and B. Culshaw, Opt. Eng. 36, 598 (1997).
[CrossRef]

Monzon, D.

A. N. Starodumov, L. A. Zenteno, D. Monzon, and E. De La Rosa, Appl. Phys. Lett. 70, 19 (1997).
[CrossRef]

Morey, W. W.

A. D. Kersey, T. A. Berkoff, and W. W. Morey, Electron. Lett. 28, 236 (1992).
[CrossRef]

Pryamikov, A. D.

Qida, Z.

Roy, P.

O. Frazão, L. M. N. Amaral, J. M. Baptista, P. Roy, R. Jamier, and S. Février, IEEE Photonics Technol. Lett. 22, 1616 (2010).
[CrossRef]

O. Frazão, J. M. Baptista, P. Roy, R. Jamier, and S. Février, Proc. SPIE 7714, 771402 (2010).
[CrossRef]

Roy, R. P.

Salganskii, M. Y.

Semjonov, S. L.

Shuhong, L.

Starodumov, A. N.

A. N. Starodumov, L. A. Zenteno, D. Monzon, and E. De La Rosa, Appl. Phys. Lett. 70, 19 (1997).
[CrossRef]

Thursby, G.

W. Jin, W. Craig Michie, G. Thursby, M. Konstantaki, and B. Culshaw, Opt. Eng. 36, 598 (1997).
[CrossRef]

Tuan, G.

Wallace, P. A. A.

M. Campbell, G. Zheng, A. S. Holmes-Smith, and P. A. A. Wallace, Meas. Sci. Technol. 10, 218 (1999).
[CrossRef]

Yariv, A.

Yashkov, M. Y.

Yeh, P.

Yuan, S.

Zenteno, L. A.

A. N. Starodumov, L. A. Zenteno, D. Monzon, and E. De La Rosa, Appl. Phys. Lett. 70, 19 (1997).
[CrossRef]

Zhang, W.

Zheng, G.

M. Campbell, G. Zheng, A. S. Holmes-Smith, and P. A. A. Wallace, Meas. Sci. Technol. 10, 218 (1999).
[CrossRef]

Zhou, G.

Appl. Opt. (2)

Appl. Phys. Lett. (1)

A. N. Starodumov, L. A. Zenteno, D. Monzon, and E. De La Rosa, Appl. Phys. Lett. 70, 19 (1997).
[CrossRef]

Electron. Lett. (1)

A. D. Kersey, T. A. Berkoff, and W. W. Morey, Electron. Lett. 28, 236 (1992).
[CrossRef]

IEEE Photonics Technol. Lett. (1)

O. Frazão, L. M. N. Amaral, J. M. Baptista, P. Roy, R. Jamier, and S. Février, IEEE Photonics Technol. Lett. 22, 1616 (2010).
[CrossRef]

J. Opt. Soc. Am. (1)

Meas. Sci. Technol. (2)

B. Culshaw, Meas. Sci. Technol. 4, 1071 (2006).

M. Campbell, G. Zheng, A. S. Holmes-Smith, and P. A. A. Wallace, Meas. Sci. Technol. 10, 218 (1999).
[CrossRef]

Opt. Eng. (1)

W. Jin, W. Craig Michie, G. Thursby, M. Konstantaki, and B. Culshaw, Opt. Eng. 36, 598 (1997).
[CrossRef]

Opt. Lett. (2)

Proc. SPIE (1)

O. Frazão, J. M. Baptista, P. Roy, R. Jamier, and S. Février, Proc. SPIE 7714, 771402 (2010).
[CrossRef]

Other (1)

R. Jamier, S. Février, N. Ducros, M. E. Likhachev, and M. Y. Salganskii, in Proceedings CLEO/IQEC (Optical Society of America, 2009), paper JWA53.

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Figures (5)

Fig. 1
Fig. 1

Experimental setup (left) and cross section (right) of the Hi-Bi Bragg fiber.

Fig. 2
Fig. 2

Measured and computed spectral response of the Hi-Bi Bragg FLM.

Fig. 3
Fig. 3

Response to strain when the Hi-Bi Bragg fiber is subjected to deformation.

Fig. 4
Fig. 4

Response to temperature when the Hi-Bi Bragg fiber is subjected to temperature variation.

Fig. 5
Fig. 5

Sensor output as determined by Eq. (3) for variation in strain at constant temperature and for variation in temperature at constant strain.

Equations (3)

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T = [ cos ( φ 2 ) sin ( θ ) ]
[ Δ T Δ ε ] = 1 D [ κ ε FLM κ ε SLP κ TFLM κ TSLP ] [ Δ λ SLP Δ λ FLM ] ,
[ Δ T Δ ε ] = 1 53.23 × 10 3 [ 47.18 8.34 5.75 × 10 3 111.84 ] [ Δ λ SLP Δ λ FLM ] .

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