Abstract

The microstructural and microspectral characteristics of a vertically aligned liquid crystal display (VA-LCD) panel were obtained noninvasively for the first time. With 1μm axial and 2μm transversal resolutions, the cell gap profile beneath the patterned thin-film transistor of the VA-LCD panel can clearly be resolved. The thicknesses of the multiple thin-film layers and the embedded defects can also be unveiled. As far as spectral response is concerned, the light transmittance at the layer boundaries can be estimated from the measured reflectance, which is crucial information for the design of a highly transmissive panel. The color shift of the VA-LCD panel due to fabrication error was evaluated.

© 2011 Optical Society of America

Full Article  |  PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Supplementary Material (1)

» Media 1: MOV (3607 KB)     

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (4)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Tables (2)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription