Abstract

An ultrawide, tunable band rejection filter was experimentally demonstrated operating from 1060 to 1670nm seamlessly covering all communication bands (O, E, S, C, L, and U bands). The device consists of a micro-optical waveguide made from fused taper fiber coupler mounted over a microactuating platform that systematically applies a highly localized torsional stress over the coupling region. High-band rejection efficiency of 2030dB and very low insertion loss of 0.2dB were experimentally achieved over the whole operating spectral range.

© 2011 Optical Society of America

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References

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  1. G. A. Thomas, B. I. Shraiman, P. F. Glodis, and M. J. Stephen, Nature 404, 262 (2000).
    [Crossref] [PubMed]
  2. International Telecomunication Union (ITU), “100GHz, 50GHz, 25GHz channel spacing (G.694.1),” http://www.itu.int/.
  3. A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, T. Erdogan, and J. E. Sip, J. Lightwave Technol. 14, 58 (1996).
    [Crossref]
  4. K. S. Hong, H. C. Park, B. Y. Kim, I. K. Hwang, W. Jin, J. Ju, and D. I. Yeom, Appl. Phys. Lett. 92, 031110 (2008).
    [Crossref]
  5. T. A. Birks, Appl. Opt. 28, 4226 (1989).
    [Crossref] [PubMed]
  6. W. Shin and K. Oh, Opt. Express 12, 4378 (2004).
    [Crossref] [PubMed]
  7. J. B. Eom, H.-R. Lim, K. S. Park, and B. Lee, Opt. Lett. 35, 2726 (2010).
    [Crossref] [PubMed]
  8. W. Shin, Y. Jeong, J. Lee, and K. Oh, J. Lightwave Technol., 23, 533 (2005).
    [Crossref]
  9. M. B. J. Diemeer, W. J. De Vries, and K. W. Benoist, Electron. Lett. 24, 457 (1988).
    [Crossref]
  10. T. A. Birks, Electron. Lett. 27, 1087 (1991).
    [Crossref]
  11. N.-K. Chen, C.-L. Lee, and S. Chi, Opt. Express 15, 17747 (2007).
    [Crossref] [PubMed]
  12. W. Shin, U. C. Ryu, and K. Oh, Electron. Lett. 38, 214 (2002).
    [Crossref]
  13. J. F. Doyle and J. W. Phillips, Manual on Experimental Stress Analysis (Society for Experimental Mechanics, 1989).
  14. C. N. Alexeyev, A. V. Volyar, and M. A. Yavorsky, J. Opt. A 10, 095007 (2008).
    [Crossref]

2010 (1)

2008 (2)

K. S. Hong, H. C. Park, B. Y. Kim, I. K. Hwang, W. Jin, J. Ju, and D. I. Yeom, Appl. Phys. Lett. 92, 031110 (2008).
[Crossref]

C. N. Alexeyev, A. V. Volyar, and M. A. Yavorsky, J. Opt. A 10, 095007 (2008).
[Crossref]

2007 (1)

2005 (1)

W. Shin, Y. Jeong, J. Lee, and K. Oh, J. Lightwave Technol., 23, 533 (2005).
[Crossref]

2004 (1)

2002 (1)

W. Shin, U. C. Ryu, and K. Oh, Electron. Lett. 38, 214 (2002).
[Crossref]

2000 (1)

G. A. Thomas, B. I. Shraiman, P. F. Glodis, and M. J. Stephen, Nature 404, 262 (2000).
[Crossref] [PubMed]

1996 (1)

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, T. Erdogan, and J. E. Sip, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

1991 (1)

T. A. Birks, Electron. Lett. 27, 1087 (1991).
[Crossref]

1989 (1)

1988 (1)

M. B. J. Diemeer, W. J. De Vries, and K. W. Benoist, Electron. Lett. 24, 457 (1988).
[Crossref]

Alexeyev, C. N.

C. N. Alexeyev, A. V. Volyar, and M. A. Yavorsky, J. Opt. A 10, 095007 (2008).
[Crossref]

Benoist, K. W.

M. B. J. Diemeer, W. J. De Vries, and K. W. Benoist, Electron. Lett. 24, 457 (1988).
[Crossref]

Bhatia, V.

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, T. Erdogan, and J. E. Sip, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

Birks, T. A.

Chen, N.-K.

Chi, S.

De Vries, W. J.

M. B. J. Diemeer, W. J. De Vries, and K. W. Benoist, Electron. Lett. 24, 457 (1988).
[Crossref]

Diemeer, M. B. J.

M. B. J. Diemeer, W. J. De Vries, and K. W. Benoist, Electron. Lett. 24, 457 (1988).
[Crossref]

Doyle, J. F.

J. F. Doyle and J. W. Phillips, Manual on Experimental Stress Analysis (Society for Experimental Mechanics, 1989).

Eom, J. B.

Erdogan, T.

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, T. Erdogan, and J. E. Sip, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

Glodis, P. F.

G. A. Thomas, B. I. Shraiman, P. F. Glodis, and M. J. Stephen, Nature 404, 262 (2000).
[Crossref] [PubMed]

Hong, K. S.

K. S. Hong, H. C. Park, B. Y. Kim, I. K. Hwang, W. Jin, J. Ju, and D. I. Yeom, Appl. Phys. Lett. 92, 031110 (2008).
[Crossref]

Hwang, I. K.

K. S. Hong, H. C. Park, B. Y. Kim, I. K. Hwang, W. Jin, J. Ju, and D. I. Yeom, Appl. Phys. Lett. 92, 031110 (2008).
[Crossref]

Jeong, Y.

W. Shin, Y. Jeong, J. Lee, and K. Oh, J. Lightwave Technol., 23, 533 (2005).
[Crossref]

Jin, W.

K. S. Hong, H. C. Park, B. Y. Kim, I. K. Hwang, W. Jin, J. Ju, and D. I. Yeom, Appl. Phys. Lett. 92, 031110 (2008).
[Crossref]

Ju, J.

K. S. Hong, H. C. Park, B. Y. Kim, I. K. Hwang, W. Jin, J. Ju, and D. I. Yeom, Appl. Phys. Lett. 92, 031110 (2008).
[Crossref]

Judkins, J. B.

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, T. Erdogan, and J. E. Sip, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

Kim, B. Y.

K. S. Hong, H. C. Park, B. Y. Kim, I. K. Hwang, W. Jin, J. Ju, and D. I. Yeom, Appl. Phys. Lett. 92, 031110 (2008).
[Crossref]

Lee, B.

Lee, C.-L.

Lee, J.

W. Shin, Y. Jeong, J. Lee, and K. Oh, J. Lightwave Technol., 23, 533 (2005).
[Crossref]

Lemaire, P. J.

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, T. Erdogan, and J. E. Sip, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

Lim, H.-R.

Oh, K.

W. Shin, Y. Jeong, J. Lee, and K. Oh, J. Lightwave Technol., 23, 533 (2005).
[Crossref]

W. Shin and K. Oh, Opt. Express 12, 4378 (2004).
[Crossref] [PubMed]

W. Shin, U. C. Ryu, and K. Oh, Electron. Lett. 38, 214 (2002).
[Crossref]

Park, H. C.

K. S. Hong, H. C. Park, B. Y. Kim, I. K. Hwang, W. Jin, J. Ju, and D. I. Yeom, Appl. Phys. Lett. 92, 031110 (2008).
[Crossref]

Park, K. S.

Phillips, J. W.

J. F. Doyle and J. W. Phillips, Manual on Experimental Stress Analysis (Society for Experimental Mechanics, 1989).

Ryu, U. C.

W. Shin, U. C. Ryu, and K. Oh, Electron. Lett. 38, 214 (2002).
[Crossref]

Shin, W.

W. Shin, Y. Jeong, J. Lee, and K. Oh, J. Lightwave Technol., 23, 533 (2005).
[Crossref]

W. Shin and K. Oh, Opt. Express 12, 4378 (2004).
[Crossref] [PubMed]

W. Shin, U. C. Ryu, and K. Oh, Electron. Lett. 38, 214 (2002).
[Crossref]

Shraiman, B. I.

G. A. Thomas, B. I. Shraiman, P. F. Glodis, and M. J. Stephen, Nature 404, 262 (2000).
[Crossref] [PubMed]

Sip, J. E.

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, T. Erdogan, and J. E. Sip, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

Stephen, M. J.

G. A. Thomas, B. I. Shraiman, P. F. Glodis, and M. J. Stephen, Nature 404, 262 (2000).
[Crossref] [PubMed]

Thomas, G. A.

G. A. Thomas, B. I. Shraiman, P. F. Glodis, and M. J. Stephen, Nature 404, 262 (2000).
[Crossref] [PubMed]

Vengsarkar, A. M.

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, T. Erdogan, and J. E. Sip, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

Volyar, A. V.

C. N. Alexeyev, A. V. Volyar, and M. A. Yavorsky, J. Opt. A 10, 095007 (2008).
[Crossref]

Yavorsky, M. A.

C. N. Alexeyev, A. V. Volyar, and M. A. Yavorsky, J. Opt. A 10, 095007 (2008).
[Crossref]

Yeom, D. I.

K. S. Hong, H. C. Park, B. Y. Kim, I. K. Hwang, W. Jin, J. Ju, and D. I. Yeom, Appl. Phys. Lett. 92, 031110 (2008).
[Crossref]

Appl. Opt. (1)

Appl. Phys. Lett. (1)

K. S. Hong, H. C. Park, B. Y. Kim, I. K. Hwang, W. Jin, J. Ju, and D. I. Yeom, Appl. Phys. Lett. 92, 031110 (2008).
[Crossref]

Electron. Lett. (3)

M. B. J. Diemeer, W. J. De Vries, and K. W. Benoist, Electron. Lett. 24, 457 (1988).
[Crossref]

T. A. Birks, Electron. Lett. 27, 1087 (1991).
[Crossref]

W. Shin, U. C. Ryu, and K. Oh, Electron. Lett. 38, 214 (2002).
[Crossref]

J. Lightwave Technol. (1)

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, T. Erdogan, and J. E. Sip, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

J. Lightwave Technol., (1)

W. Shin, Y. Jeong, J. Lee, and K. Oh, J. Lightwave Technol., 23, 533 (2005).
[Crossref]

J. Opt. A (1)

C. N. Alexeyev, A. V. Volyar, and M. A. Yavorsky, J. Opt. A 10, 095007 (2008).
[Crossref]

Nature (1)

G. A. Thomas, B. I. Shraiman, P. F. Glodis, and M. J. Stephen, Nature 404, 262 (2000).
[Crossref] [PubMed]

Opt. Express (2)

Opt. Lett. (1)

Other (2)

International Telecomunication Union (ITU), “100GHz, 50GHz, 25GHz channel spacing (G.694.1),” http://www.itu.int/.

J. F. Doyle and J. W. Phillips, Manual on Experimental Stress Analysis (Society for Experimental Mechanics, 1989).

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Figures (3)

Fig. 1
Fig. 1 Schematic diagram of the proposed device. The waist of an optimized 2 × 2 fused taper fiber coupler is mounted on a rotational MAP, where electrically controlled torsional stress is applied.
Fig. 2
Fig. 2 Changes in the transmission spectra of the proposed device under torsional stress. The integer, n, assigned under each spectrum, indicates the rotation angle of ( n 1 ) × 60 ° . The spectral ranges for O, E, S, C, L, and U bands are overlaid. Here, the waist of the FTFC is 70 μm .
Fig. 3
Fig. 3 (a) Experimental measurements for the spectral shifts for FTFC of waist widths 70 and 20 μm . The reference peak wavelength is 1350 nm as in plot 1 of Fig. 2. The cyclic coupling in the shorter wavelength is illustrated as the negative shift. (b) Changes in the FWHM and bend rejection efficiency under torsional stress that were applied by rotating the MAP by increments of 60 ° . FWHM and rejection efficiency of the band rejection peaks within the tuning range for the FTTC MOW waist diameters of 70 and 20 μm .

Equations (1)

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n eff 2 = n 0 2 ( 1 + r 2 / b 2 ) ,

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