Subpicometer length measurement using semiconductor laser tracking frequency gauge

Abstract

We have demonstrated heretofore unattained distance precision of $0.14\mathrm{pm}$ ($2\mathrm{pm}$) incremental and $14\mathrm{nm}$ ($2.9\mathrm{\mu m}$) absolute in a resonant (nonresonant) interferometer at an averaging time of $1\mathrm{s}$, using inexpensive telecommunications diode lasers. We have controlled the main source of error, that due to spurious reflection and the resulting amplitude modulation. In the resonant interferometer, absolute distance precision is well under $\lambda /6$. Therefore, after an interruption, an absolute distance measurement can be used to return to the same interferometer order.

© 2011 Optical Society of America

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