Abstract

We report on selective polarization mode excitation in InGaAs/GaAs rolled-up microtubes. The microtubes are fabricated by selectively releasing a coherently strained InGaAs/GaAs quantum dot layer from its host GaAs substrate. An optical fiber abrupt taper is used to pick up the microtube, while an adiabatically tapered optical fiber is used to couple light into the resonant optical modes of the microtube. By varying the polarization of the light in the adiabatically tapered fiber both transverse electric and transverse magnetic modes are observed in the microtube. We also show that the microtube can be used as a red (0.6μm) to infrared light (1.5μm) optical-optical modulator taking advantage of the thermal-optical effect.

© 2011 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
    [CrossRef] [PubMed]
  2. S. Vicknesh, F. Li, and Z. Mi, Appl. Phys. Lett. 94, 081101(2009).
    [CrossRef]
  3. F. Li, Z. Mi, and S. Vicknesh, Opt. Lett. 34, 2915 (2009).
    [CrossRef] [PubMed]
  4. A. Milekhin, S. Mutilin, J. Yukecheva, M. Putyato, A. Vorob’ev, V. Prinz, V. Kolchuzhin, J. Mehner, and D. R. T. Zahn, Phys. Status Solidi C 6, 2060 (2009).
    [CrossRef]
  5. F. Li and Z. Mi, Opt. Express 17, 19933 (2009).
    [CrossRef] [PubMed]
  6. Ch. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
    [CrossRef]
  7. Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
    [CrossRef]
  8. Z. Tian, V. Veerasubramanian, P. Bianucci, S. Mukherjee, Z. Mi, A. G. Kirk, and D. V. Plant, Opt. Express 19, 12164(2011).
    [CrossRef] [PubMed]
  9. A. Kok, E. J. Geluk, F. Karouta, J. Tol, R. Baets, and M. K. Smit, IEEE Photon. Technol. Lett. 20, 1369(2008).
    [CrossRef]
  10. Z. Mi, P. Bianucci, F. Li, Z. Tian, V. Veerasubramanian, A. G. Kirk, D. V. Plant, and P. J. Poole, Proc. SPIE 7943, 79431C (2011).
    [CrossRef]
  11. C. Deneke, C. Muller, N. Y. Jin-Phillipp, and O. G. Schmidt, Semicond. Sci. Technol. 17, 1278 (2002).
    [CrossRef]
  12. Ch. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, Ch. Heyn, D. Heitmann, and T. Kipp, Phys. Rev. Lett. 101, 127403 (2008).
    [CrossRef] [PubMed]
  13. M. Hosoda and T. Shigaki, Appl. Phys. Lett. 90, 181107(2007).
    [CrossRef]
  14. S. Adachi, Properties of Group-IV, III-V and II-VI Semiconductors(John Wiley & Sons, 2005).
    [CrossRef]

2011

Z. Tian, V. Veerasubramanian, P. Bianucci, S. Mukherjee, Z. Mi, A. G. Kirk, and D. V. Plant, Opt. Express 19, 12164(2011).
[CrossRef] [PubMed]

Z. Mi, P. Bianucci, F. Li, Z. Tian, V. Veerasubramanian, A. G. Kirk, D. V. Plant, and P. J. Poole, Proc. SPIE 7943, 79431C (2011).
[CrossRef]

2010

Ch. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
[CrossRef]

2009

S. Vicknesh, F. Li, and Z. Mi, Appl. Phys. Lett. 94, 081101(2009).
[CrossRef]

F. Li, Z. Mi, and S. Vicknesh, Opt. Lett. 34, 2915 (2009).
[CrossRef] [PubMed]

A. Milekhin, S. Mutilin, J. Yukecheva, M. Putyato, A. Vorob’ev, V. Prinz, V. Kolchuzhin, J. Mehner, and D. R. T. Zahn, Phys. Status Solidi C 6, 2060 (2009).
[CrossRef]

F. Li and Z. Mi, Opt. Express 17, 19933 (2009).
[CrossRef] [PubMed]

2008

A. Kok, E. J. Geluk, F. Karouta, J. Tol, R. Baets, and M. K. Smit, IEEE Photon. Technol. Lett. 20, 1369(2008).
[CrossRef]

Ch. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, Ch. Heyn, D. Heitmann, and T. Kipp, Phys. Rev. Lett. 101, 127403 (2008).
[CrossRef] [PubMed]

2007

M. Hosoda and T. Shigaki, Appl. Phys. Lett. 90, 181107(2007).
[CrossRef]

2006

T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef] [PubMed]

2002

C. Deneke, C. Muller, N. Y. Jin-Phillipp, and O. G. Schmidt, Semicond. Sci. Technol. 17, 1278 (2002).
[CrossRef]

Adachi, S.

S. Adachi, Properties of Group-IV, III-V and II-VI Semiconductors(John Wiley & Sons, 2005).
[CrossRef]

Baets, R.

A. Kok, E. J. Geluk, F. Karouta, J. Tol, R. Baets, and M. K. Smit, IEEE Photon. Technol. Lett. 20, 1369(2008).
[CrossRef]

Benyoucef, M.

Ch. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

Bianucci, P.

Z. Tian, V. Veerasubramanian, P. Bianucci, S. Mukherjee, Z. Mi, A. G. Kirk, and D. V. Plant, Opt. Express 19, 12164(2011).
[CrossRef] [PubMed]

Z. Mi, P. Bianucci, F. Li, Z. Tian, V. Veerasubramanian, A. G. Kirk, D. V. Plant, and P. J. Poole, Proc. SPIE 7943, 79431C (2011).
[CrossRef]

Deneke, C.

C. Deneke, C. Muller, N. Y. Jin-Phillipp, and O. G. Schmidt, Semicond. Sci. Technol. 17, 1278 (2002).
[CrossRef]

Deneke, Ch.

Ch. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

Geluk, E. J.

A. Kok, E. J. Geluk, F. Karouta, J. Tol, R. Baets, and M. K. Smit, IEEE Photon. Technol. Lett. 20, 1369(2008).
[CrossRef]

Heitmann, D.

Ch. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, Ch. Heyn, D. Heitmann, and T. Kipp, Phys. Rev. Lett. 101, 127403 (2008).
[CrossRef] [PubMed]

T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef] [PubMed]

Heyn, Ch.

Ch. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, Ch. Heyn, D. Heitmann, and T. Kipp, Phys. Rev. Lett. 101, 127403 (2008).
[CrossRef] [PubMed]

T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef] [PubMed]

Hosoda, M.

M. Hosoda and T. Shigaki, Appl. Phys. Lett. 90, 181107(2007).
[CrossRef]

Jin-Phillipp, N. Y.

C. Deneke, C. Muller, N. Y. Jin-Phillipp, and O. G. Schmidt, Semicond. Sci. Technol. 17, 1278 (2002).
[CrossRef]

Karouta, F.

A. Kok, E. J. Geluk, F. Karouta, J. Tol, R. Baets, and M. K. Smit, IEEE Photon. Technol. Lett. 20, 1369(2008).
[CrossRef]

Kipp, T.

Ch. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, Ch. Heyn, D. Heitmann, and T. Kipp, Phys. Rev. Lett. 101, 127403 (2008).
[CrossRef] [PubMed]

T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef] [PubMed]

Kiravittaya, S.

Ch. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

Kirk, A. G.

Z. Tian, V. Veerasubramanian, P. Bianucci, S. Mukherjee, Z. Mi, A. G. Kirk, and D. V. Plant, Opt. Express 19, 12164(2011).
[CrossRef] [PubMed]

Z. Mi, P. Bianucci, F. Li, Z. Tian, V. Veerasubramanian, A. G. Kirk, D. V. Plant, and P. J. Poole, Proc. SPIE 7943, 79431C (2011).
[CrossRef]

Kok, A.

A. Kok, E. J. Geluk, F. Karouta, J. Tol, R. Baets, and M. K. Smit, IEEE Photon. Technol. Lett. 20, 1369(2008).
[CrossRef]

Kolchuzhin, V.

A. Milekhin, S. Mutilin, J. Yukecheva, M. Putyato, A. Vorob’ev, V. Prinz, V. Kolchuzhin, J. Mehner, and D. R. T. Zahn, Phys. Status Solidi C 6, 2060 (2009).
[CrossRef]

Li, F.

Z. Mi, P. Bianucci, F. Li, Z. Tian, V. Veerasubramanian, A. G. Kirk, D. V. Plant, and P. J. Poole, Proc. SPIE 7943, 79431C (2011).
[CrossRef]

Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
[CrossRef]

F. Li and Z. Mi, Opt. Express 17, 19933 (2009).
[CrossRef] [PubMed]

F. Li, Z. Mi, and S. Vicknesh, Opt. Lett. 34, 2915 (2009).
[CrossRef] [PubMed]

S. Vicknesh, F. Li, and Z. Mi, Appl. Phys. Lett. 94, 081101(2009).
[CrossRef]

Malachias, A.

Ch. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

Mehner, J.

A. Milekhin, S. Mutilin, J. Yukecheva, M. Putyato, A. Vorob’ev, V. Prinz, V. Kolchuzhin, J. Mehner, and D. R. T. Zahn, Phys. Status Solidi C 6, 2060 (2009).
[CrossRef]

Metzger, T. H.

Ch. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

Mi, Z.

Z. Tian, V. Veerasubramanian, P. Bianucci, S. Mukherjee, Z. Mi, A. G. Kirk, and D. V. Plant, Opt. Express 19, 12164(2011).
[CrossRef] [PubMed]

Z. Mi, P. Bianucci, F. Li, Z. Tian, V. Veerasubramanian, A. G. Kirk, D. V. Plant, and P. J. Poole, Proc. SPIE 7943, 79431C (2011).
[CrossRef]

Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
[CrossRef]

F. Li and Z. Mi, Opt. Express 17, 19933 (2009).
[CrossRef] [PubMed]

F. Li, Z. Mi, and S. Vicknesh, Opt. Lett. 34, 2915 (2009).
[CrossRef] [PubMed]

S. Vicknesh, F. Li, and Z. Mi, Appl. Phys. Lett. 94, 081101(2009).
[CrossRef]

Milekhin, A.

A. Milekhin, S. Mutilin, J. Yukecheva, M. Putyato, A. Vorob’ev, V. Prinz, V. Kolchuzhin, J. Mehner, and D. R. T. Zahn, Phys. Status Solidi C 6, 2060 (2009).
[CrossRef]

Mukherjee, S.

Muller, C.

C. Deneke, C. Muller, N. Y. Jin-Phillipp, and O. G. Schmidt, Semicond. Sci. Technol. 17, 1278 (2002).
[CrossRef]

Mutilin, S.

A. Milekhin, S. Mutilin, J. Yukecheva, M. Putyato, A. Vorob’ev, V. Prinz, V. Kolchuzhin, J. Mehner, and D. R. T. Zahn, Phys. Status Solidi C 6, 2060 (2009).
[CrossRef]

Plant, D. V.

Z. Mi, P. Bianucci, F. Li, Z. Tian, V. Veerasubramanian, A. G. Kirk, D. V. Plant, and P. J. Poole, Proc. SPIE 7943, 79431C (2011).
[CrossRef]

Z. Tian, V. Veerasubramanian, P. Bianucci, S. Mukherjee, Z. Mi, A. G. Kirk, and D. V. Plant, Opt. Express 19, 12164(2011).
[CrossRef] [PubMed]

Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
[CrossRef]

Poole, P. J.

Z. Mi, P. Bianucci, F. Li, Z. Tian, V. Veerasubramanian, A. G. Kirk, D. V. Plant, and P. J. Poole, Proc. SPIE 7943, 79431C (2011).
[CrossRef]

Prinz, V.

A. Milekhin, S. Mutilin, J. Yukecheva, M. Putyato, A. Vorob’ev, V. Prinz, V. Kolchuzhin, J. Mehner, and D. R. T. Zahn, Phys. Status Solidi C 6, 2060 (2009).
[CrossRef]

Putyato, M.

A. Milekhin, S. Mutilin, J. Yukecheva, M. Putyato, A. Vorob’ev, V. Prinz, V. Kolchuzhin, J. Mehner, and D. R. T. Zahn, Phys. Status Solidi C 6, 2060 (2009).
[CrossRef]

Rehberg, H.

Ch. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, Ch. Heyn, D. Heitmann, and T. Kipp, Phys. Rev. Lett. 101, 127403 (2008).
[CrossRef] [PubMed]

Schmidt, O. G.

Ch. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

C. Deneke, C. Muller, N. Y. Jin-Phillipp, and O. G. Schmidt, Semicond. Sci. Technol. 17, 1278 (2002).
[CrossRef]

Schultz, C. M.

Ch. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, Ch. Heyn, D. Heitmann, and T. Kipp, Phys. Rev. Lett. 101, 127403 (2008).
[CrossRef] [PubMed]

Shigaki, T.

M. Hosoda and T. Shigaki, Appl. Phys. Lett. 90, 181107(2007).
[CrossRef]

Smit, M. K.

A. Kok, E. J. Geluk, F. Karouta, J. Tol, R. Baets, and M. K. Smit, IEEE Photon. Technol. Lett. 20, 1369(2008).
[CrossRef]

Strelow, Ch.

Ch. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, Ch. Heyn, D. Heitmann, and T. Kipp, Phys. Rev. Lett. 101, 127403 (2008).
[CrossRef] [PubMed]

T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef] [PubMed]

Tian, Z.

Z. Tian, V. Veerasubramanian, P. Bianucci, S. Mukherjee, Z. Mi, A. G. Kirk, and D. V. Plant, Opt. Express 19, 12164(2011).
[CrossRef] [PubMed]

Z. Mi, P. Bianucci, F. Li, Z. Tian, V. Veerasubramanian, A. G. Kirk, D. V. Plant, and P. J. Poole, Proc. SPIE 7943, 79431C (2011).
[CrossRef]

Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
[CrossRef]

Tol, J.

A. Kok, E. J. Geluk, F. Karouta, J. Tol, R. Baets, and M. K. Smit, IEEE Photon. Technol. Lett. 20, 1369(2008).
[CrossRef]

Veerasubramanian, V.

Z. Mi, P. Bianucci, F. Li, Z. Tian, V. Veerasubramanian, A. G. Kirk, D. V. Plant, and P. J. Poole, Proc. SPIE 7943, 79431C (2011).
[CrossRef]

Z. Tian, V. Veerasubramanian, P. Bianucci, S. Mukherjee, Z. Mi, A. G. Kirk, and D. V. Plant, Opt. Express 19, 12164(2011).
[CrossRef] [PubMed]

Vicknesh, S.

S. Vicknesh, F. Li, and Z. Mi, Appl. Phys. Lett. 94, 081101(2009).
[CrossRef]

F. Li, Z. Mi, and S. Vicknesh, Opt. Lett. 34, 2915 (2009).
[CrossRef] [PubMed]

Vorob’ev, A.

A. Milekhin, S. Mutilin, J. Yukecheva, M. Putyato, A. Vorob’ev, V. Prinz, V. Kolchuzhin, J. Mehner, and D. R. T. Zahn, Phys. Status Solidi C 6, 2060 (2009).
[CrossRef]

Welsch, H.

Ch. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, Ch. Heyn, D. Heitmann, and T. Kipp, Phys. Rev. Lett. 101, 127403 (2008).
[CrossRef] [PubMed]

T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef] [PubMed]

Yukecheva, J.

A. Milekhin, S. Mutilin, J. Yukecheva, M. Putyato, A. Vorob’ev, V. Prinz, V. Kolchuzhin, J. Mehner, and D. R. T. Zahn, Phys. Status Solidi C 6, 2060 (2009).
[CrossRef]

Zahn, D. R. T.

A. Milekhin, S. Mutilin, J. Yukecheva, M. Putyato, A. Vorob’ev, V. Prinz, V. Kolchuzhin, J. Mehner, and D. R. T. Zahn, Phys. Status Solidi C 6, 2060 (2009).
[CrossRef]

Appl. Phys. Lett.

S. Vicknesh, F. Li, and Z. Mi, Appl. Phys. Lett. 94, 081101(2009).
[CrossRef]

Ch. Deneke, A. Malachias, S. Kiravittaya, M. Benyoucef, T. H. Metzger, and O. G. Schmidt, Appl. Phys. Lett. 96, 143101 (2010).
[CrossRef]

M. Hosoda and T. Shigaki, Appl. Phys. Lett. 90, 181107(2007).
[CrossRef]

IEEE Photon. Technol. Lett.

Z. Tian, F. Li, Z. Mi, and D. V. Plant, IEEE Photon. Technol. Lett. 22, 311 (2010).
[CrossRef]

A. Kok, E. J. Geluk, F. Karouta, J. Tol, R. Baets, and M. K. Smit, IEEE Photon. Technol. Lett. 20, 1369(2008).
[CrossRef]

Opt. Express

Opt. Lett.

Phys. Rev. Lett.

T. Kipp, H. Welsch, Ch. Strelow, Ch. Heyn, and D. Heitmann, Phys. Rev. Lett. 96, 077403 (2006).
[CrossRef] [PubMed]

Ch. Strelow, H. Rehberg, C. M. Schultz, H. Welsch, Ch. Heyn, D. Heitmann, and T. Kipp, Phys. Rev. Lett. 101, 127403 (2008).
[CrossRef] [PubMed]

Phys. Status Solidi C

A. Milekhin, S. Mutilin, J. Yukecheva, M. Putyato, A. Vorob’ev, V. Prinz, V. Kolchuzhin, J. Mehner, and D. R. T. Zahn, Phys. Status Solidi C 6, 2060 (2009).
[CrossRef]

Proc. SPIE

Z. Mi, P. Bianucci, F. Li, Z. Tian, V. Veerasubramanian, A. G. Kirk, D. V. Plant, and P. J. Poole, Proc. SPIE 7943, 79431C (2011).
[CrossRef]

Semicond. Sci. Technol.

C. Deneke, C. Muller, N. Y. Jin-Phillipp, and O. G. Schmidt, Semicond. Sci. Technol. 17, 1278 (2002).
[CrossRef]

Other

S. Adachi, Properties of Group-IV, III-V and II-VI Semiconductors(John Wiley & Sons, 2005).
[CrossRef]

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (6)

Fig. 1
Fig. 1

Optical microscope image of an InGaAs/GaAs microtube. (Left insets show schematic of TE and TM modes in the microtube, and right inset shows the free-standing part with surface corrugations).

Fig. 2
Fig. 2

Transmission spectra of a nonadiabatically tapered fiber (solid curve) and an adiabatically tapered fiber (dashed curve). Inset is the optical image of a tapered fiber with a 1 μm waist.

Fig. 3
Fig. 3

Experimental setup for the coupling of an InGaAs/GaAs microtube and an adiabatically tapered fiber.

Fig. 4
Fig. 4

Transmission spectra of the coupling from an InGaAs/GaAs microtube and adiabatically tapered fiber under the TE/TM mode excitations (left axis), and spectrum of the mode locked laser (right axis).

Fig. 5
Fig. 5

Optical images of the microtube and the adiabatic taper under (a) visible light illumination, (b) TE mode excitation by the mode locked laser, (c) TM mode excitation by the mode locked laser.

Fig. 6
Fig. 6

Optical modulation generated by the microtube when the pump laser is modulated at 500 Hz and the probe laser wavelength is set as (a) TM resonance wavelength of 1533.62 nm [point A in (c)] and (b)  1533.82 nm [point B in (c)]. Vertical 100 mV / grid , horizontal 1 ms / grid in (a) and (b).

Equations (3)

Equations on this page are rendered with MathJax. Learn more.

λ = π D n eff / m ,
FSR λ 2 / n π D ,
δ n / δ T = ( n / 4 E g ) × ( δ E g / δ T ) ,

Metrics