Abstract

Many three-dimensional (3D) shape measurement techniques in stereophotogrammetry with temporal coded structured illumination are limited to static scenes because the time for measurement is too long in comparison to the object speed. The measurement of moving objects result in erroneous reconstructions. This is apparent to reduce measurement time to overcome this limitation, which is often done by increasing the projection rate for illumination while shrinking the amount of images taken for reconstruction. The projection rate limits most applications in its speed because digital light processing (DLP) projectors, which are widely used, bring a limited projection rate along. Our approach, in contrast, does not take a DLP. Instead we use laser speckles as projected patterns which are switched using an acousto-optical deflector. The projection rate is 10× higher than what the fastest stripe projection systems to our knowledge achieve. Hence, we present this uncommon but potential approach for high speed (2503Dfps= [3D measurements per second]), dense, and accurate 3D measurements of spatially separated objects and show the media that emphasizes the ability of accurate measurements while the objects under testing move.

© 2011 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. S. Lei and S. Zhang, Opt. Lett. 34, 3080 (2009).
    [CrossRef] [PubMed]
  2. C. Bräuer-Burchardt, A. Breitbarth, P. Kühmstedt, I. Schmidt, M. Heinze, and G. Notni, in Optical Measurement Systems for Industrial Inspection VII, P.H.Lehmann, W.Osten, and K.Gastinger, eds. (2011).
  3. S. Zhang and P. Huang, in Computer Vision and Pattern Recognition Workshop (IEEE, 2004), Vol. 3, pp. 28.
    [CrossRef]
  4. Y. Gong and S. Zhang, Opt. Express 18, 19743 (2010).
    [CrossRef] [PubMed]
  5. Y. Wang and S. Zhang, Opt. Express 19, 5149 (2011).
    [CrossRef] [PubMed]
  6. Y. Wang, S. Zhang, and J. H. Oliver, Opt. Express 19, 8539 (2011).
    [CrossRef] [PubMed]
  7. X. Yin, H. Zhao, J. Zeng, and Y. Qu, Appl. Opt. 46, 3046(2007).
    [CrossRef] [PubMed]
  8. E. Li, J. Yao, D. Yu, J. Xi, and J. Chicharo, Opt. Lett. 30, 189(2005).
    [CrossRef] [PubMed]
  9. J. Y. Cheng and Q. Chen, Proc. SPIE 6068, 60680L (2006).
    [CrossRef]
  10. M. Schaffer, M. Grosse, and R. Kowarschik, Appl. Opt. 49, 3622 (2010).
    [CrossRef] [PubMed]
  11. P. Albrecht and B. Michaelis, in Proceedings Fourteenth International Conference on Pattern Recognition, 1998 (IEEE, 1998), Vol.  1, pp. 845–849.
    [CrossRef]
  12. A. Wiegmann, H. Wagner, and R. Kowarschik, Opt. Express 14, 7692 (2006).
    [CrossRef] [PubMed]

2011 (3)

C. Bräuer-Burchardt, A. Breitbarth, P. Kühmstedt, I. Schmidt, M. Heinze, and G. Notni, in Optical Measurement Systems for Industrial Inspection VII, P.H.Lehmann, W.Osten, and K.Gastinger, eds. (2011).

Y. Wang and S. Zhang, Opt. Express 19, 5149 (2011).
[CrossRef] [PubMed]

Y. Wang, S. Zhang, and J. H. Oliver, Opt. Express 19, 8539 (2011).
[CrossRef] [PubMed]

2010 (2)

2009 (1)

2007 (1)

2006 (2)

2005 (1)

2004 (1)

S. Zhang and P. Huang, in Computer Vision and Pattern Recognition Workshop (IEEE, 2004), Vol. 3, pp. 28.
[CrossRef]

1998 (1)

P. Albrecht and B. Michaelis, in Proceedings Fourteenth International Conference on Pattern Recognition, 1998 (IEEE, 1998), Vol.  1, pp. 845–849.
[CrossRef]

Albrecht, P.

P. Albrecht and B. Michaelis, in Proceedings Fourteenth International Conference on Pattern Recognition, 1998 (IEEE, 1998), Vol.  1, pp. 845–849.
[CrossRef]

Bräuer-Burchardt, C.

C. Bräuer-Burchardt, A. Breitbarth, P. Kühmstedt, I. Schmidt, M. Heinze, and G. Notni, in Optical Measurement Systems for Industrial Inspection VII, P.H.Lehmann, W.Osten, and K.Gastinger, eds. (2011).

Breitbarth, A.

C. Bräuer-Burchardt, A. Breitbarth, P. Kühmstedt, I. Schmidt, M. Heinze, and G. Notni, in Optical Measurement Systems for Industrial Inspection VII, P.H.Lehmann, W.Osten, and K.Gastinger, eds. (2011).

Chen, Q.

J. Y. Cheng and Q. Chen, Proc. SPIE 6068, 60680L (2006).
[CrossRef]

Cheng, J. Y.

J. Y. Cheng and Q. Chen, Proc. SPIE 6068, 60680L (2006).
[CrossRef]

Chicharo, J.

Gong, Y.

Grosse, M.

Heinze, M.

C. Bräuer-Burchardt, A. Breitbarth, P. Kühmstedt, I. Schmidt, M. Heinze, and G. Notni, in Optical Measurement Systems for Industrial Inspection VII, P.H.Lehmann, W.Osten, and K.Gastinger, eds. (2011).

Huang, P.

S. Zhang and P. Huang, in Computer Vision and Pattern Recognition Workshop (IEEE, 2004), Vol. 3, pp. 28.
[CrossRef]

Kowarschik, R.

Kühmstedt, P.

C. Bräuer-Burchardt, A. Breitbarth, P. Kühmstedt, I. Schmidt, M. Heinze, and G. Notni, in Optical Measurement Systems for Industrial Inspection VII, P.H.Lehmann, W.Osten, and K.Gastinger, eds. (2011).

Lei, S.

Li, E.

Michaelis, B.

P. Albrecht and B. Michaelis, in Proceedings Fourteenth International Conference on Pattern Recognition, 1998 (IEEE, 1998), Vol.  1, pp. 845–849.
[CrossRef]

Notni, G.

C. Bräuer-Burchardt, A. Breitbarth, P. Kühmstedt, I. Schmidt, M. Heinze, and G. Notni, in Optical Measurement Systems for Industrial Inspection VII, P.H.Lehmann, W.Osten, and K.Gastinger, eds. (2011).

Oliver, J. H.

Qu, Y.

Schaffer, M.

Schmidt, I.

C. Bräuer-Burchardt, A. Breitbarth, P. Kühmstedt, I. Schmidt, M. Heinze, and G. Notni, in Optical Measurement Systems for Industrial Inspection VII, P.H.Lehmann, W.Osten, and K.Gastinger, eds. (2011).

Wagner, H.

Wang, Y.

Wiegmann, A.

Xi, J.

Yao, J.

Yin, X.

Yu, D.

Zeng, J.

Zhang, S.

Zhao, H.

Appl. Opt. (2)

Opt. Express (4)

Opt. Lett. (2)

Proc. SPIE (1)

J. Y. Cheng and Q. Chen, Proc. SPIE 6068, 60680L (2006).
[CrossRef]

Other (3)

P. Albrecht and B. Michaelis, in Proceedings Fourteenth International Conference on Pattern Recognition, 1998 (IEEE, 1998), Vol.  1, pp. 845–849.
[CrossRef]

C. Bräuer-Burchardt, A. Breitbarth, P. Kühmstedt, I. Schmidt, M. Heinze, and G. Notni, in Optical Measurement Systems for Industrial Inspection VII, P.H.Lehmann, W.Osten, and K.Gastinger, eds. (2011).

S. Zhang and P. Huang, in Computer Vision and Pattern Recognition Workshop (IEEE, 2004), Vol. 3, pp. 28.
[CrossRef]

Supplementary Material (4)

» Media 1: MPG (13516 KB)     
» Media 2: MPG (4036 KB)     
» Media 3: MPG (13968 KB)     
» Media 4: MPG (3960 KB)     

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1
Fig. 1

Speckle projection setup deflecting the laser beam by an AOD.

Fig. 2
Fig. 2

Corresponding pixels with similar gray-value vectors using temporal correlation.

Fig. 3
Fig. 3

σ versus gray-value length N.

Fig. 4
Fig. 4

3D reconstructions using speckle pattern projection and temporal correlation. (a) Static circuit board acquired in 5 ms , σ = 36 μm in pseudocolors (Media 1 and Media 3). (b) Moving objects acquired with 193 3Dfps , σ = 36 μm (Media 2 and Media 4).

Equations (1)

Equations on this page are rendered with MathJax. Learn more.

ρ i , j , i , j = t = 1 N ( g i , j , t g ¯ i , j ) · ( g i , j , t g ¯ i , j ) t = 1 N ( g i , j , t g ¯ i , j ) 2 · t = 1 N ( g i , j , t g ¯ i , j ) 2 .

Metrics