Abstract

We report that a modified Z-scan method by nonlinear ellipse rotation (NER) can be used to discriminate true nonlinear refraction from thermal effect in the transient regime and steady state. The combination of Z-scan and NER allows us to measure the third-order nonlinear susceptibility component without the influence of thermal–optical nonlinearity. The experimental results of pure CS2 and CS2 solutions of nigrosine verify that the transient thermal effect can be successfully eliminated from the NER-modified Z-scan measurements. This method is also extended to the case in which thermal–optical nonlinearities depend on a high repetition rate of femtosecond laser pulses for the N,N-dimethylmethanamide solutions of graphene oxide.

© 2011 Optical Society of America

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