Abstract

A laser Doppler vibrometer with single photodetector is introduced to measure the vibration on multiple points of target simultaneously. A 2×5 beam array with various frequency shifts is generated by three acousto-optic devices, illuminating different points on a vibrating object. The reflected beams interfere with a reference beam on a high-speed photodetector, and the signal is amplified and digitized with a rate of 500 megasampless. To extract vibration information of different points, the carrier frequencies of each beam are elaborately designed so that they can be separated from cross-talk regions in the spectrum. The experimental results are compared with that from a commercial single-point vibrometer, and the comparison shows that it is possible to do a precise measurement on multiple points simultaneously using a single photodetector.

© 2010 Optical Society of America

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2010 (1)

2009 (2)

J. J. J. Dirckx, H. J. van Elburg, W. F. Decraemer, J. A. N. Buytaert, and J. A. Melkebeek, Opt. Lasers Eng. 47, 488 (2009).
[CrossRef]

R. Burgett, V. Aranchuk, J. Sabatier, and S. S. Bishop, Proc. SPIE 7303, 730301 (2009).

2008 (2)

J. M. Kilpatrick and V. Markov, Proc. SPIE 7098, 709809 (2008).
[CrossRef]

A. Waz, P. R. Kaczmarek, M. P. Nikodem, and K. M. Abramski, Proc. SPIE 7098, 70980E (2008).
[CrossRef]

2007 (2)

2006 (2)

P. Castellini, M. Martarelli, and E. P. Tomasini, Mech. Syst. Signal Process. 20, 1265 (2006).
[CrossRef]

K. Qian, Y. Fu, Q. Liu, H. S. Seah, and A. Asundi, Opt. Lett. 31, 2121 (2006).
[CrossRef] [PubMed]

2005 (1)

E. B. Li, J. Xi, J. F. Chicharo, J. Q. Yao, and D. Y. Yu, Opt. Commun. 245, 309 (2005).
[CrossRef]

2004 (1)

R. Di Sante and L. Scalise, Rev. Sci. Instrum. 75, 1952 (2004).
[CrossRef]

2003 (1)

J. La, J. Choi, S. Wang, K. Kim, and K. Park, Opt. Eng. 42, 731 (2003).
[CrossRef]

1998 (1)

W. Zheng, R. V. Kruzelecky, and R. Changkakoti, Proc. SPIE 3411, 376 (1998).
[CrossRef]

Abramski, K. M.

A. Waz, P. R. Kaczmarek, M. P. Nikodem, and K. M. Abramski, Proc. SPIE 7098, 70980E (2008).
[CrossRef]

Aranchuk, V.

R. Burgett, V. Aranchuk, J. Sabatier, and S. S. Bishop, Proc. SPIE 7303, 730301 (2009).

Asundi, A.

Bishop, S. S.

R. Burgett, V. Aranchuk, J. Sabatier, and S. S. Bishop, Proc. SPIE 7303, 730301 (2009).

Burgett, R.

R. Burgett, V. Aranchuk, J. Sabatier, and S. S. Bishop, Proc. SPIE 7303, 730301 (2009).

Buytaert, J. A. N.

J. J. J. Dirckx, H. J. van Elburg, W. F. Decraemer, J. A. N. Buytaert, and J. A. Melkebeek, Opt. Lasers Eng. 47, 488 (2009).
[CrossRef]

Castellini, P.

P. Castellini, M. Martarelli, and E. P. Tomasini, Mech. Syst. Signal Process. 20, 1265 (2006).
[CrossRef]

Changkakoti, R.

W. Zheng, R. V. Kruzelecky, and R. Changkakoti, Proc. SPIE 3411, 376 (1998).
[CrossRef]

Chicharo, J. F.

E. B. Li, J. Xi, J. F. Chicharo, J. Q. Yao, and D. Y. Yu, Opt. Commun. 245, 309 (2005).
[CrossRef]

Choi, J.

J. La, J. Choi, S. Wang, K. Kim, and K. Park, Opt. Eng. 42, 731 (2003).
[CrossRef]

Decraemer, W. F.

J. J. J. Dirckx, H. J. van Elburg, W. F. Decraemer, J. A. N. Buytaert, and J. A. Melkebeek, Opt. Lasers Eng. 47, 488 (2009).
[CrossRef]

Di Sante, R.

R. Di Sante and L. Scalise, Rev. Sci. Instrum. 75, 1952 (2004).
[CrossRef]

Dirckx, J. J. J.

J. J. J. Dirckx, H. J. van Elburg, W. F. Decraemer, J. A. N. Buytaert, and J. A. Melkebeek, Opt. Lasers Eng. 47, 488 (2009).
[CrossRef]

Fu, Y.

Fujii, Y.

Groves, R. M.

Kaczmarek, P. R.

A. Waz, P. R. Kaczmarek, M. P. Nikodem, and K. M. Abramski, Proc. SPIE 7098, 70980E (2008).
[CrossRef]

Kilpatrick, J. M.

J. M. Kilpatrick and V. Markov, Proc. SPIE 7098, 709809 (2008).
[CrossRef]

Kim, K.

J. La, J. Choi, S. Wang, K. Kim, and K. Park, Opt. Eng. 42, 731 (2003).
[CrossRef]

Kobayashi, K.

Kruzelecky, R. V.

W. Zheng, R. V. Kruzelecky, and R. Changkakoti, Proc. SPIE 3411, 376 (1998).
[CrossRef]

La, J.

J. La, J. Choi, S. Wang, K. Kim, and K. Park, Opt. Eng. 42, 731 (2003).
[CrossRef]

Li, E. B.

E. B. Li, J. Xi, J. F. Chicharo, J. Q. Yao, and D. Y. Yu, Opt. Commun. 245, 309 (2005).
[CrossRef]

Liu, Q.

Markov, V.

J. M. Kilpatrick and V. Markov, Proc. SPIE 7098, 709809 (2008).
[CrossRef]

Martarelli, M.

P. Castellini, M. Martarelli, and E. P. Tomasini, Mech. Syst. Signal Process. 20, 1265 (2006).
[CrossRef]

Maru, K.

Melkebeek, J. A.

J. J. J. Dirckx, H. J. van Elburg, W. F. Decraemer, J. A. N. Buytaert, and J. A. Melkebeek, Opt. Lasers Eng. 47, 488 (2009).
[CrossRef]

Nikodem, M. P.

A. Waz, P. R. Kaczmarek, M. P. Nikodem, and K. M. Abramski, Proc. SPIE 7098, 70980E (2008).
[CrossRef]

Osten, W.

Park, K.

J. La, J. Choi, S. Wang, K. Kim, and K. Park, Opt. Eng. 42, 731 (2003).
[CrossRef]

Pedrini, G.

Qian, K.

Sabatier, J.

R. Burgett, V. Aranchuk, J. Sabatier, and S. S. Bishop, Proc. SPIE 7303, 730301 (2009).

Scalise, L.

R. Di Sante and L. Scalise, Rev. Sci. Instrum. 75, 1952 (2004).
[CrossRef]

Seah, H. S.

Tomasini, E. P.

P. Castellini, M. Martarelli, and E. P. Tomasini, Mech. Syst. Signal Process. 20, 1265 (2006).
[CrossRef]

van Elburg, H. J.

J. J. J. Dirckx, H. J. van Elburg, W. F. Decraemer, J. A. N. Buytaert, and J. A. Melkebeek, Opt. Lasers Eng. 47, 488 (2009).
[CrossRef]

Wang, S.

J. La, J. Choi, S. Wang, K. Kim, and K. Park, Opt. Eng. 42, 731 (2003).
[CrossRef]

Waz, A.

A. Waz, P. R. Kaczmarek, M. P. Nikodem, and K. M. Abramski, Proc. SPIE 7098, 70980E (2008).
[CrossRef]

Xi, J.

E. B. Li, J. Xi, J. F. Chicharo, J. Q. Yao, and D. Y. Yu, Opt. Commun. 245, 309 (2005).
[CrossRef]

Yao, J. Q.

E. B. Li, J. Xi, J. F. Chicharo, J. Q. Yao, and D. Y. Yu, Opt. Commun. 245, 309 (2005).
[CrossRef]

Yu, D. Y.

E. B. Li, J. Xi, J. F. Chicharo, J. Q. Yao, and D. Y. Yu, Opt. Commun. 245, 309 (2005).
[CrossRef]

Zheng, W.

W. Zheng, R. V. Kruzelecky, and R. Changkakoti, Proc. SPIE 3411, 376 (1998).
[CrossRef]

Appl. Opt. (2)

Mech. Syst. Signal Process. (1)

P. Castellini, M. Martarelli, and E. P. Tomasini, Mech. Syst. Signal Process. 20, 1265 (2006).
[CrossRef]

Opt. Commun. (1)

E. B. Li, J. Xi, J. F. Chicharo, J. Q. Yao, and D. Y. Yu, Opt. Commun. 245, 309 (2005).
[CrossRef]

Opt. Eng. (1)

J. La, J. Choi, S. Wang, K. Kim, and K. Park, Opt. Eng. 42, 731 (2003).
[CrossRef]

Opt. Express (1)

Opt. Lasers Eng. (1)

J. J. J. Dirckx, H. J. van Elburg, W. F. Decraemer, J. A. N. Buytaert, and J. A. Melkebeek, Opt. Lasers Eng. 47, 488 (2009).
[CrossRef]

Opt. Lett. (1)

Proc. SPIE (4)

A. Waz, P. R. Kaczmarek, M. P. Nikodem, and K. M. Abramski, Proc. SPIE 7098, 70980E (2008).
[CrossRef]

W. Zheng, R. V. Kruzelecky, and R. Changkakoti, Proc. SPIE 3411, 376 (1998).
[CrossRef]

R. Burgett, V. Aranchuk, J. Sabatier, and S. S. Bishop, Proc. SPIE 7303, 730301 (2009).

J. M. Kilpatrick and V. Markov, Proc. SPIE 7098, 709809 (2008).
[CrossRef]

Rev. Sci. Instrum. (1)

R. Di Sante and L. Scalise, Rev. Sci. Instrum. 75, 1952 (2004).
[CrossRef]

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Figures (4)

Fig. 1
Fig. 1

Beam array with different frequency shifts generated by (a) Raman–Nath frequency shifter, (b) frequency shifter in Bragg regime, and (c) combination of (a) and (b). (d) Final frequency shifts of beam array after a 50 MHz fiber-based acousto-optic modulator (AOM) is introduced (all frequency shift values are in megahertz).

Fig. 2
Fig. 2

(a) Experimental setup of multibeam LDV with a single detector: 1, 80 mW distributed feedback (DFB) laser system; 2, single-mode-fiber coupler (1:99); 3, polarization controller; 4, fiber-based acousto-optic modulator; 5, groduct-index lens; 6, Raman–Nath frequency shifter; 7, telescope system that determines the width–height ratio of the beam array; 8, Bragg frequency shifter; 9, collimating lens; 10, polarizing beam splitter; 11, quarter-wave plate; 12, specimen; 13, shaker system; 14, function generator; 15, telescope system to reduce the size of beam array; 16, collimating lens; 17, single-mode-fiber coupler (50:50); 18, high-speed photodetector; 19, NI preamplifier and high-speed digitizer with processor. (b) Specimen: two cantilever beams with different thickness.

Fig. 3
Fig. 3

(a) spectrum of the signal; (b) retrieved displacement of points A and B; (c) spectrum of displacement of point A obtained by proposed method; (d) spectrum of displacement of point A obtained by Polytec PDV-100 single-point vibrometer.

Fig. 4
Fig. 4

Displacement of two cantilever beams at different instants.

Equations (1)

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I ( t ) = A 0 + A m cos [ 2 π ( f B + f D ( t ) ) t + φ 0 ] ,

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