Abstract

A quantitative assessment method for computer-generated holograms is presented. Our scheme is based on a simple evaluation quantity reflecting the optical radiating power from the holograms; this assures the overall validity of our method as a three-dimensional (3D) display assessment technique. Moreover, the effect of location from which the 3D view is observed is ruled out from the result. This contributes to both economy of computation and conciseness of the result.

© 2010 Optical Society of America

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    [CrossRef]
  3. C. Slinger, C. Cameron, and M. Stanley, Computer 38, 46 (2005).
    [CrossRef]
  4. T. Ito, T. Shimobaba, H. Godo, and M. Horiuchi, Opt. Lett. 27, 1406 (2002).
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  5. M. Yamaguchi, H. Hoshino, T. Honda, and N. Ohyama, Proc. SPIE 1914, 25 (1993).
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  6. H. Yoshikawa, Opt. Rev. 8, 331 (2001).
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    [CrossRef]

2008 (1)

2006 (1)

2005 (3)

2003 (2)

M. Liebling, T. Blu, and M. Unser, IEEE Trans. Image Process. 12, 29 (2003).
[CrossRef]

K. Matsushima, H. Schimmel, and F. Wyrowski, J. Opt. Soc. Am. A 20, 1755 (2003).
[CrossRef]

2002 (1)

2001 (1)

H. Yoshikawa, Opt. Rev. 8, 331 (2001).
[CrossRef]

1997 (1)

M. Lucente, in ACM SIGGRAPH Computer Graphics (Addison Wesley, 1997), pp. 63.
[CrossRef]

1994 (1)

1993 (1)

M. Yamaguchi, H. Hoshino, T. Honda, and N. Ohyama, Proc. SPIE 1914, 25 (1993).
[CrossRef]

1990 (1)

P. Hilaire, S. Benton, M. Lucente, M. Jepsen, J. Kollin, H. Yoshikawa, and J. Underkoffler, Proc. SPIE 1212, 174 (1990).
[CrossRef]

Benton, S.

P. Hilaire, S. Benton, M. Lucente, M. Jepsen, J. Kollin, H. Yoshikawa, and J. Underkoffler, Proc. SPIE 1212, 174 (1990).
[CrossRef]

Blu, T.

M. Liebling, T. Blu, and M. Unser, IEEE Trans. Image Process. 12, 29 (2003).
[CrossRef]

Cameron, C.

C. Slinger, C. Cameron, and M. Stanley, Computer 38, 46 (2005).
[CrossRef]

Charrière, F.

Colomb, T.

Cuche, E.

Depeursinge, C.

Godo, H.

Hilaire, P.

P. Hilaire, S. Benton, M. Lucente, M. Jepsen, J. Kollin, H. Yoshikawa, and J. Underkoffler, Proc. SPIE 1212, 174 (1990).
[CrossRef]

Honda, T.

M. Yamaguchi, H. Hoshino, T. Honda, and N. Ohyama, Proc. SPIE 1914, 25 (1993).
[CrossRef]

Horiuchi, M.

Hoshino, H.

M. Yamaguchi, H. Hoshino, T. Honda, and N. Ohyama, Proc. SPIE 1914, 25 (1993).
[CrossRef]

Ito, T.

Jepsen, M.

P. Hilaire, S. Benton, M. Lucente, M. Jepsen, J. Kollin, H. Yoshikawa, and J. Underkoffler, Proc. SPIE 1212, 174 (1990).
[CrossRef]

Jüptner, W.

Kollin, J.

P. Hilaire, S. Benton, M. Lucente, M. Jepsen, J. Kollin, H. Yoshikawa, and J. Underkoffler, Proc. SPIE 1212, 174 (1990).
[CrossRef]

Liebling, M.

M. Liebling, T. Blu, and M. Unser, IEEE Trans. Image Process. 12, 29 (2003).
[CrossRef]

Lucente, M.

M. Lucente, in ACM SIGGRAPH Computer Graphics (Addison Wesley, 1997), pp. 63.
[CrossRef]

P. Hilaire, S. Benton, M. Lucente, M. Jepsen, J. Kollin, H. Yoshikawa, and J. Underkoffler, Proc. SPIE 1212, 174 (1990).
[CrossRef]

Marquet, P.

Masuda, N.

Matsushima, K.

Miura, J.

Montfort, F.

Ohyama, N.

M. Yamaguchi, H. Hoshino, T. Honda, and N. Ohyama, Proc. SPIE 1914, 25 (1993).
[CrossRef]

Sato, Y.

Schimmel, H.

Schnars, U.

Shimobaba, T.

Shiraki, A.

Slinger, C.

C. Slinger, C. Cameron, and M. Stanley, Computer 38, 46 (2005).
[CrossRef]

Stanley, M.

C. Slinger, C. Cameron, and M. Stanley, Computer 38, 46 (2005).
[CrossRef]

Sugie, T.

Takenouchi, M.

Underkoffler, J.

P. Hilaire, S. Benton, M. Lucente, M. Jepsen, J. Kollin, H. Yoshikawa, and J. Underkoffler, Proc. SPIE 1212, 174 (1990).
[CrossRef]

Unser, M.

M. Liebling, T. Blu, and M. Unser, IEEE Trans. Image Process. 12, 29 (2003).
[CrossRef]

Wyrowski, F.

Yamaguchi, M.

M. Yamaguchi, H. Hoshino, T. Honda, and N. Ohyama, Proc. SPIE 1914, 25 (1993).
[CrossRef]

Yoshikawa, H.

H. Yoshikawa, Opt. Rev. 8, 331 (2001).
[CrossRef]

P. Hilaire, S. Benton, M. Lucente, M. Jepsen, J. Kollin, H. Yoshikawa, and J. Underkoffler, Proc. SPIE 1212, 174 (1990).
[CrossRef]

Yoshimura, K.

Appl. Opt. (3)

Computer (1)

C. Slinger, C. Cameron, and M. Stanley, Computer 38, 46 (2005).
[CrossRef]

IEEE Trans. Image Process. (1)

M. Liebling, T. Blu, and M. Unser, IEEE Trans. Image Process. 12, 29 (2003).
[CrossRef]

J. Opt. Soc. Am. A (1)

Opt. Express (2)

Opt. Lett. (1)

Opt. Rev. (1)

H. Yoshikawa, Opt. Rev. 8, 331 (2001).
[CrossRef]

Proc. SPIE (2)

M. Yamaguchi, H. Hoshino, T. Honda, and N. Ohyama, Proc. SPIE 1914, 25 (1993).
[CrossRef]

P. Hilaire, S. Benton, M. Lucente, M. Jepsen, J. Kollin, H. Yoshikawa, and J. Underkoffler, Proc. SPIE 1212, 174 (1990).
[CrossRef]

Other (1)

M. Lucente, in ACM SIGGRAPH Computer Graphics (Addison Wesley, 1997), pp. 63.
[CrossRef]

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Figures (4)

Fig. 1
Fig. 1

Overview of the propagation.

Fig. 2
Fig. 2

Holograms used for the evaluation test: (a) criterial hologram with direct computation, (b) test hologram with PAS, where the resolution of elemental holograms is 32 × 32 .

Fig. 3
Fig. 3

Reconstructed intensity images from the holograms of Fig. 2 at z 0 = 1000 mm : (a) that from the criterial hologram, (b) that from the test hologram. They are the result of the clipping process with a threshold of 20% of the maximum intensity.

Fig. 4
Fig. 4

Normalized error power computed through the reconstructing simulation with Eq. (4) (circles) and direct computation with Eq. (7) (box). The results with Eq. (4) in fact have fluctuation of 10 10 , owing to numerical errors.

Equations (8)

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w z 0 ( x , y ) = exp ( i k z 0 ) i λ z 0 R 2 h ( x , y ) exp { i k 2 z 0 [ ( x x ) 2 + ( y y ) 2 ] } d x d y F z 0 [ h ( x , y ) ] ,
w z 0 c ( x , y ) = F z 0 [ h c ( x , y ) ] ,
w z 0 t ( x , y ) = F z 0 [ h t ( x , y ) ] .
P ̃ E ( z 0 ) = w z 0 t α ( z 0 ) w z 0 c 2 w z 0 t 2 ,
α ( z 0 ) = w z 0 t , w z 0 c w z 0 c 2 ,
u , v = F z 0 [ u ] , F z 0 [ v ] ,
P ̃ E ( z 0 ) P ̃ E h t α h c 2 h t 2 ,
α = h t , h c h c 2 .

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