Abstract

A new common-path and in-line point-diffraction interferometer for quantitative phase microscopy is proposed. The interferometer is constructed by introducing a grating pair into the point-diffraction interferometer, thus forming a common-path and in-line configuration for object and reference waves. Achromatic phase shifting is implemented by linearly moving one of the two gratings in its grating vector direction. The feasibility of the proposed configuration is demonstrated by theoretical analysis and experiments.

© 2010 Optical Society of America

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References

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H. Kadono, M. Ogusu, and S. Toyooka, Opt. Commun. 110, 391 (1994).
[CrossRef]

1984

1983

1965

1964

1935

F. Zernike, Z. Tech. Phys. (Leipzig) 16, 454 (1935).

Attwood, D.

Badizadegan, K.

Bokor, J.

Burow, R.

Chang, C.

Chen, L. J.

Choi, W.

Dasari, R. R.

Deflores, L. P.

Elssner, K.-E.

Feld, M. S.

Gao, P.

García, J.

Geist, E.

Glückstad, J.

Goldberg, K. A.

Grzanna, J.

Han, J. H.

Harder, I.

P. Gao, B. L Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, Opt. Lett. 34, 3553 (2009).
[CrossRef] [PubMed]

I. Harder, N. Lindlein, and J. Schwider, in Fringe 2005, the 5th International Workshop on Automatic Procession of Fringe Patterns, W.Osten, ed. (Springer, 2005), p. 275.

Ikeda, T.

Iwai, H.

Kadono, H.

H. Kadono, M. Ogusu, and S. Toyooka, Opt. Commun. 110, 391 (1994).
[CrossRef]

Kothapalli, S.

Lee, S. H.

Lei, M.

Lindlein, N.

P. Gao, B. L Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, Opt. Lett. 34, 3553 (2009).
[CrossRef] [PubMed]

I. Harder, N. Lindlein, and J. Schwider, in Fringe 2005, the 5th International Workshop on Automatic Procession of Fringe Patterns, W.Osten, ed. (Springer, 2005), p. 275.

V. Nercissian, K. Mantel, N. Lindlein, and J. Schwider, in Deutshen Gesellschaft für angewandte Optik (DGaO) Proceedings (2008), p. 1614.

Lue, N.

Malacara, D.

D. Malacara, Optical Shop Testing (Wiley, 2007).
[CrossRef]

Mantel, K.

P. Gao, B. L Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, Opt. Lett. 34, 3553 (2009).
[CrossRef] [PubMed]

V. Nercissian, K. Mantel, N. Lindlein, and J. Schwider, in Deutshen Gesellschaft für angewandte Optik (DGaO) Proceedings (2008), p. 1614.

Medecki, H.

Merkel, K.

Mico, V.

Mogensen, P. C.

Naulleau, P. P.

Nercissian, V.

V. Nercissian, K. Mantel, N. Lindlein, and J. Schwider, in Deutshen Gesellschaft für angewandte Optik (DGaO) Proceedings (2008), p. 1614.

Ogusu, M.

H. Kadono, M. Ogusu, and S. Toyooka, Opt. Commun. 110, 391 (1994).
[CrossRef]

Park, Y.

Popescu, G.

Rao, D. V. G. L. N.

Ronchi, V.

Schreiber, H.

Schwider, J.

H. Schreiber and J. Schwider, Appl. Opt. 36, 5321 (1997).
[CrossRef] [PubMed]

J. Schwider, Appl. Opt. 23, 4403 (1984).
[CrossRef] [PubMed]

J. Schwider, R. Burow, K.-E. Elssner, J. Grzanna, R. Spolaczyk, and K. Merkel, Appl. Opt. 22, 3421 (1983).
[CrossRef] [PubMed]

I. Harder, N. Lindlein, and J. Schwider, in Fringe 2005, the 5th International Workshop on Automatic Procession of Fringe Patterns, W.Osten, ed. (Springer, 2005), p. 275.

V. Nercissian, K. Mantel, N. Lindlein, and J. Schwider, in Deutshen Gesellschaft für angewandte Optik (DGaO) Proceedings (2008), p. 1614.

Spolaczyk, R.

Tejnil, E.

Tipping, M.

Toyooka, S.

H. Kadono, M. Ogusu, and S. Toyooka, Opt. Commun. 110, 391 (1994).
[CrossRef]

Vaughan, J. C.

Veraksa, A.

Vogl, G.

Wang, Y. L.

Yamaguchi, I.

Yao, B. L

Yelleswarapu, C. S.

Zalevsky, Z.

Zernike, F.

F. Zernike, Z. Tech. Phys. (Leipzig) 16, 454 (1935).

Zhang, T.

Appl. Opt.

Opt. Commun.

H. Kadono, M. Ogusu, and S. Toyooka, Opt. Commun. 110, 391 (1994).
[CrossRef]

Opt. Express

Opt. Lett.

Z. Tech. Phys. (Leipzig)

F. Zernike, Z. Tech. Phys. (Leipzig) 16, 454 (1935).

Other

D. Malacara, Optical Shop Testing (Wiley, 2007).
[CrossRef]

I. Harder, N. Lindlein, and J. Schwider, in Fringe 2005, the 5th International Workshop on Automatic Procession of Fringe Patterns, W.Osten, ed. (Springer, 2005), p. 275.

V. Nercissian, K. Mantel, N. Lindlein, and J. Schwider, in Deutshen Gesellschaft für angewandte Optik (DGaO) Proceedings (2008), p. 1614.

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Figures (3)

Fig. 1
Fig. 1

Experimental setup for phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy. MO 1 and MO 2 , microscope objectives with magnification 10 × and NA = 0.3 ; L 1 L 6 , achromatic lenses; focal lengths of the lenses f 1 = 50 mm , f 2 = 200 mm , f 3 = f 4 = 80 mm , f 5 = 100 mm , f 6 = 300 mm ; P and P 1 P 3 , linear polarizers; PH, pinhole filter with diameter 20 μ m ; G 1 and G 2 , Ronchi phase gratings with period Λ = 15 μ m .

Fig. 2
Fig. 2

Phase-shifting interferograms of a microlens array with phase shifts: (a) 0, (b) π 2 , (c) π, (d) 3 π 2 .

Fig. 3
Fig. 3

Reconstructed phase distribution of the tested microlens array.

Equations (7)

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τ ̃ ( x , y ) = l = + a l exp ( i l K x ) ,
a l = 1 2 π 0 2 π τ ̃ exp ( i l K x ) d ( K x ) .
{ O + 1 ( x , y ) = O test ( x , y ) a 1 exp ( i K x ) , O 1 ( x , y ) = O test ( x , y ) a 1 exp ( i K x ) . }
O 1 f ( x , y ) = O 0 a 1 exp ( i K x ) .
O ( x , y ) = O 1 ( x , y ) a 1 exp [ i K ( x + Δ x ) ] = T O O test ( x , y ) exp ( i K Δ x ) ,
R ( x , y ) = O 1 f ( x , y ) a 1 exp [ i K ( x + Δ x ) ] = T R exp ( i K Δ x ) .
I ( x , y ) = I 0 ( x , y ) + V ( x , y ) cos [ φ ( x , y ) + 2 K Δ x ] .

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