Abstract

We manufactured and investigated distributed Bragg reflector ridge-waveguide diode lasers having sixth-order surface gratings and an emission wavelength around 974 nm. The single-mode output power of the lasers with a total length of 4 mm exceeded 1 W. A very small spectral linewidth of 1.4 MHz (3 dB) consisting of a Lorentzian part of 146 kHz and a Gaussian part of 1308 MHz was measured using a self-delayed heterodyne measurement technique.

© 2010 Optical Society of America

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  1. H. Wenzel, J. Fricke, A. Klehr, A. Knauer, and G. Erbert, IEEE Photon. Technol. Lett. 18, 737 (2006).
    [CrossRef]
  2. M. Achtenhagen, A. Hardy, and C. S. Harder, IEEE Photon. Technol. Lett. 18, 526 (2006).
    [CrossRef]
  3. P. Doussiere, C. Shieh, S. Demars, and K. Dzurko, Proc. SPIE 6485, 64850G (2007).
    [CrossRef]
  4. H. Wenzel, F. Bugge, M. Dallmer, F. Dittmar, J. Fricke, K. H. Hasler, and G. Erbert, IEEE Photon. Technol. Lett. 20, 214 (2008).
    [CrossRef]
  5. H. J. Wünsche, U. Bandelow, and H. Wenzel, IEEE J. Quantum Electron. 29, 1751 (1993).
    [CrossRef]
  6. J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
    [CrossRef]
  7. P. Ressel, G. Erbert, U. Zeimer, K. Hausler, G. Beister, B. Sumpf, A. Klehr, and G. Tränkle, IEEE Photon. Technol. Lett. 17, 962 (2005).
    [CrossRef]
  8. T. Okoshi, K. Kikuchi, and A. Nakayama, Electron. Lett. 16, 630 (1980).
    [CrossRef]
  9. H. Ludvigsen, M. Tossavainen, and M. Kaivola, Opt. Commun. 155, 180 (1998).
    [CrossRef]
  10. L. B. Mercer, J. Lightwave Technol. 9, 485 (1991).
    [CrossRef]
  11. A. L. Schawlow and C. H. Townes, Phys. Rev. 112, 1940 (1958).
    [CrossRef]
  12. C. H. Henry, IEEE J. Quantum Electron. 18, 259 (1982).
    [CrossRef]
  13. B. Tromborg, H. Olesen, and X. Pan, IEEE J. Quantum Electron. 27, 178 (1991).
    [CrossRef]

2008 (1)

H. Wenzel, F. Bugge, M. Dallmer, F. Dittmar, J. Fricke, K. H. Hasler, and G. Erbert, IEEE Photon. Technol. Lett. 20, 214 (2008).
[CrossRef]

2007 (1)

P. Doussiere, C. Shieh, S. Demars, and K. Dzurko, Proc. SPIE 6485, 64850G (2007).
[CrossRef]

2006 (2)

H. Wenzel, J. Fricke, A. Klehr, A. Knauer, and G. Erbert, IEEE Photon. Technol. Lett. 18, 737 (2006).
[CrossRef]

M. Achtenhagen, A. Hardy, and C. S. Harder, IEEE Photon. Technol. Lett. 18, 526 (2006).
[CrossRef]

2005 (2)

J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
[CrossRef]

P. Ressel, G. Erbert, U. Zeimer, K. Hausler, G. Beister, B. Sumpf, A. Klehr, and G. Tränkle, IEEE Photon. Technol. Lett. 17, 962 (2005).
[CrossRef]

1998 (1)

H. Ludvigsen, M. Tossavainen, and M. Kaivola, Opt. Commun. 155, 180 (1998).
[CrossRef]

1993 (1)

H. J. Wünsche, U. Bandelow, and H. Wenzel, IEEE J. Quantum Electron. 29, 1751 (1993).
[CrossRef]

1991 (2)

L. B. Mercer, J. Lightwave Technol. 9, 485 (1991).
[CrossRef]

B. Tromborg, H. Olesen, and X. Pan, IEEE J. Quantum Electron. 27, 178 (1991).
[CrossRef]

1982 (1)

C. H. Henry, IEEE J. Quantum Electron. 18, 259 (1982).
[CrossRef]

1980 (1)

T. Okoshi, K. Kikuchi, and A. Nakayama, Electron. Lett. 16, 630 (1980).
[CrossRef]

1958 (1)

A. L. Schawlow and C. H. Townes, Phys. Rev. 112, 1940 (1958).
[CrossRef]

Achtenhagen, M.

M. Achtenhagen, A. Hardy, and C. S. Harder, IEEE Photon. Technol. Lett. 18, 526 (2006).
[CrossRef]

Bandelow, U.

H. J. Wünsche, U. Bandelow, and H. Wenzel, IEEE J. Quantum Electron. 29, 1751 (1993).
[CrossRef]

Beister, G.

P. Ressel, G. Erbert, U. Zeimer, K. Hausler, G. Beister, B. Sumpf, A. Klehr, and G. Tränkle, IEEE Photon. Technol. Lett. 17, 962 (2005).
[CrossRef]

Bugge, F.

H. Wenzel, F. Bugge, M. Dallmer, F. Dittmar, J. Fricke, K. H. Hasler, and G. Erbert, IEEE Photon. Technol. Lett. 20, 214 (2008).
[CrossRef]

Dallmer, M.

H. Wenzel, F. Bugge, M. Dallmer, F. Dittmar, J. Fricke, K. H. Hasler, and G. Erbert, IEEE Photon. Technol. Lett. 20, 214 (2008).
[CrossRef]

Demars, S.

P. Doussiere, C. Shieh, S. Demars, and K. Dzurko, Proc. SPIE 6485, 64850G (2007).
[CrossRef]

Dittmar, F.

H. Wenzel, F. Bugge, M. Dallmer, F. Dittmar, J. Fricke, K. H. Hasler, and G. Erbert, IEEE Photon. Technol. Lett. 20, 214 (2008).
[CrossRef]

Doussiere, P.

P. Doussiere, C. Shieh, S. Demars, and K. Dzurko, Proc. SPIE 6485, 64850G (2007).
[CrossRef]

Dzurko, K.

P. Doussiere, C. Shieh, S. Demars, and K. Dzurko, Proc. SPIE 6485, 64850G (2007).
[CrossRef]

Erbert, G.

H. Wenzel, F. Bugge, M. Dallmer, F. Dittmar, J. Fricke, K. H. Hasler, and G. Erbert, IEEE Photon. Technol. Lett. 20, 214 (2008).
[CrossRef]

H. Wenzel, J. Fricke, A. Klehr, A. Knauer, and G. Erbert, IEEE Photon. Technol. Lett. 18, 737 (2006).
[CrossRef]

P. Ressel, G. Erbert, U. Zeimer, K. Hausler, G. Beister, B. Sumpf, A. Klehr, and G. Tränkle, IEEE Photon. Technol. Lett. 17, 962 (2005).
[CrossRef]

J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
[CrossRef]

Fricke, J.

H. Wenzel, F. Bugge, M. Dallmer, F. Dittmar, J. Fricke, K. H. Hasler, and G. Erbert, IEEE Photon. Technol. Lett. 20, 214 (2008).
[CrossRef]

H. Wenzel, J. Fricke, A. Klehr, A. Knauer, and G. Erbert, IEEE Photon. Technol. Lett. 18, 737 (2006).
[CrossRef]

J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
[CrossRef]

Harder, C. S.

M. Achtenhagen, A. Hardy, and C. S. Harder, IEEE Photon. Technol. Lett. 18, 526 (2006).
[CrossRef]

Hardy, A.

M. Achtenhagen, A. Hardy, and C. S. Harder, IEEE Photon. Technol. Lett. 18, 526 (2006).
[CrossRef]

Hasler, K. H.

H. Wenzel, F. Bugge, M. Dallmer, F. Dittmar, J. Fricke, K. H. Hasler, and G. Erbert, IEEE Photon. Technol. Lett. 20, 214 (2008).
[CrossRef]

Hausler, K.

P. Ressel, G. Erbert, U. Zeimer, K. Hausler, G. Beister, B. Sumpf, A. Klehr, and G. Tränkle, IEEE Photon. Technol. Lett. 17, 962 (2005).
[CrossRef]

Henry, C. H.

C. H. Henry, IEEE J. Quantum Electron. 18, 259 (1982).
[CrossRef]

Kaivola, M.

H. Ludvigsen, M. Tossavainen, and M. Kaivola, Opt. Commun. 155, 180 (1998).
[CrossRef]

Kikuchi, K.

T. Okoshi, K. Kikuchi, and A. Nakayama, Electron. Lett. 16, 630 (1980).
[CrossRef]

Klehr, A.

H. Wenzel, J. Fricke, A. Klehr, A. Knauer, and G. Erbert, IEEE Photon. Technol. Lett. 18, 737 (2006).
[CrossRef]

J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
[CrossRef]

P. Ressel, G. Erbert, U. Zeimer, K. Hausler, G. Beister, B. Sumpf, A. Klehr, and G. Tränkle, IEEE Photon. Technol. Lett. 17, 962 (2005).
[CrossRef]

Knauer, A.

H. Wenzel, J. Fricke, A. Klehr, A. Knauer, and G. Erbert, IEEE Photon. Technol. Lett. 18, 737 (2006).
[CrossRef]

Ludvigsen, H.

H. Ludvigsen, M. Tossavainen, and M. Kaivola, Opt. Commun. 155, 180 (1998).
[CrossRef]

Matalla, M.

J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
[CrossRef]

Mercer, L. B.

L. B. Mercer, J. Lightwave Technol. 9, 485 (1991).
[CrossRef]

Nakayama, A.

T. Okoshi, K. Kikuchi, and A. Nakayama, Electron. Lett. 16, 630 (1980).
[CrossRef]

Okoshi, T.

T. Okoshi, K. Kikuchi, and A. Nakayama, Electron. Lett. 16, 630 (1980).
[CrossRef]

Olesen, H.

B. Tromborg, H. Olesen, and X. Pan, IEEE J. Quantum Electron. 27, 178 (1991).
[CrossRef]

Pan, X.

B. Tromborg, H. Olesen, and X. Pan, IEEE J. Quantum Electron. 27, 178 (1991).
[CrossRef]

Ressel, P.

P. Ressel, G. Erbert, U. Zeimer, K. Hausler, G. Beister, B. Sumpf, A. Klehr, and G. Tränkle, IEEE Photon. Technol. Lett. 17, 962 (2005).
[CrossRef]

Schawlow, A. L.

A. L. Schawlow and C. H. Townes, Phys. Rev. 112, 1940 (1958).
[CrossRef]

Shieh, C.

P. Doussiere, C. Shieh, S. Demars, and K. Dzurko, Proc. SPIE 6485, 64850G (2007).
[CrossRef]

Sumpf, B.

P. Ressel, G. Erbert, U. Zeimer, K. Hausler, G. Beister, B. Sumpf, A. Klehr, and G. Tränkle, IEEE Photon. Technol. Lett. 17, 962 (2005).
[CrossRef]

Tossavainen, M.

H. Ludvigsen, M. Tossavainen, and M. Kaivola, Opt. Commun. 155, 180 (1998).
[CrossRef]

Townes, C. H.

A. L. Schawlow and C. H. Townes, Phys. Rev. 112, 1940 (1958).
[CrossRef]

Tränkle, G.

P. Ressel, G. Erbert, U. Zeimer, K. Hausler, G. Beister, B. Sumpf, A. Klehr, and G. Tränkle, IEEE Photon. Technol. Lett. 17, 962 (2005).
[CrossRef]

Tromborg, B.

B. Tromborg, H. Olesen, and X. Pan, IEEE J. Quantum Electron. 27, 178 (1991).
[CrossRef]

Wenzel, H.

H. Wenzel, F. Bugge, M. Dallmer, F. Dittmar, J. Fricke, K. H. Hasler, and G. Erbert, IEEE Photon. Technol. Lett. 20, 214 (2008).
[CrossRef]

H. Wenzel, J. Fricke, A. Klehr, A. Knauer, and G. Erbert, IEEE Photon. Technol. Lett. 18, 737 (2006).
[CrossRef]

J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
[CrossRef]

H. J. Wünsche, U. Bandelow, and H. Wenzel, IEEE J. Quantum Electron. 29, 1751 (1993).
[CrossRef]

Wünsche, H. J.

H. J. Wünsche, U. Bandelow, and H. Wenzel, IEEE J. Quantum Electron. 29, 1751 (1993).
[CrossRef]

Zeimer, U.

P. Ressel, G. Erbert, U. Zeimer, K. Hausler, G. Beister, B. Sumpf, A. Klehr, and G. Tränkle, IEEE Photon. Technol. Lett. 17, 962 (2005).
[CrossRef]

Electron. Lett. (1)

T. Okoshi, K. Kikuchi, and A. Nakayama, Electron. Lett. 16, 630 (1980).
[CrossRef]

IEEE J. Quantum Electron. (3)

H. J. Wünsche, U. Bandelow, and H. Wenzel, IEEE J. Quantum Electron. 29, 1751 (1993).
[CrossRef]

C. H. Henry, IEEE J. Quantum Electron. 18, 259 (1982).
[CrossRef]

B. Tromborg, H. Olesen, and X. Pan, IEEE J. Quantum Electron. 27, 178 (1991).
[CrossRef]

IEEE Photon. Technol. Lett. (4)

H. Wenzel, J. Fricke, A. Klehr, A. Knauer, and G. Erbert, IEEE Photon. Technol. Lett. 18, 737 (2006).
[CrossRef]

M. Achtenhagen, A. Hardy, and C. S. Harder, IEEE Photon. Technol. Lett. 18, 526 (2006).
[CrossRef]

H. Wenzel, F. Bugge, M. Dallmer, F. Dittmar, J. Fricke, K. H. Hasler, and G. Erbert, IEEE Photon. Technol. Lett. 20, 214 (2008).
[CrossRef]

P. Ressel, G. Erbert, U. Zeimer, K. Hausler, G. Beister, B. Sumpf, A. Klehr, and G. Tränkle, IEEE Photon. Technol. Lett. 17, 962 (2005).
[CrossRef]

J. Lightwave Technol. (1)

L. B. Mercer, J. Lightwave Technol. 9, 485 (1991).
[CrossRef]

Opt. Commun. (1)

H. Ludvigsen, M. Tossavainen, and M. Kaivola, Opt. Commun. 155, 180 (1998).
[CrossRef]

Phys. Rev. (1)

A. L. Schawlow and C. H. Townes, Phys. Rev. 112, 1940 (1958).
[CrossRef]

Proc. SPIE (1)

P. Doussiere, C. Shieh, S. Demars, and K. Dzurko, Proc. SPIE 6485, 64850G (2007).
[CrossRef]

Semicond. Sci. Technol. (1)

J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
[CrossRef]

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Figures (6)

Fig. 1
Fig. 1

Schematic view of a DBR RW laser.

Fig. 2
Fig. 2

cw power-voltage-current characteristics of a 4-mm-long DBR RW laser with a 1 mm long sixth order surface grating and a ridge width of 5 μ m for various temperatures ( 15 ° C 35 ° C ) . Inset, magnification of power-current characteristics near threshold.

Fig. 3
Fig. 3

Optical spectra at 2.5 A for 15 ° C , 25 ° C , and 35 ° C .

Fig. 4
Fig. 4

Vertical and lateral profiles of (a) near and (b) far fields at P = 1   W for a heat sink temperature T = 25 ° C .

Fig. 5
Fig. 5

Normalized self-delayed-heterodyne line shape at T = 15 ° C ( I = 2200   mA , P = 1091   mW ) and T = 25 ° C ( I = 2.2   A , P = 1.1   W ).

Fig. 6
Fig. 6

Lorentzian and Gaussian contributions to the spectral linewidth versus output power.

Equations (1)

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Δ ν = K n sp h ν ( α R + α i ) α R c 2 4 π P out n g 2 ( 1 + α eff 2 ) .

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